CN115244404B - 自动分析装置 - Google Patents

自动分析装置

Info

Publication number
CN115244404B
CN115244404B CN202180019357.2A CN202180019357A CN115244404B CN 115244404 B CN115244404 B CN 115244404B CN 202180019357 A CN202180019357 A CN 202180019357A CN 115244404 B CN115244404 B CN 115244404B
Authority
CN
China
Prior art keywords
temperature
incubator
heat source
parallelogram
analysis device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202180019357.2A
Other languages
English (en)
Chinese (zh)
Other versions
CN115244404A (zh
Inventor
辻仁望
松冈裕哉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi High Technologies Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Technologies Corp filed Critical Hitachi High Technologies Corp
Publication of CN115244404A publication Critical patent/CN115244404A/zh
Application granted granted Critical
Publication of CN115244404B publication Critical patent/CN115244404B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L1/00—Enclosures; Chambers
    • B01L1/02—Air-pressure chambers; Air-locks therefor
    • B01L1/025—Environmental chambers
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L7/00—Heating or cooling apparatus; Heat insulating devices
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L9/00—Supporting devices; Holding devices
    • B01L9/06—Test-tube stands; Test-tube holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/025—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having a carousel or turntable for reaction cells or cuvettes
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L2200/00—Solutions for specific problems relating to chemical or physical laboratory apparatus
    • B01L2200/14—Process control and prevention of errors
    • B01L2200/143—Quality control, feedback systems
    • B01L2200/147—Employing temperature sensors
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L2200/00—Solutions for specific problems relating to chemical or physical laboratory apparatus
    • B01L2200/16—Reagents, handling or storing thereof
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L2300/00—Additional constructional details
    • B01L2300/08—Geometry, shape and general structure
    • B01L2300/0803—Disc shape
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L2300/00—Additional constructional details
    • B01L2300/18—Means for temperature control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N2035/00346—Heating or cooling arrangements
    • G01N2035/00356—Holding samples at elevated temperature (incubation)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/0439—Rotary sample carriers, i.e. carousels
    • G01N2035/0444—Rotary sample carriers, i.e. carousels for cuvettes or reaction vessels

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Clinical Laboratory Science (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
CN202180019357.2A 2020-03-17 2021-01-26 自动分析装置 Active CN115244404B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020046242 2020-03-17
JP2020-046242 2020-03-17
PCT/JP2021/002632 WO2021186902A1 (ja) 2020-03-17 2021-01-26 自動分析装置

Publications (2)

Publication Number Publication Date
CN115244404A CN115244404A (zh) 2022-10-25
CN115244404B true CN115244404B (zh) 2025-12-09

Family

ID=77770810

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202180019357.2A Active CN115244404B (zh) 2020-03-17 2021-01-26 自动分析装置

Country Status (5)

Country Link
US (1) US20230107314A1 (enExample)
EP (1) EP4123309A4 (enExample)
JP (1) JP7460752B2 (enExample)
CN (1) CN115244404B (enExample)
WO (1) WO2021186902A1 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115754182A (zh) * 2022-11-24 2023-03-07 中农康正技术服务(泰州)有限公司 一种食品中金黄色葡萄球菌的检测方法和装置
CN117270608B (zh) * 2023-10-31 2025-07-11 宁波精微电子科技有限公司 一种应用于蛋白分析仪的温控装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008196000A (ja) * 2007-02-13 2008-08-28 Nissin Electric Co Ltd ヒータ温度制御方法、ヒータ温度制御装置及び物品処理装置
JP2012216423A (ja) * 2011-03-31 2012-11-08 Toyota Industries Corp 温度ムラを考慮した熱入出量制御システム
CN110383035A (zh) * 2017-03-16 2019-10-25 美国西门子医学诊断股份有限公司 用于诊断分析仪中的培育系统的热控制的系统和方法

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JP3127419B2 (ja) * 1995-03-24 2001-01-22 矢崎総業株式会社 多位置動作の温度制御装置及び温度制御方法
JPH11173559A (ja) * 1997-12-10 1999-06-29 Toshiba Corp 電子レンジ
WO1999043434A1 (en) * 1998-02-27 1999-09-02 Ventana Medical Systems, Inc. System and method of aspirating and dispensing reagent
JP4712343B2 (ja) * 2003-10-30 2011-06-29 東京エレクトロン株式会社 熱処理装置、熱処理方法、プログラム及び記録媒体
EP2322940B1 (en) * 2005-03-10 2014-10-29 Gen-Probe Incorporated Systems amd methods to perform assays for detecting or quantifing analytes within samples
CN201065405Y (zh) * 2006-10-11 2008-05-28 崔实 多点温度测控的生物培养箱
JP2011504727A (ja) * 2007-11-30 2011-02-17 コーベット リサーチ プロプライエタリー リミテッド 熱サイクル装置
JP5343512B2 (ja) * 2008-10-30 2013-11-13 トヨタ自動車株式会社 電池パック入出力制御装置
JP2014143927A (ja) * 2013-01-28 2014-08-14 Hitachi High-Technologies Corp 核酸増幅装置および温度調節機能の異常検出方法
JP2016073129A (ja) * 2014-09-30 2016-05-09 株式会社東芝 冷却ガス温度制御装置
CN105097408B (zh) * 2015-07-21 2017-09-26 深圳市华星光电技术有限公司 一种干法刻蚀机台及其使用方法
JP6505538B2 (ja) 2015-07-24 2019-04-24 株式会社日立ハイテクノロジーズ 自動分析装置、遺伝子検査装置及び温度制御方法
CN107923920B (zh) * 2015-08-25 2021-07-23 株式会社日立高新技术 自动分析装置和自动分析系统
JP6845858B2 (ja) * 2015-12-31 2021-03-24 ジェン−プローブ・インコーポレーテッド サンプルを分析し、光信号検出器の性能を監視するシステム及び方法
CN105628687B (zh) * 2016-02-24 2018-08-07 南京诺尔曼生物技术有限公司 一种全自动化学发光测定仪
CN107472001B (zh) * 2016-12-08 2019-11-22 宝沃汽车（中国）有限公司 冷却水泵的控制方法、装置及车辆
CN107354240A (zh) * 2017-08-21 2017-11-17 上海跃进医疗器械有限公司 一种制冷恒温控制方法及培养箱
JP2019115266A (ja) * 2017-12-26 2019-07-18 オリンパス株式会社 観察システム、観察装置及び温度制御方法
EP3539660B1 (de) * 2018-03-16 2024-05-01 Eppendorf SE Labortemperiervorrichtung und verfahren
JP7157658B2 (ja) * 2018-12-27 2022-10-20 株式会社日立ハイテク 自動分析装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008196000A (ja) * 2007-02-13 2008-08-28 Nissin Electric Co Ltd ヒータ温度制御方法、ヒータ温度制御装置及び物品処理装置
JP2012216423A (ja) * 2011-03-31 2012-11-08 Toyota Industries Corp 温度ムラを考慮した熱入出量制御システム
CN110383035A (zh) * 2017-03-16 2019-10-25 美国西门子医学诊断股份有限公司 用于诊断分析仪中的培育系统的热控制的系统和方法

Also Published As

Publication number Publication date
CN115244404A (zh) 2022-10-25
US20230107314A1 (en) 2023-04-06
EP4123309A4 (en) 2024-04-10
EP4123309A1 (en) 2023-01-25
WO2021186902A1 (ja) 2021-09-23
JP7460752B2 (ja) 2024-04-02
JPWO2021186902A1 (enExample) 2021-09-23

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