CN219625268U - Integrated circuit package testing device - Google Patents

Abstract

The utility model discloses an integrated circuit packaging testing device which comprises a testing table and an L-shaped frame, wherein the vertical edge of the L-shaped frame is arranged at the center of one side of the top of the testing table, an integrated circuit testing mechanism is arranged on the transverse edge of the L-shaped frame, a turntable is horizontally rotated at the center of the top of the testing table, one end of the top of the turntable is provided with an integrated circuit clamping mechanism, a vertical groove is vertically formed in the center of the vertical edge of the L-shaped frame, and a reciprocating rotating mechanism for reciprocally rotating a disc is arranged on the L-shaped frame. According to the utility model, through the arrangement of the turntable and the first gear, the clamping seat is rotated out to be conveniently placed when the integrated circuit is placed, and the clamping seat with the integrated circuit is rotated to the lower part of the pin test board when needed, so that the pin test board and the turntable rotate synchronously without distribution operation, and the use efficiency is improved.

Description

Integrated circuit package testing device

Technical Field

The present utility model relates to the field of testing technologies, and in particular, to an integrated circuit package testing device.

Background

The integrated circuit is a miniature electronic device or component, and is made up by adopting a certain technological process, and making the elements of transistor, resistor, capacitor and inductor and wiring required in a circuit be interconnected together, and made into a small block or several small blocks of semiconductor wafer or dielectric substrate, then packaged in a tube shell so as to obtain the invented miniature structure with the required circuit function.

In the existing integrated circuit package testing device, the placement (clamping seat) of the integrated circuit is located below the testing mechanism, and the integrated circuit is not easy to be placed on the clamping seat due to the obstruction of the testing mechanism, and the lowest point limit function of the pin testing board is not needed when the integrated circuit is tested, so that the situation of crushing the integrated circuit is easy to occur, and therefore, the need for redesigning the integrated circuit package testing device is urgent, so that the problems are solved.

Disclosure of Invention

The utility model aims to solve the defects in the prior art and provides an integrated circuit package testing device.

In order to achieve the above purpose, the present utility model adopts the following technical scheme:

an integrated circuit package testing apparatus, comprising:

a test bench;

the L-shaped frame is arranged at the center of one side of the top of the test bench, an integrated circuit test mechanism is arranged on the transverse edge of the L-shaped frame, the center of the top of the test bench horizontally rotates to form a turntable, one end of the top of the turntable is provided with an integrated circuit clamping mechanism, a vertical groove is vertically formed in the center of the vertical edge of the L-shaped frame, and a reciprocating rotating mechanism for reciprocally rotating the turntable is arranged on the L-shaped frame.

As a further aspect of the present utility model, the integrated circuit testing mechanism includes: the pin test board, the pin test board level sets up in L type frame horizontal limit below, and the vertical electric telescopic handle that installs in L type frame horizontal limit top, electric telescopic handle's output shaft installs in pin test board top center department.

As a further aspect of the present utility model, the integrated circuit clamping mechanism includes: the clamping seat and the sliding plate, clamping seat horizontal installation is in carousel top one end, and clamping seat top both ends all slide there is splint, bar notch has been seted up to clamping seat top level.

As a further technical scheme of the utility model, the two sliding plates are respectively slid at two ends of the inner part of the clamping seat, the tops of the sliding plates are respectively provided with the convex columns, and the two convex columns respectively penetrate through the strip-shaped notch and are respectively arranged at the bottoms of the two clamping plates.

As a further technical scheme of the utility model, a screw rod horizontally rotates in the clamping seat, the surface of the screw rod is connected in the two sliding plates through threads, the screw rod is connected with the two sliding plates in opposite directions, a driving motor is horizontally arranged on one side of the clamping seat, and an output shaft of the driving motor is arranged at the center of one end of the screw rod.

As a further aspect of the present utility model, the reciprocating rotation mechanism includes: the first gear rotates on one side of the test board, a rack is vertically arranged on one side of the vertical edge of the L-shaped frame, a rack part is provided with teeth, an L-shaped plate is arranged on one side of the rack, and the other end of the L-shaped plate penetrates through the vertical groove and is arranged on one side of the pin test board.

As a further technical scheme of the utility model, a first bevel gear and a second bevel gear are rotated at the bottom of the test bench and meshed with each other, the first bevel gear is rotated at the center of the bottom of the test bench and is fixedly connected with the turntable through a rotating shaft, the same rotating rod is horizontally arranged on the opposite side surfaces of the second bevel gear and the first bevel gear, a limiting block is arranged at the bottom of the test bench, and the surface of the rotating rod is rotated inside the limiting block.

The beneficial effects of the utility model are as follows:

1. this integrated circuit encapsulation testing arrangement, through the setting of grip slipper and splint, can fix integrated circuit before testing integrated circuit, guaranteed the stability when testing integrated circuit, at first place integrated circuit in the grip slipper top and lie in between two splint, drive the lead screw through driving motor and rotate, the lead screw rotates and can drive two splint synchronous movement to can carry out the centre gripping to integrated circuit, guaranteed the stability when testing.

2. This integrated circuit encapsulation testing arrangement, through the setting of carousel and first gear, can make to placing integrated circuit when, the grip slipper rolls out and conveniently places, the grip slipper that has integrated circuit rotates to pin test board below again when needs, the rotation of pin test board and carousel is synchronous to be carried out and need not the distribution operation, the efficiency of using has been improved, after fixing integrated circuit, drive pin test board through electric telescopic handle and remove, pin test board removes and can drive L template and remove, L template removes and can drive the rack and remove, the rack removes and can drive first gear rotation, first gear rotation can drive bull stick and second bevel gear rotation, second bevel gear rotation can drive first bevel gear and carousel rotation, thereby can rotate the grip slipper that has installed integrated circuit and need the position of test, and then the staff has placed integrated circuit conveniently, the convenience of using has been improved.

Drawings

FIG. 1 is a schematic diagram of an integrated circuit package testing apparatus according to the present utility model;

FIG. 2 is a schematic diagram showing a rear view of an integrated circuit package testing device according to the present utility model;

FIG. 3 is a schematic diagram showing a bottom view of an integrated circuit package testing device according to the present utility model;

fig. 4 is a schematic cross-sectional structure diagram of a clamping seat of an integrated circuit package testing device according to the present utility model.

In the figure: 1. a test bench; 2. a turntable; 3. an L-shaped frame; 4. a pin test board; 5. an electric telescopic rod; 6. a vertical groove; 7. a clamping seat; 8. a clamping plate; 9. an L-shaped plate; 10. a rack; 11. a first gear; 12. a driving motor; 13. a first bevel gear; 14. a second bevel gear; 15. a rotating rod; 16. a limiting block; 17. a screw rod; 18. and (3) a sliding plate.

Detailed Description

The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments.

It should be noted that, without conflict, the embodiments of the present utility model and features of the embodiments may be combined with each other. The utility model will be described in detail below with reference to the drawings in connection with embodiments.

Referring to fig. 1-4, an integrated circuit package testing apparatus, comprising: the test bench 1 and the L type frame 3, the perpendicular limit of L type frame 3 is installed in test bench 1 top one side center department, and the horizontal edge of L type frame 3 is equipped with integrated circuit testing mechanism, and test bench 1 top center department level rotation has carousel 2, and carousel 2 top one end is equipped with integrated circuit clamping mechanism, the perpendicular groove 6 of having seted up in the perpendicular limit center department of L type frame 3, and be equipped with the reciprocal rotary mechanism who is used for reciprocal rotation disc 2 on the L type frame 3, through the setting of this equipment, can conveniently place integrated circuit on grip slipper 7, avoided having the hindrance object to hinder, inconvenient condition emergence of placing.

Referring to fig. 1 and 2, in a preferred embodiment, an integrated circuit testing mechanism includes: the pin test board 4, pin test board 4 level sets up in the horizontal limit below of L type frame 3, and the vertical electric telescopic handle 5 of installing in pin test board 4 top center department of L type frame 3 horizontal limit top, and through integrated circuit testing mechanism's setting, can detect the integrated circuit pin when down moving to pin test board 4, when the pin is defective, the pin can remove to only need observe the pin and have the displacement to accomplish the test.

Referring to fig. 4 and 3, in a preferred embodiment, the integrated circuit clamping mechanism comprises: clamping seat 7 and slide 18, clamping seat 7 horizontal installation is in carousel 2 top one end, and clamping seat 7 top both ends all slide and have splint 8, bar notch has been seted up to clamping seat 7 top level, slide 18 has two and slides respectively in clamping seat 7 inside both ends, and the projection is all installed at slide 18 top, two projections all pass bar notch and install respectively in two splint 8 bottoms, the inside horizontal rotation of clamping seat 7 has lead screw 17, and the lead screw 17 surface passes through threaded connection in two slide 18 inside, the screw 17 connects the screw opposite direction of two slide 18, and clamping seat 7 one side horizontal installation has driving motor 12, driving motor 12's output shaft is installed in lead screw 17 one end center department, through integrated circuit clamping mechanism's setting, can press from both sides tightly integrated circuit, stability when testing and test's accuracy have been guaranteed.

Referring to fig. 2 and 3, in a preferred embodiment, the reciprocating rotary mechanism includes: the first gear 11, first gear 11 rotates in test bench 1 one side, L type frame 3 erects limit one side vertical setting up rack 10, and rack 10 part has the tooth, L template 9 is installed to rack 10 one side, and the L template 9 other end passes perpendicular groove 6 and installs in pin test board 4 one side, test bench 1 bottom rotates there is first bevel gear 13 and second bevel gear 14 and intermeshing, and first bevel gear 13 rotates in test bench 1 bottom center department and passes through pivot fixed connection with carousel 2, same bull stick 15 is installed to second bevel gear 14 and first gear 11 opposite side level, and the stopper 16 is installed to test bench 1 bottom, bull stick 15 surface rotates in stopper 16 inside, through reciprocating rotating mechanism's setting, pin test board 4 and carousel 2 link when, convenient synchronous operation has avoided the condition that the distribution operation reduces efficiency to take place.

From the above description, it can be seen that the above embodiments of the present utility model achieve the following technical effects: firstly, the integrated circuit is placed at the top of the clamping seat 7 and is positioned between the two clamping plates 8, the driving motor 12 drives the screw rod 17 to rotate, the screw rod 17 rotates to drive the two clamping plates 8 to synchronously move, so that the integrated circuit can be clamped, after the integrated circuit is fixed, the pin testing plate 4 is driven to move through the electric telescopic rod 5, the pin testing plate 4 can drive the L-shaped plate 9 to move, the L-shaped plate 9 can drive the rack 10 to move, the rack 10 can drive the first gear 11 to rotate, the first gear 11 rotates to drive the rotating rod and the second bevel gear 14 to rotate, the second bevel gear 14 rotates to drive the first bevel gear 13 and the rotating disc 2 to rotate the clamping seat 7 with the integrated circuit is arranged, the integrated circuit can be conveniently placed by a worker, the convenience of use is improved, pins of the integrated circuit can be detected when the pins are in a defect state, and the test can be completed only by observing whether the pins are shifted or not.

The above description is only of the preferred embodiments of the present utility model and is not intended to limit the present utility model, but various modifications and variations can be made to the present utility model by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present utility model should be included in the protection scope of the present utility model.

Claims (7)

1. An integrated circuit package testing apparatus, comprising:

a test bench (1);

the testing device comprises an L-shaped frame (3), wherein the vertical edge of the L-shaped frame (3) is arranged at the center of one side of the top of a testing table (1), an integrated circuit testing mechanism is arranged on the transverse edge of the L-shaped frame (3), a turntable (2) horizontally rotates at the center of the top of the testing table (1), an integrated circuit clamping mechanism is arranged at one end of the top of the turntable (2), a vertical groove (6) is vertically formed in the center of the vertical edge of the L-shaped frame (3), and a reciprocating rotating mechanism for reciprocally rotating the turntable (2) is arranged on the L-shaped frame (3).

2. The integrated circuit package testing apparatus of claim 1, wherein the integrated circuit testing mechanism comprises: the pin test board (4), pin test board (4) level sets up in L type frame (3) horizontal limit below, and electric telescopic handle (5) are vertically installed at L type frame (3) horizontal limit top, electric telescopic handle (5) output shaft installs in pin test board (4) top center department.

3. The integrated circuit package testing apparatus of claim 2, wherein the integrated circuit clamping mechanism comprises: clamping seat (7) and slide (18), clamping seat (7) horizontal installation is in carousel (2) top one end, and clamping seat (7) top both ends all slide have splint (8), bar notch has been seted up to clamping seat (7) top level.

4. An integrated circuit package testing device according to claim 3, wherein the sliding plate (18) has two sliding plates respectively sliding at two ends inside the clamping seat (7), and the top of the sliding plate (18) is provided with two protruding columns, and the two protruding columns respectively pass through the strip-shaped notch and are respectively arranged at the bottoms of the two clamping plates (8).

5. The integrated circuit package testing device according to claim 4, wherein the inside of the clamping seat (7) horizontally rotates with a screw rod (17), the surface of the screw rod (17) is connected to the inside of the two sliding plates (18) through threads, the screw threads of the screw rod (17) connected with the two sliding plates (18) are opposite in direction, a driving motor (12) is horizontally arranged on one side of the clamping seat (7), and an output shaft of the driving motor (12) is arranged at the center of one end of the screw rod (17).

6. The integrated circuit package testing apparatus of claim 5, wherein the reciprocating rotary mechanism comprises: the test board comprises a first gear (11), wherein the first gear (11) rotates on one side of a test board (1), a rack (10) is vertically arranged on one side of a vertical edge of an L-shaped frame (3), a part of the rack (10) is provided with teeth, an L-shaped board (9) is arranged on one side of the rack (10), and the other end of the L-shaped board (9) penetrates through a vertical groove (6) and is arranged on one side of a pin test board (4).

7. The integrated circuit package testing device according to claim 6, wherein the first bevel gear (13) and the second bevel gear (14) are rotated at the bottom of the testing table (1) and meshed with each other, the first bevel gear (13) is rotated at the center of the bottom of the testing table (1) and is fixedly connected with the turntable (2) through a rotating shaft, the same rotating rod (15) is horizontally arranged on opposite side surfaces of the second bevel gear (14) and the first bevel gear (11), a limiting block (16) is arranged at the bottom of the testing table (1), and the surface of the rotating rod (15) is rotated inside the limiting block (16).