CN119173752A - 印刷线路板用基板的可靠性试验方法 - Google Patents
印刷线路板用基板的可靠性试验方法 Download PDFInfo
- Publication number
- CN119173752A CN119173752A CN202480002352.2A CN202480002352A CN119173752A CN 119173752 A CN119173752 A CN 119173752A CN 202480002352 A CN202480002352 A CN 202480002352A CN 119173752 A CN119173752 A CN 119173752A
- Authority
- CN
- China
- Prior art keywords
- printed wiring
- wiring board
- substrate
- test
- load
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/08—Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N19/00—Investigating materials by mechanical methods
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/40—Investigating hardness or rebound hardness
- G01N3/42—Investigating hardness or rebound hardness by performing impressions under a steady load by indentors, e.g. sphere, pyramid
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/0058—Kind of property studied
- G01N2203/006—Crack, flaws, fracture or rupture
- G01N2203/0062—Crack or flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/0058—Kind of property studied
- G01N2203/0076—Hardness, compressibility or resistance to crushing
- G01N2203/0078—Hardness, compressibility or resistance to crushing using indentation
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/16—Inspection; Monitoring; Aligning
- H05K2203/162—Testing a finished product, e.g. heat cycle testing of solder joints
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
- Measuring Or Testing Involving Enzymes Or Micro-Organisms (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2023-068328 | 2023-04-19 | ||
| JP2023068328 | 2023-04-19 | ||
| PCT/JP2024/014015 WO2024219249A1 (ja) | 2023-04-19 | 2024-04-05 | プリント配線板用基板の信頼性試験方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN119173752A true CN119173752A (zh) | 2024-12-20 |
Family
ID=93152877
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202480002352.2A Pending CN119173752A (zh) | 2023-04-19 | 2024-04-05 | 印刷线路板用基板的可靠性试验方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US20250283793A1 (https=) |
| EP (1) | EP4700359A1 (https=) |
| JP (1) | JPWO2024219249A1 (https=) |
| KR (1) | KR20250174619A (https=) |
| CN (1) | CN119173752A (https=) |
| TW (1) | TW202446174A (https=) |
| WO (1) | WO2024219249A1 (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN119437897A (zh) * | 2025-01-07 | 2025-02-14 | 高邮鑫润龙印刷科技有限公司 | 一种印刷材料检测机构及具有该检测机构的印刷机 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07325029A (ja) * | 1994-05-31 | 1995-12-12 | Nec Corp | 薄膜物性評価装置 |
| JPH07260658A (ja) * | 1994-12-13 | 1995-10-13 | Shimadzu Corp | 薄膜の剥離荷重測定方法 |
| US6339958B1 (en) * | 1998-12-10 | 2002-01-22 | Advanced Micro Devices, Inc. | Adhesion strength testing using a depth-sensing indentation technique |
| JP3581279B2 (ja) * | 1999-10-13 | 2004-10-27 | 正樹 白鳥 | 材料試験機 |
| JP3819701B2 (ja) * | 2000-11-10 | 2006-09-13 | 三菱樹脂株式会社 | ビルドアップ多層プリント配線基板用コア基板 |
| JP3861148B2 (ja) * | 2002-11-19 | 2006-12-20 | 独立行政法人産業技術総合研究所 | 無機質膜の剥離力測定方法及び測定装置 |
| JP4610275B2 (ja) | 2004-09-27 | 2011-01-12 | イビデン株式会社 | 多層プリント配線板 |
| JP2012146990A (ja) * | 2012-02-22 | 2012-08-02 | Sumitomo Bakelite Co Ltd | 多層回路基板、多層回路基板の製造方法および半導体装置 |
-
2024
- 2024-04-05 CN CN202480002352.2A patent/CN119173752A/zh active Pending
- 2024-04-05 KR KR1020257034537A patent/KR20250174619A/ko active Pending
- 2024-04-05 EP EP24792524.1A patent/EP4700359A1/en active Pending
- 2024-04-05 US US18/859,872 patent/US20250283793A1/en active Pending
- 2024-04-05 WO PCT/JP2024/014015 patent/WO2024219249A1/ja not_active Ceased
- 2024-04-05 JP JP2025515160A patent/JPWO2024219249A1/ja active Pending
- 2024-04-09 TW TW113113093A patent/TW202446174A/zh unknown
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN119437897A (zh) * | 2025-01-07 | 2025-02-14 | 高邮鑫润龙印刷科技有限公司 | 一种印刷材料检测机构及具有该检测机构的印刷机 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPWO2024219249A1 (https=) | 2024-10-24 |
| KR20250174619A (ko) | 2025-12-12 |
| US20250283793A1 (en) | 2025-09-11 |
| EP4700359A1 (en) | 2026-02-25 |
| WO2024219249A1 (ja) | 2024-10-24 |
| TW202446174A (zh) | 2024-11-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR101483275B1 (ko) | 탄성 플레이트를 이용한 박막 부착력 시험 방법 | |
| Kabaar et al. | Characterization of materials and their interfaces in a direct bonded copper substrate for power electronics applications | |
| CN119173752A (zh) | 印刷线路板用基板的可靠性试验方法 | |
| Van Driel et al. | Prediction of delamination related IC & packaging reliability problems | |
| Xie et al. | Investigation of interfacial delamination of a copper-epoxy interface under monotonic and cyclic loading: Experimental characterization | |
| Gruber et al. | A novel approach to assess the mechanical reliability of thin, ceramic-based multilayer architectures | |
| Deluca et al. | Strength and fracture analysis of silicon-based components for embedding | |
| Geisler et al. | Experimental analyses of the mechanical reliability of advanced BEOL/fBEOL stacks regarding CPI loading | |
| Walter et al. | Characterization of cyclic delamination behavior of thin film multilayers | |
| Gonzalez et al. | Mechanical stability of Cu/low-k BEOL interconnects | |
| JP3518545B2 (ja) | 樹脂材料の表示方法 | |
| Yeo et al. | A combined experimental and modelling study of indentation damage test on thin-film stacked structures | |
| McCann et al. | Use of birefringence to determine redistribution layer stresses to create design guidelines to prevent glass cracking | |
| Zhao et al. | Investigation of delamination control in plastic package | |
| Shaw et al. | Experimental determination of the toughness of crack stop structures | |
| Moore et al. | Mechanical characterization of low-K dielectric materials | |
| JP4353378B2 (ja) | 膜密着性測定方法、膜密着性測定装置、及び膜密着性測定用サンプル | |
| Unterreitmeier et al. | An improved crack probability model for silicon oxide layers using three-parameter Weibull analysis | |
| WO2019171475A1 (ja) | 樹脂組成物の流動性評価方法、樹脂組成物の選別方法及び半導体装置の製造方法 | |
| Yeo et al. | A novel damage test evaluation of IC bond pad stack strength | |
| Yeo | Mechanical characterization and analysis of thin-film stacked structures for microelectronic assembly | |
| Wong et al. | Swelling and time-dependent subcritical debonding of underfill during temperature-humidity aging of flip chip packages | |
| Gaiser et al. | Novel concepts for modelling and enhancing the DBC-Al 2 O 3 lifetime | |
| KR102840537B1 (ko) | 전기 장치 검사용 프로브 헤드 및 그의 제조 방법 | |
| Wunderle et al. | Non-destructive failure analysis and modeling of encapsulated miniature SMD ceramic chip capacitors under thermal and mechanical loading |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |