CN116727259A - Integrated circuit test equipment - Google Patents
Integrated circuit test equipment Download PDFInfo
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- CN116727259A CN116727259A CN202311023001.3A CN202311023001A CN116727259A CN 116727259 A CN116727259 A CN 116727259A CN 202311023001 A CN202311023001 A CN 202311023001A CN 116727259 A CN116727259 A CN 116727259A
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- 238000012360 testing method Methods 0.000 title claims abstract description 180
- 230000002950 deficient Effects 0.000 claims abstract description 59
- 230000007246 mechanism Effects 0.000 claims abstract description 56
- 230000007306 turnover Effects 0.000 claims description 36
- 230000000712 assembly Effects 0.000 claims description 24
- 238000000429 assembly Methods 0.000 claims description 24
- 238000001514 detection method Methods 0.000 claims description 18
- 239000000523 sample Substances 0.000 claims description 13
- 239000011241 protective layer Substances 0.000 claims description 4
- 239000000428 dust Substances 0.000 claims description 3
- 230000008520 organization Effects 0.000 claims 1
- 238000005538 encapsulation Methods 0.000 abstract description 2
- 230000000903 blocking effect Effects 0.000 description 20
- 238000000034 method Methods 0.000 description 5
- 230000008569 process Effects 0.000 description 4
- 210000002421 cell wall Anatomy 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 235000012431 wafers Nutrition 0.000 description 2
- 230000004075 alteration Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 230000008602 contraction Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000010410 layer Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 238000012858 packaging process Methods 0.000 description 1
- 230000002035 prolonged effect Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
- B07C5/361—Processing or control devices therefor, e.g. escort memory
- B07C5/362—Separating or distributor mechanisms
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
- B07C5/38—Collecting or arranging articles in groups
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses integrated circuit test equipment, which comprises a base and a test mechanism arranged on the base, wherein a defective product collecting table, a test table and a qualified product collecting table are arranged on the base, the bottom of the defective product collecting table is fixed on the base, the test table surrounds the outer side of the defective product collecting table in a ring shape and is rotationally connected with the defective product collecting table, the qualified product collecting table surrounds the outer side of the test table in a ring shape and is rotationally connected with the test table, and a power mechanism connected with the test table and the qualified product collecting table is also arranged on the base; this integrated circuit test equipment, through setting up six at least test module and cooperate six test seats, all placed the integrated circuit after the encapsulation on each test seat, along with the removal of pivoted testboard, every integrated circuit all can be by carrying out the cubic in proper order and detect, and this kind of test can improve the degree of accuracy that detects.
Description
Technical Field
The invention belongs to the technical field of integrated circuit testing, and particularly relates to integrated circuit testing equipment.
Background
An integrated circuit is a type of microelectronic device or component. The method comprises the steps of adopting a certain process to interconnect elements such as a transistor, a diode, a resistor, a capacitor, an inductor and the like required in a circuit and wiring, manufacturing the elements on a small semiconductor wafer or a medium substrate or a plurality of small semiconductor wafers or medium substrates, then packaging the elements in a tube shell to form a microstructure with the required circuit function, and in order to avoid damage of the integrated circuit in the packaging process, testing the integrated circuit by using test equipment after the integrated circuit is packaged, wherein the test equipment of the general integrated circuit in the prior art can not test the packaged integrated circuit continuously for a plurality of times, inaccuracy is easy to judge if the test is carried out only once, qualified products and defective products of the integrated circuit after the test are not collected in time, and the test assembly can generate excessive pressure on the integrated circuit in the test process to damage the integrated circuit and the test assembly.
Disclosure of Invention
The invention aims to: the integrated circuit testing equipment is provided to solve the problems that the integrated circuit testing equipment in the prior art cannot perform continuous and repeated tests on the packaged integrated circuit, is easy to judge inaccurately if the integrated circuit testing equipment is used for performing the test once, cannot collect qualified products and defective products of the integrated circuit after the test is finished in time, and the test assembly can generate excessive pressure on the integrated circuit in the test process to damage the integrated circuit and the test assembly.
