CN1630911A - 多级闪存的部分页编程 - Google Patents
多级闪存的部分页编程 Download PDFInfo
- Publication number
- CN1630911A CN1630911A CNA038036126A CN03803612A CN1630911A CN 1630911 A CN1630911 A CN 1630911A CN A038036126 A CNA038036126 A CN A038036126A CN 03803612 A CN03803612 A CN 03803612A CN 1630911 A CN1630911 A CN 1630911A
- Authority
- CN
- China
- Prior art keywords
- flash memory
- unit
- information
- level
- partial page
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
- G11C11/5621—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
- G11C11/5628—Programming or writing circuits; Data input circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Read Only Memory (AREA)
Abstract
Description
新数据 | 以前储存的数据 | 结合以被编程 |
0011 | 0101 | 0001 |
Claims (5)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/074,495 | 2002-02-11 | ||
US10/074,495 US6836432B1 (en) | 2002-02-11 | 2002-02-11 | Partial page programming of multi level flash |
PCT/US2003/003330 WO2003069627A1 (en) | 2002-02-11 | 2003-02-05 | Partial page programming of multi level flash semiconductor memory |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1630911A true CN1630911A (zh) | 2005-06-22 |
CN1630911B CN1630911B (zh) | 2012-05-23 |
Family
ID=27732372
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN038036126A Expired - Fee Related CN1630911B (zh) | 2002-02-11 | 2003-02-05 | 用于多级闪存存储单元的部分页编程的半导体装置 |
Country Status (9)
Country | Link |
---|---|
US (1) | US6836432B1 (zh) |
JP (1) | JP2005518061A (zh) |
KR (1) | KR100936086B1 (zh) |
CN (1) | CN1630911B (zh) |
AU (1) | AU2003219707A1 (zh) |
DE (1) | DE10392271T5 (zh) |
GB (1) | GB2401460B (zh) |
TW (1) | TWI262505B (zh) |
WO (1) | WO2003069627A1 (zh) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101202106B (zh) * | 2006-09-22 | 2012-12-19 | 三星电子株式会社 | 非易失性存储系统及其相应的编程方法 |
CN101202109B (zh) * | 2006-10-19 | 2012-12-26 | 三星电子株式会社 | 非易失性存储系统和相关编程方法 |
CN110908924A (zh) * | 2018-09-17 | 2020-03-24 | 北京兆易创新科技股份有限公司 | 一种写入检测方法、装置、终端及存储介质 |
Families Citing this family (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE60134870D1 (de) * | 2001-12-28 | 2008-08-28 | St Microelectronics Srl | Programmierverfahren für eine Multibitspeicherzelle |
US20050219224A1 (en) * | 2004-03-31 | 2005-10-06 | Frank Liebenow | Electronic ink digitizer |
US7490283B2 (en) | 2004-05-13 | 2009-02-10 | Sandisk Corporation | Pipelined data relocation and improved chip architectures |
KR100590219B1 (ko) | 2004-12-01 | 2006-06-19 | 삼성전자주식회사 | 프로그램 시간을 줄일 수 있는 불 휘발성 메모리 장치 |
US7120051B2 (en) | 2004-12-14 | 2006-10-10 | Sandisk Corporation | Pipelined programming of non-volatile memories using early data |
US7849381B2 (en) | 2004-12-21 | 2010-12-07 | Sandisk Corporation | Method for copying data in reprogrammable non-volatile memory |
US7409473B2 (en) | 2004-12-21 | 2008-08-05 | Sandisk Corporation | Off-chip data relocation |
US7212440B2 (en) | 2004-12-30 | 2007-05-01 | Sandisk Corporation | On-chip data grouping and alignment |
US7526715B2 (en) * | 2005-10-17 | 2009-04-28 | Ramot At Tel Aviv University Ltd. | Probabilistic error correction in multi-bit-per-cell flash memory |
US7509471B2 (en) | 2005-10-27 | 2009-03-24 | Sandisk Corporation | Methods for adaptively handling data writes in non-volatile memories |
US7631162B2 (en) | 2005-10-27 | 2009-12-08 | Sandisck Corporation | Non-volatile memory with adaptive handling of data writes |
US7586784B2 (en) * | 2006-06-09 | 2009-09-08 | Micron Technology, Inc. | Apparatus and methods for programming multilevel-cell NAND memory devices |
US7877564B2 (en) * | 2006-08-05 | 2011-01-25 | Benhov Gmbh, Llc | Memory configuration and method for calibrating read/write data based on performance characteristics of the memory configuration |
US7426139B2 (en) * | 2006-11-02 | 2008-09-16 | Macronix International Co., Ltd. | Dynamic program and read adjustment for multi-level cell memory array |
KR100877610B1 (ko) | 2007-01-23 | 2009-01-09 | 삼성전자주식회사 | 페이지 데이터 저장 방법과 저장 장치 |
US8296498B2 (en) * | 2007-11-13 | 2012-10-23 | Sandisk Technologies Inc. | Method and system for virtual fast access non-volatile RAM |
US9690513B2 (en) * | 2009-08-27 | 2017-06-27 | International Business Machines Corporation | Dispersed storage processing unit and methods with operating system diversity for use in a dispersed storage system |
KR101625641B1 (ko) | 2010-04-08 | 2016-05-30 | 삼성전자주식회사 | 비휘발성 메모리 장치, 이의 동작 방법 및 이를 포함하는 장치들 |
KR101438072B1 (ko) | 2010-04-15 | 2014-09-03 | 라모트 앳 텔-아비브 유니버시티 리미티드 | 소거 없는 플래시 메모리의 다중 프로그래밍 |
US10445226B2 (en) * | 2010-08-10 | 2019-10-15 | Rambus Inc. | Verify before program resume for memory devices |
KR101293224B1 (ko) * | 2011-04-01 | 2013-08-05 | (주)아토솔루션 | 데이터 기록 방법. 메모리, 및 메모리 기록 시스템 |
US9436594B2 (en) * | 2011-05-27 | 2016-09-06 | Seagate Technology Llc | Write operation with immediate local destruction of old content in non-volatile memory |
JP5971547B2 (ja) * | 2012-02-15 | 2016-08-17 | 国立大学法人 東京大学 | メモリコントローラ,データ記憶装置およびメモリの制御方法 |
KR102020818B1 (ko) * | 2012-07-02 | 2019-09-16 | 삼성전자주식회사 | 3차원 불휘발성 메모리 및 3차원 불휘발성 메모리를 포함하는 메모리 시스템 및의 프로그램 방법 |
JP5995071B2 (ja) * | 2012-09-19 | 2016-09-21 | 学校法人 中央大学 | メモリコントローラ,データ記憶装置およびメモリの制御方法 |
JP5940705B1 (ja) * | 2015-03-27 | 2016-06-29 | ウィンボンド エレクトロニクス コーポレーション | 半導体記憶装置 |
US9858994B2 (en) * | 2015-06-18 | 2018-01-02 | Samsung Electronics Co., Ltd. | Memory system with MLC memory cells and partial page compression or reduction |
KR102144124B1 (ko) * | 2019-04-22 | 2020-08-13 | 고려대학교 산학협력단 | 하이브리드 메인 메모리 시스템의 비휘발성 메모리의 데이터 관리 방법 및 장치 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR0135247B1 (ko) * | 1994-07-06 | 1998-04-22 | 김주용 | 플래쉬 메모리 셀 및 그 제조 방법 |
US5815434A (en) * | 1995-09-29 | 1998-09-29 | Intel Corporation | Multiple writes per a single erase for a nonvolatile memory |
US5724284A (en) * | 1996-06-24 | 1998-03-03 | Advanced Micro Devices, Inc. | Multiple bits-per-cell flash shift register page buffer |
JP3114630B2 (ja) | 1996-10-03 | 2000-12-04 | 日本電気株式会社 | 不揮発性半導体メモリおよび書込み読出し方法 |
US5903497A (en) | 1997-12-22 | 1999-05-11 | Programmable Microelectronics Corporation | Integrated program verify page buffer |
