CN116829762A - 循环低温膜生长工艺 - Google Patents

循环低温膜生长工艺 Download PDF

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Publication number
CN116829762A
CN116829762A CN202180063927.8A CN202180063927A CN116829762A CN 116829762 A CN116829762 A CN 116829762A CN 202180063927 A CN202180063927 A CN 202180063927A CN 116829762 A CN116829762 A CN 116829762A
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reactive
substrate
reactive surface
nitridation
plasma
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CN202180063927.8A
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Chinese (zh)
Inventor
赵建平
彼得·文特泽克
岩尾俊彦
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Tokyo Electron Ltd
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Tokyo Electron Ltd
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    • C23C8/00Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals
    • C23C8/06Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals using gases
    • C23C8/08Solid state diffusion of only non-metal elements into metallic material surfaces; Chemical surface treatment of metallic material by reaction of the surface with a reactive gas, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals using gases only one element being applied
    • C23C8/24Nitriding
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    • H10P14/6526Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed after formation of the materials by introduction of substances into an already-existing insulating layer the substance being nitrogen introduced into an oxide material, e.g. changing SiO to SiON
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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Metallurgy (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Organic Chemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • Formation Of Insulating Films (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Chemical Vapour Deposition (AREA)
  • Insulated Gate Type Field-Effect Transistor (AREA)
CN202180063927.8A 2020-09-19 2021-09-15 循环低温膜生长工艺 Pending CN116829762A (zh)

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US17/026,168 2020-09-19
US17/026,168 US11605536B2 (en) 2020-09-19 2020-09-19 Cyclic low temperature film growth processes
PCT/US2021/050516 WO2022060875A1 (en) 2020-09-19 2021-09-15 Cyclic low temperature film growth processes

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CN116829762A true CN116829762A (zh) 2023-09-29

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US (3) US11605536B2 (https=)
JP (1) JP7797757B2 (https=)
KR (1) KR20230070221A (https=)
CN (1) CN116829762A (https=)
TW (1) TWI896762B (https=)
WO (1) WO2022060875A1 (https=)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11605536B2 (en) * 2020-09-19 2023-03-14 Tokyo Electron Limited Cyclic low temperature film growth processes

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010512646A (ja) * 2006-12-08 2010-04-22 ヴァリアン セミコンダクター イクイップメント アソシエイツ インコーポレイテッド ひずみ薄膜形成方法および窒化ケイ素薄膜形成方法
CN103168344A (zh) * 2010-11-03 2013-06-19 应用材料公司 用于沉积碳化硅和碳氮化硅膜的设备和方法
US20140073145A1 (en) * 2007-11-08 2014-03-13 Stephen Moffatt Pulse train annealing method and apparatus
JP2016066794A (ja) * 2014-09-24 2016-04-28 ラム リサーチ コーポレーションLam Research Corporation Aldにより形成される窒化シリコン膜の表面形状内ウェットエッチング速度を均一に低下させるための方法及び装置
TW202028216A (zh) * 2018-10-03 2020-08-01 美商慧盛材料美國責任有限公司 含矽及氮膜的製造方法

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4715937A (en) 1986-05-05 1987-12-29 The Board Of Trustees Of The Leland Stanford Junior University Low-temperature direct nitridation of silicon in nitrogen plasma generated by microwave discharge
JPH07221035A (ja) * 1994-02-07 1995-08-18 Semiconductor Energy Lab Co Ltd 基板処理装置およびその動作方法
JPH1070303A (ja) * 1996-08-26 1998-03-10 Fuji Xerox Co Ltd 半導体受光素子
JPH11168097A (ja) * 1997-12-04 1999-06-22 Hitachi Ltd 半導体装置の製造方法
US6682973B1 (en) * 2002-05-16 2004-01-27 Advanced Micro Devices, Inc. Formation of well-controlled thin SiO, SiN, SiON layer for multilayer high-K dielectric applications
WO2004009861A2 (en) 2002-07-19 2004-01-29 Asm America, Inc. Method to form ultra high quality silicon-containing compound layers
US7972663B2 (en) 2002-12-20 2011-07-05 Applied Materials, Inc. Method and apparatus for forming a high quality low temperature silicon nitride layer
US8129290B2 (en) 2005-05-26 2012-03-06 Applied Materials, Inc. Method to increase tensile stress of silicon nitride films using a post PECVD deposition UV cure
US7732342B2 (en) 2005-05-26 2010-06-08 Applied Materials, Inc. Method to increase the compressive stress of PECVD silicon nitride films
US8138104B2 (en) 2005-05-26 2012-03-20 Applied Materials, Inc. Method to increase silicon nitride tensile stress using nitrogen plasma in-situ treatment and ex-situ UV cure
US7648927B2 (en) 2005-06-21 2010-01-19 Applied Materials, Inc. Method for forming silicon-containing materials during a photoexcitation deposition process
KR101313705B1 (ko) 2005-06-24 2013-10-01 주성엔지니어링(주) 저온 폴리 실리콘의 증착방법 및 이를 위한 플라즈마발생장치
JP2007073941A (ja) * 2005-08-11 2007-03-22 Advanced Lcd Technologies Development Center Co Ltd 非結晶半導体膜の結晶化方法及び結晶化用被処理基板の製造装置
KR101402103B1 (ko) 2007-03-23 2014-06-02 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체장치
US20090155606A1 (en) 2007-12-13 2009-06-18 Asm Genitech Korea Ltd. Methods of depositing a silicon nitride film
JP5467007B2 (ja) 2009-09-30 2014-04-09 株式会社日立国際電気 半導体装置の製造方法および基板処理装置
US8563924B2 (en) * 2011-06-28 2013-10-22 Agilent Technologies, Inc. Windowless ionization device
US8728955B2 (en) 2012-02-14 2014-05-20 Novellus Systems, Inc. Method of plasma activated deposition of a conformal film on a substrate surface
US9911620B2 (en) 2015-02-23 2018-03-06 Lam Research Corporation Method for achieving ultra-high selectivity while etching silicon nitride
JP6665032B2 (ja) * 2015-08-26 2020-03-13 株式会社Screenホールディングス 熱処理方法および熱処理装置
US11605536B2 (en) * 2020-09-19 2023-03-14 Tokyo Electron Limited Cyclic low temperature film growth processes

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010512646A (ja) * 2006-12-08 2010-04-22 ヴァリアン セミコンダクター イクイップメント アソシエイツ インコーポレイテッド ひずみ薄膜形成方法および窒化ケイ素薄膜形成方法
US20140073145A1 (en) * 2007-11-08 2014-03-13 Stephen Moffatt Pulse train annealing method and apparatus
CN103168344A (zh) * 2010-11-03 2013-06-19 应用材料公司 用于沉积碳化硅和碳氮化硅膜的设备和方法
JP2016066794A (ja) * 2014-09-24 2016-04-28 ラム リサーチ コーポレーションLam Research Corporation Aldにより形成される窒化シリコン膜の表面形状内ウェットエッチング速度を均一に低下させるための方法及び装置
TW202028216A (zh) * 2018-10-03 2020-08-01 美商慧盛材料美國責任有限公司 含矽及氮膜的製造方法

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