CN116250088B - 半导体装置及半导体模组 - Google Patents

半导体装置及半导体模组

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Publication number
CN116250088B
CN116250088B CN202280006391.0A CN202280006391A CN116250088B CN 116250088 B CN116250088 B CN 116250088B CN 202280006391 A CN202280006391 A CN 202280006391A CN 116250088 B CN116250088 B CN 116250088B
Authority
CN
China
Prior art keywords
semiconductor device
semiconductor layer
semiconductor
aforementioned
gate pad
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202280006391.0A
Other languages
English (en)
Chinese (zh)
Other versions
CN116250088A (zh
Inventor
山本兴辉
秋吉伸一
网师本亮一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nuvoton Technology Corp Japan
Original Assignee
Nuvoton Technology Corp Japan
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nuvoton Technology Corp Japan filed Critical Nuvoton Technology Corp Japan
Priority claimed from PCT/JP2022/005414 external-priority patent/WO2022209346A1/ja
Publication of CN116250088A publication Critical patent/CN116250088A/zh
Application granted granted Critical
Publication of CN116250088B publication Critical patent/CN116250088B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
    • H10D84/82—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
    • H10D84/83—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H10D30/64—Double-diffused metal-oxide semiconductor [DMOS] FETs
    • H10D30/66—Vertical DMOS [VDMOS] FETs
    • H10D30/668—Vertical DMOS [VDMOS] FETs having trench gate electrodes, e.g. UMOS transistors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D64/00—Electrodes of devices having potential barriers
    • H10D64/20—Electrodes characterised by their shapes, relative sizes or dispositions 
    • H10D64/23—Electrodes carrying the current to be rectified, amplified, oscillated or switched, e.g. sources, drains, anodes or cathodes
    • H10D64/251—Source or drain electrodes for field-effect devices
    • H10D64/258—Source or drain electrodes for field-effect devices characterised by the relative positions of the source or drain electrodes with respect to the gate electrode
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W20/00—Interconnections in chips, wafers or substrates
    • H10W20/20—Interconnections within wafers or substrates, e.g. through-silicon vias [TSV]
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W20/00—Interconnections in chips, wafers or substrates
    • H10W20/40—Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes
    • H10W20/41—Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes characterised by their conductive parts
    • H10W20/43—Layouts of interconnections
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00—Interconnections or connectors in packages
    • H10W72/30—Die-attach connectors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00—Interconnections or connectors in packages
    • H10W72/90—Bond pads, in general
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00—Encapsulations, e.g. protective coatings
    • H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
    • H10W74/111—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed
    • H10W74/129—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed forming a chip-scale package [CSP]
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00—Package configurations
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00—Interconnections or connectors in packages
    • H10W72/90—Bond pads, in general
    • H10W72/941—Dispositions of bond pads
    • H10W72/944—Dispositions of multiple bond pads
    • H10W72/9445—Top-view layouts, e.g. mirror arrays
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00—Package configurations
    • H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/791—Package configurations characterised by the relative positions of pads or connectors relative to package parts of direct-bonded pads
    • H10W90/794—Package configurations characterised by the relative positions of pads or connectors relative to package parts of direct-bonded pads between a chip and a stacked insulating package substrate, interposer or RDL

Landscapes

  • Semiconductor Integrated Circuits (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Wire Bonding (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
CN202280006391.0A 2021-03-29 2022-02-10 半导体装置及半导体模组 Active CN116250088B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US202163167348P 2021-03-29 2021-03-29
US63/167,348 2021-03-29
PCT/JP2022/005414 WO2022209346A1 (ja) 2021-03-29 2022-02-10 半導体装置および半導体モジュール

Publications (2)

Publication Number Publication Date
CN116250088A CN116250088A (zh) 2023-06-09
CN116250088B true CN116250088B (zh) 2025-12-26

Family

ID=82384804

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202280006391.0A Active CN116250088B (zh) 2021-03-29 2022-02-10 半导体装置及半导体模组

Country Status (4)

Country Link
US (2) US12165999B2 (https=)
JP (2) JP7100219B1 (https=)
KR (1) KR102629278B1 (https=)
CN (1) CN116250088B (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7728714B2 (ja) * 2022-02-03 2025-08-25 ルネサスエレクトロニクス株式会社 半導体装置および回路装置
WO2025197135A1 (ja) * 2024-03-21 2025-09-25 ヌヴォトンテクノロジージャパン株式会社 半導体装置
JP7651085B1 (ja) * 2024-03-21 2025-03-25 ヌヴォトンテクノロジージャパン株式会社 半導体装置
WO2026079378A1 (ja) * 2024-10-09 2026-04-16 ヌヴォトンテクノロジージャパン株式会社 半導体装置および積層構造体

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013161977A (ja) * 2012-02-06 2013-08-19 Semiconductor Components Industries Llc 絶縁ゲート型半導体装置
CN111684608A (zh) * 2018-12-19 2020-09-18 松下半导体解决方案株式会社 半导体装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1315195C (zh) 2000-02-10 2007-05-09 国际整流器有限公司 在单面上带块形连接的垂直导电倒装芯片式器件
JP4270772B2 (ja) * 2001-06-08 2009-06-03 三洋電機株式会社 １チップデュアル型絶縁ゲート型半導体装置
JP4453587B2 (ja) * 2005-03-24 2010-04-21 株式会社デンソー 加速度センサ
US7898831B2 (en) * 2008-05-09 2011-03-01 Alpha and Omega Semiconductor Inc. Device and method for limiting drain-source voltage of transformer-coupled push pull power conversion circuit
JP5990401B2 (ja) 2012-05-29 2016-09-14 ルネサスエレクトロニクス株式会社 半導体装置および半導体装置の製造方法
JP6063713B2 (ja) * 2012-11-08 2017-01-18 ルネサスエレクトロニクス株式会社 電池保護システム
JP6348703B2 (ja) 2013-11-12 2018-06-27 ルネサスエレクトロニクス株式会社 半導体装置及びその製造方法
CN111640742B (zh) 2015-07-01 2021-04-20 新唐科技日本株式会社 半导体装置
JP6795888B2 (ja) 2016-01-06 2020-12-02 力智電子股▲フン▼有限公司ｕＰＩ Ｓｅｍｉｃｏｎｄｕｃｔｏｒ Ｃｏｒｐ． 半導体装置及びそれを用いた携帯機器
JP6447946B1 (ja) 2018-01-19 2019-01-09 パナソニックＩｐマネジメント株式会社 半導体装置および半導体モジュール
JP6856569B2 (ja) 2018-03-21 2021-04-07 株式会社東芝 半導体装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013161977A (ja) * 2012-02-06 2013-08-19 Semiconductor Components Industries Llc 絶縁ゲート型半導体装置
CN111684608A (zh) * 2018-12-19 2020-09-18 松下半导体解决方案株式会社 半导体装置

Also Published As

Publication number Publication date
JP7100219B1 (ja) 2022-07-12
KR20230043220A (ko) 2023-03-30
JP7177961B2 (ja) 2022-11-24
KR102629278B1 (ko) 2024-01-25
JPWO2022209346A1 (https=) 2022-10-06
US12080664B2 (en) 2024-09-03
CN116250088A (zh) 2023-06-09
US20230307393A1 (en) 2023-09-28
US20240030167A1 (en) 2024-01-25
JP2022153382A (ja) 2022-10-12
US12165999B2 (en) 2024-12-10

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