CN116256610A - Method for realizing automatic triggering of test signal of semiconductor tester - Google Patents
Method for realizing automatic triggering of test signal of semiconductor tester Download PDFInfo
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- CN116256610A CN116256610A CN202310530169.7A CN202310530169A CN116256610A CN 116256610 A CN116256610 A CN 116256610A CN 202310530169 A CN202310530169 A CN 202310530169A CN 116256610 A CN116256610 A CN 116256610A
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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Abstract
The invention discloses a method for realizing automatic triggering of a test signal of a semiconductor tester, which comprises the steps of converting a square wave signal sent by the semiconductor tester to an automatic triggering control signal control board into a high-level square wave; then generating a new square wave signal; switching to a high level or a low level according to signal settings in the semiconductor tester; converting the output waveform into a waveform with a charging radian rising edge; the terminal of the semiconductor tester receives the output signal and then automatically tests the output signal; through the cooperation of the isolation circuit I, the square wave generating circuit and the isolation circuit II, the circulation test function of automatically performing the next round of test immediately after the semiconductor tester finishes the previous test and waiting for a few milliseconds can be realized, so that the automatic production test under the simulated production environment is realized, and the function of detecting the related circuits and the stability of long-time operation are realized.
Description
Technical Field
The invention relates to the technical field of signal testing, in particular to a method for automatically triggering a test signal of a semiconductor tester.
Background
Semiconductor testers are also known as semiconductor automated testers, and are synonymous with semiconductor automated test systems. The semiconductor tester tests circuit functions and electrical performance parameters of the semiconductor device, and specifically includes direct current parameters (voltage and current), alternating current parameters (time, duty ratio, total harmonic distortion, frequency and the like), functional tests and the like.
In the semiconductor test industry, the existing control circuit is mostly directly connected with a sorting machine to control the operation of a test host, or is triggered by a manual key to perform function verification, and cannot be used for automatic circulation control.
In addition, the price of the sorting machine is relatively high, and if the number of the sorting machines is small, the sorting machines are occupied for a long time because the sorting machines need to be operated circularly for a long time, and the mass production capacity of the testing machine is affected. If the purchase is more, the equipment cost is relatively high, and the waste of resources is caused by the low-season production, so that a method for automatically triggering the test signals of the semiconductor tester is provided to solve the problems.
Disclosure of Invention
The purpose of the application is to provide a method for automatically triggering a test signal of a semiconductor tester, so as to solve the problems of long time and high cost of the detection equipment required to be occupied in the background technology.
In order to achieve the above purpose, the present application provides the following technical solutions: a method for automatically triggering test signals of a semiconductor tester, comprising the steps of:
s1, after the semiconductor tester finishes testing, a square wave signal is sent to an automatic trigger control signal control board;
s2, converting the square wave signal into a high-level square wave;
s3, enabling the high-level square wave signal to automatically generate a new square wave signal;
s4, converting the new square wave signal into a high-level square wave or a low-level square wave according to signal setting in the semiconductor testing machine, and taking the square wave signal as an output signal which accords with the triggering of the semiconductor testing machine to start testing;
s5, converting the output waveform into a waveform with a charging radian rising edge;
and S6, after the output signal is received on the terminal of the semiconductor tester, when the rising edge waveform with radian reaches the trigger level for starting the test, a time delay of a few milliseconds is generated between the rising edge waveform and the square wave signal, and the test is automatically performed.
Through the steps, the circulation test function that the semiconductor tester can automatically perform the next round of test immediately after finishing the previous test and waiting for a few milliseconds can be realized, so that the automatic production test under the simulated production environment is realized, and the function of detecting related circuits and the stability of long-time operation are realized.
Further, in the step S2, the square wave signal is converted into a high-level square wave through an isolation circuit i.
Further, in the step S2, the square wave signal is converted into a high-level square wave through the first isolation circuit, and the first isolation circuit isolates the high-level square wave signal; the converted high-level square wave signal is isolated from the input signal from the tester, so that even though the driving capability of different testers may be different, the waveform is basically a fixed waveform and the same driving capability after passing through the first isolating circuit.
Further, in the step S3, a new square wave signal is automatically generated after the high level square wave signal reaches the trigger level of the square wave generating circuit.
Further, in the step S4, the new square wave signal is set according to the signal in the semiconductor tester, and is converted into a high-level square wave or a low-level square wave through the forward and reverse setting of the second isolation circuit, so as to be used as an output signal which accords with the triggering of the semiconductor tester to start the test.
Further, in S5, the output signal is grounded to a capacitor with a suitable capacitance, so that the output waveform is converted into a waveform with a charging radian rising edge.
The circuit for realizing automatic triggering of the test signal of the semiconductor tester comprises a first isolation circuit, a square wave generating circuit and a second isolation circuit, wherein the first isolation circuit, the square wave generating circuit and the second isolation circuit are uniformly arranged on an automatic triggering test signal control board.
