CN111257677B - Electromagnetic pulse interference test method and system - Google Patents
Electromagnetic pulse interference test method and system Download PDFInfo
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- CN111257677B CN111257677B CN202010113354.2A CN202010113354A CN111257677B CN 111257677 B CN111257677 B CN 111257677B CN 202010113354 A CN202010113354 A CN 202010113354A CN 111257677 B CN111257677 B CN 111257677B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
- G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
- G01R31/2841—Signal generators
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2843—In-circuit-testing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31712—Input or output aspects
- G01R31/31713—Input or output interfaces for test, e.g. test pins, buffers
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Abstract
The invention discloses an electromagnetic pulse interference test method and system; the method comprises the following steps: inputting electromagnetic pulses to the first digital circuit by using transmission line pulse testing equipment in a first initial voltage and first voltage stepping mode, and monitoring leakage current of the first digital circuit; recording a first voltage of the electromagnetic pulse when the first digital circuit has leakage current distortion or abnormal function; inputting electromagnetic pulses to a second digital circuit which is the same as the first digital circuit by stepping a second initial voltage and a second voltage, and monitoring the leakage current of the second digital circuit; recording a second voltage of the electromagnetic pulse when the second digital circuit has leakage current distortion or abnormal function; if the difference between the first voltage and the second voltage is smaller than a preset threshold value, taking the first voltage as an electromagnetic pulse interference threshold value; the second initial voltage is obtained by up-down floating according to the first voltage, and the second voltage step is smaller than the first voltage step. The invention can reduce the test cost of the electromagnetic pulse interference test.
Description
Technical Field
The invention belongs to the technical field of electromagnetic pulse interference testing, and particularly relates to an electromagnetic pulse interference testing method and system.
Background
With the development of technologies such as pulse power amplification technology, radar antenna technology, pulse weapons and the like, the electromagnetic environment is more and more complex, and a digital circuit is more and more easily interfered by electromagnetic pulses; when an electromagnetic pulse is coupled into a digital circuit, a transient high amplitude voltage and/or current is generated; when the generated voltage and/or current exceeds the endurance of the circuit, damage or even destruction may occur to the digital circuit. Therefore, it is necessary to perform an electromagnetic pulse interference test on the digital circuit to know the interference resistance of the digital circuit to the electromagnetic pulse. The rise time of the rising edge of the electromagnetic pulse input into the digital circuit needs to be fast enough at the time of testing.
In the existing electromagnetic pulse interference test method for a digital circuit, a Gaussian pulse generator or a double-exponential pulse generator is utilized to input electromagnetic pulses to a port to be tested of the digital circuit and monitor the leakage current of the digital circuit; when current distortion occurs in leakage current or the function of the digital circuit is abnormal, the current voltage of the electromagnetic pulse is used as the electromagnetic pulse interference threshold of the digital circuit. The leakage current is generated by the output port corresponding to the port to be tested and pre-designated by a tester under the action of the electromagnetic pulse.
However, when the rise time of the rising edge of the electromagnetic pulse is required to be fast enough, the gaussian pulse generator or the dual-exponential pulse generator is relatively expensive to manufacture; in addition, when a test is actually carried out, auxiliary equipment such as a matching power amplifier and monitoring equipment needs to be arranged between the digital circuit and the gaussian pulse generator or the double-exponential pulse generator, so that the test cost of the existing electromagnetic pulse interference test method is higher.
Disclosure of Invention
In order to solve the above problems in the prior art, embodiments of the present invention provide a method and a system for testing electromagnetic pulse interference.
The technical problem to be solved by the invention is realized by the following technical scheme:
in a first aspect, an embodiment of the present invention provides an electromagnetic pulse interference test method, including:
inputting electromagnetic pulses to a port to be tested of a first digital circuit by using transmission line pulse testing equipment in a first initial voltage and first voltage stepping mode, and monitoring the voltage of the input electromagnetic pulses and the leakage current of the first digital circuit;
when current distortion occurs in the leakage current of the first digital circuit or the function of the first digital circuit is abnormal, recording the voltage of the currently monitored electromagnetic pulse as a first voltage;
inputting electromagnetic pulses to a port to be tested of a second digital circuit by stepping a second initial voltage and a second voltage by using the transmission line pulse test equipment, and monitoring the voltage of the input electromagnetic pulses and the leakage current of the second digital circuit; the second digital circuit is the same circuit as the first digital circuit;
when the current distortion of the leakage current of the second digital circuit occurs or the function of the second digital circuit is abnormal, recording the voltage of the currently monitored electromagnetic pulse as a second voltage;
when the difference between the first voltage and the second voltage is smaller than a preset threshold value, taking the first voltage as an electromagnetic pulse interference threshold value of the first digital circuit and the second digital circuit;
the second initial voltage is a lower limit voltage of a voltage interval calculated according to the first voltage and a preset first voltage floating value; the first voltage floating value is several times of the second voltage step; the second voltage step is less than the first voltage step.
