CN117295931A - 用于监测辐射发射元件的发射温度的装置和方法 - Google Patents

用于监测辐射发射元件的发射温度的装置和方法 Download PDF

Info

Publication number
CN117295931A
CN117295931A CN202280033179.3A CN202280033179A CN117295931A CN 117295931 A CN117295931 A CN 117295931A CN 202280033179 A CN202280033179 A CN 202280033179A CN 117295931 A CN117295931 A CN 117295931A
Authority
CN
China
Prior art keywords
radiation
emitting element
radiation emitting
emission temperature
temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202280033179.3A
Other languages
English (en)
Chinese (zh)
Inventor
C·M·奥古恩
F·霍尔穆特
S·瓦鲁施
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TrinamiX GmbH
Original Assignee
TrinamiX GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TrinamiX GmbH filed Critical TrinamiX GmbH
Publication of CN117295931A publication Critical patent/CN117295931A/zh
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/0003—Radiation pyrometry, e.g. infrared or optical thermometry for sensing the radiant heat transfer of samples, e.g. emittance meter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G01J5/0801—Means for wavelength selection or discrimination
    • G01J5/0802—Optical filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B6/00—Heating by electric, magnetic or electromagnetic fields
    • H05B6/02—Induction heating
    • H05B6/06—Control, e.g. of temperature, of power
    • H05B6/062—Control, e.g. of temperature, of power for cooking plates or the like
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
    • G01J5/061—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity by controlling the temperature of the apparatus or parts thereof, e.g. using cooling means or thermostats
    • G01J2005/063—Heating; Thermostating
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B2213/00—Aspects relating both to resistive heating and to induction heating, covered by H05B3/00 and H05B6/00
    • H05B2213/07—Heating plates with temperature control means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Electromagnetism (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Radiation Pyrometers (AREA)
  • Electric Stoves And Ranges (AREA)
CN202280033179.3A 2021-05-07 2022-05-06 用于监测辐射发射元件的发射温度的装置和方法 Pending CN117295931A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP21172760.7 2021-05-07
EP21172760 2021-05-07
PCT/EP2022/062260 WO2022234073A1 (en) 2021-05-07 2022-05-06 Device and method for monitoring an emission temperature of a radiation emitting element

Publications (1)

Publication Number Publication Date
CN117295931A true CN117295931A (zh) 2023-12-26

Family

ID=75870482

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202280033179.3A Pending CN117295931A (zh) 2021-05-07 2022-05-06 用于监测辐射发射元件的发射温度的装置和方法

Country Status (6)

Country Link
US (1) US20240319011A1 (enExample)
EP (1) EP4334689A1 (enExample)
JP (1) JP2024519730A (enExample)
KR (1) KR20240004475A (enExample)
CN (1) CN117295931A (enExample)
WO (1) WO2022234073A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN121346983A (zh) * 2025-12-03 2026-01-16 盛吉盛半导体科技(北京)有限公司 一种基于透射与辐射的晶圆测温方法、装置、设备及介质

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2024213601A1 (en) 2023-04-12 2024-10-17 Trinamix Gmbh Calibration and operation methods for devices for monitoring an emission temperature

