JPWO2021246125A1 - - Google Patents

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Publication number
JPWO2021246125A1
JPWO2021246125A1 JP2022528505A JP2022528505A JPWO2021246125A1 JP WO2021246125 A1 JPWO2021246125 A1 JP WO2021246125A1 JP 2022528505 A JP2022528505 A JP 2022528505A JP 2022528505 A JP2022528505 A JP 2022528505A JP WO2021246125 A1 JPWO2021246125 A1 JP WO2021246125A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2022528505A
Other languages
Japanese (ja)
Other versions
JP7816144B2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPWO2021246125A1 publication Critical patent/JPWO2021246125A1/ja
Application granted granted Critical
Publication of JP7816144B2 publication Critical patent/JP7816144B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0227—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using notch filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4413—Type
    • G01J2001/4426—Type with intensity to frequency or voltage to frequency conversion [IFC or VFC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G01J3/433—Modulation spectrometry; Derivative spectrometry
    • G01J2003/4332—Modulation spectrometry; Derivative spectrometry frequency-modulated

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
JP2022528505A 2020-06-01 2021-05-13 光波形計測装置及び計測方法 Active JP7816144B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020095517 2020-06-01
JP2020095517 2020-06-01
PCT/JP2021/018217 WO2021246125A1 (ja) 2020-06-01 2021-05-13 光波形計測装置及び計測方法

Publications (2)

Publication Number Publication Date
JPWO2021246125A1 true JPWO2021246125A1 (https=) 2021-12-09
JP7816144B2 JP7816144B2 (ja) 2026-02-18

Family

ID=78830876

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022528505A Active JP7816144B2 (ja) 2020-06-01 2021-05-13 光波形計測装置及び計測方法

Country Status (4)

Country Link
JP (1) JP7816144B2 (https=)
KR (1) KR102808720B1 (https=)
CN (1) CN115667861A (https=)
WO (1) WO2021246125A1 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20240113543A (ko) * 2022-01-11 2024-07-22 코니카 미놀타 가부시키가이샤 광 계측 방법, 광 계측 장치, 데이터 처리 장치 및 프로그램
CN118647845A (zh) * 2022-02-07 2024-09-13 柯尼卡美能达株式会社 显示器光测量装置及光测量方法、数据处理装置和程序
WO2023189479A1 (ja) * 2022-03-30 2023-10-05 コニカミノルタ株式会社 ディスプレイ光計測装置及び光計測方法、データ処理装置並びにプログラム

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003106898A (ja) * 2001-09-28 2003-04-09 Nohmi Bosai Ltd 炎検出装置
US20050103979A1 (en) * 2003-11-13 2005-05-19 Photo Research, Inc. Temporal source analysis using array detectors
JP2009017214A (ja) * 2007-07-04 2009-01-22 Canon Inc フリッカ検出装置及びフリッカ検出方法
JP2012247303A (ja) * 2011-05-27 2012-12-13 Sonic Corp 周波数検出方法及び装置
JP2016092787A (ja) * 2014-11-11 2016-05-23 キヤノン株式会社 画像処理装置
WO2017038675A1 (ja) * 2015-09-02 2017-03-09 コニカミノルタ株式会社 二次元測色装置及び二次元測色方法
WO2019069634A1 (ja) * 2017-10-05 2019-04-11 コニカミノルタ株式会社 二次元フリッカ測定装置、二次元フリッカ測定システム、二次元フリッカ測定方法、及び、二次元フリッカ測定プログラム
JP2019100868A (ja) * 2017-12-04 2019-06-24 日置電機株式会社 測定条件設定方法および光測定装置
WO2020166201A1 (ja) * 2019-02-12 2020-08-20 コニカミノルタ株式会社 フリッカ測定装置、フリッカ測定方法及びフリッカ測定プログラム

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60137825A (ja) * 1983-12-27 1985-07-22 Seto Yogyo Genryo Kk 高純度チタニアの製造法
TW594022B (en) * 2003-01-08 2004-06-21 Machvision Inc Inspection method and system for LCD panel
DE10311617A1 (de) 2003-03-14 2004-09-23 Basf Ag Verwendung von Polyacrylsäuren als Mahlhilfsmittel für Calciumcarbonat
EP2237054A4 (en) * 2008-01-23 2014-10-01 Anritsu Corp MEASURED SIGNAL REPETITIVE FREQUENCY DETECTION METHOD, SAMPLING APPARATUS USING THE SAME, AND WAVEFORM OBSERVATION SYSTEM
JP5635038B2 (ja) * 2012-06-25 2014-12-03 株式会社中電シーティーアイ 振動特性を推定する方法および振動特性推定プログラムならびに振動特性推定プログラムを記録したコンピュータ読み取り可能な記録媒体
WO2014167865A1 (ja) 2013-04-12 2014-10-16 パナソニック インテレクチュアル プロパティ コーポレーション オブ アメリカ フリッカ低減装置、撮像装置およびフリッカ低減方法
US11490028B2 (en) * 2017-10-05 2022-11-01 Konica Minolta, Inc. Two-dimensional flicker measurement apparatus and two-dimensional flicker measurement method

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003106898A (ja) * 2001-09-28 2003-04-09 Nohmi Bosai Ltd 炎検出装置
US20050103979A1 (en) * 2003-11-13 2005-05-19 Photo Research, Inc. Temporal source analysis using array detectors
JP2009017214A (ja) * 2007-07-04 2009-01-22 Canon Inc フリッカ検出装置及びフリッカ検出方法
JP2012247303A (ja) * 2011-05-27 2012-12-13 Sonic Corp 周波数検出方法及び装置
JP2016092787A (ja) * 2014-11-11 2016-05-23 キヤノン株式会社 画像処理装置
WO2017038675A1 (ja) * 2015-09-02 2017-03-09 コニカミノルタ株式会社 二次元測色装置及び二次元測色方法
WO2019069634A1 (ja) * 2017-10-05 2019-04-11 コニカミノルタ株式会社 二次元フリッカ測定装置、二次元フリッカ測定システム、二次元フリッカ測定方法、及び、二次元フリッカ測定プログラム
JP2019100868A (ja) * 2017-12-04 2019-06-24 日置電機株式会社 測定条件設定方法および光測定装置
WO2020166201A1 (ja) * 2019-02-12 2020-08-20 コニカミノルタ株式会社 フリッカ測定装置、フリッカ測定方法及びフリッカ測定プログラム

Also Published As

Publication number Publication date
WO2021246125A1 (ja) 2021-12-09
KR20230003205A (ko) 2023-01-05
JP7816144B2 (ja) 2026-02-18
CN115667861A (zh) 2023-01-31
KR102808720B1 (ko) 2025-05-15

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