CN115166400A - Detection device, method and system - Google Patents
Detection device, method and system Download PDFInfo
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- CN115166400A CN115166400A CN202210860341.0A CN202210860341A CN115166400A CN 115166400 A CN115166400 A CN 115166400A CN 202210860341 A CN202210860341 A CN 202210860341A CN 115166400 A CN115166400 A CN 115166400A
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- 238000001514 detection method Methods 0.000 title claims abstract description 111
- 238000000034 method Methods 0.000 title abstract description 10
- 239000004020 conductor Substances 0.000 claims abstract description 34
- 230000005684 electric field Effects 0.000 claims abstract description 25
- 239000000523 sample Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 12
- 238000012360 testing method Methods 0.000 description 8
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 230000005686 electrostatic field Effects 0.000 description 2
- 239000011810 insulating material Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/28—Provision in measuring instruments for reference values, e.g. standard voltage, standard waveform
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Abstract
The invention relates to the field of power electronics, in particular to a detection device, a method and a system, wherein the detection device is used for detecting a sensitive area causing an electronic device to generate a specific event, the detection device comprises a lead, the lead is provided with a first conductor layer, a first insulating layer and a second conductor layer from inside to outside, the first conductor layer is provided with a signal access end, the signal access end is used for receiving a power supply signal, the second conductor layer is provided with a grounding end, and the grounding end is used for grounding; the detection device is used for: receiving the power supply signal, generating a specific magnetic field or a specific electric field according to the power supply signal, and when the electronic device generates the specific event, the detection device moves on the surface of the electronic device to detect the sensitive area of the electronic device according to the generated specific magnetic field or the generated specific electric field. The invention can more efficiently search the sensitive area of the electronic device.
Description
Technical Field
The present invention relates to the field of power electronics, and in particular, to a detection apparatus, method, and system.
Background
With the smaller and smaller process size of semiconductors and the requirement of users for portability, the size of printed circuit boards in electronic products is becoming smaller and the density of electronic components on the printed circuit boards is becoming greater, and the high logic level and ground level inside integrated circuits are becoming closer to each other in order to satisfy more complex electronic functions. Therefore, when the electronic product has a fault, such as an electrostatic fault, in order to find out the faulty component, it takes a lot of time to detect the components of the electronic product one by one, so that a lot of time is consumed in the finding process.
Disclosure of Invention
The technical problem to be solved by the embodiments of the present invention is to provide a detection apparatus, a method and a system, which can more efficiently search for a sensitive area of an electronic apparatus.
In order to solve the technical problem, one technical scheme adopted by the embodiment of the invention is as follows: the detection device comprises a lead, wherein the lead is provided with a first conductor layer, a first insulating layer and a second conductor layer from inside to outside, the first conductor layer is provided with a signal access end, the signal access end is used for receiving a power supply signal, the second conductor layer is provided with a grounding end, and the grounding end is used for grounding;
the detection device is used for: receiving the power supply signal, generating a specific magnetic field or a specific electric field according to the power supply signal, and when the electronic device generates the specific event, the detection device moves on the surface of the electronic device to detect the sensitive area of the electronic device according to the generated specific magnetic field or the generated specific electric field.
In some embodiments, the wire is circular when the detection device is used to generate the specific magnetic field.
In some embodiments, when the detection device is used to generate the specific electric field, the wire is linear.
In some embodiments, the wire further comprises a second insulating layer disposed on an outermost layer of the wire.
In some embodiments, the power signal is an electrostatic signal or a burst signal.
In order to solve the above technical problem, another technical solution adopted by the embodiment of the present invention is: there is provided a detection method for detecting a sensitive area causing an electronic device to generate a specific event, the detection method comprising:
controlling the detection device as described above to move relative to the electronic device;
detecting whether the specific event occurs to the electronic device;
when the specific event of the electronic device is detected, determining that the area of the electronic device corresponding to the detection device at the moment is a sensitive area.
In some embodiments, after determining the sensitive region, the detection method further comprises: and detecting the components in the sensitive area one by one to determine the components with faults.
In some embodiments, the particular event is an electrostatic interference event.
