CN115701370A - 光照射装置 - Google Patents

光照射装置 Download PDF

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Publication number
CN115701370A
CN115701370A CN202210875138.0A CN202210875138A CN115701370A CN 115701370 A CN115701370 A CN 115701370A CN 202210875138 A CN202210875138 A CN 202210875138A CN 115701370 A CN115701370 A CN 115701370A
Authority
CN
China
Prior art keywords
light
light irradiation
transmission member
photodetector
scattering
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202210875138.0A
Other languages
English (en)
Chinese (zh)
Inventor
石川直树
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Screen Holdings Co Ltd
Original Assignee
Screen Holdings Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Screen Holdings Co Ltd filed Critical Screen Holdings Co Ltd
Publication of CN115701370A publication Critical patent/CN115701370A/zh
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/0242Control or determination of height or angle information of sensors or receivers; Goniophotometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • G01J1/0407Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0411Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using focussing or collimating elements, i.e. lenses or mirrors; Aberration correction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • G01J1/0407Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0414Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using plane or convex mirrors, parallel phase plates, or plane beam-splitters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/08Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Laser Beam Processing (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Heating, Cooling, Or Curing Plastics Or The Like In General (AREA)
  • Steering Control In Accordance With Driving Conditions (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
CN202210875138.0A 2021-08-02 2022-07-22 光照射装置 Pending CN115701370A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021-126520 2021-08-02
JP2021126520A JP2023021574A (ja) 2021-08-02 2021-08-02 光照射装置

Publications (1)

Publication Number Publication Date
CN115701370A true CN115701370A (zh) 2023-02-10

Family

ID=85142612

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202210875138.0A Pending CN115701370A (zh) 2021-08-02 2022-07-22 光照射装置

Country Status (4)

Country Link
JP (1) JP2023021574A (ko)
KR (1) KR20230019777A (ko)
CN (1) CN115701370A (ko)
TW (1) TWI808774B (ko)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DK0648154T3 (da) * 1992-07-01 1998-09-23 Litel Instr Inc Anvendelse af Fresnel-zone plader til materialebearbejdning
JP2006272430A (ja) 2005-03-30 2006-10-12 Seiko Epson Corp レーザ加工装置
DE102010002423A1 (de) * 2010-02-26 2011-09-01 Robert Bosch Gmbh Vorrichtung und Verfahren zum Kalibrieren eines Streulichtmessgerätes
KR20160117815A (ko) * 2015-03-31 2016-10-11 삼성전자주식회사 광학 검사 장치
JP2019095360A (ja) * 2017-11-27 2019-06-20 株式会社アマダホールディングス ファイバレーザ加工機、及び光学式エンコーダ

Also Published As

Publication number Publication date
KR20230019777A (ko) 2023-02-09
TWI808774B (zh) 2023-07-11
TW202306689A (zh) 2023-02-16
JP2023021574A (ja) 2023-02-14

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