CN116157911A - 半导体装置 - Google Patents
半导体装置 Download PDFInfo
- Publication number
- CN116157911A CN116157911A CN202180059759.5A CN202180059759A CN116157911A CN 116157911 A CN116157911 A CN 116157911A CN 202180059759 A CN202180059759 A CN 202180059759A CN 116157911 A CN116157911 A CN 116157911A
- Authority
- CN
- China
- Prior art keywords
- transistor
- potential
- wiring
- current
- insulator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/54—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using elements simulating biological cells, e.g. neuron
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D88/00—Three-dimensional [3D] integrated devices
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N3/00—Computing arrangements based on biological models
- G06N3/02—Neural networks
- G06N3/06—Physical realisation, i.e. hardware implementation of neural networks, neurons or parts of neurons
- G06N3/063—Physical realisation, i.e. hardware implementation of neural networks, neurons or parts of neurons using electronic means
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B12/00—Dynamic random access memory [DRAM] devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/0123—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
- H10D84/0126—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/02—Manufacture or treatment characterised by using material-based technologies
- H10D84/03—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
- H10D84/038—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
- H10D84/811—Combinations of field-effect devices and one or more diodes, capacitors or resistors
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/403—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells with charge regeneration common to a multiplicity of memory cells, i.e. external refresh
- G11C11/405—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells with charge regeneration common to a multiplicity of memory cells, i.e. external refresh with three charge-transfer gates, e.g. MOS transistors, per cell
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1006—Data managing, e.g. manipulating data before writing or reading out, data bus switches or control circuits therefor
Landscapes
- Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biomedical Technology (AREA)
- Physics & Mathematics (AREA)
- Molecular Biology (AREA)
- Computer Hardware Design (AREA)
- Neurology (AREA)
- General Health & Medical Sciences (AREA)
- Biophysics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Theoretical Computer Science (AREA)
- Mathematical Physics (AREA)
- Computational Linguistics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Evolutionary Computation (AREA)
- Software Systems (AREA)
- Data Mining & Analysis (AREA)
- Computing Systems (AREA)
- Artificial Intelligence (AREA)
- Thin Film Transistor (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Semiconductor Memories (AREA)
- Non-Volatile Memory (AREA)
- Dram (AREA)
Applications Claiming Priority (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020-129876 | 2020-07-31 | ||
| JP2020129876 | 2020-07-31 | ||
| JP2021017030 | 2021-02-05 | ||
| JP2021-017030 | 2021-02-05 | ||
| JP2021-107848 | 2021-06-29 | ||
| JP2021107848 | 2021-06-29 | ||
| PCT/IB2021/056483 WO2022023866A1 (ja) | 2020-07-31 | 2021-07-19 | 半導体装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN116157911A true CN116157911A (zh) | 2023-05-23 |
Family
ID=80036203
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202180059759.5A Pending CN116157911A (zh) | 2020-07-31 | 2021-07-19 | 半导体装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20230284429A1 (https=) |
| JP (2) | JP7724221B2 (https=) |
| KR (1) | KR20230043882A (https=) |
| CN (1) | CN116157911A (https=) |
| WO (1) | WO2022023866A1 (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20230047392A (ko) | 2020-08-03 | 2023-04-07 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 전자 기기 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8634228B2 (en) | 2010-09-02 | 2014-01-21 | Semiconductor Energy Laboratory Co., Ltd. | Driving method of semiconductor device |
| TWI536388B (zh) | 2012-01-12 | 2016-06-01 | Sharp Kk | Semiconductor memory circuits and devices |
| US9842842B2 (en) * | 2014-03-19 | 2017-12-12 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor memory device and semiconductor device and electronic device having the same |
| WO2018069785A1 (en) | 2016-10-12 | 2018-04-19 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and system using the same |
| WO2018211378A1 (ja) * | 2017-05-19 | 2018-11-22 | 株式会社半導体エネルギー研究所 | 半導体装置または記憶装置 |
| CN110637415B (zh) * | 2017-05-31 | 2024-10-01 | 株式会社半导体能源研究所 | 比较电路、半导体装置、电子构件以及电子设备 |
| JP6956784B2 (ja) * | 2017-06-08 | 2021-11-02 | 株式会社半導体エネルギー研究所 | 撮像装置 |
| US11417704B2 (en) | 2018-10-19 | 2022-08-16 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and electronic device |
-
2021
- 2021-07-19 US US18/016,745 patent/US20230284429A1/en active Pending
- 2021-07-19 KR KR1020237004663A patent/KR20230043882A/ko active Pending
- 2021-07-19 JP JP2022539784A patent/JP7724221B2/ja active Active
- 2021-07-19 CN CN202180059759.5A patent/CN116157911A/zh active Pending
- 2021-07-19 WO PCT/IB2021/056483 patent/WO2022023866A1/ja not_active Ceased
-
2025
- 2025-08-04 JP JP2025129917A patent/JP2025159013A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| WO2022023866A1 (ja) | 2022-02-03 |
| JPWO2022023866A1 (https=) | 2022-02-03 |
| JP7724221B2 (ja) | 2025-08-15 |
| JP2025159013A (ja) | 2025-10-17 |
| US20230284429A1 (en) | 2023-09-07 |
| KR20230043882A (ko) | 2023-03-31 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP7842280B2 (ja) | 半導体装置及び電子機器 | |
| JP7854547B2 (ja) | 半導体装置 | |
| JP2026075093A (ja) | 半導体装置、電子機器 | |
| JP7208891B2 (ja) | 半導体装置の作製方法 | |
| JP7804827B1 (ja) | 演算回路 | |
| CN113383342A (zh) | 半导体装置及电子设备 | |
| CN111937074A (zh) | 存储装置及电子设备 | |
| CN115769221A (zh) | 半导体装置及电子设备 | |
| CN110678989A (zh) | 半导体装置及半导体装置的制造方法 | |
| JP7799127B2 (ja) | 有機el表示装置 | |
| CN111344665B (zh) | 加法运算方法、半导体装置及电子设备 | |
| US20250174259A1 (en) | Semiconductor device and electronic device | |
| CN114787998A (zh) | 半导体装置及电子设备 | |
| JP2025159013A (ja) | 半導体装置 | |
| CN120019724A (zh) | 半导体装置、存储装置及电子设备 | |
| JP2018156699A (ja) | 半導体装置、電子部品、及び電子機器 | |
| WO2025181636A1 (ja) | 半導体装置、演算装置及び電子機器 | |
| JP2019021219A (ja) | 集積回路、モジュール、コンピュータ、電子機器及びシステム | |
| WO2025224594A1 (ja) | 半導体装置 | |
| CN120712570A (zh) | 半导体装置及电子设备 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |