KR20230079215A - 파장 측정 장치 및 파장 측정 방법 - Google Patents

파장 측정 장치 및 파장 측정 방법 Download PDF

Info

Publication number
KR20230079215A
KR20230079215A KR1020237015246A KR20237015246A KR20230079215A KR 20230079215 A KR20230079215 A KR 20230079215A KR 1020237015246 A KR1020237015246 A KR 1020237015246A KR 20237015246 A KR20237015246 A KR 20237015246A KR 20230079215 A KR20230079215 A KR 20230079215A
Authority
KR
South Korea
Prior art keywords
wavelength
light
light emitting
measurement
measurement data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
KR1020237015246A
Other languages
English (en)
Korean (ko)
Inventor
아키라 고사카
유스케 히라오
Original Assignee
코니카 미놀타 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 코니카 미놀타 가부시키가이샤 filed Critical 코니카 미놀타 가부시키가이샤
Publication of KR20230079215A publication Critical patent/KR20230079215A/ko
Pending legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/443—Emission spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0275—Details making use of sensor-related data, e.g. for identification of sensor parts or optical elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80—Constructional details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J2003/2853—Averaging successive scans or readings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J2003/2859—Peak detecting in spectrum
    • G01J2003/2863—Peak detecting in spectrum and calculating peak area

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
KR1020237015246A 2020-11-09 2021-11-05 파장 측정 장치 및 파장 측정 방법 Pending KR20230079215A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020186652 2020-11-09
JPJP-P-2020-186652 2020-11-09
PCT/JP2021/040846 WO2022097726A1 (ja) 2020-11-09 2021-11-05 波長測定装置及び波長測定方法

Publications (1)

Publication Number Publication Date
KR20230079215A true KR20230079215A (ko) 2023-06-05

Family

ID=81458339

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020237015246A Pending KR20230079215A (ko) 2020-11-09 2021-11-05 파장 측정 장치 및 파장 측정 방법

Country Status (4)

Country Link
JP (1) JPWO2022097726A1 (enrdf_load_stackoverflow)
KR (1) KR20230079215A (enrdf_load_stackoverflow)
CN (1) CN116457642A (enrdf_load_stackoverflow)
WO (1) WO2022097726A1 (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20250033303A (ko) 2022-09-16 2025-03-07 코니카 미놀타 가부시키가이샤 파장 측정 장치, 데이터 처리 장치, 파장 측정 방법 및 프로그램

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000205955A (ja) * 1999-01-08 2000-07-28 Minolta Co Ltd ポリクロメ―タの校正デ―タ算出装置及びその算出方法
JP2012177551A (ja) * 2011-02-25 2012-09-13 Yokogawa Electric Corp 分光測定装置、測定システムおよび分光測定方法
JP6136357B2 (ja) * 2013-02-25 2017-05-31 セイコーエプソン株式会社 分光測定装置、通信システム及びカラーマネージメントシステム
JP2015178995A (ja) * 2014-03-19 2015-10-08 株式会社オプトコム 色調校正装置、撮像装置及び色調検査装置
CN109186946B (zh) * 2018-09-25 2019-11-08 厦门大学 发光器件微区光度和色度学参数的测量方法及其测量装置
EP3644045A1 (en) * 2018-10-26 2020-04-29 Julius-Maximilians-Universität Würzburg Hyperspectral imaging for spectral and spatial characterization of quantum dots
CN109274906A (zh) * 2018-10-31 2019-01-25 威海华菱光电股份有限公司 图像处理装置
US10801953B2 (en) * 2019-01-11 2020-10-13 Kla-Tencor Corporation Semiconductor metrology based on hyperspectral imaging
CN116978806A (zh) * 2019-03-28 2023-10-31 浜松光子学株式会社 检查装置及检查方法

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
오츠카 전자 주식회사 홈페이지 활용예 「LED 제조 공정 LED 의 색 분류 (LE series)」URL:https://www.otsukael.jp/appcase/detail/caseid/116

Also Published As

Publication number Publication date
WO2022097726A1 (ja) 2022-05-12
JPWO2022097726A1 (enrdf_load_stackoverflow) 2022-05-12
CN116457642A (zh) 2023-07-18

Similar Documents

Publication Publication Date Title
US9867544B2 (en) Spectrometer including vertical stack structure and non-invasive biometric sensor including the spectrometer
TWI400761B (zh) 少數載子擴散長度判定技術
US10101203B2 (en) Device and method for detecting light
JP7410340B2 (ja) 装置および方法
KR102422102B1 (ko) 광발광 분광법을 사용한, oled 제조를 위한 계측
US20140253924A1 (en) Spectrometer
CN106796146B (zh) 确定入射辐射的频谱发射特性
US20240302292A1 (en) Inspection apparatus and inspection method
KR20230079215A (ko) 파장 측정 장치 및 파장 측정 방법
Ceccarelli et al. Red-Enhanced Photon Detection Module Featuring a $32\times 1$ Single-Photon Avalanche Diode Array
US20100091273A1 (en) Reference Light Source Device
KR20240027128A (ko) 파장 측정 장치 및 파장 측정 방법
KR100998015B1 (ko) 발광소자의 전류분산을 평가하는 방법 및 이를 이용한 평가시스템
CN119816932A (zh) 波长测定装置、数据处理装置、波长测定方法以及程序
JP2688040B2 (ja) 螢光特性検査装置
JP7201868B2 (ja) 分光測定装置および分光測定方法
KR20240026229A (ko) 이차원 분광 장치, 관찰 시스템, 관리 시스템, 정보 처리 장치 및 프로그램
TW202346833A (zh) 分光裝置、拉曼分光測定裝置及分光方法
TW201602527A (zh) 發光體的發光波長推定方法與其裝置

Legal Events

Date Code Title Description
PA0105 International application

St.27 status event code: A-0-1-A10-A15-nap-PA0105

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

D13-X000 Search requested

St.27 status event code: A-1-2-D10-D13-srh-X000

D14-X000 Search report completed

St.27 status event code: A-1-2-D10-D14-srh-X000

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902