In one embodiment of the invention, the method further comprises:
when the difference between the first voltage and the second voltage is not smaller than a preset threshold value, inputting an electromagnetic pulse to a port to be tested of a third digital circuit by stepping a third initial voltage and a third voltage by using the transmission line pulse test equipment, and monitoring the voltage of the input electromagnetic pulse and the leakage current of the third digital circuit; the third digital circuit is the same as the first digital circuit and the second digital circuit;
when the current distortion of the leakage current of the third digital circuit occurs or the function of the third digital circuit is abnormal, the voltage of the currently monitored electromagnetic pulse is used as the electromagnetic pulse interference threshold of the first digital circuit, the second digital circuit and the third digital circuit;
the third initial voltage is a lower limit voltage of a voltage interval calculated according to the second voltage and a preset second voltage floating value; the second voltage floating value is smaller than the first voltage floating value and is several times of the third voltage step; the third voltage step is less than or equal to the second voltage step, and the third voltage step is not greater than 5V.
In one embodiment of the invention, the method further comprises:
when the difference between the first voltage and the second voltage is smaller than a preset threshold value, judging that the current distortion of the leakage current of the first digital circuit or the abnormal function of the first digital circuit is unrelated to the accumulation effect;
when the difference between the first voltage and the second voltage is not less than a preset threshold value, it is determined that current distortion of leakage current of the first digital circuit or abnormality of function of the first digital circuit is related to cumulative effect.
In one embodiment of the invention, the method further comprises:
judging whether the difference between the third voltage and the second voltage is smaller than the threshold value;
when the judgment result is yes, judging that the current distortion of the leakage current of the second digital circuit or the abnormal function of the second digital circuit is unrelated to the accumulation effect;
and when the judgment result is negative, judging that the current distortion of the leakage current of the second digital circuit or the abnormality of the function of the second digital circuit is related to the accumulation effect.
In one embodiment of the present invention, the port under test includes one or more of the following ports: a
Power port, data input port, data output port, ground port and control port.
In one embodiment of the present invention, the leakage current exhibits a current distortion: the difference in magnitude of leakage current before and after distortion is not less than 103。
In an embodiment of the invention, the first digital circuit, the second digital circuit and the third digital circuit are circuits belonging to the same production batch.
In one embodiment of the invention, the first voltage floating value e [10V,100V ]; the second voltage floating value e [5V,10V ].
In a second aspect, an embodiment of the present invention provides an electromagnetic pulse interference testing system, including: the device comprises transmission line pulse test equipment, a digital circuit to be tested and auxiliary test equipment;
the transmission line pulse test equipment is used for inputting electromagnetic pulses to the digital circuit to be tested and monitoring the voltage of the input electromagnetic pulses and the leakage current of the digital circuit to be tested;
and the auxiliary test equipment is used for detecting whether the function of the digital circuit to be tested is normal or not.
The invention has the beneficial effects that:
in the electromagnetic pulse interference test method provided by the embodiment of the invention, transmission line pulse test equipment is utilized to input electromagnetic pulses to a port to be tested of a first digital circuit to be tested and a port to be tested of a second digital circuit to be tested; the transmission line pulse test equipment is usually used for simulating electrostatic discharge test, the manufacturing cost is lower than that of a Gaussian pulse generator and a double-index pulse generator, and the rising time of the rising edge of an output pulse signal can be less than 1 nanosecond; therefore, the electromagnetic pulse interference test is carried out by utilizing the electromagnetic pulse signal sent by the transmission line pulse test equipment, and the same test effect as that of the electromagnetic pulse interference test by utilizing a Gaussian pulse generator or a double-exponential pulse generator can be achieved; moreover, the transmission line pulse test equipment is generally provided with a pin pad, and a port to be tested and an output port of the digital circuit can be connected with the TLP test system by using a pin matched with the pin pad and a simple lead wire without additional matching equipment; in addition, various monitoring devices are usually integrated in the transmission line pulse testing device, so that the voltage of the input electromagnetic pulse and the leakage current of the digital circuit to be tested can be monitored without additional monitoring devices; in summary, the electromagnetic pulse interference test method provided by the embodiment of the invention has lower test cost compared with the existing electromagnetic pulse interference test method.
In the method for testing electromagnetic pulse interference provided by the embodiment of the invention, the first digital circuit is tested to obtain a first voltage which is possibly an electromagnetic pulse interference threshold; then, on the basis of the first voltage, setting a voltage floating range, and testing a second digital circuit with the same circuit to obtain a first voltage which is possibly an electromagnetic pulse interference threshold; if the difference between the first voltage and the second voltage is smaller than a preset threshold value, the first voltage and the second voltage are basically the same, and the fact that the first digital circuit is abnormal is proved to be irrelevant to the accumulation effect; if the difference between the first voltage and the second voltage is not less than a preset threshold value, the first digital circuit is proved to be abnormal and related to the accumulation effect; therefore, the electromagnetic pulse interference test method provided by the embodiment of the invention can test the electromagnetic pulse interference threshold value irrelevant to the accumulation effect, and has higher credibility compared with the test result of the existing electromagnetic pulse interference test method.
The present invention will be described in further detail with reference to the accompanying drawings and examples.
Drawings
FIG. 1 is a schematic flow chart of an EMI testing method according to an embodiment of the present invention;
FIG. 2 is a schematic flow chart of another EMI testing method according to an embodiment of the present invention;
fig. 3 is a schematic structural diagram of an electromagnetic pulse interference test system according to an embodiment of the present invention.
Detailed Description
The present invention will be described in further detail with reference to specific examples, but the embodiments of the present invention are not limited thereto.
In order to reduce the test cost of the electromagnetic pulse interference test, the embodiment of the invention provides an electromagnetic pulse interference test method and an electromagnetic pulse interference test system. As shown in fig. 1, the method may include the steps of:
s10: and inputting electromagnetic pulses to a port to be tested of the first digital circuit by using transmission line pulse testing equipment in a first initial voltage and first voltage stepping mode, and monitoring the voltage of the input electromagnetic pulses and the leakage current of the first digital circuit.
The first digital circuit can be a digital chip or a digital circuit built by a plurality of digital chips; transmission line pulse test equipment is also commonly referred to as a TLP (Transmission line pulse) test system; in the TLP test system, a transmission line pulse generator is integrated, and various monitoring devices such as an SMU (Source measurement Unit) and an oscilloscope are integrated; thus, by using the monitoring device integrated in the TLP test system, the voltage of the electromagnetic pulse input to the port to be tested can be monitored, and the leakage current of the first digital circuit can also be monitored; also, the TLP test system is provided with a pin pad; therefore, the pin and the lead matched with the pin pad can be used for connecting the port to be tested and the output port of the first digital circuit with the TLP test system, and extra matching does not need to be considered.
In addition, there are a variety of ports of the first digital circuit to be tested. Illustratively, the ports under test of the first digital circuit may include one or more of the following:
power port, data input port, data output port, ground port and control port.
Also, the output port of the digital circuit may be previously designated by a tester according to the type of the port to be tested.
In this step, the first initial voltage and the first voltage step may be predetermined by a tester according to a test experience.
In addition, in practical applications, in order to temporally correlate the voltage of the monitored electromagnetic pulse with the leakage current of the first digital circuit, I-V curve data may be generated from the voltage of the monitored electromagnetic pulse and the leakage current of the first digital circuit.
S20: when the current distortion of the leakage current of the first digital circuit occurs or the function of the first digital circuit is abnormal, the voltage of the currently monitored electromagnetic pulse is recorded as a first voltage.
Wherein the current distortion of the leakage current may be that the difference in magnitude of the current before and after the distortion is not less than 103. For example, distortionThe former leakage current was 0.1mA, and the distorted leakage current was 1A.
