CN118043625A - 透明体的测定方法及测定机以及玻璃板的制造方法 - Google Patents

透明体的测定方法及测定机以及玻璃板的制造方法 Download PDF

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Publication number
CN118043625A
CN118043625A CN202280066719.8A CN202280066719A CN118043625A CN 118043625 A CN118043625 A CN 118043625A CN 202280066719 A CN202280066719 A CN 202280066719A CN 118043625 A CN118043625 A CN 118043625A
Authority
CN
China
Prior art keywords
measuring
transparent body
measurement
mounting table
opening
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202280066719.8A
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English (en)
Chinese (zh)
Inventor
大庭直树
高桥忠
前田透
德丸裕二
小柳智明
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Electric Glass Co Ltd
Original Assignee
Nippon Electric Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Glass Co Ltd filed Critical Nippon Electric Glass Co Ltd
Publication of CN118043625A publication Critical patent/CN118043625A/zh
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/16Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/30Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21Polarisation-affecting properties
    • G01N21/23Bi-refringence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Length Measuring Devices By Optical Means (AREA)
CN202280066719.8A 2021-12-03 2022-11-29 透明体的测定方法及测定机以及玻璃板的制造方法 Pending CN118043625A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021-197109 2021-12-03
JP2021197109 2021-12-03
PCT/JP2022/044027 WO2023100892A1 (ja) 2021-12-03 2022-11-29 透明体の測定方法及び測定機並びにガラス板の製造方法

Publications (1)

Publication Number Publication Date
CN118043625A true CN118043625A (zh) 2024-05-14

Family

ID=86612302

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202280066719.8A Pending CN118043625A (zh) 2021-12-03 2022-11-29 透明体的测定方法及测定机以及玻璃板的制造方法

Country Status (4)

Country Link
JP (1) JPWO2023100892A1 (https=)
KR (1) KR20240116702A (https=)
CN (1) CN118043625A (https=)
WO (1) WO2023100892A1 (https=)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62276437A (ja) * 1986-05-26 1987-12-01 Sumitomo Metal Mining Co Ltd 厚膜材料の評価方法
JPH09159615A (ja) * 1995-12-08 1997-06-20 Matsushita Electric Ind Co Ltd 光透過性板材の欠陥検査装置および欠陥検査方法
JP2010151666A (ja) * 2008-12-25 2010-07-08 Toray Ind Inc パターン検査装置および検査方法
IN2015KN00605A (https=) * 2012-08-13 2015-07-17 Kawasaki Heavy Ind Ltd
CN105784723A (zh) * 2014-12-24 2016-07-20 日东电工株式会社 透射式缺陷检查装置和透射式缺陷检查方法
KR102390357B1 (ko) 2016-06-23 2022-04-22 니폰 덴키 가라스 가부시키가이샤 유리 기판 왜곡 측정 방법 및 유리 기판 왜곡 측정 장치

Also Published As

Publication number Publication date
JPWO2023100892A1 (https=) 2023-06-08
KR20240116702A (ko) 2024-07-30
WO2023100892A1 (ja) 2023-06-08

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