KR100332950B1 (ko) * | 1998-04-10 | 2002-08-21 | 삼성전자 주식회사 | 단일비트동작모드와다중비트동작모드를갖는불휘발성반도체메모리장치및그것의기입/독출방법 |
JP3942342B2 (ja) * | 2000-06-30 | 2007-07-11 | 富士通株式会社 | 多値データを記録する不揮発性メモリ |
US6671204B2 (en) * | 2001-07-23 | 2003-12-30 | Samsung Electronics Co., Ltd. | Nonvolatile memory device with page buffer having dual registers and methods of using the same |
US6563745B1 (en) * | 2001-12-14 | 2003-05-13 | Matrix Semiconductor, Inc. | Memory device and method for dynamic bit inversion |
-
2002
- 2002-02-11 US US10/074,495 patent/US6836432B1/en not_active Expired - Lifetime
-
2003
- 2003-02-05 CN CN038036126A patent/CN1630911B/zh not_active Expired - Fee Related
- 2003-02-05 JP JP2003568662A patent/JP2005518061A/ja active Pending
- 2003-02-05 DE DE10392271T patent/DE10392271T5/de not_active Ceased
- 2003-02-05 KR KR1020047012003A patent/KR100936086B1/ko not_active IP Right Cessation
- 2003-02-05 GB GB0417907A patent/GB2401460B/en not_active Expired - Fee Related
- 2003-02-05 AU AU2003219707A patent/AU2003219707A1/en not_active Abandoned
- 2003-02-05 WO PCT/US2003/003330 patent/WO2003069627A1/en active Application Filing
- 2003-02-11 TW TW092102719A patent/TWI262505B/zh not_active IP Right Cessation
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101202106B (zh) * | 2006-09-22 | 2012-12-19 | 三星电子株式会社 | 非易失性存储系统及其相应的编程方法 |
CN101202109B (zh) * | 2006-10-19 | 2012-12-26 | 三星电子株式会社 | 非易失性存储系统和相关编程方法 |
CN110908924A (zh) * | 2018-09-17 | 2020-03-24 | 北京兆易创新科技股份有限公司 | 一种写入检测方法、装置、终端及存储介质 |
Also Published As
Publication number | Publication date |
---|---|
CN1630911B (zh) | 2012-05-23 |
GB0417907D0 (en) | 2004-09-15 |
KR100936086B1 (ko) | 2010-01-12 |
GB2401460B (en) | 2005-08-10 |
TWI262505B (en) | 2006-09-21 |
TW200303023A (en) | 2003-08-16 |
US6836432B1 (en) | 2004-12-28 |
KR20040085174A (ko) | 2004-10-07 |
AU2003219707A1 (en) | 2003-09-04 |
JP2005518061A (ja) | 2005-06-16 |
WO2003069627A1 (en) | 2003-08-21 |
GB2401460A (en) | 2004-11-10 |
DE10392271T5 (de) | 2005-04-07 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
ASS | Succession or assignment of patent right |
Owner name: SPANSION CO.,LTD. Free format text: FORMER OWNER: ADVANCED MICRO DEVICES INC. Effective date: 20070413 Owner name: SPANSION CO., LTD. Free format text: FORMER OWNER: SPANSION CO.,LTD. Effective date: 20070413 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20070413 Address after: California, USA Applicant after: SPANSION LLC Address before: California, USA Applicant before: Spanson Co. Effective date of registration: 20070413 Address after: California, USA Applicant after: Spanson Co. Address before: California, USA Applicant before: ADVANCED MICRO DEVICES, Inc. |
|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20160412 Address after: California, USA Patentee after: CYPRESS SEMICONDUCTOR Corp. Address before: California, USA Patentee before: SPANSION LLC |
|
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20120523 Termination date: 20190205 |