CN115667861A - 光波形测量装置及测量方法 - Google Patents

光波形测量装置及测量方法 Download PDF

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Publication number
CN115667861A
CN115667861A CN202180039449.7A CN202180039449A CN115667861A CN 115667861 A CN115667861 A CN 115667861A CN 202180039449 A CN202180039449 A CN 202180039449A CN 115667861 A CN115667861 A CN 115667861A
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CN
China
Prior art keywords
frequency
measurement
light amount
optical waveform
waveform
Prior art date
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Pending
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CN202180039449.7A
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English (en)
Chinese (zh)
Inventor
增田敏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Konica Minolta Inc
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Konica Minolta Inc
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Publication date
Application filed by Konica Minolta Inc filed Critical Konica Minolta Inc
Publication of CN115667861A publication Critical patent/CN115667861A/zh
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44Electric circuits
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J11/00Measuring the characteristics of individual optical pulses or of optical pulse trains
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0227Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using notch filters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16Spectrum analysis; Fourier analysis
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44Electric circuits
    • G01J2001/4413Type
    • G01J2001/4426Type with intensity to frequency or voltage to frequency conversion [IFC or VFC]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/42Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G01J3/433Modulation spectrometry; Derivative spectrometry
    • G01J2003/4332Modulation spectrometry; Derivative spectrometry frequency-modulated

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
CN202180039449.7A 2020-06-01 2021-05-13 光波形测量装置及测量方法 Pending CN115667861A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020-095517 2020-06-01
JP2020095517 2020-06-01
PCT/JP2021/018217 WO2021246125A1 (ja) 2020-06-01 2021-05-13 光波形計測装置及び計測方法

Publications (1)

Publication Number Publication Date
CN115667861A true CN115667861A (zh) 2023-01-31

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Family Applications (1)

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CN202180039449.7A Pending CN115667861A (zh) 2020-06-01 2021-05-13 光波形测量装置及测量方法

Country Status (4)

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JP (1) JP7816144B2 (https=)
KR (1) KR102808720B1 (https=)
CN (1) CN115667861A (https=)
WO (1) WO2021246125A1 (https=)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20240113543A (ko) * 2022-01-11 2024-07-22 코니카 미놀타 가부시키가이샤 광 계측 방법, 광 계측 장치, 데이터 처리 장치 및 프로그램
CN118647845A (zh) * 2022-02-07 2024-09-13 柯尼卡美能达株式会社 显示器光测量装置及光测量方法、数据处理装置和程序
WO2023189479A1 (ja) * 2022-03-30 2023-10-05 コニカミノルタ株式会社 ディスプレイ光計測装置及び光計測方法、データ処理装置並びにプログラム

Citations (4)

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JP2003106898A (ja) * 2001-09-28 2003-04-09 Nohmi Bosai Ltd 炎検出装置
US20100225302A1 (en) * 2008-01-23 2010-09-09 Yukio Tsuda Measured-Signal Repetition Frequency Detection Method, and Sampling Apparatus and Waveform Observation System Using the Method
CN111164407A (zh) * 2017-10-05 2020-05-15 柯尼卡美能达株式会社 二维闪烁测量装置、二维闪烁测量系统、二维闪烁测量方法以及二维闪烁测量程序
CN111164406A (zh) * 2017-10-05 2020-05-15 柯尼卡美能达株式会社 二维闪烁测定装置及二维闪烁测定方法

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JPS60137825A (ja) * 1983-12-27 1985-07-22 Seto Yogyo Genryo Kk 高純度チタニアの製造法
TW594022B (en) * 2003-01-08 2004-06-21 Machvision Inc Inspection method and system for LCD panel
DE10311617A1 (de) 2003-03-14 2004-09-23 Basf Ag Verwendung von Polyacrylsäuren als Mahlhilfsmittel für Calciumcarbonat
US20050103979A1 (en) * 2003-11-13 2005-05-19 Photo Research, Inc. Temporal source analysis using array detectors
JP2009017214A (ja) * 2007-07-04 2009-01-22 Canon Inc フリッカ検出装置及びフリッカ検出方法
JP5840868B2 (ja) * 2011-05-27 2016-01-06 株式会社ソニック 周波数検出方法及び装置
JP5635038B2 (ja) * 2012-06-25 2014-12-03 株式会社中電シーティーアイ 振動特性を推定する方法および振動特性推定プログラムならびに振動特性推定プログラムを記録したコンピュータ読み取り可能な記録媒体
WO2014167865A1 (ja) 2013-04-12 2014-10-16 パナソニック インテレクチュアル プロパティ コーポレーション オブ アメリカ フリッカ低減装置、撮像装置およびフリッカ低減方法
JP2016092787A (ja) * 2014-11-11 2016-05-23 キヤノン株式会社 画像処理装置
JP6915539B2 (ja) * 2015-09-02 2021-08-04 コニカミノルタ株式会社 二次元測色装置及び二次元測色方法
JP6982926B2 (ja) * 2017-12-04 2021-12-17 日置電機株式会社 測定条件設定方法および光測定装置
WO2020166201A1 (ja) * 2019-02-12 2020-08-20 コニカミノルタ株式会社 フリッカ測定装置、フリッカ測定方法及びフリッカ測定プログラム

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003106898A (ja) * 2001-09-28 2003-04-09 Nohmi Bosai Ltd 炎検出装置
US20100225302A1 (en) * 2008-01-23 2010-09-09 Yukio Tsuda Measured-Signal Repetition Frequency Detection Method, and Sampling Apparatus and Waveform Observation System Using the Method
CN111164407A (zh) * 2017-10-05 2020-05-15 柯尼卡美能达株式会社 二维闪烁测量装置、二维闪烁测量系统、二维闪烁测量方法以及二维闪烁测量程序
CN111164406A (zh) * 2017-10-05 2020-05-15 柯尼卡美能达株式会社 二维闪烁测定装置及二维闪烁测定方法

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WO2021246125A1 (ja) 2021-12-09
KR20230003205A (ko) 2023-01-05
JP7816144B2 (ja) 2026-02-18
JPWO2021246125A1 (https=) 2021-12-09
KR102808720B1 (ko) 2025-05-15

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