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19856140A1 (de) * 1998-12-04 2000-06-08 Bsh Bosch Siemens Hausgeraete Sensorgesteuertes Kochfeld mit unterhalb der Kochfeldplatte angeordneter Sensoreinheit
DE19906115C1 (de) * 1999-02-13 2000-08-31 Schott Glas Verfahren zum Erkennen des Leerkochens von Geschirr bei Kochfeldern mit einer Glaskeramik-Kochfläche und zugehörige Vorrichtung
US6169486B1 (en) 1999-07-19 2001-01-02 General Electric Company Monitoring and control system for monitoring the temperature of a glass ceramic cooktop
US6140617A (en) * 1999-10-22 2000-10-31 General Electric Company Cooktop control and monitoring system including detecting properties of a utensil through a solid-surface cooktop
JP4422943B2 (ja) * 2001-03-16 2010-03-03 大阪瓦斯株式会社 コンロ
JP3969986B2 (ja) 2001-09-28 2007-09-05 大阪瓦斯株式会社 クッキングヒータ装置
JP2003315148A (ja) * 2002-04-24 2003-11-06 Kyocera Corp 赤外線センサ素子収納用パッケージおよび赤外線センサ装置
JP2004257769A (ja) * 2003-02-24 2004-09-16 Nec San-Ei Instruments Ltd 多色赤外線撮像装置及び赤外エネルギーデータ処理方法
JP2006292439A (ja) * 2005-04-06 2006-10-26 Hamamatsu Photonics Kk 温度検出装置
JP4285502B2 (ja) * 2006-05-22 2009-06-24 パナソニック株式会社 誘導加熱調理器
JP5030812B2 (ja) * 2008-02-18 2012-09-19 三菱電機株式会社 誘導加熱調理器
ES2629443T3 (es) 2008-02-19 2017-08-09 Panasonic Corporation Dispositivos de cocción por calentamiento por inducción
JP5506405B2 (ja) * 2010-01-04 2014-05-28 三菱電機株式会社 誘導加熱調理器
JP5537505B2 (ja) * 2011-06-17 2014-07-02 日立アプライアンス株式会社 誘導加熱調理器
JP5492928B2 (ja) * 2012-03-28 2014-05-14 日立アプライアンス株式会社 誘導加熱調理器
EP2704521B1 (de) 2012-09-03 2020-10-14 BSH Hausgeräte GmbH Hausgerätevorrichtung
DE102013108648A1 (de) 2013-08-09 2015-02-12 Miele & Cie. Kg Kocheinrichtung und Verfahren zum Betreiben der Kocheinrichtung
JP6207693B2 (ja) * 2016-08-24 2017-10-04 三菱電機株式会社 加熱調理器
US10356853B2 (en) 2016-08-29 2019-07-16 Cooktek Induction Systems, Llc Infrared temperature sensing in induction cooking systems
JP7204667B2 (ja) * 2017-04-20 2023-01-16 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 光検出器
JPWO2019124084A1 (ja) 2017-12-18 2020-12-17 パナソニックＩｐマネジメント株式会社 誘導加熱装置
JP7043278B2 (ja) * 2018-02-08 2022-03-29 日本アビオニクス株式会社 放射率測定装置、温度測定装置、放射率測定方法及び温度測定方法
US20230043515A1 (en) * 2018-05-02 2023-02-09 Elatronic Ag Remote temperature measurement of cookware through a ceramic glass plate using an infrared sensor
FI131067B1 (fi) 2018-05-25 2024-08-29 Safera Oy Liesivahti, joka hyödyntää eri aallonpituuksia
CN109041312A (zh) * 2018-08-13 2018-12-18 中山市雅乐思商住电器有限公司 一种感应加热炊具

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN121346983A (zh) * 2025-12-03 2026-01-16 盛吉盛半导体科技(北京)有限公司 一种基于透射与辐射的晶圆测温方法、装置、设备及介质

Also Published As

Publication number Publication date
WO2022234073A1 (en) 2022-11-10
EP4334689A1 (en) 2024-03-13
US20240319011A1 (en) 2024-09-26
JP2024519730A (ja) 2024-05-21
KR20240004475A (ko) 2024-01-11

Similar Documents

Publication Publication Date Title
US6140617A (en) Cooktop control and monitoring system including detecting properties of a utensil through a solid-surface cooktop
CN103369754B (zh) 感应加热烹饪器
CN117295931A (zh) 用于监测辐射发射元件的发射温度的装置和方法
DE602004020883D1 (de) Thermo-empfindliche Vorrichtung zur Anwesenheitsbestimmung von automatischen Türen
CN116569004A (zh) 用于测量光辐射的光谱感测设备和方法
JPH0435017B2 (enExample)
US20240192059A1 (en) Device and method for monitoring an emission temperature of a radiation emitting element
US20030067956A1 (en) Temperature measuring method and apparatus
US6538238B1 (en) Long term calibration of sensor assembly for glass-ceramic cooktop appliance
JP2016157545A (ja) 誘導加熱調理器
JP2024519730A5 (enExample)
CN117295930A (zh) 用于监测辐射发射元件的发射温度的装置和方法
JP6129680B2 (ja) 誘導加熱調理器
TW201412195A (zh) 感應加熱調理器
WO2024213601A1 (en) Calibration and operation methods for devices for monitoring an emission temperature
US10317286B2 (en) Luminaire and method for temperature control
CN114144643A (zh) 监测辐射的方法和设备
JP2024536732A (ja) 光放射線を測定するためのスペクトル感知装置及び方法
US20250003801A1 (en) Photodetector for measuring optical radiation
KR20190048705A (ko) 유리 투과형 온도 측정 장치 및 이를 구비하는 인덕션 가열 장치
JP3659412B2 (ja) 温度測定方法および装置
WO2025069623A1 (ja) 加熱調理器
JP2023512586A (ja) 差動デュアル検出器による温度検出
JP2013101835A (ja) 誘導加熱調理器
Salvatori Wide-band gap semiconductors for noncontact thermometry

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination