CN217879515U

CN217879515U - Flash tester for IC chip

Info

Publication number: CN217879515U
Application number: CN202221530371.7U
Authority: CN
Inventors: 黄家国
Original assignee: Jiadechuan Technology Shenzhen Co ltd
Current assignee: Jiadechuan Technology Shenzhen Co ltd
Priority date: 2022-06-20
Filing date: 2022-06-20
Publication date: 2022-11-22
Anticipated expiration: 2032-06-20

Abstract

The utility model discloses a quick-flashing test machine for IC chip, including testboard and support, the testboard level sets up in the support top, and the inside slip of support has rectangular plate and level to set up, the vertical spliced pole of installing in rectangular plate top, and the spliced pole top passes the support top and install in testboard bottom center department, the inside elevating system who is used for going up and down the rectangular plate that is equipped with of support, and the testboard top rotates has hollow piece, hollow piece has a plurality ofly and is sharp evenly distributed in testboard top, the inside slewing mechanism who is used for rotating a plurality of hollow pieces that is equipped with of testboard, and all be equipped with IC chip fixed establishment on every hollow piece. The utility model discloses a setting of support can highly adjusting the testboard, makes its height that can adapt to different staff when the test to this test equipment's application scope has been improved.

Description

Flash tester for IC chip

Technical Field

The utility model relates to a IC chip test technical field especially relates to IC chip quickflashing test machine.

Background

An IC chip is a chip formed by placing an integrated circuit formed by a large number of microelectronic components (transistors, resistors, capacitors, etc.) on a plastic substrate. The IC chip comprises a wafer chip and a packaging chip, a corresponding IC chip production line consists of a wafer production line and a packaging production line, and the IC chip needs to use test equipment in production.

If the authorization notice number is CN 212722968U, the disclosed testing device for the IC chip can adjust the height of the tester main body and the height of the working table top by passing through the arranged height-adjusting frame, is suitable for operators with different heights to test, relieves the problem that the neck is sore when the operators roll down for a long time, but does not have the function of adjusting the orientation of the chip during testing, leads to manual turning, and reduces the efficiency of chip testing.

SUMMERY OF THE UTILITY MODEL

The utility model aims at solving the defects existing in the prior art and providing a flash tester for IC chips.

In order to achieve the above purpose, the utility model adopts the following technical scheme:

the IC chip flash testing machine comprises a testing table and a support, wherein the testing table is horizontally arranged above the support, a rectangular plate is arranged inside the support in a sliding mode, a connecting column is vertically arranged at the top of the rectangular plate, the top of the connecting column penetrates through the top of the support and is arranged in the center of the bottom of the testing table, a lifting mechanism used for lifting the rectangular plate is arranged inside the support, a plurality of hollow blocks are rotated at the top of the testing table and are uniformly distributed at the top of the testing table in a straight line mode, a rotating mechanism used for rotating the hollow blocks is arranged inside the testing table, and an IC chip fixing mechanism is arranged on each hollow block.

As a further scheme of the utility model, IC chip fixed establishment includes splint, and splint have two and slide respectively in hollow piece top both ends, the bar notch has been seted up to hollow piece top level, and the inside level of hollow piece rotates and has the lead screw, the inside both ends of hollow piece all slide and have the bar board, and the lead screw surface passes through threaded connection inside two bar boards, the screw thread opposite direction of two bar boards of lead screw connection, and the inside one side horizontal installation of hollow piece has the motor, the output shaft of motor is installed in lead screw one end center department, and two bar board tops all are fixed with the lug, and two other both ends of lug all pass the bar notch and install respectively in two splint bottoms.

Preferably, slewing mechanism includes first gear, and first gear revolve inside the testboard, first gear has a plurality ofly and is sharp evenly distributed, and every hollow block bottom center department is equal vertical be fixed with the bull stick, every the bull stick end all rotates bottom in the testboard, and is a plurality of first gear cup joints respectively in a plurality of bull stick surfaces and fixed, and the inside horizontal slip of testboard has rack and a plurality of first gear engagement, rack one side horizontal fixation has the connecting plate, and the inside one side horizontal mounting of testboard has electric telescopic handle, electric telescopic handle's output shaft is installed in connecting plate one side, the inside stop gear who is used for spacing connecting plate that is equipped with of testboard.

Furthermore, elevating system includes framework and driving motor, and the framework slides inside the support, the framework top is installed in rectangular plate bottom center department, and the vertical rotation of bottom has the lead screw in the support, the lead screw surface passes through threaded connection inside the framework base.

As a further scheme of the utility model, driving motor horizontal installation is in support one side, and the inside rotation of support has first bevel gear and second bevel gear and intermeshing, first bevel gear cup joints in the lead screw surface and fixed, and driving motor's output shaft installs in second bevel gear one side center department.

Preferably, the limiting mechanism comprises a limiting column, the limiting column is horizontally and fixedly connected inside the test board, and the surface of the limiting column slides inside the connecting plate.

Furthermore, the limiting mechanism comprises a slide way, the slide way is horizontally arranged at the bottom in the test board, a slide block slides in the slide way, and the top of the slide block is arranged at the bottom of the connecting plate.

The utility model has the advantages that:

IC chip quickflashing test machine, setting through the support, can adjust the height of testboard, make it can adapt to different staff's height when the test, thereby the application scope of this test equipment has been improved, drive second bevel gear through driving motor and rotate, second bevel gear rotates and can drive first bevel gear and rotate, first bevel gear rotates and can drive the lead screw and rotate, the lead screw rotates and can drive the framework and go up and down, the framework goes up and down and can drive the rectangular plate and go up and down, the rectangular plate goes up and down and can drive the spliced pole and go up and down, the spliced pole goes up and down and can drive the testboard and go up and down, further can adjust the height of testboard, and then the practicality of this equipment has been improved.

IC chip quickflashing test machine, setting through splint, can fix the IC chip of awaiting measuring, the setting of rethread testboard, can transfer to the IC chip by fixing, the condition of artifical manual turn to the waste time takes place, place the IC chip at hollow piece top at first, it rotates to drive the lead screw through the motor, the lead screw rotates and to drive two bar shaped plate removals, two bar shaped plate removals can drive two splint removals, thereby can fix the IC chip, the condition that the IC chip dropped when transferring to has been avoided takes place, drive the connecting plate through electric telescopic handle and remove in addition, and through the setting of spacing post, the stability of connecting plate removal has been guaranteed, the connecting plate removes and can drive the rack and remove, the rack removes and can drive a plurality of first gear revolve, a plurality of first gear revolve can drive a plurality of bull stick rotations, a plurality of bull stick rotations can drive a plurality of hollow piece rotations, thereby can carry out collective transfer to fixed IC chip, and then improved the efficiency of testing to the IC chip.

Drawings

Fig. 1 is a schematic structural diagram of an IC chip flash tester according to embodiment 1 of the present invention;

fig. 2 is a schematic view of the inside of a support of an IC chip flash tester according to embodiment 1 of the present invention;

fig. 3 is a cross-sectional view of a hollow block of an IC chip flash tester according to embodiment 1 of the present invention;

fig. 4 is a cross-sectional view of a test bed of an IC chip flash test machine according to embodiment 1 of the present invention;

fig. 5 is a schematic cross-sectional view of an IC chip flash tester according to embodiment 2 of the present invention.

In the figure: 1. a support; 2. a test bench; 3. a hollow block; 4. a splint; 5. a strip-shaped notch; 6. a drive motor; 7. connecting columns; 8. a rectangular plate; 9. a frame body; 10. a screw rod; 11. a first bevel gear; 12. a second bevel gear; 13. a strip-shaped plate; 14. a lead screw; 15. a motor; 16. a first gear; 17. a rack; 18. a connecting plate; 19. an electric telescopic rod; 20. a limiting post; 21. a slideway; 22. a slider; 23. and (4) rotating the rod.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments.

Example 1

Referring to fig. 1-4, the IC chip flash test machine comprises a test board 2 and a support 1, wherein the test board 2 is horizontally arranged above the support 1, a rectangular plate 8 is arranged inside the support 1 in a sliding mode and is horizontally arranged, a connecting column 7 is vertically arranged at the top of the rectangular plate 8, the top of the connecting column 7 penetrates through the top of the support 1 and is arranged at the center of the bottom of the test board 2, a lifting mechanism used for lifting the rectangular plate 8 is arranged inside the support 1, a plurality of hollow blocks 3 are arranged at the top of the test board 2 in a rotating mode and are uniformly distributed at the top of the test board 2 in a straight line mode, a rotating mechanism used for rotating the plurality of hollow blocks 3 is arranged inside the test board 2, an IC chip fixing mechanism is arranged on each hollow block 3, and the IC chip can be collectively steered through the arrangement of the IC chip flash test machine, and the test efficiency is improved.

Referring to fig. 1 and 3, in a preferred embodiment, the IC chip fixing mechanism includes clamp plates 4, and clamp plates 4 have two and slide respectively in 3 top both ends of hollow block, bar notch 5 has been seted up to 3 top levels of hollow block, and 3 inside levels of hollow block rotate there is

lead screw

14, 3 inside both ends of hollow block all slide bar 13, and lead screw 14 surface passes through threaded connection inside two bar 13, lead screw 14 connects the opposite direction of the screw thread of two

bar

13, and 3 inside one side horizontal installations have motor 15 in hollow block, the output shaft of motor 15 is installed in 14 one end center departments of lead screw, and two bar 13 tops all are fixed with the lug, two other both ends of lug all pass bar notch 5 and install respectively in two splint 4 bottoms, through the setting of IC chip fixing mechanism, be used for fixing the IC chip, have avoided dropping when the test or the direction modulation.

Referring to fig. 4, in a preferred embodiment, the rotating mechanism includes a plurality of first gears 16, the first gears 16 rotate inside the test board 2, the first gears 16 are uniformly distributed in a straight line, a rotating rod 23 is vertically fixed at the center of the bottom of each hollow block 3, the tail end of each rotating rod 23 rotates at the bottom of the test board 2, the plurality of first gears 16 are respectively sleeved on the surfaces of the plurality of rotating rods 23 and are fixed, a rack 17 is horizontally slid inside the test board 2 and is engaged with the plurality of first gears 16, a connecting plate 18 is horizontally fixed on one side of the rack 17, an electric telescopic rod 19 is horizontally installed on one side inside the test board 2, an output shaft of the electric telescopic rod 19 is installed on one side of the connecting plate 18, a limiting mechanism for limiting the connecting plate 18 is arranged inside the test board 2, and the hollow board 3 and the IC chip fixed by the rotating mechanism are driven to rotate and turn.

Referring to fig. 1 and 2, in a preferred embodiment, the lifting mechanism includes a frame 9 and a driving motor 6, the frame 9 slides inside the support 1, the top of the frame 9 is installed at the center of the bottom of the rectangular plate 8, a screw rod 10 vertically rotates at the bottom inside the support 1, the surface of the screw rod 10 is connected inside the bottom edge of the frame 9 through a thread, the driving motor 6 is horizontally installed at one side of the support 1, a first bevel gear 11 and a second bevel gear 12 rotate inside the support 1 and are engaged with each other, the first bevel gear 11 is sleeved on the surface of the screw rod 10 and is fixed, and the output shaft of the driving motor 6 is installed at the center of one side of the second bevel gear 12, and through the setting of the lifting mechanism, the lifting mechanism is used for adjusting the height of the test bench 2, so that the lifting mechanism can be adapted to different operators.

In this embodiment, the limiting mechanism includes a limiting post 20, the limiting post 20 is horizontally and fixedly connected to the inside of the testing platform 2, and the surface of the limiting post 20 slides inside the connecting plate 18.

The working principle of the embodiment is as follows: when in actual use, the height of the test bench 2 can be adjusted through the arrangement of the support 1, so that the test bench can adapt to the heights of different workers during testing, thereby improving the application range of the test equipment, driving the second bevel gear 12 to rotate by the driving motor 6, driving the first bevel gear 11 to rotate by the rotation of the second bevel gear 12, driving the screw rod 10 to rotate by the rotation of the first bevel gear 11, driving the frame body 9 to lift by the rotation of the screw rod 10, driving the rectangular plate 8 to lift by the lifting of the frame body 9, driving the connecting column 7 to lift by the lifting of the rectangular plate 8, driving the test board 2 to lift by the lifting of the connecting column 7, further adjusting the height of the test board 2, thereby improving the practicability of the device, the IC chip to be tested can be fixed through the arrangement of the clamping plate 4, and then through the arrangement of the test bench 2, the fixed IC chip can be adjusted in direction, the situation that manual steering wastes time is avoided, the IC chip is firstly placed at the top of the hollow block 3, the motor 15 drives the screw 14 to rotate, the rotation of the screw 14 drives the two strip-shaped plates 13 to move, the movement of the two strip-shaped plates 13 drives the two clamping plates 4 to move, thereby fixing the IC chip, avoiding the falling of the IC chip during direction adjustment, in addition, the connecting plate 18 is driven to move by the electric telescopic rod 19, and the stability of the movement of the connecting plate 18 is ensured by the arrangement of the limiting column 20, the movement of the connecting plate 18 can drive the rack 17 to move, the movement of the rack 17 can drive the plurality of first gears 16 to rotate, the rotation of the plurality of first gears 16 can drive the plurality of rotating rods 23 to rotate, the rotation of the plurality of rotating rods 3 can drive the plurality of hollow blocks 3 to rotate, therefore, the fixed IC chip can be collectively adjusted in direction, and the efficiency of testing the IC chip is further improved.

Example 2

Referring to fig. 1-4, an IC chip flash test machine comprises a test board 2 and a support 1, wherein the test board 2 is horizontally arranged above the support 1, a rectangular plate 8 is arranged inside the support 1 in a sliding mode and is horizontally arranged, a connecting column 7 is vertically arranged at the top of the rectangular plate 8, the top of the connecting column 7 penetrates through the top of the support 1 and is arranged at the center of the bottom of the test board 2, a lifting mechanism used for lifting the rectangular plate 8 is arranged inside the support 1, a hollow block 3 is rotated at the top of the test board 2, the hollow blocks 3 are uniformly distributed at the top of the test board 2 in a straight line mode, a rotating mechanism used for rotating the hollow blocks 3 is arranged inside the test board 2, an IC chip fixing mechanism is arranged on each hollow block 3, and the IC chip can be collectively steered through the arrangement of the IC chip flash test machine, and the test efficiency is improved.

Referring to fig. 1 and 3, in a preferred embodiment, the IC chip fixing mechanism includes clamp plates 4, and clamp plates 4 have two and slide respectively in 3 top both ends of hollow block, bar notch 5 has been seted up to 3 top levels of hollow block, and 3 inside levels of hollow block rotate has

lead screw

14, 3 inside both ends of hollow block all slide and have bar slab 13, and lead screw 14 surface passes through threaded connection inside two bar slabs 13, lead screw 14 connects the opposite direction of the screw thread of two

bar slabs

13, and 3 inside one side horizontal mounting of hollow block has motor 15, the output shaft of motor 15 is installed in 14 one end center departments of lead screw, and two bar slab 13 tops all are fixed with the lug, two other lug both ends all pass bar notch 5 and install respectively in two splint 4 bottoms, through the setting of IC chip fixing mechanism, be used for fixing the IC chip, the dropping when testing or direction adjustment has been avoided.

Referring to fig. 4, in a preferred embodiment, the rotating mechanism includes a plurality of first gears 16, the first gears 16 rotate inside the test platform 2, the first gears 16 are uniformly distributed in a straight line, a rotating rod 23 is vertically fixed at the center of the bottom of each hollow block 3, the end of each rotating rod 23 rotates at the bottom of the test platform 2, the plurality of first gears 16 are respectively sleeved on the surfaces of the plurality of rotating rods 23 and are fixed, a rack 17 is horizontally slid inside the test platform 2 and is engaged with the plurality of first gears 16, a connecting plate 18 is horizontally fixed on one side of the rack 17, an electric telescopic rod 19 is horizontally installed on one side of the inside of the test platform 2, an output shaft of the electric telescopic rod 19 is installed on one side of the connecting plate 18, a limiting mechanism for limiting the connecting plate 18 is arranged inside the test platform 2, and the hollow plate 3 and the IC chip fixed by the rotating mechanism are driven to rotate and turn.

Referring to fig. 1 and 2, in a preferred embodiment, the lifting mechanism includes a frame 9 and a driving motor 6, and the frame 9 slides inside the support 1, the top of the frame 9 is installed at the center of the bottom of the rectangular plate 8, and a lead screw 10 vertically rotates at the bottom of the support 1, the surface of the lead screw 10 is connected inside the bottom edge of the frame 9 through a thread, the driving motor 6 is horizontally installed at one side of the support 1, and a first bevel gear 11 and a second bevel gear 12 rotate inside the support 1 and are engaged with each other, the first bevel gear 11 is sleeved on the surface of the lead screw 10 and is fixed, and an output shaft of the driving motor 6 is installed at the center of one side of the second bevel gear 12, and through the setting of the lifting mechanism, the lifting mechanism is used for adjusting the height of the test bench 2, so that the lifting mechanism can be adapted to different operators.

Referring to fig. 5, in the present embodiment, the limiting mechanism includes a slide rail 21, the slide rail 21 is horizontally installed at the bottom inside the test platform 2, a slide block 22 slides inside the slide rail 21, and the top of the slide block 22 is installed at the bottom of the connecting plate 18.

The working principle of the embodiment is as follows: when in actual use, through the setting of slide 21 and slider 20, the stability that connecting plate 18 removed has been guaranteed, connecting plate 18 removes and can drive rack 17 and remove, rack 17 removes and can drive a plurality of first gears 16 and rotate, a plurality of first gears 16 rotate and can drive a plurality of bull stick 23 and rotate, a plurality of bull sticks 3 rotate and can drive a plurality of hollow block 3 and rotate, thereby can carry out the collective accent to fixed IC chip to the efficiency of IC chip test has then been improved.

Having shown and described the basic principles and essential features of the invention and advantages thereof, it will be apparent to those skilled in the art that the invention is not limited to the details of the foregoing exemplary embodiments, but is capable of other specific forms without departing from the spirit or essential characteristics thereof, and it is therefore intended that the embodiments be considered as exemplary and not limiting in any way, since the scope of the invention is defined by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein and are therefore not to be embraced therein by any reference numerals in the claims.

Furthermore, it should be understood that although the present description refers to embodiments, not every embodiment may contain only a single embodiment, and such description is for clarity only, and those skilled in the art should integrate the description, and the embodiments may be combined as appropriate to form other embodiments understood by those skilled in the art.

Claims

The IC chip flash testing machine comprises a testing platform (2) and a support (1), and is characterized in that the testing platform (2) is horizontally arranged above the support (1), a rectangular plate (8) is arranged inside the support (1) in a sliding mode and horizontally arranged, a connecting column (7) is vertically arranged at the top of the rectangular plate (8), the top of the connecting column (7) penetrates through the top of the support (1) and is arranged at the center of the bottom of the testing platform (2), a lifting mechanism used for lifting the rectangular plate (8) is arranged inside the support (1), a hollow block (3) is rotated at the top of the testing platform (2), a plurality of hollow blocks (3) are uniformly distributed at the top of the testing platform (2) in a straight line mode, a rotating mechanism used for rotating the plurality of hollow blocks (3) is arranged inside the testing platform (2), and an IC chip fixing mechanism is arranged on each hollow block (3).
2. The IC chip flash testing machine according to claim 1, wherein the IC chip fixing mechanism comprises two clamping plates (4), the two clamping plates (4) slide on two ends of the top of the hollow block (3) respectively, a strip-shaped notch (5) is horizontally formed in the top of the hollow block (3), a lead screw (14) horizontally rotates inside the hollow block (3), strip-shaped plates (13) slide on two ends of the inside of the hollow block (3), the surface of the lead screw (14) is connected inside the two strip-shaped plates (13) through threads, the thread directions of the lead screw (14) connecting the two strip-shaped plates (13) are opposite, a motor (15) is horizontally installed on one side of the inside of the hollow block (3), an output shaft of the motor (15) is installed at the center of one end of the lead screw (14), convex blocks are fixed on the tops of the two strip-shaped plates (13), and the other two ends of the two convex blocks pass through the strip-shaped notch (5) and are installed at the bottoms of the two clamping plates (4) respectively.
3. The IC chip flash testing machine according to claim 2, wherein the rotating mechanism comprises a first gear (16), the first gear (16) rotates inside the testing platform (2), the first gear (16) is provided with a plurality of gears which are uniformly distributed in a straight line, a rotating rod (23) is vertically fixed at the center of the bottom of each hollow block (3), the tail end of each rotating rod (23) rotates at the bottom inside the testing platform (2), the plurality of first gears (16) are respectively sleeved and fixed on the surfaces of the plurality of rotating rods (23), a rack (17) horizontally slides inside the testing platform (2) and is meshed with the plurality of first gears (16), a connecting plate (18) is horizontally fixed on one side of the rack (17), an electric telescopic rod (19) is horizontally installed on one side of the testing platform (2), an output shaft of the electric telescopic rod (19) is installed on one side of the connecting plate (18), and a limiting mechanism for limiting the connecting plate (18) is arranged inside the testing platform (2).
4. The IC chip flash tester according to claim 3, wherein the lifting mechanism comprises a frame (9) and a driving motor (6), the frame (9) slides inside the support (1), the top of the frame (9) is installed at the center of the bottom of the rectangular plate (8), a lead screw (10) vertically rotates at the bottom inside the support (1), and the surface of the lead screw (10) is connected inside the bottom of the frame (9) through a thread.
5. The IC chip flash tester according to claim 4, wherein the driving motor (6) is horizontally installed at one side of the support (1), a first bevel gear (11) and a second bevel gear (12) are rotated inside the support (1) and are engaged with each other, the first bevel gear (11) is sleeved on the surface of the screw rod (10) and is fixed, and the output shaft of the driving motor (6) is installed at the center of one side of the second bevel gear (12).
6. The IC chip flash tester according to claim 5, wherein the limiting mechanism comprises a limiting post (20), the limiting post (20) is horizontally and fixedly connected inside the testing platform (2), and the surface of the limiting post (20) slides inside the connecting plate (18).
7. The IC chip flash tester according to claim 5, wherein the limiting mechanism comprises a slide rail (21), the slide rail (21) is horizontally installed at the bottom in the test bench (2), a slide block (22) slides in the slide rail (21), and the top of the slide block (22) is installed at the bottom of the connecting plate (18).