In order to solve the above technical problem, another technical solution adopted by the embodiment of the present invention is: the detection system comprises the detection device, a power supply device and the electronic device, wherein the detection device comprises a lead, the lead is provided with a first conductor layer, a first insulating layer and a second conductor layer from inside to outside, the first conductor layer is provided with a signal access end, the signal access end is used for being connected with the power supply device to receive a power supply signal, the second conductor layer is provided with a grounding end, and the grounding end is used for being connected with the same ground as the power supply device;
the power supply device is used for sending a power supply signal to the detection device;
the detection device is used for receiving the power supply signal and generating a specific magnetic field or a specific electric field according to the power supply signal, and when the electronic device generates the specific event, the detection device moves on the surface of the electronic device so as to detect the sensitive area of the electronic device according to the generated specific magnetic field or the generated specific electric field.
In some embodiments, the power supply device is a waveform signal generator.
The embodiment of the invention provides a detection device, a method and a system, wherein the detection device is used for detecting a sensitive region causing an electronic device to generate a specific event, the detection device comprises a lead, the lead is provided with a first conductor layer, a first insulating layer and a second conductor layer from inside to outside, the first conductor layer is provided with a signal access end, the signal access end is used for receiving a power supply signal, the second conductor layer is provided with a grounding end, and the grounding end is used for grounding; the detection device is used for: receiving the power supply signal, generating a specific magnetic field or a specific electric field according to the power supply signal, and when the electronic device generates the specific event, the detection device moves on the surface of the electronic device to detect the sensitive area of the electronic device according to the generated specific magnetic field or the generated specific electric field. The detection device, the method and the system provided by the embodiment of the invention can more efficiently search the sensitive area of the electronic device.
Drawings
One or more embodiments are illustrated in drawings corresponding to, and not limiting to, the embodiments, in which elements having the same reference number designation may be represented as similar elements, unless specifically noted, the drawings in the figures are not to scale.
Fig. 1 is a schematic structural diagram of a detection system according to an embodiment of the present invention;
FIG. 2 is a schematic structural diagram of a detecting device according to an embodiment of the present invention;
FIG. 3 is a schematic structural diagram of another detecting device provided in an embodiment of the present invention;
FIG. 4 is a schematic structural diagram of a circular ring-shaped detection device provided in the embodiment of the present invention;
FIG. 5 is a schematic structural diagram of a linear detection device according to an embodiment of the present invention;
fig. 6 is a schematic flowchart of a detection method according to an embodiment of the present invention.
Detailed Description
The present invention will be described in detail with reference to specific examples. The following examples will assist those skilled in the art in further understanding the invention, but are not intended to limit the invention in any way. It should be noted that variations and modifications can be made by persons skilled in the art without departing from the concept of the invention. All falling within the scope of the invention.
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
It should be noted that, if not conflicting, various features of the embodiments of the present invention may be combined with each other within the scope of the present invention. Additionally, while functional block divisions are performed in the device diagrams, with logical sequences shown in the flowcharts, in some cases, the steps shown or described may be performed in a different order than the block divisions in the device diagrams, or the flowcharts.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention.
In addition, the technical features involved in the respective embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.
Referring to fig. 1, fig. 1 is a schematic structural diagram of a detection system 1000 according to an embodiment of the present invention. The detection system 1000 includes a detection device 100, a power supply device 200, and an electronic device 300. The detection system 1000 is used to detect a sensitive area that causes the electronic device 300 to generate a specific event.
The electronic device 300 is an electronic device having electronic components or a circuit board, and may be, for example, a notebook computer, a desktop computer, a tablet computer, a smart phone, a smart watch, and the like. The electronic device 300 may have a failure such as a black screen or a shutdown due to static electricity on components of the motherboard. The specific events include a screen blank event, a shutdown event, and the like, and the sensitive area represents an area of the electronic device 300 including a faulty component.
The power supply apparatus 200 includes a signal output terminal (terminal + in fig. 1) through which the power supply apparatus 200 transmits a power supply signal to the signal input terminal 110 of the detection apparatus 100, and a ground terminal (terminal-in fig. 1) through which the power supply apparatus 200 is connected to the ground terminal 120 of the detection apparatus 100 and grounded. The power supply device 200 may be a waveform signal generator, a pulse burst generator, or the like.
In some embodiments, the power signal is a high voltage pulse signal such as an electrostatic signal or a burst signal.
The detecting device 100 includes a conductive wire, the conductive wire is provided with a first conductive layer (not shown in fig. 1), a first insulating layer (not shown in fig. 1) and a second conductive layer (not shown in fig. 1) from inside to outside, the first conductive layer is provided with a signal incoming end 110, the signal incoming end 110 is used for being connected with the power supply device 200 to receive a power supply signal, the second conductive layer is provided with a grounding end 120, and the grounding end is used for being connected with the same ground as the power supply device 200.