The technical scheme is as follows:
the integrated circuit test equipment comprises a base and a test mechanism arranged on the base, wherein a defective product collecting table, a test table and a qualified product collecting table are arranged on the base, the bottom of the defective product collecting table is fixed on the base, the test table surrounds the outer side of the defective product collecting table in a ring shape and is rotationally connected with the defective product collecting table, the qualified product collecting table surrounds the outer side of the test table in a ring shape and is rotationally connected with the test table, and a power mechanism connected with the test table and the qualified product collecting table is further arranged on the base and drives the test table and the qualified product collecting table to rotate;
the testing mechanism comprises a top plate, a lifting assembly and at least six testing assemblies arranged on the top plate, wherein the testing assemblies comprise a transverse plate connected to the top plate and probes fixed on the transverse plate, the probes are contacted with pins of an integrated circuit during detection, the top plate is arranged above the base in parallel, the lifting assembly is connected to the central positions of the top plate and the base, and six testing assemblies are lifted simultaneously when the lifting assembly drives the top plate to lift;
at least six test seats are uniformly distributed on the test table along the annular direction of the test table, the vertical projection positions of the test assembly correspond to the positions of the test seats, and the test seats comprise a placing table and a turnover mechanism for driving the placing table to turn over;
a pressure limiting component is arranged between the test component and the test seat and is used for limiting the pressure value when the test component descends and contacts with the integrated circuit;
after the at least six test assemblies test the first group of data of the corresponding integrated circuits on the test table, the lifting assembly drives the test assemblies to rise, the power mechanism drives the test table to rotate, so that the vertical projection position of the test assemblies corresponds to the position of the next adjacent placement table of the initial corresponding placement table, the lifting assembly drives the test assemblies to descend to perform second detection on the integrated circuits on the placement table until the test assemblies complete three detection on the integrated circuits on the placement table, the at least two test results display the integrated circuits as qualified products, the turnover mechanism drives the placement table to turn towards the direction of the qualified product collection table to enable the qualified integrated circuits to slide into the qualified product collection table, the at least two test results display the integrated circuits as defective products, and the turnover mechanism drives the placement table to turn towards the direction of the defective product collection table to enable the defective integrated circuits to slide into the defective product collection table.
In a further embodiment, the turnover mechanism comprises a turnover motor and a turnover shaft, the turnover motor is arranged on the test bench, the turnover shaft is connected with the placing bench and the test bench, and the turnover motor drives the turnover shaft to rotate so that the placing bench turns over;
a spring is arranged between the placing table and the test table; the integrated circuits can be made to fall into the corresponding collection stations by the flipping of the placement stations.
In a further embodiment, the placement stage is further provided with a clamping mechanism for confining the integrated circuit on the placement stage;
the clamping mechanism comprises two clamping plates symmetrically arranged about the central line of the placing table and a clamping motor arranged in the placing table, the clamping motor is a double-headed motor, two output ends of the double-headed motor are connected with screw rods, nuts are arranged on the clamping plates and are connected to the screw rods in a threaded fit manner, and the two screw rods rotate simultaneously to enable the two nuts to move in opposite directions;
an anti-slip protective layer is arranged on one surface of the clamping plate, which is contacted with the integrated circuit; the position of the integrated circuit on the placing table can be limited, the integrated circuit can be guaranteed to be opposite to the probe, and the situation that the integrated circuit is deviated and rocked in the process of contact detection with the probe can be avoided.
In a further embodiment, the pressure limiting assembly comprises a touch-up lever and a pressure sensor, one end of the touch-up lever is fixed on the transverse plate, the other end of the touch-up lever contacts the pressure sensor during detection, and the pressure sensor is arranged on the placing table.
In a further embodiment, the power mechanism comprises a first power ring, a second power ring, a power gear and a power motor, wherein the power motor is arranged on the base, and the output end of the power circuit is connected with the power gear;
a plurality of first gear teeth are arranged on the inner ring surface of the first power ring at equal intervals, a plurality of second gear teeth are arranged on the outer ring surface of the second power ring at equal intervals, the power gear is positioned between the first power ring and the second power ring, and the power gear is in meshed connection with the plurality of first gear teeth and the plurality of second gear teeth;
the first power ring is connected with the bottom of the qualified product collection table through a first upright post, and the second power ring is connected with the bottom of the test table through a second upright post;
the first power ring is sleeved outside the second power ring, and the first power ring and the second power ring are both in sliding connection with the base; the power can be provided for the rotation of the test bench and the qualified product collecting bench.
