CN202710007U - 一种测量关键尺寸的扫描电子显微镜校准用样品 - Google Patents
一种测量关键尺寸的扫描电子显微镜校准用样品 Download PDFInfo
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- CN202710007U CN202710007U CN 201220328146 CN201220328146U CN202710007U CN 202710007 U CN202710007 U CN 202710007U CN 201220328146 CN201220328146 CN 201220328146 CN 201220328146 U CN201220328146 U CN 201220328146U CN 202710007 U CN202710007 U CN 202710007U
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104752407A (zh) * | 2013-12-31 | 2015-07-01 | 中芯国际集成电路制造(上海)有限公司 | 用于检测cdsem机台的方法、晶圆、晶圆的制作方法 |
CN112863980A (zh) * | 2021-01-05 | 2021-05-28 | 长江存储科技有限责任公司 | 特征尺寸扫描电子显微镜机台的校准方法及校准装置 |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104752407A (zh) * | 2013-12-31 | 2015-07-01 | 中芯国际集成电路制造(上海)有限公司 | 用于检测cdsem机台的方法、晶圆、晶圆的制作方法 |
CN104752407B (zh) * | 2013-12-31 | 2018-05-25 | 中芯国际集成电路制造(上海)有限公司 | 用于检测cdsem机台的方法、晶圆、晶圆的制作方法 |
CN112863980A (zh) * | 2021-01-05 | 2021-05-28 | 长江存储科技有限责任公司 | 特征尺寸扫描电子显微镜机台的校准方法及校准装置 |
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Owner name: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (BEIJING Free format text: FORMER OWNER: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION Effective date: 20130424 |
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Free format text: CORRECT: ADDRESS; FROM: 201203 PUDONG NEW AREA, SHANGHAI TO: 100176 DAXING, BEIJING |
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Effective date of registration: 20130424 Address after: 100176 No. 18, Wenchang Avenue, Beijing economic and Technological Development Zone Patentee after: Semiconductor Manufacturing International (Beijing) Corp. Address before: 201203 Shanghai City, Pudong New Area Zhangjiang Road No. 18 Patentee before: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) Corp. |
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CX01 | Expiry of patent term |
Granted publication date: 20130130 |
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CX01 | Expiry of patent term |