CN1864229B - 磁隧道结器件以及用于所述器件的写/读方法 - Google Patents
磁隧道结器件以及用于所述器件的写/读方法 Download PDFInfo
- Publication number
- CN1864229B CN1864229B CN2004800293670A CN200480029367A CN1864229B CN 1864229 B CN1864229 B CN 1864229B CN 2004800293670 A CN2004800293670 A CN 2004800293670A CN 200480029367 A CN200480029367 A CN 200480029367A CN 1864229 B CN1864229 B CN 1864229B
- Authority
- CN
- China
- Prior art keywords
- layer
- magnetic device
- magnetic
- thermal boundary
- magnetosphere
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/10—Magnetoresistive devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/14—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements
- G11C11/15—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements using multiple magnetic layers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
- H01F10/3254—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the spacer being semiconducting or insulating, e.g. for spin tunnel junction [STJ]
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Nanotechnology (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Hall/Mr Elements (AREA)
- Mram Or Spin Memory Techniques (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR0311897A FR2860910B1 (fr) | 2003-10-10 | 2003-10-10 | Dispositif a jonction tunnel magnetique et procede d'ecriture/lecture d'un tel dispositif |
| FR0311897 | 2003-10-10 | ||
| PCT/FR2004/002517 WO2005036559A1 (fr) | 2003-10-10 | 2004-10-06 | Dispositif à jonction tunnel magnétique et procédé d'écriture/lecture d'un tel dispositif |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1864229A CN1864229A (zh) | 2006-11-15 |
| CN1864229B true CN1864229B (zh) | 2012-01-25 |
Family
ID=34355400
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2004800293670A Expired - Fee Related CN1864229B (zh) | 2003-10-10 | 2004-10-06 | 磁隧道结器件以及用于所述器件的写/读方法 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US7480175B2 (enExample) |
| EP (1) | EP1671330B1 (enExample) |
| JP (1) | JP5035829B2 (enExample) |
| KR (1) | KR101169241B1 (enExample) |
| CN (1) | CN1864229B (enExample) |
| CA (1) | CA2540608C (enExample) |
| FR (1) | FR2860910B1 (enExample) |
| WO (1) | WO2005036559A1 (enExample) |
Families Citing this family (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7986454B1 (en) * | 2006-07-03 | 2011-07-26 | Terahertz Technologies Llc | Tunable terahertz generator using a magnon gain medium with an antenna |
| TWI449040B (zh) | 2006-10-06 | 2014-08-11 | Crocus Technology Sa | 用於提供內容可定址的磁阻式隨機存取記憶體單元之系統及方法 |
| KR20080057881A (ko) | 2006-12-21 | 2008-06-25 | 엘지전자 주식회사 | 인쇄회로기판, 이를 포함하는 발광 장치 및 그 제조 방법 |
| US7679163B2 (en) * | 2007-05-14 | 2010-03-16 | Industrial Technology Research Institute | Phase-change memory element |
| JP5152712B2 (ja) * | 2007-07-17 | 2013-02-27 | 独立行政法人理化学研究所 | 磁化状態制御装置および磁気情報記録装置 |
| CN101354908B (zh) * | 2007-07-23 | 2011-01-19 | 财团法人工业技术研究院 | 栓扣式磁性存储器的数据写入控制电路及数据写入方法 |
| KR100943860B1 (ko) * | 2007-12-21 | 2010-02-24 | 주식회사 하이닉스반도체 | 자기터널접합 셀 형성방법 |
| US8426838B2 (en) | 2008-01-25 | 2013-04-23 | Higgs Opl. Capital Llc | Phase-change memory |
| EP2109111B1 (en) | 2008-04-07 | 2011-12-21 | Crocus Technology S.A. | System and method for writing data to magnetoresistive random access memory cells |
| FR2931011B1 (fr) | 2008-05-06 | 2010-05-28 | Commissariat Energie Atomique | Element magnetique a ecriture assistee thermiquement |
| EP2124228B1 (en) | 2008-05-20 | 2014-03-05 | Crocus Technology | Magnetic random access memory with an elliptical junction |
| US8031519B2 (en) | 2008-06-18 | 2011-10-04 | Crocus Technology S.A. | Shared line magnetic random access memory cells |
| US8089132B2 (en) * | 2008-10-09 | 2012-01-03 | Seagate Technology Llc | Magnetic memory with phonon glass electron crystal material |
| US8604457B2 (en) | 2008-11-12 | 2013-12-10 | Higgs Opl. Capital Llc | Phase-change memory element |
| US8102703B2 (en) * | 2009-07-14 | 2012-01-24 | Crocus Technology | Magnetic element with a fast spin transfer torque writing procedure |
| EP2325846B1 (en) * | 2009-11-12 | 2015-10-28 | Crocus Technology S.A. | A magnetic tunnel junction memory with thermally assisted writing |
| EP2405439B1 (en) * | 2010-07-07 | 2013-01-23 | Crocus Technology S.A. | Magnetic device with optimized heat confinement |
| JP2012066476A (ja) * | 2010-09-24 | 2012-04-05 | Toshiba Hokuto Electronics Corp | サーマルヘッド |
| JP2012084765A (ja) * | 2010-10-14 | 2012-04-26 | Sony Corp | 不揮発性メモリ素子及びその製造方法 |
| EP2447948B1 (en) * | 2010-10-26 | 2014-12-31 | Crocus Technology S.A. | Thermally assisted magnetic random access memory element with improved endurance |
| US11004489B2 (en) * | 2019-06-19 | 2021-05-11 | Western Digital Technologies, Inc. | Perpendicular spin transfer torque MRAM memory cell with in-stack thermal barriers |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1365117A (zh) * | 2001-01-11 | 2002-08-21 | 惠普公司 | 磁随机存取存储装置的热辅助切换 |
| CN1402254A (zh) * | 2001-08-02 | 2003-03-12 | 三菱电机株式会社 | 具有含磁隧道结的存储器单元的薄膜磁存储装置 |
Family Cites Families (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5933365A (en) * | 1997-06-19 | 1999-08-03 | Energy Conversion Devices, Inc. | Memory element with energy control mechanism |
| JP3148703B2 (ja) * | 1997-12-05 | 2001-03-26 | 株式会社日立製作所 | 磁気抵抗効果型ヘッドおよび磁気記録再生装置 |
| US6072718A (en) * | 1998-02-10 | 2000-06-06 | International Business Machines Corporation | Magnetic memory devices having multiple magnetic tunnel junctions therein |
| US6535416B1 (en) * | 1999-06-18 | 2003-03-18 | Nve Corporation | Magnetic memory coincident thermal pulse data storage |
| US6519179B2 (en) * | 1999-12-10 | 2003-02-11 | Sharp Kabushiki Kaisha | Magnetic tunnel junction device, magnetic memory adopting the same, magnetic memory cell and access method of the same |
| US6385082B1 (en) * | 2000-11-08 | 2002-05-07 | International Business Machines Corp. | Thermally-assisted magnetic random access memory (MRAM) |
| JP4666774B2 (ja) * | 2001-01-11 | 2011-04-06 | キヤノン株式会社 | 磁気薄膜メモリ素子、磁気薄膜メモリおよび情報記録再生方法 |
| US6744086B2 (en) * | 2001-05-15 | 2004-06-01 | Nve Corporation | Current switched magnetoresistive memory cell |
| JP4798895B2 (ja) * | 2001-08-21 | 2011-10-19 | キヤノン株式会社 | 強磁性体メモリとその熱補助駆動方法 |
| FR2829867B1 (fr) | 2001-09-20 | 2003-12-19 | Centre Nat Rech Scient | Memoire magnetique a selection a l'ecriture par inhibition et procede pour son ecriture |
| FR2832542B1 (fr) | 2001-11-16 | 2005-05-06 | Commissariat Energie Atomique | Dispositif magnetique a jonction tunnel magnetique, memoire et procedes d'ecriture et de lecture utilisant ce dispositif |
| JP3871572B2 (ja) * | 2002-01-16 | 2007-01-24 | 株式会社東芝 | 磁気記憶装置 |
| SG115462A1 (en) * | 2002-03-12 | 2005-10-28 | Inst Data Storage | Multi-stage per cell magnetoresistive random access memory |
| JP2003282837A (ja) * | 2002-03-27 | 2003-10-03 | Sony Corp | 磁気メモリ装置およびその製造方法 |
| US6704220B2 (en) * | 2002-05-03 | 2004-03-09 | Infineon Technologies Ag | Layout for thermally selected cross-point MRAM cell |
| US6667897B1 (en) * | 2002-06-28 | 2003-12-23 | International Business Machines Corporation | Magnetic tunnel junction containing a ferrimagnetic layer and anti-parallel layer |
| US6980468B1 (en) * | 2002-10-28 | 2005-12-27 | Silicon Magnetic Systems | High density MRAM using thermal writing |
| US6771534B2 (en) * | 2002-11-15 | 2004-08-03 | International Business Machines Corporation | Thermally-assisted magnetic writing using an oxide layer and current-induced heating |
| US6909633B2 (en) * | 2002-12-09 | 2005-06-21 | Applied Spintronics Technology, Inc. | MRAM architecture with a flux closed data storage layer |
| EP1639656B1 (en) * | 2003-06-23 | 2019-06-12 | NVE Corporation | Thermally operated ferromagnetic memory cell |
| US7522446B2 (en) * | 2003-10-31 | 2009-04-21 | Samsung Electronics Co., Ltd. | Heating MRAM cells to ease state switching |
-
2003
- 2003-10-10 FR FR0311897A patent/FR2860910B1/fr not_active Expired - Fee Related
-
2004
- 2004-10-06 JP JP2006530418A patent/JP5035829B2/ja not_active Expired - Fee Related
- 2004-10-06 CA CA2540608A patent/CA2540608C/en not_active Expired - Fee Related
- 2004-10-06 KR KR1020067006941A patent/KR101169241B1/ko not_active Expired - Fee Related
- 2004-10-06 EP EP04791472.6A patent/EP1671330B1/fr not_active Expired - Lifetime
- 2004-10-06 CN CN2004800293670A patent/CN1864229B/zh not_active Expired - Fee Related
- 2004-10-06 WO PCT/FR2004/002517 patent/WO2005036559A1/fr not_active Ceased
-
2007
- 2007-07-19 US US11/780,402 patent/US7480175B2/en not_active Expired - Lifetime
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1365117A (zh) * | 2001-01-11 | 2002-08-21 | 惠普公司 | 磁随机存取存储装置的热辅助切换 |
| CN1402254A (zh) * | 2001-08-02 | 2003-03-12 | 三菱电机株式会社 | 具有含磁隧道结的存储器单元的薄膜磁存储装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP1671330B1 (fr) | 2015-03-18 |
| CN1864229A (zh) | 2006-11-15 |
| FR2860910A1 (fr) | 2005-04-15 |
| JP5035829B2 (ja) | 2012-09-26 |
| CA2540608A1 (en) | 2005-04-21 |
| KR101169241B1 (ko) | 2012-08-06 |
| FR2860910B1 (fr) | 2006-02-10 |
| US7480175B2 (en) | 2009-01-20 |
| US20070263434A1 (en) | 2007-11-15 |
| WO2005036559A1 (fr) | 2005-04-21 |
| EP1671330A1 (fr) | 2006-06-21 |
| KR20060131740A (ko) | 2006-12-20 |
| CA2540608C (en) | 2013-12-17 |
| JP2007509489A (ja) | 2007-04-12 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| ASS | Succession or assignment of patent right |
Owner name: CENTRO NACIONAL DE INVESTIGACIONES CIENTIFICAS |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20110517 Address after: Paris France Applicant after: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES Co-applicant after: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE Address before: Paris France Applicant before: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20120125 |
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| CF01 | Termination of patent right due to non-payment of annual fee |