In a further embodiment, the lifting assembly comprises a vertical pipe which is concentric with the defective product collecting table and is fixed in the defective product collecting table, wherein a lifting cylinder is arranged in the vertical pipe, and the telescopic end of the lifting cylinder is connected with the top plate;
a supporting rod is further arranged between the top plate and the vertical pipe, one end of the supporting rod is hinged to the side wall of the vertical pipe, the other end of the supporting rod is hinged to a moving block, and the moving block is in sliding connection with the top plate; the stability of roof can be improved to the setting of branch also can effectually balance the roof.
In a further embodiment, a defective product collecting assembly is further arranged in the defective product collecting table, the defective product collecting assembly comprises a collecting plate, a lifting tube and a driving assembly, the lifting tube surrounds the vertical tube and is rotationally connected with the vertical tube, external threads are formed on the surface of the lifting tube, a through hole is formed in the collecting plate and penetrates through the lifting tube, and internal threads matched with the external threads are formed on the inner wall of the through hole;
the driving assembly is positioned between the lower part of the collecting plate and the inner bottom wall of the defective product collecting table, and comprises a driving motor, a main gear is arranged at the output end of the driving motor, the main gear is in meshed connection with a pinion, and the pinion is arranged on the lifting tube; the unqualified integrated circuits concentrated at the bottom of the defective product collection table can be collected in a concentrated manner.
In a further embodiment, a blocking mechanism is further arranged on the base, the blocking mechanism is located on a rotating path of the qualified product collecting table, the blocking mechanism comprises a vertical rod and a blocking rod, the bottom end of the vertical rod is fixed on the base, the top end of the vertical rod is fixedly connected with one end of the blocking rod, the other end of the blocking rod vertically stretches into the qualified product collecting table, a gap is reserved between the other end of the blocking rod and the bottom wall of the qualified product collecting table, and the gap is smaller than a dust collecting circuit; the staff only need stand in the position of stopping the pole then can be convenient collect qualified integrated circuit.
The invention has the beneficial effects that: by arranging at least six test assemblies and matching with six test seats, each test seat is provided with a packaged integrated circuit, and each integrated circuit can be sequentially detected for three times along with the movement of a rotating test table;
at least two qualified data of the integrated circuit to be tested for three times are judged to be qualified products, and then the integrated circuit can enter a qualified product collecting table, and at least two incomplete data of the integrated circuit to be tested for three times are judged to be incomplete products, so that the integrated circuit enters an incomplete product collecting table, and the qualified products and the incomplete products can be collected rapidly and conveniently in a centralized mode;
meanwhile, the pressure limiting assembly is further arranged, the integrated circuit can be tested and limited by the pressure limiting assembly when the testing assembly is pressed down, the integrated circuit is prevented from being damaged due to overlarge pressure, and the probe can be protected.
Drawings
Fig. 1 is a schematic view of the front cross-sectional structure of the present invention.
Fig. 2 is an enlarged schematic view of the structure of fig. 1 a according to the present invention.
Fig. 3 is a schematic side sectional view of the placement table of the present invention.
Fig. 4 is a schematic top view of the power mechanism of the present invention.
Fig. 5 is a schematic top view of the test bench and the collection bench of the present invention.
Fig. 6 is a schematic top view of the base of the present invention.
The reference numerals are: base 1, vertical bar 11, blocking bar 12, defective product collection table 2, test table 3, acceptable product collection table 4, test seat 5, placement table 51, clamping mechanism 52, clamping motor 521, clamping plate 522, tilting mechanism 53, tilting shaft 531, spring 54, integrated circuit 55, test assembly 6, cross plate 61, probe 62, pressure limiting assembly 63, interference bar 631, pressure sensor 632, lift cylinder 7, top plate 71, vertical tube 72, support bar 8, collection plate 9, lift tube 91, driving assembly 92, power mechanism 10, first power ring 101, second power ring 102, power gear 103.
Detailed Description
In the following description, numerous specific details are set forth in order to provide a more thorough understanding of the present invention. It will be apparent, however, to one skilled in the art that the invention may be practiced without one or more of these details. In other instances, well-known features have not been described in detail in order to avoid obscuring the invention.
The present invention will be described in further detail with reference to the accompanying drawings.
