CN116745883A - 质量分析装置 - Google Patents

质量分析装置 Download PDF

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Publication number
CN116745883A
CN116745883A CN202180088733.3A CN202180088733A CN116745883A CN 116745883 A CN116745883 A CN 116745883A CN 202180088733 A CN202180088733 A CN 202180088733A CN 116745883 A CN116745883 A CN 116745883A
Authority
CN
China
Prior art keywords
gas
temperature
humidity
mass spectrometer
mass
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
CN202180088733.3A
Other languages
English (en)
Chinese (zh)
Inventor
石黑浩二
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi High Technologies Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Technologies Corp filed Critical Hitachi High Technologies Corp
Publication of CN116745883A publication Critical patent/CN116745883A/zh
Withdrawn legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0201—Thermal arrangements, e.g. for cooling, heating or preventing overheating
    • H05K1/0203—Cooling of mounted components
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K7/00—Constructional details common to different types of electric apparatus
    • H05K7/20—Modifications to facilitate cooling, ventilating, or heating
    • H05K7/20009—Modifications to facilitate cooling, ventilating, or heating using a gaseous coolant in electronic enclosures
    • H05K7/20209—Thermal management, e.g. fan control
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10007—Types of components
    • H05K2201/10015—Non-printed capacitor
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10007—Types of components
    • H05K2201/10151—Sensor
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10007—Types of components
    • H05K2201/10174—Diode

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Thermal Sciences (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
CN202180088733.3A 2021-01-22 2021-01-22 质量分析装置 Withdrawn CN116745883A (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2021/002136 WO2022157905A1 (ja) 2021-01-22 2021-01-22 質量分析装置

Publications (1)

Publication Number Publication Date
CN116745883A true CN116745883A (zh) 2023-09-12

Family

ID=82548594

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202180088733.3A Withdrawn CN116745883A (zh) 2021-01-22 2021-01-22 质量分析装置

Country Status (5)

Country Link
US (1) US20230402273A1 (https=)
EP (1) EP4283657B1 (https=)
JP (1) JP7449418B2 (https=)
CN (1) CN116745883A (https=)
WO (1) WO2022157905A1 (https=)

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4260886A (en) * 1979-09-07 1981-04-07 Rca Corporation Measurement of a gas constituent by a mass spectrometer
JPS6271712U (https=) * 1985-10-22 1987-05-08
JPH0418960U (https=) * 1990-06-06 1992-02-18
JP2003166785A (ja) 2001-11-30 2003-06-13 Dainippon Printing Co Ltd 乾燥装置
EP2591482B1 (en) * 2010-07-09 2017-05-24 Micromass UK Limited Capacitor assembly for a mass spectrometer
JP5285735B2 (ja) * 2011-03-31 2013-09-11 株式会社日立ハイテクノロジーズ 質量分析装置
US8455815B2 (en) * 2011-07-15 2013-06-04 Bruker Daltonics, Inc. Radio frequency voltage temperature stabilization
JP5970274B2 (ja) * 2012-07-18 2016-08-17 株式会社日立ハイテクノロジーズ 質量分析装置
JP5847678B2 (ja) * 2012-09-14 2016-01-27 株式会社日立ハイテクノロジーズ 質量分析装置及び方法
JP2014123469A (ja) 2012-12-20 2014-07-03 Hitachi High-Technologies Corp 質量分析装置および質量分析装置の調整方法
JP6047414B2 (ja) 2013-01-30 2016-12-21 株式会社日立ハイテクノロジーズ 質量分析装置
JP6205806B2 (ja) 2013-04-08 2017-10-04 コニカミノルタ株式会社 ＲＩｆＳ（反射干渉分光法）測定装置
JP6313092B2 (ja) * 2014-03-31 2018-04-18 キヤノンメディカルシステムズ株式会社 Ｘ線コンピュータ断層撮影装置
GB2533168B (en) 2014-12-12 2017-05-24 Thermo Fisher Scient (Bremen) Gmbh An electrical connection assembly
GB2552965B (en) 2016-08-15 2020-07-15 Thermo Fisher Scient Bremen Gmbh Temperature-compensated rectifying component
US10971348B2 (en) * 2017-07-11 2021-04-06 Thermo Finnigan Apparatus for delivering reagent ions to a mass spectrometer
CN120275621A (zh) * 2017-12-19 2025-07-08 拜克门寇尔特公司 具有可变工作流的集成样品处理系统
WO2020213283A1 (ja) 2019-04-16 2020-10-22 株式会社日立ハイテク 質量分析装置および質量分析方法

Also Published As

Publication number Publication date
EP4283657B1 (en) 2025-06-25
JP7449418B2 (ja) 2024-03-13
US20230402273A1 (en) 2023-12-14
JPWO2022157905A1 (https=) 2022-07-28
EP4283657A4 (en) 2024-11-27
WO2022157905A1 (ja) 2022-07-28
EP4283657A1 (en) 2023-11-29

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Application publication date: 20230912

WW01 Invention patent application withdrawn after publication