When a faulty component that causes the electronic device 300 to generate a specific event (e.g., a black screen) needs to be detected, the embodiment of the present invention finds the faulty component by detecting a sensitive area including the faulty component and then detecting all components in the sensitive area one by one.
Specifically, when a faulty component that causes the electronic device 300 to generate a specific event (for example, a black screen) needs to be detected, the electronic device 300 operates normally, and the detection device 100 receives a power signal sent by the power supply device 200 and generates a specific magnetic field or a specific electric field according to the power signal. When the specific event occurs again in the electronic device 300, the detection device 100 determines that the area of the detection device 100 corresponding to the electronic device 300 is the sensitive area, and then detects all the components in the sensitive area of the electronic device 300 one by one to find out the faulty component.
The embodiment of the present invention provides a detection system 1000 for detecting a sensitive area causing a specific event generated by an electronic device 300, the detection system 1000 includes a detection device 100, a power device 200 and the electronic device 300, the detection device 100 includes a conductive wire, the conductive wire is provided with a first conductive layer, a first insulating layer and a second conductive layer from inside to outside, the first conductive layer is provided with a signal access terminal 110, the signal access terminal 110 is used for being connected with the power device 200 to receive a power signal, the second conductive layer is provided with a ground terminal 120, and the ground terminal 120 is used for being connected to the same ground as the power device 200. The detecting device 100 is used for receiving a power signal and generating a specific magnetic field or a specific electric field according to the power signal, and when the electronic device 300 generates a specific event, the detecting device 100 moves on the surface of the electronic device 300 to detect the sensitive area of the electronic device 300 according to the generated specific magnetic field or the generated specific electric field. The embodiment of the invention can search the sensitive area of the electronic device 300 to more efficiently search the faulty component of the electronic device 300.
Referring to fig. 2, fig. 2 is a schematic structural diagram of a detection apparatus 100 according to an embodiment of the present invention. The detecting device 100 includes a conductive wire, the conductive wire is provided with a first conductive layer 10, a first insulating layer 20 and a second conductive layer 30 from inside to outside, the first conductive layer 10 is provided with a signal access terminal 110, the signal access terminal 110 is used for connecting with a power supply device 200 to receive a power supply signal, the second conductive layer 30 is provided with a grounding terminal 120 (not shown in fig. 2), and the grounding terminal 120 is used for connecting with the same ground as the power supply device 200.
As shown in fig. 2, the signal access terminal 110 is a small hole formed on the wire, and the hole penetrates through the second conductor layer 30 and the first insulating layer 20 to the surface of the first conductor layer 10. In order to prevent signals from accessing other layers than the first conductor layer 10, the periphery of the hole may be coated with an insulating material.
The first insulating layer 20 is, for example, a plastic layer, or a ceramic layer, which is disposed between the first conductor layer 10 and the second conductor layer 30. The first insulating layer 20 can prevent a short circuit between the first conductor layer 10 and the second conductor layer 30.
In this embodiment, the material of the first conductor layer 10 and the second conductor layer 30 is not limited, and may be a conductor such as iron or copper. The material of the first insulating layer 20 is not limited in this embodiment, and may be an insulating material.
It should be noted that the shape of the wire of the detection apparatus 100 is not limited in this embodiment, and may be a circular ring, a square, a hexagon, a straight line, and the like. In this embodiment, the shapes of the first conductive layer 10, the second conductive layer 30 and the first insulating layer 20 are not limited, and the three layers do not need to be arranged coaxially.
When the power supply device 200 generates an instantaneous high voltage (power supply signal), the detection device 100 is discharged to generate a specific electric field or a specific magnetic field. The specific electric field or the specific magnetic field is generated because a current of the instantaneous discharge flows on the wire of the power supply device 200. The specific electric field or the specific magnetic field can be used to simulate the electrostatic field generated when the electrostatic discharge occurs, and to test the protection capability of the components of the electronic device 300 against the electrostatic field.
In testing, the user may turn on the power device 200 to make the detection device 100 generate a specific electric field or a specific magnetic field, then move the detection device 100 above the motherboard or other circuit boards of the electronic device 300, and then check whether a specific event occurs via the electronic device 300 or other testing devices to determine a sensitive area on the circuit board of the electronic device 300 for further analysis of the failure problem.