In this step, whether the function of the first digital circuit is abnormal or not may be determined according to a test result of the auxiliary test equipment on the first digital circuit. It can be understood that, in the process of testing whether the function of the first digital circuit is normal or not by the auxiliary test equipment, the transmission line pulse test equipment may suspend inputting the electromagnetic pulse to the port to be tested of the first digital circuit. In practical applications, one or more observation ports capable of characterizing whether the first digital circuit functions normally may be selected, and the selected ports may be loaded with corresponding auxiliary test equipment. In practical applications, the auxiliary test equipment may include a test meter such as an oscilloscope, an SMU, and/or a multimeter.
It can be understood that the task of controlling the transmission line pulse test device and the auxiliary test device to work in a time-sharing manner can be realized manually or by a pre-programmed automatic test script.
S30: inputting electromagnetic pulses to a port to be tested of a second digital circuit by transmission line pulse testing equipment in a stepping mode according to a second initial voltage and a second voltage, and monitoring the voltage of the input electromagnetic pulses and the leakage current of the second digital circuit; the second initial voltage is a lower limit voltage of a voltage interval calculated according to the first voltage and a preset first voltage floating value; a first voltage float value that is several times the second voltage step; the second voltage step is less than the first voltage step.
Here, the second digital circuit is the same circuit as the first digital circuit.
For example, assume that the first voltage is 100V, the first voltage step is 5V, and the first voltage float is 50V; then, the voltage interval calculated according to the first voltage and the preset first voltage floating value is [50V,150V ], and the second initial voltage is 50V; furthermore, the first voltage step is 5V, and the second voltage step is at least less than 5V.
It will be appreciated that the port under test of the second digital circuit is the same as the port under test of the first digital circuit.
S40: and when the current distortion occurs in the leakage current of the second digital circuit or the function of the second digital circuit is abnormal, recording the voltage of the currently monitored electromagnetic pulse as a second voltage.
In this step, the detection mode of whether the leakage current of the second digital circuit has current distortion or not and the detection mode of whether the function of the second digital circuit has abnormality or not are the same as the first digital circuit, and are not described herein again.
S50: and when the difference between the first voltage and the second voltage is smaller than a preset threshold value, taking the first voltage as an electromagnetic pulse interference threshold value of the first digital circuit and the second digital circuit.
Here, the preset threshold may be understood as a criterion for determining whether the first voltage and the second voltage are close to each other; thus, when the difference between the first voltage and the second voltage is smaller than the preset threshold, it can be understood that the second voltage is close to the first voltage; when the difference between the first voltage and the second voltage is not less than the preset threshold, it can be understood that the second voltage is not close to the first voltage.
Correspondingly, when the difference between the first voltage and the second voltage is smaller than a preset threshold value, namely when the second voltage is close to the first voltage, the current distortion of the leakage current of the first digital circuit or the abnormity of the first digital circuit is judged to be unrelated to the accumulation effect; otherwise, the current distortion of the leakage current of the first digital circuit or the abnormality of the first digital circuit is determined to be related to the cumulative effect. Here, the cumulative effect means that the occurrence of current distortion in the leakage current of the first digital circuit or the occurrence of abnormality in the first digital circuit is a cumulative effect due to the electromagnetic pulse input to the first digital circuit a plurality of times, not an effect resulting from the electromagnetic pulse input to the first digital circuit a single time.
It can be understood that the electromagnetic pulse interference threshold independent of the cumulative effect has important reference significance for subsequent guidance of research, development, test, production and other links of the same or similar circuits. The electromagnetic pulse interference threshold related to the cumulative effect has little reference meaning for subsequent guidance of links such as research, development, test, production and the like of the same or similar circuit due to the variability of the process of generating the cumulative effect.
In the electromagnetic pulse interference test method provided by the embodiment of the invention, transmission line pulse test equipment is utilized to input electromagnetic pulses to a port to be tested of a first digital circuit to be tested and a port to be tested of a second digital circuit to be tested; the transmission line pulse test equipment is usually used for simulating electrostatic discharge test, the manufacturing cost is lower than that of a Gaussian pulse generator and a double-index pulse generator, and the rising time of the rising edge of an output pulse signal can be less than 1 nanosecond; therefore, the electromagnetic pulse interference test is carried out by utilizing the electromagnetic pulse signal sent by the transmission line pulse test equipment, and the same test effect as that of the electromagnetic pulse interference test by utilizing a Gaussian pulse generator or a double-exponential pulse generator can be achieved; moreover, the transmission line pulse test equipment is generally provided with a pin pad, and a port to be tested and an output port of the digital circuit can be connected with the TLP test system by using a pin matched with the pin pad and a simple lead wire without additional matching equipment; in addition, various monitoring devices are usually integrated in the transmission line pulse testing device, so that the voltage of the input electromagnetic pulse and the leakage current of the digital circuit to be tested can be monitored without additional monitoring devices; in summary, the electromagnetic pulse interference test method provided by the embodiment of the invention has lower test cost compared with the existing electromagnetic pulse interference test method.
In the method for testing electromagnetic pulse interference provided by the embodiment of the invention, the first digital circuit is tested to obtain a first voltage which is possibly an electromagnetic pulse interference threshold; then, on the basis of the first voltage, setting a voltage floating range, and testing a second digital circuit with the same circuit to obtain a first voltage which is possibly an electromagnetic pulse interference threshold; if the difference between the first voltage and the second voltage is smaller than a preset threshold value, the first voltage and the second voltage are basically the same, and the fact that the first digital circuit is abnormal is proved to be irrelevant to the accumulation effect; if the difference between the first voltage and the second voltage is not less than a preset threshold value, the first digital circuit is proved to be abnormal and related to the accumulation effect; therefore, the electromagnetic pulse interference test method provided by the embodiment of the invention can test the electromagnetic pulse interference threshold value irrelevant to the accumulation effect, and has higher credibility compared with the test result of the existing electromagnetic pulse interference test method.
In addition, as shown in fig. 2, the electromagnetic pulse interference testing method provided in the embodiment of the present invention may further include the following steps:
s60: when the difference between the first voltage and the second voltage is not less than the preset threshold value, the transmission line pulse test equipment is utilized to input electromagnetic pulses to the port to be tested of the third digital circuit in a stepping mode according to the third initial voltage and the third voltage, and the voltage of the input electromagnetic pulses and the leakage current of the third digital circuit are monitored.
The third digital circuit is the same as the first digital circuit and the second digital circuit; the port to be tested of the third digital circuit is the same as the ports to be tested of the first digital circuit and the third digital circuit.
In addition, the third initial voltage is a lower limit voltage of a voltage interval calculated according to the second voltage and a preset second voltage floating value; the second voltage floating value is smaller than the first voltage floating value and is several times of the third voltage step; the third voltage step is less than or equal to the second voltage step, and the third voltage step is not greater than 5V.
For example, assume that the second voltage is 120V, the second voltage step is 1V, and the second voltage floating value is 5V; then, the voltage interval calculated according to the second voltage and the second voltage floating value is [115V,125V ], and the second initial voltage is 115V; in addition, if the second voltage step is 1V, the third voltage step may be equal to 1V, or may be any voltage value greater than 1V and less than 5V.
S70: and when the leakage current of the third digital circuit has current distortion or the function of the third digital circuit is abnormal, taking the voltage of the currently monitored electromagnetic pulse as the electromagnetic pulse interference threshold of the first digital circuit, the second digital circuit and the third digital circuit.
In this step, the detection mode of whether the leakage current of the third digital circuit has current distortion or not and the detection mode of whether the function of the third digital circuit has abnormality or not are the same as the first digital circuit and the second digital circuit, and are not described herein again.
It will be appreciated that the voltage of the electromagnetic pulse input to the third digital circuit is already very close to the true electromagnetic pulse interference threshold independent of the cumulative effect, compared to the first voltage and the second voltage; and, since the third voltage step is small, when the leakage current of the third digital circuit has current distortion and the function of the third digital circuit is abnormal, the voltage of the electromagnetic pulse currently input into the third digital circuit can be directly used as the final electromagnetic pulse interference threshold. Therefore, even if the difference exists between the measured electromagnetic pulse interference threshold and the actual electromagnetic pulse interference threshold, the guiding effect of subsequent loop time for guiding research, development, test, production and the like of the same or similar circuit is not influenced.
In addition, in the embodiment of the present invention, by determining whether the difference between the third voltage and the second voltage is smaller than a preset threshold, it can be known whether current distortion occurs in the leakage current of the second digital circuit or whether the function abnormality of the second digital circuit is related to the cumulative effect; specifically, when the judgment result is yes, it is judged that the current distortion of the leakage current of the second digital circuit or the abnormality of the function of the second digital circuit is unrelated to the accumulation effect; when the judgment result is negative, the current distortion of the leakage current of the second digital circuit or the abnormality of the function of the second digital circuit is judged to be related to the accumulation effect.
Alternatively, in order to reduce the test error, the first digital circuit, the second digital circuit and the third digital circuit may be circuits belonging to the same production batch.
It will be appreciated that circuits belonging to the same production lot, and devices in the circuits will typically also belong to the same processing lot.
In addition, as an example, the first voltage floating value may be selected from an interval of [10V,100V ]; the second voltage floating value may be selected from the interval of [5V,10V ].
Further, as a preferred example, the present embodiment provides a set of preferred test parameters. In the set of test parameters, the first initial voltage may be 0V, and the first voltage step may be 5V; the first voltage floating value may be 50V and the second voltage step may be 1V; the second voltage floating value may be 5V and the third voltage step may be 1V. In addition, in practical applications, when the electromagnetic pulse is input to each digital circuit by using the transmission line pulse test apparatus, the upper limit voltage of the electromagnetic pulse may be determined empirically by a tester.
It can be understood that after the anti-interference threshold of the electromagnetic pulse is obtained through testing, the chip in the digital circuit can be further sliced to know the damage appearance and the damage position of the chip, so that the vulnerable damage point of the digital circuit can be known. Therefore, if the anti-interference threshold of the electromagnetic pulse of the digital circuit is lower, the anti-interference performance of the digital circuit to the electromagnetic pulse can be improved by adding the protection circuit at the vulnerable point.
Corresponding to the above-mentioned electromagnetic pulse interference testing method, an embodiment of the present invention further provides an electromagnetic pulse interference testing system, as shown in fig. 3, the system may include: a transmission line pulse test device 301, a digital circuit to be tested 302 and an auxiliary test device 303;
the transmission line pulse test equipment 301, specifically, a TLP test system, is configured to input an electromagnetic pulse to the digital circuit to be tested 302, and monitor a voltage of the input electromagnetic pulse and a leakage current of the digital circuit to be tested 302;
the auxiliary device 303 is configured to detect whether the function of the digital circuit 302 under test is normal. Specifically, when the leakage current of the digital circuit to be tested has current distortion, the transmission line pulse test device 301 suspends inputting electromagnetic pulses to the circuit to be tested, and at this time, the auxiliary device 303 detects whether the function of the digital circuit to be tested 302 is normal. That is, in this system, the transmission line pulse test device 301 and the auxiliary test device 303 operate in time division. In practical applications, the auxiliary device 303 may include a meter such as an oscilloscope, an SMU, and/or a multimeter.
In addition, the digital circuit under test 302 may include a plurality of identical digital circuits.
It should be noted that, for the system embodiment, since the specific functions of each component of the system embodiment have been described in detail in the method embodiment, the description is relatively simple, and relevant points can be referred to the partial description of the method embodiment.
It should be noted that the terms "first" and "second" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more features. In the description of the present invention, "a plurality" means two or more unless specifically defined otherwise.
In the description of the specification, reference to the description of the term "one embodiment", "some embodiments", "an example", "a specific example", or "some examples", etc., means that a particular feature or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples described in this specification can be combined and combined by those skilled in the art.
While the present application has been described in connection with various embodiments, other variations to the disclosed embodiments can be understood and effected by those skilled in the art in practicing the claimed application, from a review of the drawings, the disclosure, and the appended claims. In the claims, the word "comprising" does not exclude other elements or steps, and the word "a" or "an" does not exclude a plurality. A single processor or other unit may fulfill the functions of several items recited in the claims. The mere fact that certain measures are recited in mutually different dependent claims does not indicate that a combination of these measures cannot be used to advantage.
The foregoing is a more detailed description of the invention in connection with specific preferred embodiments and it is not intended that the invention be limited to these specific details. For those skilled in the art to which the invention pertains, several simple deductions or substitutions can be made without departing from the spirit of the invention, and all shall be considered as belonging to the protection scope of the invention.
Claims (8)
1. An electromagnetic pulse interference test method, comprising:
inputting electromagnetic pulses to a port to be tested of a first digital circuit by using transmission line pulse testing equipment in a first initial voltage and first voltage stepping mode, and monitoring the voltage of the input electromagnetic pulses and the leakage current of the first digital circuit;
when current distortion occurs in the leakage current of the first digital circuit or the function of the first digital circuit is abnormal, recording the voltage of the currently monitored electromagnetic pulse as a first voltage;
inputting electromagnetic pulses to a port to be tested of a second digital circuit by stepping a second initial voltage and a second voltage by using the transmission line pulse test equipment, and monitoring the voltage of the input electromagnetic pulses and the leakage current of the second digital circuit; the second digital circuit is the same circuit as the first digital circuit;
when the current distortion of the leakage current of the second digital circuit occurs or the function of the second digital circuit is abnormal, recording the voltage of the currently monitored electromagnetic pulse as a second voltage;
when the difference between the first voltage and the second voltage is smaller than a preset threshold value, taking the first voltage as an electromagnetic pulse interference threshold value of the first digital circuit and the second digital circuit;
the second initial voltage is a lower limit voltage of a voltage interval calculated according to the first voltage and a preset first voltage floating value; the first voltage floating value is several times of the second voltage step; the second voltage step is less than the first voltage step.
2. The method of claim 1, further comprising:
when the difference between the first voltage and the second voltage is not smaller than a preset threshold value, inputting an electromagnetic pulse to a port to be tested of a third digital circuit by stepping a third initial voltage and a third voltage by using the transmission line pulse test equipment, and monitoring the voltage of the input electromagnetic pulse and the leakage current of the third digital circuit; the third digital circuit is the same as the first digital circuit and the second digital circuit;
when the current distortion of the leakage current of the third digital circuit occurs or the function of the third digital circuit is abnormal, the voltage of the currently monitored electromagnetic pulse is used as the electromagnetic pulse interference threshold of the first digital circuit, the second digital circuit and the third digital circuit;
the third initial voltage is a lower limit voltage of a voltage interval calculated according to the second voltage and a preset second voltage floating value; the second voltage floating value is smaller than the first voltage floating value and is several times of the third voltage step; the third voltage step is less than or equal to the second voltage step, and the third voltage step is not greater than 5V.
3. The method of claim 1, further comprising:
when the difference between the first voltage and the second voltage is smaller than a preset threshold value, judging that the current distortion of the leakage current of the first digital circuit or the abnormal function of the first digital circuit is unrelated to the accumulation effect;
when the difference between the first voltage and the second voltage is not less than a preset threshold value, it is determined that current distortion of leakage current of the first digital circuit or abnormality of function of the first digital circuit is related to cumulative effect.
4. The method of claim 2, further comprising:
judging whether the difference between the third voltage and the second voltage is smaller than the threshold value;
when the judgment result is yes, judging that the current distortion of the leakage current of the second digital circuit or the abnormal function of the second digital circuit is unrelated to the accumulation effect;
and when the judgment result is negative, judging that the current distortion of the leakage current of the second digital circuit or the abnormality of the function of the second digital circuit is related to the accumulation effect.
5. The method of claim 1, wherein the ports under test comprise one or more of: a
Power port, data input port, data output port, ground port and control port.
6. The method of claim 1, wherein the leakage current exhibits a current distortion of: the difference in magnitude of leakage current before and after distortion is not less than 103。
7. The method of claim 2, wherein the first digital circuit, the second digital circuit, and the third digital circuit are circuits belonging to the same production lot.
8. The method of claim 1, wherein the first voltage float value e [10V,100V ]; the second voltage floating value e [5V,10V ].
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| US5459392A (en) * | 1993-12-27 | 1995-10-17 | Megapower Corp. | Unity power factor power supply which includes an electromagnetic interference reduction circuit |
| CN204479674U (en) * | 2015-03-10 | 2015-07-15 | 国家电网公司 | A kind of strong electromagnetic pulse interference detecting apparatus |
| CN205426977U (en) * | 2016-03-24 | 2016-08-03 | 吉林大学 | Measurement system that anti strong electromagnetic radiation disturbed |
| CN106413370A (en) * | 2016-11-17 | 2017-02-15 | 中国工程物理研究院流体物理研究所 | Optoelectronic isolation shielding box with strong electromagnetic interference resisting performance, system and method |
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