CN104318755A - Automatic testing device and method - Google Patents
Automatic testing device and method Download PDFInfo
- Publication number
- CN104318755A CN104318755A CN201410555239.5A CN201410555239A CN104318755A CN 104318755 A CN104318755 A CN 104318755A CN 201410555239 A CN201410555239 A CN 201410555239A CN 104318755 A CN104318755 A CN 104318755A
- Authority
- CN
- China
- Prior art keywords
- circuit
- moment value
- infrared
- signal
- key assignments
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
The embodiment of the invention discloses an automatic testing device and a method. The device comprises a processor circuit, an infrared receiving circuit, an infrared transmitting circuit and a clock circuit, wherein the infrared receiving circuit can receive an infrared signal sent by a remote control and convert the infrared signal into a square signal when the processor circuit detects a recording instruction, so that the processor circuit analyzes the square signal to obtain corresponding key values; the clock circuit can record the moment values when the infrared signal is received; the processor circuit can correspondingly store the key values and the moment values into a record file, and each convert the key value corresponding to one moment value into high-low level signals sequentially according to the time interval between two moment values in the record file while detecting the test instruction, so that the infrared transmitting circuit sends the infrared signal to the tested device. Due to implementation of the embodiment of the invention, the key values can be automatically recorded so as to carry out automated testing on the tested device, so that the labor cost is saved, and the testing efficiency is improved.
Description
Technical field
The present invention relates to electronic technology field, be specifically related to a kind of automatic test device and method.
Background technology
Current set top box and TV etc. need the product of infrared control need carry out long remote control burn-in test in research and development of products and test phase, such as, Set Top Box need repeat the test of 1,000 functions such as switching channels, choice menus respectively, and the function that will test of the Set Top Box of different model or the test duration also different, if all test jobs are by having tested manually, will huge human cost be expended and easily cause personnel tired and easily make mistakes.
Summary of the invention
The embodiment of the invention discloses a kind of automatic test device and method, the key assignments of the outer remote keying of Different Red can be recorded, automatically can test device being tested.
The embodiment of the invention discloses a kind of automatic test device, this device comprises processor circuit, infrared receiving circuit, infrared transmitting circuit and clock circuit,
Described infrared receiving circuit, for when described processor circuit detects recording instruction, receives the infrared signal of telepilot transmission and described infrared signal is converted to square-wave signal;
Described clock circuit, for recording moment value when described infrared receiving circuit receives described infrared signal;
Described processor circuit, for described square-wave signal is resolved to corresponding key assignments, and by described key assignments and described moment value corresponding stored in log file, and when test instruction being detected, according to the time interval between moment value described in described log file, successively described key assignments corresponding for described moment value is converted to low and high level signal;
Described infrared transmitting circuit, for the described low and high level signal changed according to described processor circuit, sends infrared signal to device being tested.
Correspondingly, the embodiment of the invention also discloses a kind of automated testing method, the method comprises:
When recording instruction being detected, receiving the infrared signal of telepilot transmission and described infrared signal is converted to square-wave signal;
Record receives moment value during described infrared signal;
Described square-wave signal is resolved to corresponding key assignments, and by described key assignments and described moment value corresponding stored in log file;
When test instruction being detected, according to the time interval between moment value described in described log file, successively described key assignments corresponding for described moment value is converted to low and high level signal;
According to described low and high level signal, send infrared signal to device being tested.
In the embodiment of the present invention, infrared receiving circuit can receive infrared signal and be converted into square-wave signal, key assignments corresponding to this square-wave signal is resolved to make processor circuit, clock circuit can record receive each key-value pair answer infrared signal time moment value, the key assignments that infrared receiving circuit and clock circuit can obtain by processor circuit and moment value corresponding stored are in log file, thus can when test instruction being detected, according to log file, key assignments corresponding for each moment value is converted to low and high level signal, export to infrared transmitting circuit, controlled to send infrared signal to device being tested according to low and high level signal by infrared transmitting circuit.Visible, the embodiment of the present invention can operate automatic test to device being tested by automatic reception, record, transmission etc., thus saves human cost, improves testing efficiency.
Accompanying drawing explanation
In order to be illustrated more clearly in the technical scheme in the embodiment of the present invention, be briefly described to the accompanying drawing used required in embodiment below, apparently, accompanying drawing in the following describes is only some embodiments of the present invention, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to these accompanying drawings.
Fig. 1 is the structural representation of a kind of automatic test device disclosed in the embodiment of the present invention;
Fig. 2 is the structural representation of another kind of automatic test device disclosed in the embodiment of the present invention;
Fig. 3 is the schematic diagram of a kind of automatization test system disclosed in the embodiment of the present invention;
Fig. 4 is the schematic flow sheet of a kind of automated testing method disclosed in the embodiment of the present invention;
Fig. 5 is the schematic flow sheet of another kind of automated testing method disclosed in the embodiment of the present invention.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, be clearly and completely described the technical scheme in the embodiment of the present invention, obviously, described embodiment is the present invention's part embodiment, instead of whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art, not making the every other embodiment obtained under creative work prerequisite, belong to the scope of protection of the invention.
The embodiment of the invention discloses a kind of structural representation of automatic test device, the key assignments of the outer remote keying of Different Red can be recorded, automatically can test device being tested.Below be described in detail respectively.
Refer to Fig. 1, Fig. 1 is the structural representation of automatic test device disclosed in the embodiment of the present invention.As shown in Figure 1, this automatic test device can comprise infrared receiving circuit 1, clock circuit 2, processor circuit 3 and infrared transmitting circuit 4.
Wherein, infrared receiving circuit 1, infrared transmitting circuit 4 and clock circuit 2 can be connected with the input/output port (I/O) of processor in processor circuit 3 respectively.
Infrared receiving circuit 1, for when described processor circuit detects recording instruction, receives the infrared signal of telepilot transmission and described infrared signal is converted to square-wave signal.
Wherein, this recording instruction is used to indicate and starts to receive infrared signal and record key assignments corresponding to this infrared signal, also learn command can be called, concrete, the infrared signal of reception can carry out amplifying by infrared receiving circuit, filtering and demodulation, finally be converted to the discernible square wave electric signal of processor circuit, i.e. the key assignments of corresponding respective keys.This key assignments is specially infrared coding value corresponding to remote controller key.
Clock circuit 2, for recording moment value when described infrared receiving circuit receives described infrared signal.
Wherein, clock circuit can comprise clock chip, this chip can provide current year, month, day, week, time, minute, second information, by clock circuit can record accurately receive each key-value pair answer infrared signal time moment value.
Processor circuit 3, for described square-wave signal is resolved to corresponding key assignments, and by each key assignments and each moment value corresponding stored in log file, and when test instruction being detected, according to the time interval between moment value each in log file, successively key assignments corresponding for each moment value is converted to low and high level signal.
Wherein, the processor in this processor circuit 3 can be the process chip such as single-chip microcomputer, digital signal processor (DSP, digital signal processor).
Concrete, this automatic test device also can comprise memory circuit, and processor circuit can call memory circuit, by each key assignments and each moment value corresponding stored in log file.Wherein, test instruction is used to indicate and starts to test device being tested according to log file.
Infrared transmitting circuit 4, for the low and high level signal changed according to processor circuit, sends infrared signal to device being tested.
Concrete, infrared transmitting circuit infrared transmitting circuit comprises infrared transmitting tube IR_LED and triode, for when receiving the high level of the low and high level signal that processor circuit is changed according to key assignments, triode ON is to send infrared signal by infrared transmitting tube IR_LED to described device being tested; When receiving the low level in low and high level signal, triode cut-off is to stop sending infrared signal to device being tested.Wherein, the square-wave signal of infrared receiving circuit 1 conversion acquisition is corresponding with the low and high level signal that key assignments converts to by processor circuit 3.
Alternatively, this automatic test device can also comprise key circuit and timing circuit, this key circuit and timing circuit are all connected with the input/output port (I/O port) of processor in processor circuit, tester can be made by key circuit to processor circuit input recording instruction or test instruction, and the loop test time can be set; Timing circuit can determine timing according to the loop test time, and when timing circuit time-out, interrupt instruction is sent to processor circuit, with make processor circuit stop perform described according to the time interval in log file between moment value, successively key assignments corresponding for each moment value is converted to the operation of low and high level signal.
Alternatively, this automatic test device also can not comprise timing circuit, the loop test time arranged according to key circuit by clock circuit, determine timing, at timing then, to processor circuit send interrupt instruction, with make processor circuit stop perform described according to the time interval in log file between moment value, successively key assignments corresponding for each moment value is converted to the operation of low and high level signal.
In the device described by Fig. 1, infrared receiving circuit 1 can receive infrared signal and be converted to the key assignments of respective keys, clock circuit 2 can record receive each key-value pair answer infrared signal time moment value, the key assignments that infrared receiving circuit 1 and clock circuit 2 can obtain by processor circuit 3 and moment value corresponding stored are in log file, thus can when test instruction being detected, according to log file, key assignments corresponding for each moment value is converted to low and high level signal, and export to infrared transmitting circuit 4, controlled to send infrared signal to device being tested according to low and high level signal by infrared transmitting circuit.Visible, the device described by Fig. 1 can operate automatic test to device being tested by automatic reception, record, transmission etc., thus saves human cost, improves testing efficiency.
Refer to Fig. 2, Fig. 2 is the structural representation of another kind of automatic test device disclosed in the embodiment of the present invention.As shown in Figure 2, this automatic test device, except comprising the infrared receiving circuit 1 of Fig. 1, clock circuit 2, processor circuit 3 and infrared transmitting circuit 4, can also comprise: key circuit 5 and timing circuit 6;
Key circuit 5, for arranging the loop test time;
Accordingly, the loop test time that key circuit 5 can arrange by processor circuit 3 sends to timing circuit 6.
Timing circuit 6, for determining timing according to the loop test time, and when timing circuit time-out, interrupt instruction is sent to processor circuit 3, with make processor circuit stop perform described according to the time interval in described log file between moment value, successively key assignments corresponding for each moment value is converted to the operation of low and high level signal.
Correspondingly, processor circuit 3 is when timing circuit 6 is not overtime, according to the order of moment value each in log file, successively key assignments corresponding for each moment value is converted to low and high level signal with the time interval between each moment value, and when key assignments corresponding for last moment value in described log file is converted to low and high level signal, from described log file the earliest a moment value, the order according to moment value described in described log file described in execution, successively described key assignments corresponding for described moment value is converted to the operation of low and high level signal with the time interval between described moment value.
For example, the corresponding relation list of the moment value recorded in log file and key assignments, is followed successively by (T1, K1), (T2, K2), (T3, K3), (T4, K4) by the sequencing of moment value.The loop test time that key circuit 5 is arranged is T, and the timing that timing circuit 6 sets according to loop test time T is T; When test instruction being detected, timing circuit 6 starts, and carries out countdown, and meanwhile, key assignments K1 is converted to low and high level signal by processor circuit 3, sends to infrared transmitting circuit 4, makes infrared transmitting circuit 4 launch infrared waveform W1; After latency period T2-T1, key assignments K2 is converted to low and high level signal by processor circuit 3, sends to infrared transmitting circuit 4, makes infrared transmitting circuit 4 launch infrared waveform W2; After latency period T3-T2, key assignments K3 is converted to low and high level signal and launches infrared waveform W3 to make infrared transmitting circuit 4 by processor circuit 3; After latency period T4-T3, key assignments K4 is converted to low and high level signal and launches infrared waveform W4 to make infrared transmitting circuit 4 by processor circuit 3; If timing circuit is not overtime, then processor circuit 3 can continue respectively key assignments K1, K2, K3 or K4 to be converted to low and high level signal according to the corresponding time interval, send to infrared transmitting circuit 4, make infrared transmitting circuit 4 correspondence launch infrared waveform W1, W2, W3 or W4.
Accordingly, the automatic test device described by Fig. 2 can also comprise display circuit 7, display circuit 7, for showing the corresponding relation in log file between each key assignments and each moment value, and the loop test time that tester is arranged by key circuit 5.
Concrete, in the automatic test device described by Fig. 2, infrared receiving circuit 1 comprises infrared receiving tube IR, the power end VCC of this infrared receiving tube is connected with 5V power supply, the earth terminal GND ground connection of this infrared receiving tube IR, the output terminal OUT of this infrared receiving tube IR is connected with processor circuit 3 by resistance R1, correspondingly, this infrared receiving circuit 1 also comprises for other resistance R1 of dividing potential drop and the electric capacity for filtering, no longer describes in detail here.This infrared receiving tube IR, for receiving the infrared signal of telepilot transmission and infrared signal being converted to square-wave signal, exports to processor circuit 3.
Concrete, in the automatic test device described by Fig. 2, infrared transmitting circuit 4 comprises infrared transmitting tube IR_LED and triode Q, this triode Q base stage is connected with processor circuit 3 by resistance R2, the grounded emitter GND of this triode Q, collector is connected with the negative electrode of infrared transmitting tube IR_LED by resistance R3, and the anode of this infrared transmitting tube IR_LED connects 5V power supply.
The principle of work of this infrared transmitting circuit 4 is: the base stage of triode Q is when receiving the high level in the low and high level signal that processor circuit 3 exports, and conducting sends infrared signal to trigger infrared transmitting tube IR_LED to device being tested; When receiving the low level in low and high level signal, ending to stop triggering infrared transmitting tube IR_LED and sending infrared signal to device being tested.
Automatic test device described by Fig. 2 is that the automatic test device described by Fig. 1 optimizes acquisition further, automatic test device described by Fig. 2 can arrange the loop test time by key circuit, and determine timing by timing circuit according to this loop test time, when timing circuit time-out, interrupt instruction can be sent, with interrupt test to processor circuit.Visible, the loop test time of carrying out device being tested can be conveniently set by the automatic test device described by Fig. 2, and the key assignments of test and the corresponding relation of moment value and loop test time can be watched in real time by display circuit, facilitate tester to operate.
Refer to Fig. 3, the schematic diagram of Fig. 3 a kind of automatization test system disclosed in the embodiment of the present invention, as shown in Figure 3, this automatization test system comprises the tester of automatic test device, at least one device being tested (Fig. 3 is for a device being tested) and hand-held remote controller, and idiographic flow is as follows:
11) first tester sends recording instruction to automatic test device;
12), when automatic test device receives recording instruction, record waiting status is in;
13) tester of hand-held remote controller sends infrared signal by telepilot to automatic test device;
14) automatic test device receives infrared signal that telepilot sends and infrared signal is converted to the key assignments of button; Record receive key-value pair answer infrared signal time moment value; By key assignments and moment value corresponding stored in log file.
15) tester of hand-held remote controller can send to automatic test device and stop recording instruction, and sends test instruction, stops receiving infrared signal, start to perform test to device being tested to make automatic test device;
16) automatic test device is when test instruction being detected, according to the time interval in log file between moment value, successively key assignments corresponding for each moment value is converted to low and high level signal, and according to low and high level signal, sends infrared signal to device being tested;
17) device being tested performs corresponding function according to the infrared signal received.
Alternatively, in the system described by Fig. 3, tester can also in step 16) before, by the button on automatic test device, the loop test time of automatic test device is set; Correspondingly, step 16) can be: automatic test device, when test instruction being detected, is determined the timing of timer, and is started described timer according to the described loop test time; Circulation performed according to the time interval between moment value described in described log file, successively described key assignments corresponding for described moment value was converted to the operation of low and high level signal, until described timer expiry.
Refer to Fig. 4, the schematic flow sheet of a kind of automated testing method disclosed in embodiment of the present invention during Fig. 4, as shown in Figure 4, this process flow diagram can comprise the following steps:
S101: when recording instruction being detected, receives the infrared signal of telepilot transmission and infrared signal is converted to square-wave signal;
Wherein, recording instruction is used to indicate and starts wait-receiving mode infrared signal.
S102: record receives moment value during infrared signal;
Wherein, the moment value of this reception infrared signal is corresponding with square-wave signal infrared signal converted to.
S103: the square-wave signal be converted to is resolved to corresponding key assignments, and by key assignments and moment value corresponding stored in log file;
Concrete, key assignments infrared signal being converted to button is specially: the infrared signal received is passed through amplification, filtering and demodulation operation, obtains square-wave signal, and square-wave signal is resolved to corresponding key assignments, this key assignments is infrared coding value.
S104: when test instruction being detected, according to the time interval in log file between moment value, is converted to low and high level signal by key assignments corresponding for moment value successively;
Alternatively, before step S104, can also arrange the loop test time, step S104 is specifically as follows: when test instruction being detected, determines the timing of timer, and start timer according to the loop test time; Circulation performed according to the time interval in log file between moment value, successively key assignments corresponding for each moment value was converted to the operation of low and high level signal, until timer expiry.
Concrete, circulation performed according to the time interval in log file between moment value, the operation successively key assignments corresponding for each moment value being converted to low and high level signal can be: when timer is not overtime, according to the order of moment value each in log file, successively key assignments corresponding for moment value is converted to low and high level signal with the time interval between moment value, and when key assignments corresponding for last moment value in log file is converted to low and high level signal, from log file the earliest a moment value, the order according to moment value described in described log file described in execution, successively described key assignments corresponding for described moment value is converted to the operation of low and high level signal with the time interval between described moment value.
S105: according to this low and high level signal, sends infrared signal to device being tested.
Concrete, can according to this low and high level signal, when high level, infrared signal is sent to device being tested, when low level, stop sending infrared signal to device being tested, device being tested can determine pending concrete function according to the infrared signal received.
Method described by Fig. 4 can when detecting recording instruction, receive the infrared signal of telepilot transmission and infrared signal is converted to square-wave signal, and record receive key-value pair answer infrared signal time moment value, square-wave signal can be resolved to corresponding key assignments, and by key assignments and moment value corresponding stored in log file; When test instruction being detected, according to the time interval in log file between moment value, successively key assignments corresponding for moment value can be converted to low and high level signal, and according to low and high level signal, send infrared signal to device being tested.Visible, the embodiment of the present invention can record key assignments, to carry out automatic test to device being tested, saves human cost, improves testing efficiency.
Refer to Fig. 5, the schematic flow sheet of Fig. 5 another kind of automated testing method disclosed in the embodiment of the present invention, as shown in Figure 5, this flow process is specially:
S201: when recording instruction being detected, receives the infrared signal of telepilot transmission and infrared signal is converted to square-wave signal.
Wherein, this recording instruction is also referred to as learn command, and namely instruction starts to receive the corresponding key assignments of infrared signal study.
S202: record receives moment value during infrared signal.
S203: the square-wave signal be converted to by step S201 resolves to corresponding key assignments, and by key assignments and moment value corresponding stored in log file.
S204: the loop test time is set.
S205: judge whether test instruction to be detected, if test instruction detected, then performs step S206, if test instruction do not detected, and can process ends.
Wherein, this test instruction is used to indicate and starts to test device being tested.
S206: the timing determining timer according to the loop test time, and start timer.
S207: according to the time interval in log file between moment value, is converted to low and high level signal by key assignments corresponding for each moment value successively.
Concrete, when key assignments corresponding for moment value each in log file is converted to low and high level signal by step S207 successively, when converting the low and high level signal of key assignments corresponding to last moment value, can step S207. be performed
S208: judge that whether timer is overtime, if not overtime, then continues to perform step S207; If overtime, then process ends.
The embodiment of the present invention is by performing step S201 to S203, key assignments corresponding for function to be tested can be stored in log file, when test instruction being detected, can test device being tested according to log file, carry out test compared with by performing script file to device being tested to make automatic test device with adopting scripting language's function to be tested in prior art, the embodiment of the present invention can avoid research staff need distinguish compile script file for different devices being tested, and follow-up personnel can be made not need to understand the former script file, just can treat test function to change.
One of ordinary skill in the art will appreciate that all or part of step in the various methods of above-described embodiment can carry out the device-dependent hardware of command terminal by program to have come, this program can be stored in a computer-readable recording medium, storage medium can comprise: flash disk, ROM (read-only memory) (Read-Only Memory, ROM), random access device (Random Access Memory, RAM), disk or CD etc.
Above a kind of automatic test device disclosed in the embodiment of the present invention and method are described in detail, apply specific case herein to set forth principle of the present invention and embodiment, the explanation of above embodiment just understands method of the present invention and core concept thereof for helping; Meanwhile, for one of ordinary skill in the art, according to thought of the present invention, all will change in specific embodiments and applications, in sum, this description should not be construed as limitation of the present invention.
Claims (8)
1. an automatic test device, is characterized in that, described device comprises processor circuit, infrared receiving circuit, infrared transmitting circuit and clock circuit,
Described infrared receiving circuit, for when described processor circuit detects recording instruction, receives the infrared signal of telepilot transmission and described infrared signal is converted to square-wave signal;
Described clock circuit, for recording moment value when described infrared receiving circuit receives described infrared signal;
Described processor circuit, for described square-wave signal is resolved to corresponding key assignments, and by described key assignments and described moment value corresponding stored in log file, and when test instruction being detected, according to the time interval between moment value described in described log file, successively described key assignments corresponding for described moment value is converted to low and high level signal;
Described infrared transmitting circuit, for the described low and high level signal changed according to described processor circuit, sends infrared signal to device being tested.
2. device as claimed in claim 1, it is characterized in that, described infrared receiving circuit comprises infrared receiving tube,
Described infrared receiving tube, for receiving the infrared signal of telepilot transmission and described infrared signal being converted to square-wave signal.
3. device as claimed in claim 1, it is characterized in that, described infrared transmitting circuit comprises infrared transmitting tube IR_LED and triode,
Wherein, the base stage of described triode is connected with described processor circuit, and the emitter of described triode is connected with the negative electrode of described infrared transmitting tube IR_LED;
Described infrared transmitting tube IR_LED, for sending infrared signal to described device being tested;
Described triode, for receive described processor circuit export low and high level signal in high level time, conducting is to send infrared signal by described infrared transmitting tube IR_LED to described device being tested, and when receiving the low level in described low and high level signal, end to stop sending infrared signal to device being tested.
4. device as claimed in claim 1, it is characterized in that, described device also comprises key circuit and timing circuit;
Described key circuit, for arranging the loop test time;
Described timing circuit, for determining timing according to the described loop test time, and when described timing circuit time-out, interrupt instruction is sent to described processor circuit, with make described processor stop perform described according to the time interval between moment value described in described log file, successively described key assignments corresponding for described moment value is converted to the operation of low and high level signal.
5. device as claimed in claim 4, it is characterized in that, described device also comprises display circuit,
Described display circuit, for showing the corresponding relation described in described log file between key assignments and described moment value, and the loop test time that described key circuit is arranged.
6. an automated testing method, is characterized in that, comprising:
When recording instruction being detected, receiving the infrared signal of telepilot transmission and described infrared signal is converted to square-wave signal;
Record receives moment value during described infrared signal;
Described square-wave signal is resolved to corresponding key assignments, and by described key assignments and described moment value corresponding stored in log file;
When test instruction being detected, according to the time interval between moment value described in described log file, successively described key assignments corresponding for described moment value is converted to low and high level signal;
According to described low and high level signal, send infrared signal to device being tested.
7. method as claimed in claim 6, is characterized in that,
Described when test instruction being detected, according to the time interval between moment value described in described log file, before successively described key assignments corresponding for described moment value being converted to low and high level signal, described method also comprises:
The loop test time is set;
Described when test instruction being detected, according to the time interval between moment value described in described log file, successively described key assignments corresponding for described moment value is converted to low and high level signal, comprises:
When test instruction being detected, determining the timing of timer according to the described loop test time, and starting described timer;
Circulation performed according to the time interval between moment value described in described log file, successively described key assignments corresponding for described moment value was converted to the operation of low and high level signal, until described timer expiry.
8. method as claimed in claim 7, is characterized in that, described circulation performed according to the time interval between moment value described in described log file, successively described key assignments corresponding for described moment value was converted to the operation of low and high level signal, comprised:
When described timer is not overtime, according to the order of moment value described in described log file, successively described key assignments corresponding for described moment value is converted to low and high level signal with the time interval between described moment value,
And when key assignments corresponding for last moment value in described log file is converted to low and high level signal, from described log file the earliest a moment value, the order according to moment value described in described log file described in execution, is converted to the operation of low and high level signal successively by described key assignments corresponding for described moment value with the time interval between described moment value.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410555239.5A CN104318755A (en) | 2014-10-17 | 2014-10-17 | Automatic testing device and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410555239.5A CN104318755A (en) | 2014-10-17 | 2014-10-17 | Automatic testing device and method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN104318755A true CN104318755A (en) | 2015-01-28 |
Family
ID=52373979
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410555239.5A Pending CN104318755A (en) | 2014-10-17 | 2014-10-17 | Automatic testing device and method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104318755A (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107703796A (en) * | 2017-09-20 | 2018-02-16 | 深圳市帆泰检测技术有限公司 | television environment pressure test device and method |
| CN108632606A (en) * | 2018-04-02 | 2018-10-09 | 广州视源电子科技股份有限公司 | Television set ageing testing method and system |
| CN110400456A (en) * | 2019-07-30 | 2019-11-01 | 海信（山东）空调有限公司 | A kind of remote signal detection system and method |
| CN110865645A (en) * | 2019-11-29 | 2020-03-06 | 小狗电器互联网科技（北京）股份有限公司 | Robot and recharging system |
| CN111307420A (en) * | 2020-01-23 | 2020-06-19 | 珠海荣邦智能科技有限公司 | Infrared quality testing device and method for infrared transmitting tube product |
| CN113284333A (en) * | 2021-05-21 | 2021-08-20 | 北京昆羽科技有限公司 | Learning method and device based on remote controller, remote controller and storage medium |
| CN116256610A (en) * | 2023-05-12 | 2023-06-13 | 南京宏泰半导体科技股份有限公司 | Method for realizing automatic triggering of test signal of semiconductor tester |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB9518966D0 (en) * | 1995-09-15 | 1995-11-15 | Thomson Consumer Electronics | Method and device for learning an IR code |
| CN101211505A (en) * | 2006-12-31 | 2008-07-02 | 深圳市同洲电子股份有限公司 | Remote controller with study function and its learning and test method |
| CN101478696A (en) * | 2008-12-31 | 2009-07-08 | 深圳市同洲电子股份有限公司 | Automatic test method, system and multimedia device for test cases |
| CN101853569A (en) * | 2010-05-24 | 2010-10-06 | 江苏银河电子股份有限公司 | Method for transmitting multi-key codes of remote control device |
| CN102104794A (en) * | 2009-12-21 | 2011-06-22 | 康佳集团股份有限公司 | Television test reproduction method and equipment |
| CN103345829A (en) * | 2013-06-17 | 2013-10-09 | 深圳市九洲电器有限公司 | Method and device for remote controller learning |
-
2014
- 2014-10-17 CN CN201410555239.5A patent/CN104318755A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB9518966D0 (en) * | 1995-09-15 | 1995-11-15 | Thomson Consumer Electronics | Method and device for learning an IR code |
| CN101211505A (en) * | 2006-12-31 | 2008-07-02 | 深圳市同洲电子股份有限公司 | Remote controller with study function and its learning and test method |
| CN101478696A (en) * | 2008-12-31 | 2009-07-08 | 深圳市同洲电子股份有限公司 | Automatic test method, system and multimedia device for test cases |
| CN102104794A (en) * | 2009-12-21 | 2011-06-22 | 康佳集团股份有限公司 | Television test reproduction method and equipment |
| CN101853569A (en) * | 2010-05-24 | 2010-10-06 | 江苏银河电子股份有限公司 | Method for transmitting multi-key codes of remote control device |
| CN103345829A (en) * | 2013-06-17 | 2013-10-09 | 深圳市九洲电器有限公司 | Method and device for remote controller learning |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107703796A (en) * | 2017-09-20 | 2018-02-16 | 深圳市帆泰检测技术有限公司 | television environment pressure test device and method |
| CN108632606A (en) * | 2018-04-02 | 2018-10-09 | 广州视源电子科技股份有限公司 | Television set ageing testing method and system |
| CN110400456A (en) * | 2019-07-30 | 2019-11-01 | 海信（山东）空调有限公司 | A kind of remote signal detection system and method |
| CN110865645A (en) * | 2019-11-29 | 2020-03-06 | 小狗电器互联网科技（北京）股份有限公司 | Robot and recharging system |
| CN110865645B (en) * | 2019-11-29 | 2023-08-11 | 小狗电器互联网科技（北京）股份有限公司 | Robot and recharging system |
| CN111307420A (en) * | 2020-01-23 | 2020-06-19 | 珠海荣邦智能科技有限公司 | Infrared quality testing device and method for infrared transmitting tube product |
| CN113284333A (en) * | 2021-05-21 | 2021-08-20 | 北京昆羽科技有限公司 | Learning method and device based on remote controller, remote controller and storage medium |
| CN116256610A (en) * | 2023-05-12 | 2023-06-13 | 南京宏泰半导体科技股份有限公司 | Method for realizing automatic triggering of test signal of semiconductor tester |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN104318755A (en) | Automatic testing device and method | |
| CN102833577A (en) | Method and device for automatically testing function of television | |
| CN101839956B (en) | Secondary cable alignment device | |
| CN105611491B (en) | A kind of Bluetooth connecting method and device | |
| CN102650963A (en) | Computer startup and shutdown testing device | |
| CN104299402B (en) | Infrared learning method using AD mode | |
| CN115827111B (en) | Method and device for adjusting server startup item, storage medium and electronic device | |
| CN107659336B (en) | Function test method of power line carrier module | |
| CN109217425A (en) | A kind of charger circuit and its intelligent charge control method | |
| CN101859485A (en) | Infrared signal learning device | |
| CN112015609A (en) | Hot plug test method, device and equipment | |
| CN115827358A (en) | Automatic test system, method and device for PFR function and storage medium | |
| CN103267919A (en) | Automatic startup and shutdown device | |
| CN105141947A (en) | Pressure testing device and method thereof | |
| WO2021164068A1 (en) | Test system for variable-frequency drive | |
| CN102999410A (en) | Computer startup and shutdown control system | |
| CN103852735B (en) | Lamp fixture discharge timing circuit | |
| CN108957176B (en) | Analog array standard type automatic testing method | |
| CN104917245A (en) | Charging management circuit, mobile terminal and charging control method of mobile terminal | |
| CN205283749U (en) | Intelligent test system of STB | |
| CN201654162U (en) | Secondary cable sorter | |
| CN109086154B (en) | Device and method for detecting countdown of BIOS watchdog function | |
| CN203931175U (en) | Telepilot detector | |
| CN203909783U (en) | Automatic detection device | |
| CN211402533U (en) | Automatic module and system of patrolling and examining of multichannel voltage |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20150128 |
|
| WD01 | Invention patent application deemed withdrawn after publication |