Referring to fig. 3, fig. 3 is a schematic structural diagram of another detecting device 100 according to an embodiment of the invention. As shown in fig. 3, the conductive wire of the detecting device 100 is provided with a first conductive layer 10, a first insulating layer 20, a second conductive layer 30 and a second insulating layer 40 from inside to outside. The second insulating layer 40 is disposed on the outermost layer of the conducting wire, which is convenient for a user to hold the detecting device 100, and prevents the human body of the user from contacting the second conductive layer, and also prevents the detecting device 100 from contacting the electronic device 300 when in use.
The user can directly take the detecting device 100 above the electronic device 300 for testing to detect the sensitive area of the electronic device 300, which is very convenient.
The details of the operation of the detecting device 100 can be derived from the above description by those skilled in the art, and are not repeated herein.
In the present embodiment, the shapes of the first conductive layer 10, the first insulating layer 20, the second conductive layer 30 and the second insulating layer 40 are not limited, and the four layers do not need to be coaxially disposed.
Referring to fig. 4 and 5, fig. 4 is a schematic structural diagram of a circular ring shape of the detection device according to the embodiment of the present invention, and fig. 5 is a schematic structural diagram of a linear shape of the detection device according to the embodiment of the present invention.
In some embodiments, the wire is circular when the detection device 100 is used to generate a particular magnetic field. In fig. 4, the conductive line of the detection device 100 is circular, the signal input terminal 110 of the detection device 100 is connected to the power signal VCC, the power signal VCC is provided by the power supply device 200, and the ground terminal 120 of the detection device 100 is grounded. The size of the circular ring is not limited in this embodiment, and may be, for example, 3 cm in diameter.
In some embodiments, the conductive lines are linear when the detection device 100 is used to generate a particular electric field. In fig. 5, the conductive line of the detecting device 100 is linear, i.e. a line segment. The size of the straight line segment is not limited in this embodiment, and may be 5 cm long, for example.
It should be noted that the shape of the wire of the detection device 100 can be configured in other shapes, such as square, hexagon, etc., as required.
During testing, a circular ring-shaped detection device and a linear detection device can be connected to the power supply device, a user can open the power supply device to enable the circular ring-shaped detection device to generate a specific magnetic field and the linear detection device to generate a specific electric field, then the two detection devices are moved above a main board or other circuit boards of the electronic device, and then the electronic device or other test devices are used for checking whether a specific event occurs to determine a sensitive area on the circuit board of the electronic device, so that the fault problem can be further analyzed. The efficiency of detection can be improved by using two detection devices for simultaneous detection. Further, other numbers and shapes of detection devices may be selected to simultaneously detect the electronic devices.
The embodiment of the invention provides a detection device 100 for detecting a sensitive area causing a specific event generated by an electronic device 300, wherein the detection device 100 includes a conductive wire, the conductive wire is provided with a first conductive layer 10, a first insulating layer 20 and a second conductive layer 30 from inside to outside, the first conductive layer 10 is provided with a signal access terminal 110, the signal access terminal 110 is used for receiving a power signal, the second conductive layer 30 is provided with a grounding terminal 120, and the grounding terminal 120 is used for grounding. The detection apparatus 100 is configured to: the detection device 100 moves on the surface of the electronic device 300 when the electronic device 300 generates a specific event, so as to detect the sensitive area of the electronic device 300 according to the generated specific magnetic field or specific electric field, thereby being capable of more efficiently searching the sensitive area of the electronic device and further more efficiently searching for a faulty component.
Referring to fig. 6, fig. 6 is a schematic flow chart of a detection method according to an embodiment of the present invention. The detection method is used for detecting a sensitive area which triggers the electronic device to generate a specific event, and comprises the following steps:
step S1, controlling the detection device to move relative to the electronic device.
And S2, detecting whether the electronic device generates a specific event or not.
And S3, when the electronic device is detected to have a specific event, determining that the area of the electronic device corresponding to the detection device at the moment is a sensitive area.
In some embodiments, after determining the sensitive region, the detection method further comprises: and S4, detecting the components in the sensitive area one by one to determine the components with faults.
In some embodiments, the particular event is an electrostatic interference event.
In some embodiments, the wire of the detection device may be circular, linear, square, or the like.
In some embodiments, step S1 may comprise: and S11, controlling a circular detection device and a linear detection device to move above the electronic device simultaneously.
During testing, a circular ring-shaped detection device and a linear detection device can be connected to the power supply device, a user can open the power supply device to enable the circular ring-shaped detection device to generate a specific magnetic field and the linear detection device to generate a specific electric field, then the two detection devices are moved above a main board or other circuit boards of the electronic device, and then the electronic device or other test devices are used for checking whether a specific event occurs to determine a sensitive area on the circuit board of the electronic device, so that the fault problem can be further analyzed. The efficiency of detection can be improved by using two detection devices for simultaneous detection. Further, other numbers and shapes of detection devices may be selected to simultaneously detect the electronic devices.
In the embodiment, when a specific event occurs in the electronic device, the sensitive area that causes the electronic device to generate the specific event can be detected, and the method provided by the embodiment can effectively improve the failure detection efficiency of the electronic device by referring to the above device embodiments in detail.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, and not to limit it; within the idea of the invention, also technical features in the above embodiments or in different embodiments may be combined, steps may be implemented in any order, and there are many other variations of the different aspects of the invention as described above, which are not provided in detail for the sake of brevity; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present application.
Claims (10)
1. A detection device is used for detecting a sensitive area causing an electronic device to generate a specific event, and is characterized by comprising a lead, wherein the lead is provided with a first conductor layer, a first insulating layer and a second conductor layer from inside to outside, the first conductor layer is provided with a signal access end, the signal access end is used for receiving a power supply signal, the second conductor layer is provided with a grounding end, and the grounding end is used for grounding;
the detection device is used for: receiving the power supply signal, generating a specific magnetic field or a specific electric field according to the power supply signal, and when the electronic device generates the specific event, the detection device moves on the surface of the electronic device to detect the sensitive area of the electronic device according to the generated specific magnetic field or the generated specific electric field.
2. The detecting means according to claim 1, characterized in that said wire is circular when said detecting means is used to generate said specific magnetic field.
3. The detecting device according to claim 1, wherein the conductive wire is linear when the detecting device is used to generate the specific electric field.
4. The probe apparatus of any one of claims 1-3, wherein the lead further comprises a second insulating layer disposed on an outermost layer of the lead.
5. The detection device according to claim 4, wherein the power signal is an electrostatic signal or a burst signal.
6. A detection method for detecting a sensitive area causing an electronic device to generate a specific event, the detection method comprising:
controlling the detection device according to any one of claims 1-5 to move relative to the electronic device;
detecting whether the specific event occurs to the electronic device;
when the specific event of the electronic device is detected, determining that the area of the electronic device corresponding to the detection device at the moment is a sensitive area.
7. The detection method according to claim 6, wherein after determining the sensitive region, the detection method further comprises:
and detecting the components in the sensitive area one by one to determine the components with faults.
8. The detection method according to claim 7, wherein the specific event is an electrostatic interference event.
9. A detection system for detecting a sensitive area causing an electronic device to generate a specific event, wherein the detection system comprises the detection device, the power supply device and the electronic device according to any one of claims 1 to 5, the detection device comprises a wire, the wire is provided with a first conductor layer, a first insulating layer and a second conductor layer from inside to outside, the first conductor layer is provided with a signal access end, the signal access end is used for being connected with the power supply device to receive a power supply signal, the second conductor layer is provided with a grounding end, and the grounding end is used for being connected with the same ground as the power supply device;
the power supply device is used for sending a power supply signal to the detection device;
the detection device is used for receiving the power supply signal and generating a specific magnetic field or a specific electric field according to the power supply signal, and when the electronic device generates the specific event, the detection device moves on the surface of the electronic device so as to detect the sensitive area of the electronic device according to the generated specific magnetic field or the generated specific electric field.
10. The detection system of claim 9, wherein the power supply device is a waveform signal generator.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN202210860341.0A CN115166400A (en) | 2022-07-21 | 2022-07-21 | Detection device, method and system |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202210860341.0A CN115166400A (en) | 2022-07-21 | 2022-07-21 | Detection device, method and system |
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| CN202210860341.0A Pending CN115166400A (en) | 2022-07-21 | 2022-07-21 | Detection device, method and system |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116298648A (en) * | 2023-05-12 | 2023-06-23 | 合肥联宝信息技术有限公司 | Detection method and device for electrostatic paths and electronic equipment |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116298648A (en) * | 2023-05-12 | 2023-06-23 | 合肥联宝信息技术有限公司 | Detection method and device for electrostatic paths and electronic equipment |
| CN116298648B (en) * | 2023-05-12 | 2023-09-19 | 合肥联宝信息技术有限公司 | Detection method and device for electrostatic paths and electronic equipment |
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