CN201051088Y - 半导体检测设备的进样器 - Google Patents
半导体检测设备的进样器 Download PDFInfo
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- CN201051088Y CN201051088Y CNU2007200705474U CN200720070547U CN201051088Y CN 201051088 Y CN201051088 Y CN 201051088Y CN U2007200705474 U CNU2007200705474 U CN U2007200705474U CN 200720070547 U CN200720070547 U CN 200720070547U CN 201051088 Y CN201051088 Y CN 201051088Y
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CNU2007200705474U CN201051088Y (zh) | 2007-06-01 | 2007-06-01 | 半导体检测设备的进样器 |
Applications Claiming Priority (1)
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CNU2007200705474U CN201051088Y (zh) | 2007-06-01 | 2007-06-01 | 半导体检测设备的进样器 |
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CN201051088Y true CN201051088Y (zh) | 2008-04-23 |
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CNU2007200705474U Expired - Lifetime CN201051088Y (zh) | 2007-06-01 | 2007-06-01 | 半导体检测设备的进样器 |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102252953A (zh) * | 2010-05-21 | 2011-11-23 | 武汉新芯集成电路制造有限公司 | 用于液体颗粒测试的适配装置 |
CN107510970A (zh) * | 2016-06-15 | 2017-12-26 | 北大方正集团有限公司 | 过滤组件及液体分析装置 |
-
2007
- 2007-06-01 CN CNU2007200705474U patent/CN201051088Y/zh not_active Expired - Lifetime
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102252953A (zh) * | 2010-05-21 | 2011-11-23 | 武汉新芯集成电路制造有限公司 | 用于液体颗粒测试的适配装置 |
CN102252953B (zh) * | 2010-05-21 | 2013-07-03 | 武汉新芯集成电路制造有限公司 | 用于液体颗粒测试的适配装置 |
CN107510970A (zh) * | 2016-06-15 | 2017-12-26 | 北大方正集团有限公司 | 过滤组件及液体分析装置 |
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Legal Events
Date | Code | Title | Description |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (BEIJING Free format text: FORMER OWNER: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION Effective date: 20130322 |
|
C41 | Transfer of patent application or patent right or utility model | ||
COR | Change of bibliographic data |
Free format text: CORRECT: ADDRESS; FROM: 201203 PUDONG NEW AREA, SHANGHAI TO: 100176 DAXING, BEIJING |
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TR01 | Transfer of patent right |
Effective date of registration: 20130322 Address after: 100176 No. 18, Wenchang Avenue, Beijing economic and Technological Development Zone Patentee after: Semiconductor Manufacturing International (Beijing) Corporation Address before: 201203 No. 18 Zhangjiang Road, Shanghai Patentee before: Semiconductor Manufacturing International (Shanghai) Corporation |
|
CX01 | Expiry of patent term |
Granted publication date: 20080423 |
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CX01 | Expiry of patent term |