KR20240116702A - 투명체의 측정 방법 및 측정기 및 유리판의 제조 방법 - Google Patents

투명체의 측정 방법 및 측정기 및 유리판의 제조 방법 Download PDF

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Publication number
KR20240116702A
KR20240116702A KR1020247006192A KR20247006192A KR20240116702A KR 20240116702 A KR20240116702 A KR 20240116702A KR 1020247006192 A KR1020247006192 A KR 1020247006192A KR 20247006192 A KR20247006192 A KR 20247006192A KR 20240116702 A KR20240116702 A KR 20240116702A
Authority
KR
South Korea
Prior art keywords
laser light
measurement
measuring
measuring device
opening
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
KR1020247006192A
Other languages
English (en)
Korean (ko)
Inventor
나오키 오바
타다시 타카하시
토루 마에다
유지 토쿠마루
토모아키 코야나기
Original Assignee
니폰 덴키 가라스 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 니폰 덴키 가라스 가부시키가이샤 filed Critical 니폰 덴키 가라스 가부시키가이샤
Publication of KR20240116702A publication Critical patent/KR20240116702A/ko
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/23—Bi-refringence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Length Measuring Devices By Optical Means (AREA)
KR1020247006192A 2021-12-03 2022-11-29 투명체의 측정 방법 및 측정기 및 유리판의 제조 방법 Pending KR20240116702A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021197109 2021-12-03
JPJP-P-2021-197109 2021-12-03
PCT/JP2022/044027 WO2023100892A1 (ja) 2021-12-03 2022-11-29 透明体の測定方法及び測定機並びにガラス板の製造方法

Publications (1)

Publication Number Publication Date
KR20240116702A true KR20240116702A (ko) 2024-07-30

Family

ID=86612302

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020247006192A Pending KR20240116702A (ko) 2021-12-03 2022-11-29 투명체의 측정 방법 및 측정기 및 유리판의 제조 방법

Country Status (4)

Country Link
JP (1) JPWO2023100892A1 (https=)
KR (1) KR20240116702A (https=)
CN (1) CN118043625A (https=)
WO (1) WO2023100892A1 (https=)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017221825A1 (ja) 2016-06-23 2017-12-28 日本電気硝子株式会社 ガラス基板歪測定方法及びガラス基板歪測定装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62276437A (ja) * 1986-05-26 1987-12-01 Sumitomo Metal Mining Co Ltd 厚膜材料の評価方法
JPH09159615A (ja) * 1995-12-08 1997-06-20 Matsushita Electric Ind Co Ltd 光透過性板材の欠陥検査装置および欠陥検査方法
JP2010151666A (ja) * 2008-12-25 2010-07-08 Toray Ind Inc パターン検査装置および検査方法
IN2015KN00605A (https=) * 2012-08-13 2015-07-17 Kawasaki Heavy Ind Ltd
CN105784723A (zh) * 2014-12-24 2016-07-20 日东电工株式会社 透射式缺陷检查装置和透射式缺陷检查方法

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017221825A1 (ja) 2016-06-23 2017-12-28 日本電気硝子株式会社 ガラス基板歪測定方法及びガラス基板歪測定装置

Also Published As

Publication number Publication date
JPWO2023100892A1 (https=) 2023-06-08
CN118043625A (zh) 2024-05-14
WO2023100892A1 (ja) 2023-06-08

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Legal Events

Date Code Title Description
PA0105 International application

Patent event date: 20240223

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application