CN1713363A - 柔性触点连接器件 - Google Patents
柔性触点连接器件 Download PDFInfo
- Publication number
- CN1713363A CN1713363A CNA2005100779083A CN200510077908A CN1713363A CN 1713363 A CN1713363 A CN 1713363A CN A2005100779083 A CNA2005100779083 A CN A2005100779083A CN 200510077908 A CN200510077908 A CN 200510077908A CN 1713363 A CN1713363 A CN 1713363A
- Authority
- CN
- China
- Prior art keywords
- contact
- area
- carrier
- zone
- interface unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004020 conductor Substances 0.000 claims abstract description 63
- 239000000463 material Substances 0.000 claims description 12
- 239000013536 elastomeric material Substances 0.000 claims description 11
- 229920001296 polysiloxane Polymers 0.000 claims description 4
- 230000001186 cumulative effect Effects 0.000 claims 1
- 230000000630 rising effect Effects 0.000 claims 1
- 230000013011 mating Effects 0.000 abstract 2
- 230000006835 compression Effects 0.000 description 9
- 238000007906 compression Methods 0.000 description 9
- 238000000034 method Methods 0.000 description 8
- 238000012360 testing method Methods 0.000 description 8
- 230000006870 function Effects 0.000 description 5
- 230000002349 favourable effect Effects 0.000 description 3
- 230000012010 growth Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000010998 test method Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000013013 elastic material Substances 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 230000003319 supportive effect Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/40—Forming printed elements for providing electric connections to or between printed circuits
- H05K3/4007—Surface contacts, e.g. bumps
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/01—Dielectrics
- H05K2201/0104—Properties and characteristics in general
- H05K2201/0133—Elastomeric or compliant polymer
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/03—Conductive materials
- H05K2201/0332—Structure of the conductor
- H05K2201/0364—Conductor shape
- H05K2201/0367—Metallic bump or raised conductor not used as solder bump
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/325—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by abutting or pinching, i.e. without alloying process; mechanical auxiliary parts therefor
- H05K3/326—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by abutting or pinching, i.e. without alloying process; mechanical auxiliary parts therefor the printed circuit having integral resilient or deformable parts, e.g. tabs or parts of flexible circuits
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
Description
Claims (10)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102004030140A DE102004030140B3 (de) | 2004-06-22 | 2004-06-22 | Flexible Kontaktierungsvorrichtung |
DE102004030140.9 | 2004-06-22 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1713363A true CN1713363A (zh) | 2005-12-28 |
CN100461355C CN100461355C (zh) | 2009-02-11 |
Family
ID=35481190
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2005100779083A Expired - Fee Related CN100461355C (zh) | 2004-06-22 | 2005-06-13 | 柔性触点连接器件 |
Country Status (3)
Country | Link |
---|---|
US (1) | US7080988B2 (zh) |
CN (1) | CN100461355C (zh) |
DE (1) | DE102004030140B3 (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107180806A (zh) * | 2016-03-09 | 2017-09-19 | 赛米控电子股份有限公司 | 具有壳体的功率半导体模块 |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10016132A1 (de) * | 2000-03-31 | 2001-10-18 | Infineon Technologies Ag | Elektronisches Bauelement mit flexiblen Kontaktierungsstellen und Verfahren zu dessen Herstellung |
DE102006055576A1 (de) * | 2006-11-21 | 2008-05-29 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Verfahren zum Herstellen eines dehnbaren Schaltungsträgers und dehnbarer Schaltungsträger |
JP2008281519A (ja) * | 2007-05-14 | 2008-11-20 | Alps Electric Co Ltd | プローブカードおよびその製造方法 |
JP4294078B1 (ja) * | 2008-06-30 | 2009-07-08 | 株式会社フジクラ | 両面接続型コネクタ |
DE102011083423A1 (de) * | 2011-09-26 | 2013-03-28 | Siemens Aktiengesellschaft | Kontaktfederanordnung und Verfahren zur Herstellung derselben |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5738530A (en) * | 1996-05-28 | 1998-04-14 | Packard Hughes Interconnect Company | Contact pad having metallically anchored elastomeric electrical contacts |
TW571373B (en) * | 1996-12-04 | 2004-01-11 | Seiko Epson Corp | Semiconductor device, circuit substrate, and electronic machine |
JP3335575B2 (ja) * | 1997-06-06 | 2002-10-21 | 松下電器産業株式会社 | 半導体装置およびその製造方法 |
US6396145B1 (en) * | 1998-06-12 | 2002-05-28 | Hitachi, Ltd. | Semiconductor device and method for manufacturing the same technical field |
JP3502776B2 (ja) * | 1998-11-26 | 2004-03-02 | 新光電気工業株式会社 | バンプ付き金属箔及び回路基板及びこれを用いた半導体装置 |
KR20020011440A (ko) * | 1999-06-17 | 2002-02-08 | 마이클 골위저, 호레스트 쉐퍼 | 가요성 접점을 구비한 전자 소자 및 그 전자 소자의 제조방법 |
DE10016132A1 (de) * | 2000-03-31 | 2001-10-18 | Infineon Technologies Ag | Elektronisches Bauelement mit flexiblen Kontaktierungsstellen und Verfahren zu dessen Herstellung |
JP3978174B2 (ja) * | 2003-03-07 | 2007-09-19 | 北川工業株式会社 | コンタクト |
US6948940B2 (en) * | 2003-04-10 | 2005-09-27 | Formfactor, Inc. | Helical microelectronic contact and method for fabricating same |
-
2004
- 2004-06-22 DE DE102004030140A patent/DE102004030140B3/de not_active Expired - Fee Related
-
2005
- 2005-05-25 US US11/137,061 patent/US7080988B2/en not_active Expired - Fee Related
- 2005-06-13 CN CNB2005100779083A patent/CN100461355C/zh not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107180806A (zh) * | 2016-03-09 | 2017-09-19 | 赛米控电子股份有限公司 | 具有壳体的功率半导体模块 |
CN107180806B (zh) * | 2016-03-09 | 2021-02-05 | 赛米控电子股份有限公司 | 具有壳体的功率半导体模块 |
Also Published As
Publication number | Publication date |
---|---|
US7080988B2 (en) | 2006-07-25 |
CN100461355C (zh) | 2009-02-11 |
DE102004030140B3 (de) | 2006-01-19 |
US20050282410A1 (en) | 2005-12-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C41 | Transfer of patent application or patent right or utility model | ||
C56 | Change in the name or address of the patentee |
Owner name: INFINEON TECHNOLOGIES AG Free format text: FORMER NAME: INFINRONG SCIENCE AND TECHNOLOGY CO., LTD. |
|
CP01 | Change in the name or title of a patent holder |
Address after: Munich, Germany Patentee after: Infineon Technologies AG Address before: Munich, Germany Patentee before: INFINEON TECHNOLOGIES AG |
|
TR01 | Transfer of patent right |
Effective date of registration: 20120917 Address after: Munich, Germany Patentee after: QIMONDA AG Address before: Munich, Germany Patentee before: Infineon Technologies AG |
|
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20160104 Address after: German Berg, Laura Ibiza Patentee after: Infineon Technologies AG Address before: Munich, Germany Patentee before: QIMONDA AG |
|
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20090211 Termination date: 20160613 |