In summary, the invention has the technical effects and advantages that:
according to the invention, through the cooperation of the first isolation circuit, the square wave generating circuit and the second isolation circuit, the cyclic test function of automatically performing the next round of test immediately after the semiconductor tester finishes the previous test is realized, so that the automatic production test under the simulated production environment is realized, the function of detecting the related circuits and the stability of long-time operation are achieved, and the method has the advantages of cost saving, convenience in debugging, simplicity in operation and batch manufacturing of related devices.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described below, it being obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a flow chart of the method in the present embodiment;
FIG. 2 is a schematic diagram of the implementation of the signal function in the present embodiment;
fig. 3 is a circuit diagram in the present embodiment.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Examples: a method for implementing automatic triggering of test signals of a semiconductor tester, as shown in fig. 1 and 2, comprising the steps of:
s1, after the semiconductor tester finishes testing, a square wave signal is sent to an automatic trigger control signal control board;
s2, converting the square wave signal into a high-level square wave through the first isolation circuit, and isolating the high-level square wave signal through the first isolation circuit; the converted high-level square wave signal has been isolated from the input signal from the tester, so that even though the driving capability of different testers may be different, the waveform is basically a fixed waveform and the same driving capability after passing through the first isolating circuit;
s3, automatically generating a new square wave signal after the high-level square wave signal reaches the trigger level of the square wave generating circuit;
s4, setting a new square wave signal according to the signal in the semiconductor tester, and converting the new square wave signal into a high-level square wave or a low-level square wave through the forward and reverse setting of the second isolation circuit to serve as an output signal which accords with the triggering of the semiconductor tester to start testing;
s5, connecting the output signal to the ground to form a capacitor with a proper capacitance value, so that the output waveform is converted into a waveform with a charging radian rising edge;
and S6, after the output signal is received at the terminal of the semiconductor tester, when the rising edge waveform with radian reaches the trigger level for starting the test, a time delay of a few milliseconds is generated between the rising edge waveform with radian and the square wave signal, and the test is automatically performed.
Through the steps, the circulation test function that the semiconductor tester can automatically perform the next round of test immediately after finishing the previous test and waiting for a few milliseconds can be realized, so that the automatic production test under the simulated production environment is realized, and the function of detecting related circuits and the stability of long-time operation are realized.
As shown in fig. 2, the circuit applied to the method includes a first isolation circuit, a square wave generating circuit and a second isolation circuit, and the first isolation circuit, the square wave generating circuit and the second isolation circuit are uniformly arranged on the automatic trigger test signal control board. The schematic circuit diagram of the scheme is shown in fig. 3.
According to the invention, through the cooperation of the first isolation circuit, the square wave generating circuit and the second isolation circuit, the cyclic test function of automatically performing the next round of test immediately after the semiconductor tester finishes the previous test is realized, so that the automatic production test under the simulated production environment is realized, the function of detecting the related circuits and the stability of long-time operation are achieved, and the method has the advantages of cost saving, convenience in debugging, simplicity in operation and batch manufacturing of related devices.
Finally, it should be noted that: the foregoing description is only illustrative of the preferred embodiments of the present invention, and although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that modifications may be made to the embodiments described, or equivalents may be substituted for elements thereof, and any modifications, equivalents, improvements or changes may be made without departing from the spirit and principles of the present invention.
Claims (7)
1. A method for automatically triggering a test signal of a semiconductor tester, comprising the steps of:
s1, after the semiconductor tester finishes testing, a square wave signal is sent to an automatic trigger control signal control board;
s2, converting the square wave signal into a high-level square wave;
s3, enabling the high-level square wave signal to automatically generate a new square wave signal;
s4, converting the new square wave signal into a high-level square wave or a low-level square wave according to signal setting in the semiconductor testing machine, and taking the square wave signal as an output signal which accords with the triggering of the semiconductor testing machine to start testing;
s5, converting the output waveform into a waveform with a charging radian rising edge;
and S6, after the output signal is received on the terminal of the semiconductor tester, when the rising edge waveform with radian reaches the trigger level for starting the test, a time delay of a few milliseconds is generated between the rising edge waveform and the square wave signal, and the test is automatically performed.
2. A method for implementing automatic triggering of test signals of a semiconductor tester according to claim 1, wherein: in the step S2, the square wave signal is converted into a high-level square wave through an isolation circuit i.
3. A method of implementing automatic triggering of test signals of a semiconductor tester according to claim 2, wherein: in the step S2, the square wave signal is converted into a high-level square wave through the first isolation circuit, and the first isolation circuit isolates the high-level square wave signal.
4. A method for implementing automatic triggering of test signals of a semiconductor tester according to claim 1, wherein: in the step S3, a new square wave signal is automatically generated after the high-level square wave signal reaches the trigger level of the square wave generating circuit.
5. A method for implementing automatic triggering of test signals of a semiconductor tester according to claim 1, wherein: in the step S4, the new square wave signal is set according to the signal in the semiconductor tester, and is converted into a high-level square wave or a low-level square wave through the forward and reverse setting of the second isolation circuit, so as to be used as an output signal which accords with the triggering of the semiconductor tester to start the test.
6. A method for implementing automatic triggering of test signals of a semiconductor tester according to claim 1, wherein: in the step S5, the output signal is grounded to a capacitor with a suitable capacitance, so that the output waveform is converted into a waveform with a charging radian rising edge.
7. A circuit for realizing automatic triggering of test signals of a semiconductor tester is characterized in that: the automatic triggering test signal control board comprises a first isolation circuit, a square wave generating circuit and a second isolation circuit, wherein the first isolation circuit, the square wave generating circuit and the second isolation circuit are uniformly arranged on the automatic triggering test signal control board.
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| JP2007027328A (en) * | 2005-07-14 | 2007-02-01 | Toshiba Corp | Semiconductor integrated device and noise testing method using the same |
| US7443206B1 (en) * | 2006-01-06 | 2008-10-28 | Sun Microsystems, Inc. | High-frequency linear phase-frequency detector with wide-pulse outputs |
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