Referring to fig. 1-6, an integrated circuit testing device disclosed by the invention comprises a base 1 and a testing mechanism arranged on the base 1, wherein the testing mechanism is used for detecting the electrifying condition of pins of an integrated circuit 55 after encapsulation, a defective product collecting table 2, a testing table 3 and a qualified product collecting table 4 are arranged on the base 1, storage tanks for placing the integrated circuit 55 are respectively arranged in the defective product collecting table 2 and the qualified product collecting table 4, the notch of each storage tank is positioned at the top of the defective product collecting table 2 and the qualified product collecting table 4 and communicated with a testing table 3, the integrated circuit 55 enters the storage tank from the testing table 3, the bottom of the defective product collecting table 2 is fixed on the base 1, the defective product collecting table 2 is positioned at the center of the base 1, the testing table 3 surrounds the outer side of the defective product collecting table 2 in a ring shape and is rotationally connected with the defective product collecting table 2, the qualified product collecting table 4 surrounds the outer side of the testing table 3 in a ring shape and is rotationally connected with the testing table 3, the defective product collecting table 2, the testing table 3 and the testing table 4 and the power mechanism is also arranged on the base 10, and the qualified product collecting mechanism is connected with the testing table 4, and the power mechanism is arranged on the power table 10; the test mechanism comprises a top plate 71, a lifting assembly and at least six test assemblies 6 arranged on the top plate 71, the test assemblies 6 comprise a transverse plate 61 connected to the top plate 71 and a probe 62 fixed on the transverse plate 61, the probe 62 is contacted with pins of the integrated circuit 55 for conducting test during detection, the top plate 71 is arranged above the base 1 in parallel, the lifting assembly is connected to the central positions of the top plate 71 and the base 1, when the lifting assembly drives the top plate 71 to lift, the six test assemblies 6 lift simultaneously, and when the lifting assembly at the central position drives the top plate 71 and the six test assemblies 6 to lift simultaneously, so that balanced force application during simultaneous operation of a plurality of test assemblies 6 can be effectively ensured, and the stability is better; at least six test seats 5 are uniformly distributed on the test table 3 along the annular direction of the test table 3, the vertical projection positions of the test assemblies 6 correspond to the positions of the test seats 5, and the test seats 5 comprise a placing table 51 and a turnover mechanism 53 for driving the placing table 51 to turn over; a pressure limiting component 63 is further arranged between the test component 6 and the test seat 5, and the pressure limiting component 63 is used for limiting the pressure value when the test component 6 is in contact with the integrated circuit 55 when being lowered; after the at least six test assemblies 6 test the first group of data of the integrated circuit 55 on the corresponding test bench 3, the lifting assembly drives the test assembly 6 to rise, the power mechanism 10 drives the test bench 3 to rotate, so that the vertical projection position of the test assembly 6 corresponds to the position of the next integrated circuit 51 adjacent to the initially corresponding placement bench 51, the lifting assembly drives the test assembly 6 to descend to perform second detection on the integrated circuit 55 on the placement bench 51 until the test assembly 6 completes three-time detection on the integrated circuit 55 on the placement bench 51, the at least two test results show that the integrated circuit 55 is a qualified product, the turnover mechanism 53 drives the placement bench 51 to turn over towards the direction of the qualified product collection bench 4, the integrated circuit 55 slides into the qualified product collection bench 4, the at least two test results show that the integrated circuit 55 is a defective product, the turnover mechanism 53 drives the placement bench 51 to turn over towards the placement bench 2, the defective product collection direction enables the integrated circuit 55 to enter the defective product collection bench 55 after the three-time detection, the defective circuit 55 is the defective product collection 55 is finished after the one-time, the defective circuit 55 is manually replaced by one test bench, and the defective circuit 55 is detected after the defective circuit 55 is completely and the defective circuit is completely replaced in the three-time, and the defective circuit 55 is detected in the next group.
The turnover mechanism 53 comprises a turnover motor and a turnover shaft 531, the turnover motor is arranged on the test bench 3, the turnover shaft 531 is connected with the placing table 51 and the test bench 3, and the turnover motor drives the turnover shaft 531 to rotate so that the placing table 51 turns around the turnover shaft 531; the spring 54 is arranged between the placing table 51 and the test table 3, after the test assembly 6 sequentially tests the integrated circuits 55 on the placing table 51, when at least two qualified or unqualified results are obtained, data are fed back to the overturning motor, and when the overturning motor rotates positively and negatively according to the obtained feedback information, the overturning directions of the placing table 51 are different, so that the integrated circuits 55 can slide into the collecting tables at different positions, and the spring 54 is in telescopic fit with the overturning of the placing table 51, so that the stability of the placing table 51 is ensured.
The placing table 51 is further provided with a clamping mechanism 52, and the clamping mechanism 52 is used for limiting the integrated circuit 55 on the placing table 51; the clamping mechanism 52 comprises two clamping plates 522 symmetrically arranged about the central line of the placement table 51 and a clamping motor 521 arranged in the placement table 51, the clamping motor 521 is a double-headed motor, two output ends of the double-headed motor are connected with screw rods, nuts are arranged on the clamping plates 522 and are in threaded fit connection with the screw rods, and the two screw rods simultaneously rotate to enable the two nuts to move in opposite directions; the clamping plate 522 is equipped with anti-skidding protective layer with the one side that integrated circuit 55 contacted, anti-skidding protective layer includes the rubber layer, set up the blank groove in placing the platform 51, supply lead screw and double-end motor installation to be connected, the one end that the lead screw does not link to each other with double-end motor rotates with the cell wall in blank groove to be connected, the nut is located the blank groove, nut and the cell wall sliding connection in blank groove, place after the integrated circuit is placed on placing the platform 51, the lead screw rotates the drive clamping plate 522 and presss from both sides tightly integrated circuit and be convenient for detect, and after the detection is accomplished, clamping plate 522 removes and keeps away from integrated circuit for place when platform 51 upset, integrated circuit can the landing to collect in the platform.
The pressure limiting component 63 includes a contact lever 631 and a pressure sensor 632, one end of the contact lever 631 is fixed on the transverse plate 61, the other end contacts the pressure sensor 632 during detection, the pressure sensor 632 is arranged on the placing table 51 or the clamping plate 522, when the probe 62 moves downwards to contact with a pin of the integrated circuit 55, the contact lever 631 contacts with the pressure sensor 632, through preset pressure data, the contact data between the contact lever 631 and the pressure sensor 632 can reflect the pressure applied by the probe 62 to the integrated circuit 55, thereby avoiding the damage to the integrated circuit 55 due to excessive pressure of the probe 62, effectively protecting the integrated circuit 55, and simultaneously, because the same lifting component is arranged to drive at least six test components 6 to lift simultaneously, the integrated circuit 55 is stressed uniformly when the test components 6 are matched with the placing table 51, the application of force of the test components 6 is uniform, the service life of the test components 6 can be further improved, the test components 6 are in an accurate detection state in a longer time, the service life of the test components 6 is prolonged, if the data of one group of the pressure limiting components 63 and other pressure limiting components 63 can also be fast and accurately judged, and the operation of the pressure limiting components 63 can be also improved.
The power mechanism 10 comprises a first power ring 101, a second power ring 102, a power gear 103 and a power motor, wherein the power motor is arranged on the base 1, and the output end of the power circuit is connected with the power gear 103; a plurality of first gear teeth are arranged on the inner ring surface of the first power ring 101 at equal intervals, a plurality of second gear teeth are arranged on the outer ring surface of the second power ring 102 at equal intervals, the power gear 103 is positioned between the first power ring 101 and the second power ring 102, and the power gear 103 is in meshed connection with the plurality of first gear teeth and the plurality of second gear teeth; the first power ring 101 is connected with the bottom of the qualified product collection table 4 through a first upright post, and the second power ring 102 is connected with the bottom of the test table 3 through a second upright post; the first power ring 101 is sleeved outside the second power ring 102, the first power ring 101 and the second power ring 102 are both in sliding connection with the base 1, a plurality of groups of sliding mechanisms are arranged between the power ring and the base 1, the power ring is guaranteed to stably rotate, accordingly, the test assembly 6 and the pressure limiting assembly 63 are guaranteed to exert force uniformly, the sliding mechanisms comprise sliding blocks arranged on the power ring, the sliding blocks slide in annular sliding grooves, the annular sliding grooves are formed in the base 1, when a power motor operates, the power gear 103 drives the first power ring 101 and the second power ring 102 to simultaneously rotate through gear teeth, the test bench 3 rotates at the moment, the position of the placing bench 51 is replaced by the test assembly 6 at three different positions, the qualified product collecting bench 4 rotates along with the base, and an operator can conveniently take the qualified integrated circuit 55 at a proper position.
The lifting assembly comprises a vertical pipe 72 concentric with the defective product collecting table 2 and fixed in the defective product collecting table 2, a lifting cylinder 7 is arranged in the vertical pipe 72, and the telescopic end of the lifting cylinder 7 is connected with the top plate 71; the vertical pipe 72 is characterized in that a supporting rod 8 is further arranged between the top plate 71 and the vertical pipe 72, one end of the supporting rod 8 is hinged to the side wall of the vertical pipe 72, the other end of the supporting rod 8 is hinged to a moving block, the moving block is connected with the top plate 71 in a sliding mode, a sliding block is arranged on the moving block and horizontally slides in a sliding groove formed in the top plate 71, the height position of the top plate 71 changes along with the expansion and contraction of the lifting cylinder 7, the supporting rod 8 at the moment is in rotary fit with the lifting cylinder, the position of the moving seat is changed in a sliding mode, the stability of the top plate 71 is guaranteed, the position of the supporting rod 8 corresponds to the position of the testing component, and the testing component is further balanced and stable.
The defective product collecting table 2 is further provided with a defective product collecting assembly, the defective product collecting assembly comprises a collecting plate 9, a lifting tube 91 and a driving assembly 92, the lifting tube 91 surrounds the vertical tube 72 and is rotationally connected with the vertical tube 72, the surface of the lifting tube 91 is provided with external threads, the collecting plate 9 is provided with a through hole and penetrates through the through hole and the lifting tube 91, and the inner wall of the through hole is provided with internal threads matched with the external threads; the drive assembly 92 is located the below of collecting plate 9 with between the inside diapire of wastrel collection platform 2, the drive assembly 92 includes driving motor, driving motor's output installs the master gear, the master gear is connected with the pinion meshing, the pinion is installed on the lifter 91, when driving motor operates, drive lifter 91 through the transmission of gear and rotate, thereby make collecting plate 9 reciprocate along lifter 91 through the screw thread, the highest position that collecting plate 9 removed on lifter 91 flushes the top export of wastrel collection platform 2 basically, the incomplete integrated circuit 55 of taking out that the operating personnel can be convenient concentrate on collecting plate 9, collecting plate 9 is the rubber material, avoid dropping incomplete integrated circuit 55 on it by the secondary damage.
The base 1 is also provided with a blocking mechanism which is positioned on the rotating path of the qualified product collecting table 4, the blocking mechanism comprises a vertical rod 11 and a blocking rod 12, the bottom end of the vertical rod 11 is fixed on the base 1, the top end of the vertical rod is fixedly connected with one end of the blocking rod 12, the other end of the blocking rod 12 vertically stretches into the qualified product collecting table 4, a gap which cannot be passed by an integrated circuit is reserved between the other end of the blocking rod 12 and the bottom wall of the qualified product collecting table 4, the size of the gap is smaller than the size of a dust collecting circuit, when the qualified product collecting table 4 rotates, and the qualified integrated circuit 55 stays on the gap, the blocking rod 12 is located in the moving forward direction of the integrated circuit 55, when the integrated circuit 55 is about to pass through the blocking rod 12, the integrated circuit 55 cannot pass through the gap and can be blocked by the blocking rod 12, the integrated circuit 55 slides with the inner wall of the qualified product collection table 4, the qualified product collection table 4 continuously rotates and does not contact with the blocking rod 12, and the qualified integrated circuit 55 can be concentrated near the blocking rod 12, so that workers standing near the blocking rod 12 can conveniently take the qualified integrated circuit 55 in a concentrated manner, the collection efficiency is improved, the situation that the workers do not timely take the integrated circuit 55 can be avoided, and the integrated circuit 55 occupies the space of the qualified product collection table 4 along with the rotation of the qualified product collection table 4 again.
The implementation principle of the invention is as follows: the integrated circuits 55 are placed on the placing table 51 and fixed through the clamping mechanism 52, the power mechanism 10 is started, the test table 3 and the qualified product collecting table 4 rotate, after the test table 3 rotates twice, each integrated circuit 55 is in contact with the test assembly 6 at different positions for detection, and therefore the overturning motor overturns the placing table 51 according to detection data of each time, and the integrated circuits 55 enter different collecting tables.
Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
The preferred embodiments of the present invention have been described in detail above with reference to the accompanying drawings, but the present invention is not limited to the specific details of the above embodiments, and various equivalent changes can be made to the technical solutions of the present invention within the scope of the technical concept of the present invention, and these equivalent changes all fall within the scope of the present invention.
Claims (8)
1. An integrated circuit test device, includes the base and locates the accredited testing organization on the base, its characterized in that: the base is provided with a defective product collecting table, a test table and a qualified product collecting table, the bottom of the defective product collecting table is fixed on the base, the test table surrounds the outer side of the defective product collecting table in a ring shape and is rotationally connected with the defective product collecting table, the qualified product collecting table surrounds the outer side of the test table in a ring shape and is rotationally connected with the test table, the base is also provided with a power mechanism connected with the test table and the qualified product collecting table, and the power mechanism drives the test table and the qualified product collecting table to rotate;
the testing mechanism comprises a top plate, a lifting assembly and at least six testing assemblies arranged on the top plate, wherein the testing assemblies comprise a transverse plate connected to the top plate and probes fixed on the transverse plate, the probes are contacted with pins of an integrated circuit during detection, the top plate is arranged above the base in parallel, the lifting assembly is connected to the central positions of the top plate and the base, and six testing assemblies are lifted simultaneously when the lifting assembly drives the top plate to lift;
at least six test seats are uniformly distributed on the test table along the annular direction of the test table, the vertical projection positions of the test assembly correspond to the positions of the test seats, and the test seats comprise a placing table and a turnover mechanism for driving the placing table to turn over;
a pressure limiting component is arranged between the test component and the test seat and is used for limiting the pressure value when the test component descends and contacts with the integrated circuit;
after the at least six test assemblies test the first group of data of the corresponding integrated circuits on the test table, the lifting assembly drives the test assemblies to rise, the power mechanism drives the test table to rotate, so that the vertical projection position of the test assemblies corresponds to the position of the next adjacent placement table of the initial corresponding placement table, the lifting assembly drives the test assemblies to descend to perform second detection on the integrated circuits on the placement table until the test assemblies complete three detection on the integrated circuits on the placement table, the at least two test results display the integrated circuits as qualified products, the turnover mechanism drives the placement table to turn towards the direction of the qualified product collection table to enable the qualified integrated circuits to slide into the qualified product collection table, the at least two test results display the integrated circuits as defective products, and the turnover mechanism drives the placement table to turn towards the direction of the defective product collection table to enable the defective integrated circuits to slide into the defective product collection table.
2. An integrated circuit testing apparatus according to claim 1, wherein: the turnover mechanism comprises a turnover motor and a turnover shaft, the turnover motor is arranged on the test bench, the turnover shaft is connected with the placing bench and the test bench, and the turnover motor drives the turnover shaft to rotate so that the placing bench turns over;
and a spring is arranged between the placing table and the test table.
3. An integrated circuit testing apparatus according to claim 1, wherein: the placing table is also provided with a clamping mechanism, and the clamping mechanism is used for limiting the integrated circuit on the placing table;
the clamping mechanism comprises two clamping plates symmetrically arranged about the central line of the placing table and a clamping motor arranged in the placing table, the clamping motor is a double-headed motor, two output ends of the double-headed motor are connected with screw rods, nuts are arranged on the clamping plates and are connected to the screw rods in a threaded fit manner, and the two screw rods rotate simultaneously to enable the two nuts to move in opposite directions;
and an anti-slip protective layer is arranged on one surface of the clamping plate, which is contacted with the integrated circuit.
4. An integrated circuit testing apparatus according to claim 1, wherein: the pressure limiting assembly comprises a contact supporting rod and a pressure sensor, one end of the contact supporting rod is fixed on the transverse plate, the other end of the contact supporting rod contacts the pressure sensor during detection, and the pressure sensor is arranged on the placing table.
5. An integrated circuit testing apparatus according to claim 1, wherein: the power mechanism comprises a first power ring, a second power ring, a power gear and a power motor, wherein the power motor is arranged on the base, and the output end of the power circuit is connected with the power gear;
a plurality of first gear teeth are arranged on the inner ring surface of the first power ring at equal intervals, a plurality of second gear teeth are arranged on the outer ring surface of the second power ring at equal intervals, the power gear is positioned between the first power ring and the second power ring, and the power gear is in meshed connection with the plurality of first gear teeth and the plurality of second gear teeth;
the first power ring is connected with the bottom of the qualified product collection table through a first upright post, and the second power ring is connected with the bottom of the test table through a second upright post;
the first power ring is sleeved outside the second power ring, and the first power ring and the second power ring are both in sliding connection with the base.
6. An integrated circuit testing apparatus according to claim 1, wherein: the lifting assembly comprises a vertical pipe which is concentric with the defective product collecting table and is fixed in the defective product collecting table, a lifting cylinder is arranged in the vertical pipe, and the telescopic end of the lifting cylinder is connected with the top plate;
and a supporting rod is further arranged between the top plate and the vertical pipe, one end of the supporting rod is hinged to the side wall of the vertical pipe, the other end of the supporting rod is hinged to the moving block, and the moving block is in sliding connection with the top plate.
7. An integrated circuit testing apparatus according to claim 6, wherein: the device comprises a vertical pipe, a defective product collecting table, a defective product collecting assembly, a driving assembly and a supporting assembly, wherein the defective product collecting assembly comprises a collecting plate, a lifting pipe and a driving assembly, the lifting pipe surrounds the vertical pipe and is rotationally connected with the vertical pipe, external threads are formed on the surface of the lifting pipe, a through hole is formed in the collecting plate and penetrates through the lifting pipe through the through hole, and internal threads matched with the external threads are formed on the inner wall of the through hole;
the driving assembly is located below the collecting plate and between the inner bottom wall of the defective product collecting table and comprises a driving motor, a main gear is mounted at the output end of the driving motor, the main gear is connected with a pinion in a meshed mode, and the pinion is mounted on the lifting tube.
8. An integrated circuit testing apparatus according to claim 1, wherein: still be equipped with on the base and block the mechanism, it is located on the rotating route of work piece collection platform to block the mechanism, block the mechanism and include montant and stop the pole, the bottom mounting of montant is in on the base, the top with the one end fixed connection of stopping the pole, the other end of stopping the pole stretches into perpendicularly in the work piece collection platform, the other end of stopping the pole with leave the space between the diapire of work piece collection platform, the space is less than dust collecting circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN202311023001.3A CN116727259B (en) | 2023-08-15 | 2023-08-15 | Integrated circuit test equipment |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311023001.3A CN116727259B (en) | 2023-08-15 | 2023-08-15 | Integrated circuit test equipment |
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| CN116727259A true CN116727259A (en) | 2023-09-12 |
| CN116727259B CN116727259B (en) | 2023-10-24 |
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| JP2003142540A (en) * | 2001-11-07 | 2003-05-16 | Sony Corp | Inspection method of semiconductor integrated circuit |
| CN214812813U (en) * | 2021-06-08 | 2021-11-23 | 深圳市英赛尔电子有限公司 | Testing device for rotating disc type integrated circuit packaging part |
| CN217158118U (en) * | 2022-04-27 | 2022-08-09 | 辇芯(天津)科技有限公司 | Chip testing platform |
| CN217222506U (en) * | 2022-05-24 | 2022-08-19 | 云南经济管理学院 | Electric performance test tool for circuit board of intelligent electric energy meter |
| CN116008763A (en) * | 2022-12-14 | 2023-04-25 | 弘润半导体(苏州)有限公司 | Test seat for semiconductor device |
| CN116493516A (en) * | 2023-06-28 | 2023-07-28 | 弘润半导体(苏州)有限公司 | Integrated circuit pin inspection correcting device |
| CN219513050U (en) * | 2022-12-24 | 2023-08-11 | 弘润半导体(苏州)有限公司 | Semiconductor device testing device |
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2023
- 2023-08-15 CN CN202311023001.3A patent/CN116727259B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
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| JP2003142540A (en) * | 2001-11-07 | 2003-05-16 | Sony Corp | Inspection method of semiconductor integrated circuit |
| CN214812813U (en) * | 2021-06-08 | 2021-11-23 | 深圳市英赛尔电子有限公司 | Testing device for rotating disc type integrated circuit packaging part |
| CN217158118U (en) * | 2022-04-27 | 2022-08-09 | 辇芯(天津)科技有限公司 | Chip testing platform |
| CN217222506U (en) * | 2022-05-24 | 2022-08-19 | 云南经济管理学院 | Electric performance test tool for circuit board of intelligent electric energy meter |
| CN116008763A (en) * | 2022-12-14 | 2023-04-25 | 弘润半导体(苏州)有限公司 | Test seat for semiconductor device |
| CN219513050U (en) * | 2022-12-24 | 2023-08-11 | 弘润半导体(苏州)有限公司 | Semiconductor device testing device |
| CN116493516A (en) * | 2023-06-28 | 2023-07-28 | 弘润半导体(苏州)有限公司 | Integrated circuit pin inspection correcting device |
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| CN116727259B (en) | 2023-10-24 |
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