CN1945219B - 用于保持测量仪器的测量架 - Google Patents

用于保持测量仪器的测量架 Download PDF

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Publication number
CN1945219B
CN1945219B CN2006101085924A CN200610108592A CN1945219B CN 1945219 B CN1945219 B CN 1945219B CN 2006101085924 A CN2006101085924 A CN 2006101085924A CN 200610108592 A CN200610108592 A CN 200610108592A CN 1945219 B CN1945219 B CN 1945219B
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CN
China
Prior art keywords
measuring
cam follower
stand according
cam
pivot
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2006101085924A
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English (en)
Chinese (zh)
Other versions
CN1945219A (zh
Inventor
H·费希尔
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Immobiliengesellschaft Helmut Fischer GmbH and Co KG
Original Assignee
Immobiliengesellschaft Helmut Fischer GmbH and Co KG
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Publication of CN1945219A publication Critical patent/CN1945219A/zh
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Publication of CN1945219B publication Critical patent/CN1945219B/zh
Expired - Fee Related legal-status Critical Current
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
    • G01B7/105—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B3/00—Measuring instruments characterised by the use of mechanical techniques
    • G01B3/002—Details
    • G01B3/008—Arrangements for controlling the measuring force
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0002—Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0002—Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
    • G01B5/0004—Supports
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/02—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness
    • G01B5/06—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness for measuring thickness

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
CN2006101085924A 2005-07-20 2006-07-20 用于保持测量仪器的测量架 Expired - Fee Related CN1945219B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102005034515.8 2005-07-20
DE102005034515.8A DE102005034515B4 (de) 2005-07-20 2005-07-20 Messstativ zur Aufnahme einer Messvorrichtung

Publications (2)

Publication Number Publication Date
CN1945219A CN1945219A (zh) 2007-04-11
CN1945219B true CN1945219B (zh) 2011-05-04

Family

ID=36926609

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2006101085924A Expired - Fee Related CN1945219B (zh) 2005-07-20 2006-07-20 用于保持测量仪器的测量架

Country Status (5)

Country Link
US (1) US7610690B2 (enExample)
JP (1) JP5288694B2 (enExample)
CN (1) CN1945219B (enExample)
DE (1) DE102005034515B4 (enExample)
GB (1) GB2428481B (enExample)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005034515B4 (de) * 2005-07-20 2019-06-19 Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg Messstativ zur Aufnahme einer Messvorrichtung
JP4913618B2 (ja) 2007-02-02 2012-04-11 株式会社エヌ・ティ・ティ・ドコモ 移動通信システム
CN101158569B (zh) * 2007-11-16 2010-06-09 中钞长城金融设备控股有限公司 纸币厚度检测装置
US20100088913A1 (en) * 2008-10-15 2010-04-15 Dustin Edward Conlon Apparatus and Method for Simutaneously Functioning Internal Shaft and Plunger of a Micrometer
DE102010011633B4 (de) 2009-03-18 2020-09-24 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Messstativ und Verfahren zu dessen elektrischer Ansteuerung
AT510009B1 (de) * 2011-02-16 2012-01-15 Thomastik Infeld Ges M B H Messvorrichtung und verfahren zur dickenmessung eines bandes
CN102288090B (zh) * 2011-04-25 2013-04-24 青岛人民印刷有限公司 一种自动测厚仪及自动测厚系统
CN103542828A (zh) * 2013-10-10 2014-01-29 中国工程物理研究院化工材料研究所 用于测量的开环定位装置及误差消除方法
DE102014101577A1 (de) * 2014-02-07 2015-08-13 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Verfahren zur elektrischen Ansteuerung eines Messstativs sowie Messstativ zur Aufnahme einer Messsonde
CN104098048B (zh) * 2014-07-07 2016-08-17 重庆凌峰橡塑制品有限公司 一种旋转升降式仪器架
CN104154940A (zh) * 2014-08-26 2014-11-19 昆山迈致治具科技有限公司 一种pct治具
DE102015103136A1 (de) * 2015-03-04 2016-09-08 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Verfahren zur elektronischen Ansteuerung eines Messstativs
CN106078471B (zh) * 2016-08-04 2017-12-05 张家港Aaa精密制造股份有限公司 一种全自动轴承抛光检测一体机
RU175683U1 (ru) * 2017-06-29 2017-12-14 Федеральное государственное унитарное предприятие федеральный научно-производственный центр "Производственное объединение "Старт" им. М.В. Проценко" (ФГУП ФНПЦ ПО "Старт" им. М.В. Проценко") Вертикальный длиномер
KR102294886B1 (ko) * 2020-03-17 2021-08-27 서한산업(주) 자동차 브레이크 표면 측정장치
CN111308138A (zh) * 2020-04-13 2020-06-19 杭州思元智能科技有限公司 往复驱动装置
WO2022029998A1 (ja) * 2020-08-07 2022-02-10 株式会社Fuji プローブ操作装置
CN114562972B (zh) * 2022-04-28 2022-07-12 深圳市奕然电子科技有限公司 一种电路板贴片用厚度检测装置
CN115077766B (zh) * 2022-07-25 2022-10-28 四川富生汽车零部件有限公司 一种车载空调鼓风机电机中滑动轴承的扭力检测装置
CN115876136A (zh) * 2022-12-14 2023-03-31 中国航空工业集团公司金城南京机电液压工程研究中心 一种柱塞杆长度测量装置

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4766674A (en) * 1986-04-30 1988-08-30 Tesa A.A. Sensing device for an independent linear-magnitude measurement apparatus
US4845855A (en) * 1985-11-12 1989-07-11 Hans Meyer Instrument for measuring vertical distances
US4924598A (en) * 1987-06-11 1990-05-15 Mauser-Werke Oberndorf Gmbh Height measuring instrument
US6604295B2 (en) * 2000-03-14 2003-08-12 Mitutoyo Corporation Microscopic geometry measuring device
US20040133300A1 (en) * 2002-10-25 2004-07-08 Mitutoyo Corporation Probe driving mechanism for displacement measuring apparatuses

Family Cites Families (20)

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Publication number Priority date Publication date Assignee Title
GB417881A (en) * 1933-04-28 1934-10-15 Joseph Gogan Improvements in or relating to a method of and apparatus for testing individual bodies to determine the hardness or bending characteristics thereof or comparing said characteristics with those of a standard body
GB624868A (en) * 1946-07-20 1949-06-17 Bsa Tools Ltd Improvements in or relating to apparatus for measuring or indicating the roughness or undulations of a surface
GB1108792A (en) 1965-07-22 1968-04-03 Zeiss Jena Veb Carl Improvements in or relating to height gauges
US3750295A (en) 1971-07-22 1973-08-07 Werkzeugmasch Veb Measuring machine
GB2110371B (en) * 1981-08-10 1985-01-30 Mitutoyo Mfg Co Ltd Height gauge
US4679326A (en) * 1984-11-21 1987-07-14 Mitutoyo Mfg. Co., Ltd. Height gauge
JPH0548087Y2 (enExample) * 1985-01-22 1993-12-20
GB2192062B (en) * 1986-06-27 1990-02-28 Rank Taylor Hobson Ltd Metrological apparatus
JPH0757463B2 (ja) * 1986-07-10 1995-06-21 功 村上 エアカット時間を短縮する旋削加工方法
JP2565051Y2 (ja) * 1987-03-11 1998-03-11 富士写真フイルム株式会社 Ｘ線フイルムカセツテのサイズ検出機構
JPH076706U (ja) * 1993-06-30 1995-01-31 日立工機株式会社 用紙厚測定センサ
GB2281779B (en) * 1993-09-14 1997-04-23 Rank Taylor Hobson Ltd Metrological instrument
JPH07198370A (ja) * 1993-12-29 1995-08-01 Hitachi Constr Mach Co Ltd 力制御ロボットの位置検出プローブ
JPH09304001A (ja) 1996-05-20 1997-11-28 Oji Paper Co Ltd 紙束の厚さ測定器
US6011391A (en) * 1996-09-04 2000-01-04 Elektro-Physik Hans Nix Probe for measuring thin layers using a magnetic or eddy current process
US6401352B1 (en) * 1999-10-01 2002-06-11 Mitutoyo Corporation Linear measuring machine
US20030047388A1 (en) * 2001-08-30 2003-03-13 Faitel William M. Scissors lifter drive apparatus
JP3834817B2 (ja) * 2003-05-30 2006-10-18 株式会社東京精密 測定ヘッド
JP4330388B2 (ja) * 2003-07-28 2009-09-16 株式会社ミツトヨ 倣いプローブ
DE102005034515B4 (de) * 2005-07-20 2019-06-19 Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg Messstativ zur Aufnahme einer Messvorrichtung

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4845855A (en) * 1985-11-12 1989-07-11 Hans Meyer Instrument for measuring vertical distances
US4766674A (en) * 1986-04-30 1988-08-30 Tesa A.A. Sensing device for an independent linear-magnitude measurement apparatus
US4924598A (en) * 1987-06-11 1990-05-15 Mauser-Werke Oberndorf Gmbh Height measuring instrument
US6604295B2 (en) * 2000-03-14 2003-08-12 Mitutoyo Corporation Microscopic geometry measuring device
US20040133300A1 (en) * 2002-10-25 2004-07-08 Mitutoyo Corporation Probe driving mechanism for displacement measuring apparatuses

Also Published As

Publication number Publication date
DE102005034515B4 (de) 2019-06-19
JP5288694B2 (ja) 2013-09-11
JP2007024895A (ja) 2007-02-01
GB2428481B (en) 2010-06-16
US20070017112A1 (en) 2007-01-25
US7610690B2 (en) 2009-11-03
GB0613487D0 (en) 2006-08-16
DE102005034515A1 (de) 2007-01-25
GB2428481A (en) 2007-01-31
CN1945219A (zh) 2007-04-11

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