CN1472794A - 在半导体器件中形成铜引线的方法 - Google Patents
在半导体器件中形成铜引线的方法 Download PDFInfo
- Publication number
- CN1472794A CN1472794A CNA031475094A CN03147509A CN1472794A CN 1472794 A CN1472794 A CN 1472794A CN A031475094 A CNA031475094 A CN A031475094A CN 03147509 A CN03147509 A CN 03147509A CN 1472794 A CN1472794 A CN 1472794A
- Authority
- CN
- China
- Prior art keywords
- copper
- layer
- wafer
- copper layer
- mosaic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000010949 copper Substances 0.000 title claims abstract description 204
- 229910052802 copper Inorganic materials 0.000 title claims abstract description 204
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 title claims abstract description 134
- 238000000034 method Methods 0.000 title claims abstract description 79
- 239000004065 semiconductor Substances 0.000 title claims abstract description 24
- 239000010410 layer Substances 0.000 claims abstract description 109
- 229910052751 metal Inorganic materials 0.000 claims abstract description 35
- 239000002184 metal Substances 0.000 claims abstract description 35
- 230000004888 barrier function Effects 0.000 claims abstract description 32
- 238000009713 electroplating Methods 0.000 claims abstract description 32
- 239000011229 interlayer Substances 0.000 claims abstract description 24
- 238000007747 plating Methods 0.000 claims abstract description 24
- 239000000126 substance Substances 0.000 claims abstract description 12
- 150000001879 copper Chemical class 0.000 claims description 70
- 230000008569 process Effects 0.000 claims description 23
- 238000005282 brightening Methods 0.000 claims description 22
- 238000005516 engineering process Methods 0.000 claims description 19
- 238000005240 physical vapour deposition Methods 0.000 claims description 18
- 239000003054 catalyst Substances 0.000 claims description 13
- 239000003112 inhibitor Substances 0.000 claims description 13
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 12
- 238000003701 mechanical milling Methods 0.000 claims description 12
- 230000015572 biosynthetic process Effects 0.000 claims description 9
- 239000003795 chemical substances by application Substances 0.000 claims description 7
- 239000000758 substrate Substances 0.000 claims description 7
- 238000002488 metal-organic chemical vapour deposition Methods 0.000 claims description 4
- 230000003628 erosive effect Effects 0.000 abstract description 5
- 238000007517 polishing process Methods 0.000 abstract 3
- 238000005229 chemical vapour deposition Methods 0.000 description 10
- 239000000654 additive Substances 0.000 description 5
- 230000000996 additive effect Effects 0.000 description 5
- 230000008901 benefit Effects 0.000 description 5
- 239000006259 organic additive Substances 0.000 description 5
- 238000005498 polishing Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 3
- 238000007772 electroless plating Methods 0.000 description 2
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 2
- 239000004411 aluminium Substances 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000007850 degeneration Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000008676 import Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000013508 migration Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/12—Semiconductors
- C25D7/123—Semiconductors first coated with a seed layer or a conductive layer
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/18—Electroplating using modulated, pulsed or reversing current
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/288—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition
- H01L21/2885—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition using an external electrical current, i.e. electro-deposition
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
- H01L21/321—After treatment
- H01L21/32115—Planarisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/7684—Smoothing; Planarisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76877—Filling of holes, grooves or trenches, e.g. vias, with conductive material
Abstract
Description
Claims (14)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR40462/02 | 2002-07-11 | ||
KR40462/2002 | 2002-07-11 | ||
KR1020020040462A KR100559041B1 (ko) | 2002-07-11 | 2002-07-11 | 반도체 소자의 구리 배선 형성 방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1472794A true CN1472794A (zh) | 2004-02-04 |
CN100353519C CN100353519C (zh) | 2007-12-05 |
Family
ID=30113139
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB031475094A Expired - Fee Related CN100353519C (zh) | 2002-07-11 | 2003-07-09 | 在半导体器件中形成铜引线的方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US7098133B2 (zh) |
KR (1) | KR100559041B1 (zh) |
CN (1) | CN100353519C (zh) |
TW (1) | TWI283032B (zh) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101425505B (zh) * | 2008-12-02 | 2011-10-26 | 中国科学院微电子研究所 | 用于测量铜引线是否产生凹型坑的电路版图结构 |
CN102034737B (zh) * | 2009-09-27 | 2013-01-23 | 中芯国际集成电路制造(上海)有限公司 | 金属互连层的制作方法 |
CN111312595A (zh) * | 2020-03-03 | 2020-06-19 | 合肥晶合集成电路有限公司 | 金属互连层的制作方法 |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100866110B1 (ko) * | 2002-06-10 | 2008-10-31 | 매그나칩 반도체 유한회사 | 반도체 소자의 구리배선 형성방법 |
