CN202893706U - Test sorter for minimal type semiconductor devices - Google Patents
Test sorter for minimal type semiconductor devices Download PDFInfo
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- CN202893706U CN202893706U CN 201220607947 CN201220607947U CN202893706U CN 202893706 U CN202893706 U CN 202893706U CN 201220607947 CN201220607947 CN 201220607947 CN 201220607947 U CN201220607947 U CN 201220607947U CN 202893706 U CN202893706 U CN 202893706U
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- 238000012360 testing method Methods 0.000 title claims abstract description 73
- 239000004065 semiconductor Substances 0.000 title claims abstract description 45
- 230000007246 mechanism Effects 0.000 claims abstract description 30
- 239000002699 waste material Substances 0.000 claims abstract description 14
- 229910000838 Al alloy Inorganic materials 0.000 claims abstract description 6
- 239000000463 material Substances 0.000 claims description 17
- 230000000007 visual effect Effects 0.000 claims description 7
- 238000010330 laser marking Methods 0.000 claims description 4
- 239000013585 weight reducing agent Substances 0.000 claims description 4
- 238000011056 performance test Methods 0.000 claims description 3
- 230000033001 locomotion Effects 0.000 abstract description 4
- 238000009954 braiding Methods 0.000 abstract 2
- 238000001514 detection method Methods 0.000 description 7
- 238000005516 engineering process Methods 0.000 description 4
- 238000012856 packing Methods 0.000 description 4
- 230000009471 action Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
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- 238000012795 verification Methods 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 238000010835 comparative analysis Methods 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
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Abstract
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN 201220607947 CN202893706U (en) | 2012-11-17 | 2012-11-17 | Test sorter for minimal type semiconductor devices |
Applications Claiming Priority (1)
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CN 201220607947 CN202893706U (en) | 2012-11-17 | 2012-11-17 | Test sorter for minimal type semiconductor devices |
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CN202893706U true CN202893706U (en) | 2013-04-24 |
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CN 201220607947 Expired - Fee Related CN202893706U (en) | 2012-11-17 | 2012-11-17 | Test sorter for minimal type semiconductor devices |
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Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102921644A (en) * | 2012-11-17 | 2013-02-13 | 吴华 | Turret test selector |
CN104879495A (en) * | 2015-05-29 | 2015-09-02 | 桂林斯壮微电子有限责任公司 | Vacuum sealing device for testing sorting printing braider |
CN105467256A (en) * | 2015-05-14 | 2016-04-06 | 华润赛美科微电子(深圳)有限公司 | Chip testing and sorting method |
CN107030026A (en) * | 2017-05-17 | 2017-08-11 | 鹏南科技(厦门)有限公司 | A kind of semiconductor refrigerating crystal grain automatic fraction collector |
CN108971013A (en) * | 2018-08-31 | 2018-12-11 | 江苏创源电子有限公司 | A kind of fuse test equipment |
CN113589146A (en) * | 2021-07-29 | 2021-11-02 | 武汉云岭光电有限公司 | Method and system for testing edge-emitting semiconductor laser chip |
CN113877845A (en) * | 2021-10-28 | 2022-01-04 | 浙江庆鑫科技有限公司 | Pressure compensation device and method |
-
2012
- 2012-11-17 CN CN 201220607947 patent/CN202893706U/en not_active Expired - Fee Related
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102921644A (en) * | 2012-11-17 | 2013-02-13 | 吴华 | Turret test selector |
CN102921644B (en) * | 2012-11-17 | 2014-01-08 | 吴华 | Turret test selector |
CN105467256A (en) * | 2015-05-14 | 2016-04-06 | 华润赛美科微电子(深圳)有限公司 | Chip testing and sorting method |
CN104879495A (en) * | 2015-05-29 | 2015-09-02 | 桂林斯壮微电子有限责任公司 | Vacuum sealing device for testing sorting printing braider |
CN104879495B (en) * | 2015-05-29 | 2017-03-08 | 桂林斯壮微电子有限责任公司 | A kind of testing, sorting prints the vacuum sealing device of braider |
CN107030026A (en) * | 2017-05-17 | 2017-08-11 | 鹏南科技(厦门)有限公司 | A kind of semiconductor refrigerating crystal grain automatic fraction collector |
CN108971013A (en) * | 2018-08-31 | 2018-12-11 | 江苏创源电子有限公司 | A kind of fuse test equipment |
CN108971013B (en) * | 2018-08-31 | 2024-04-26 | 江苏创源电子有限公司 | Fuse test equipment |
CN113589146A (en) * | 2021-07-29 | 2021-11-02 | 武汉云岭光电有限公司 | Method and system for testing edge-emitting semiconductor laser chip |
CN113877845A (en) * | 2021-10-28 | 2022-01-04 | 浙江庆鑫科技有限公司 | Pressure compensation device and method |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
EE01 | Entry into force of recordation of patent licensing contract | ||
EE01 | Entry into force of recordation of patent licensing contract |
Assignee: Nantong Kingtech Co., Ltd. Assignor: Wu Hua Contract record no.: 2014320010005 Denomination of utility model: Test sorter for minimal type semiconductor devices Granted publication date: 20130424 License type: Exclusive License Record date: 20140122 |
|
TR01 | Transfer of patent right |
Effective date of registration: 20161219 Address after: Jiangsu province Nantong City Chongchuan road 226000 No. 27 4 1 floor Patentee after: Nantong Kingtech Co., Ltd. Address before: 226000 Jiangsu Province, Nantong City Chongchuan District Chongchuan Road 27, 4 floor of Building 1 Patentee before: Wu Hua |
|
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130424 Termination date: 20181117 |