CN116457642A - 波长测定装置和波长测定方法 - Google Patents

波长测定装置和波长测定方法 Download PDF

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Publication number
CN116457642A
CN116457642A CN202180075003.XA CN202180075003A CN116457642A CN 116457642 A CN116457642 A CN 116457642A CN 202180075003 A CN202180075003 A CN 202180075003A CN 116457642 A CN116457642 A CN 116457642A
Authority
CN
China
Prior art keywords
wavelength
light
emitting element
measurement
measuring device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202180075003.XA
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English (en)
Chinese (zh)
Inventor
小坂明
平尾祐亮
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Konica Minolta Inc
Original Assignee
Konica Minolta Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Konica Minolta Inc filed Critical Konica Minolta Inc
Publication of CN116457642A publication Critical patent/CN116457642A/zh
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/443—Emission spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0275—Details making use of sensor-related data, e.g. for identification of sensor parts or optical elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80—Constructional details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J2003/2853—Averaging successive scans or readings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J2003/2859—Peak detecting in spectrum
    • G01J2003/2863—Peak detecting in spectrum and calculating peak area

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
CN202180075003.XA 2020-11-09 2021-11-05 波长测定装置和波长测定方法 Pending CN116457642A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020186652 2020-11-09
JP2020-186652 2020-11-09
PCT/JP2021/040846 WO2022097726A1 (ja) 2020-11-09 2021-11-05 波長測定装置及び波長測定方法

Publications (1)

Publication Number Publication Date
CN116457642A true CN116457642A (zh) 2023-07-18

Family

ID=81458339

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202180075003.XA Pending CN116457642A (zh) 2020-11-09 2021-11-05 波长测定装置和波长测定方法

Country Status (4)

Country Link
JP (1) JPWO2022097726A1 (enrdf_load_stackoverflow)
KR (1) KR20230079215A (enrdf_load_stackoverflow)
CN (1) CN116457642A (enrdf_load_stackoverflow)
WO (1) WO2022097726A1 (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2024057889A1 (ja) * 2022-09-16 2024-03-21 コニカミノルタ株式会社 波長測定装置、データ処理装置、波長測定方法及びプログラム

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000205955A (ja) * 1999-01-08 2000-07-28 Minolta Co Ltd ポリクロメ―タの校正デ―タ算出装置及びその算出方法
JP2012177551A (ja) * 2011-02-25 2012-09-13 Yokogawa Electric Corp 分光測定装置、測定システムおよび分光測定方法
CN104006880A (zh) * 2013-02-25 2014-08-27 精工爱普生株式会社 分光测定装置、通信系统以及色彩管理系统
JP2015178995A (ja) * 2014-03-19 2015-10-08 株式会社オプトコム 色調校正装置、撮像装置及び色調検査装置
CN109274906A (zh) * 2018-10-31 2019-01-25 威海华菱光电股份有限公司 图像处理装置
WO2020084144A1 (en) * 2018-10-26 2020-04-30 Julius-Maximilians-Universität Würzburg Hyperspectral imaging for spectral and spatial characterization of quantum dots

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109186946B (zh) * 2018-09-25 2019-11-08 厦门大学 发光器件微区光度和色度学参数的测量方法及其测量装置
US10801953B2 (en) * 2019-01-11 2020-10-13 Kla-Tencor Corporation Semiconductor metrology based on hyperspectral imaging
KR102606269B1 (ko) * 2019-03-28 2023-11-29 하마마츠 포토닉스 가부시키가이샤 검사 장치 및 검사 방법

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000205955A (ja) * 1999-01-08 2000-07-28 Minolta Co Ltd ポリクロメ―タの校正デ―タ算出装置及びその算出方法
JP2012177551A (ja) * 2011-02-25 2012-09-13 Yokogawa Electric Corp 分光測定装置、測定システムおよび分光測定方法
CN104006880A (zh) * 2013-02-25 2014-08-27 精工爱普生株式会社 分光测定装置、通信系统以及色彩管理系统
JP2015178995A (ja) * 2014-03-19 2015-10-08 株式会社オプトコム 色調校正装置、撮像装置及び色調検査装置
WO2020084144A1 (en) * 2018-10-26 2020-04-30 Julius-Maximilians-Universität Würzburg Hyperspectral imaging for spectral and spatial characterization of quantum dots
CN109274906A (zh) * 2018-10-31 2019-01-25 威海华菱光电股份有限公司 图像处理装置

Also Published As

Publication number Publication date
JPWO2022097726A1 (enrdf_load_stackoverflow) 2022-05-12
WO2022097726A1 (ja) 2022-05-12
KR20230079215A (ko) 2023-06-05

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