IL161771A0 (en) * | 2004-05-04 | 2005-11-20 | J G Systems Inc | Method and composition to minimize dishing in semiconductor wafer processing |
JP2007194540A (ja) * | 2006-01-23 | 2007-08-02 | Toshiba Corp | 半導体装置の製造方法及び研磨装置 |
US8264072B2 (en) * | 2007-10-22 | 2012-09-11 | Infineon Technologies Ag | Electronic device |
KR101762657B1 (ko) * | 2011-01-31 | 2017-07-31 | 삼성전자주식회사 | 도전 패턴 구조물 및 이의 형성 방법 |
US8728934B2 (en) | 2011-06-24 | 2014-05-20 | Tessera, Inc. | Systems and methods for producing flat surfaces in interconnect structures |
US9328427B2 (en) * | 2012-09-28 | 2016-05-03 | Sunpower Corporation | Edgeless pulse plating and metal cleaning methods for solar cells |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5256565A (en) * | 1989-05-08 | 1993-10-26 | The United States Of America As Represented By The United States Department Of Energy | Electrochemical planarization |
JP3191759B2 (ja) * | 1998-02-20 | 2001-07-23 | 日本電気株式会社 | 半導体装置の製造方法 |
JP3836252B2 (ja) * | 1998-04-30 | 2006-10-25 | 株式会社荏原製作所 | 基板のめっき方法 |
US6176992B1 (en) * | 1998-11-03 | 2001-01-23 | Nutool, Inc. | Method and apparatus for electro-chemical mechanical deposition |
JP2000323568A (ja) * | 1999-05-11 | 2000-11-24 | Hitachi Ltd | 半導体装置およびその製造方法 |
US6319834B1 (en) | 1999-08-18 | 2001-11-20 | Advanced Micro Devices, Inc. | Method and apparatus for improved planarity metallization by electroplating and CMP |
US6653226B1 (en) * | 2001-01-09 | 2003-11-25 | Novellus Systems, Inc. | Method for electrochemical planarization of metal surfaces |
TW444340B (en) * | 2000-02-14 | 2001-07-01 | Vanguard Int Semiconduct Corp | Method for forming self-aligned copper wire by using electroplating technique |
KR20020051155A (ko) * | 2000-12-22 | 2002-06-28 | 윤종용 | 전기 도금법을 이용한 반도체 장치의 구리 배선 제조 방법 |
US6402592B1 (en) * | 2001-01-17 | 2002-06-11 | Steag Cutek Systems, Inc. | Electrochemical methods for polishing copper films on semiconductor substrates |
US6696358B2 (en) * | 2001-01-23 | 2004-02-24 | Honeywell International Inc. | Viscous protective overlayers for planarization of integrated circuits |
US20020115283A1 (en) * | 2001-02-20 | 2002-08-22 | Chartered Semiconductor Manufacturing Ltd. | Planarization by selective electro-dissolution |
US6537913B2 (en) * | 2001-06-29 | 2003-03-25 | Intel Corporation | Method of making a semiconductor device with aluminum capped copper interconnect pads |
US20040253809A1 (en) * | 2001-08-18 | 2004-12-16 | Yao Xiang Yu | Forming a semiconductor structure using a combination of planarizing methods and electropolishing |
TW544795B (en) * | 2002-02-25 | 2003-08-01 | Nat Science Council | Method for monitoring end point of electrolyzing polishing process |
US6518185B1 (en) * | 2002-04-22 | 2003-02-11 | Advanced Micro Devices, Inc. | Integration scheme for non-feature-size dependent cu-alloy introduction |
US6706166B2 (en) * | 2002-05-06 | 2004-03-16 | Taiwan Semiconductor Manufacturing Co. Ltd. | Method for improving an electrodeposition process through use of a multi-electrode assembly |
US6649513B1 (en) * | 2002-05-15 | 2003-11-18 | Taiwan Semiconductor Manufacturing Company | Copper back-end-of-line by electropolish |
US6774039B1 (en) * | 2002-08-08 | 2004-08-10 | Novellus Systems, Inc. | Process scheme for improving electroplating performance in integrated circuit manufacture |
US6739953B1 (en) * | 2003-04-09 | 2004-05-25 | Lsi Logic Corporation | Mechanical stress free processing method |
-
2002
- 2002-07-11 KR KR1020020040462A patent/KR100559041B1/ko active IP Right Grant
-
2003
- 2003-06-26 TW TW092117436A patent/TWI283032B/zh not_active IP Right Cessation
- 2003-07-09 CN CNB031475094A patent/CN100353519C/zh not_active Expired - Fee Related
- 2003-07-10 US US10/616,722 patent/US7098133B2/en not_active Expired - Lifetime
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101425505B (zh) * | 2008-12-02 | 2011-10-26 | 中国科学院微电子研究所 | 用于测量铜引线是否产生凹型坑的电路版图结构 |
CN102034737B (zh) * | 2009-09-27 | 2013-01-23 | 中芯国际集成电路制造(上海)有限公司 | 金属互连层的制作方法 |
CN111312595A (zh) * | 2020-03-03 | 2020-06-19 | 合肥晶合集成电路有限公司 | 金属互连层的制作方法 |
Also Published As
Publication number | Publication date |
---|---|
US20040009659A1 (en) | 2004-01-15 |
TW200402111A (en) | 2004-02-01 |
US7098133B2 (en) | 2006-08-29 |
KR20040007863A (ko) | 2004-01-28 |
KR100559041B1 (ko) | 2006-03-10 |
CN100353519C (zh) | 2007-12-05 |
TWI283032B (en) | 2007-06-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
ASS | Succession or assignment of patent right |
Owner name: MAGNACHIP CO., LTD. Free format text: FORMER OWNER: HYNIX SEMICONDUCTOR INC. Effective date: 20070525 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20070525 Address after: North Chungcheong Province Applicant after: Magnachip Semiconductor, Ltd. Address before: Gyeonggi Do, South Korea Applicant before: HYNIX SEMICONDUCTOR Inc. |
|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
TR01 | Transfer of patent right |
Effective date of registration: 20201021 Address after: Han Guozhongqingbeidao Patentee after: Key Foundry Co.,Ltd. Address before: Han Guozhongqingbeidao Patentee before: MagnaChip Semiconductor, Ltd. |
|
TR01 | Transfer of patent right | ||
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20071205 Termination date: 20210709 |