CN115076530B - Probe supporting device - Google Patents

Probe supporting device Download PDF

Info

Publication number
CN115076530B
CN115076530B CN202210560728.4A CN202210560728A CN115076530B CN 115076530 B CN115076530 B CN 115076530B CN 202210560728 A CN202210560728 A CN 202210560728A CN 115076530 B CN115076530 B CN 115076530B
Authority
CN
China
Prior art keywords
probe
structural member
support device
arc
moving mechanism
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202210560728.4A
Other languages
Chinese (zh)
Other versions
CN115076530A (en
Inventor
黄承祖
刘星汛
崔腾林
彭博
赵鹏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Beijing Institute of Radio Metrology and Measurement
Original Assignee
Beijing Institute of Radio Metrology and Measurement
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Beijing Institute of Radio Metrology and Measurement filed Critical Beijing Institute of Radio Metrology and Measurement
Priority to CN202210560728.4A priority Critical patent/CN115076530B/en
Publication of CN115076530A publication Critical patent/CN115076530A/en
Application granted granted Critical
Publication of CN115076530B publication Critical patent/CN115076530B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
    • F16M—FRAMES, CASINGS OR BEDS OF ENGINES, MACHINES OR APPARATUS, NOT SPECIFIC TO ENGINES, MACHINES OR APPARATUS PROVIDED FOR ELSEWHERE; STANDS; SUPPORTS
    • F16M11/00—Stands or trestles as supports for apparatus or articles placed thereon Stands for scientific apparatus such as gravitational force meters
    • F16M11/02—Heads
    • F16M11/04—Means for attachment of apparatus; Means allowing adjustment of the apparatus relatively to the stand
    • F16M11/043—Allowing translations
    • F16M11/046—Allowing translations adapted to upward-downward translation movement
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
    • F16M—FRAMES, CASINGS OR BEDS OF ENGINES, MACHINES OR APPARATUS, NOT SPECIFIC TO ENGINES, MACHINES OR APPARATUS PROVIDED FOR ELSEWHERE; STANDS; SUPPORTS
    • F16M11/00—Stands or trestles as supports for apparatus or articles placed thereon Stands for scientific apparatus such as gravitational force meters
    • F16M11/02—Heads
    • F16M11/04—Means for attachment of apparatus; Means allowing adjustment of the apparatus relatively to the stand
    • F16M11/06—Means for attachment of apparatus; Means allowing adjustment of the apparatus relatively to the stand allowing pivoting
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
    • F16M—FRAMES, CASINGS OR BEDS OF ENGINES, MACHINES OR APPARATUS, NOT SPECIFIC TO ENGINES, MACHINES OR APPARATUS PROVIDED FOR ELSEWHERE; STANDS; SUPPORTS
    • F16M11/00—Stands or trestles as supports for apparatus or articles placed thereon Stands for scientific apparatus such as gravitational force meters
    • F16M11/02—Heads
    • F16M11/16—Details concerning attachment of head-supporting legs, with or without actuation of locking members thereof
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
    • F16M—FRAMES, CASINGS OR BEDS OF ENGINES, MACHINES OR APPARATUS, NOT SPECIFIC TO ENGINES, MACHINES OR APPARATUS PROVIDED FOR ELSEWHERE; STANDS; SUPPORTS
    • F16M11/00—Stands or trestles as supports for apparatus or articles placed thereon Stands for scientific apparatus such as gravitational force meters
    • F16M11/20—Undercarriages with or without wheels
    • F16M11/2092—Undercarriages with or without wheels comprising means allowing depth adjustment, i.e. forward-backward translation of the head relatively to the undercarriage
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
    • F16M—FRAMES, CASINGS OR BEDS OF ENGINES, MACHINES OR APPARATUS, NOT SPECIFIC TO ENGINES, MACHINES OR APPARATUS PROVIDED FOR ELSEWHERE; STANDS; SUPPORTS
    • F16M13/00—Other supports for positioning apparatus or articles; Means for steadying hand-held apparatus or articles
    • F16M13/02—Other supports for positioning apparatus or articles; Means for steadying hand-held apparatus or articles for supporting on, or attaching to, an object, e.g. tree, gate, window-frame, cycle
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references

Abstract

The invention provides a probe supporting device, which comprises a moving mechanism positioned outside a concentric cone TEM; a locking member for disposing the probe on the moving mechanism; the moving mechanism is configured to enable the locking piece to move along a first direction or a second direction so as to drive the probe for measuring the field intensity in the cavity of the concentric cone TEM chamber to move along the first direction or the second direction; the first direction and the second direction are perpendicular in the same plane. The probe supporting device is simple in structure and convenient to operate, the influence of the probe supporting device and the probe on the field can be reduced, meanwhile, a certain degree of freedom is also provided, and the adaptability of the probe to field intensity change is enhanced.

Description

Probe supporting device
Technical Field
The invention relates to the technical field of radio measurement. And more particularly to a probe support device.
Background
The field intensity is one of the basic parameters of the radio, the accuracy of the field intensity measurement result is directly affected by the calibration accuracy of the field intensity parameter, and the field intensity and the calibration work of the field intensity probe are always very important in the national defense science and technology industry field. On the basis of accurate calibration, the national defense science and technology industry puts forward a new demand for broadband calibration of field intensity parameters, and relates to frequency bands of 10 kHz-40 GHz.
The TEM room method, the GTEM room method, the standard field method based on the pyramid horn antenna and the like are commonly adopted internationally, and jointly cover the frequency range of 10 kHz-40 GHz, but the TEM room and GTEM room calibration method is limited by the calibration frequency range, so that accurate calibration can not be completed in the frequency range of more than 1GHz, the standard field method based on the pyramid horn antenna is low in efficiency and high in cost, and the used single antenna is narrow in coverage frequency range, so that the calibration requirement of mass field intensity probe sweep frequency of the national defense and military system can not be met.
At present, a system capable of generating a broadband electromagnetic field is generally considered as a concentric cone TEM chamber broadband field intensity calibration system, and can meet the full-band broadband sweep frequency calibration requirement of a field intensity probe.
The calibration of the field intensity probe is carried out in a cavity of the concentric cone TEM chamber, the shape of the cavity of the concentric cone TEM chamber is limited, the shape of a test area in the cavity is not uniform, and how to arrange the field intensity probe with a considerable volume in a limited space is a key problem; the requirements on the precision of the outer cone inner surface and the outer cone outer surface of the concentric cone TEM are very high, and the design of the field intensity probe supporting device is difficult on the premise of ensuring the surface precision; meanwhile, the change of the testing uniform area is caused by the change of the working condition, so that the field intensity probe is required to have a certain degree of freedom in the cavity.
The concentric cone TEM chamber is used as emerging technical equipment, the traditional probe supporting device is not suitable, the traditional probe supporting device applied to the concentric cone TEM chamber needs to be subjected to the opening and closing operation of a shielding door every time the position of the probe supporting device is adjusted, the operation is complex and inconvenient, meanwhile, a probe base is generally made of metal, and a metal material is placed in a test area to cause disturbance to a field so as to influence a calibration result.
Disclosure of Invention
In order to solve the problems, the invention provides the probe supporting device which has a simple structure and convenient operation, can reduce the influence of the probe supporting device and the probe on the field, has a certain degree of freedom, and enhances the adaptability of the probe to the field intensity change.
In order to achieve the above purpose, the present invention adopts the following technical scheme:
the invention provides a probe supporting device, comprising:
a moving mechanism located outside the concentric cone TEM; and
a locking member for disposing the probe on the moving mechanism;
the moving mechanism is configured to enable the locking piece to move along a first direction or a second direction so as to drive the probe for measuring the field intensity of the testing area in the cavity of the concentric cone TEM chamber to move along the first direction or the second direction;
the first direction and the second direction are perpendicular in the same plane.
Further, preferably, the moving mechanism includes a first structural member disposed along a first direction and a second structural member disposed on the first structural member and movable along the first direction; the first structural member is configured to be secured in conjunction with a shield door.
Furthermore, preferably, the second structural member includes a straight portion disposed in the first direction and a vertical portion disposed in the second direction;
and limiting sliding grooves used for being clamped on two opposite sides of the first structural member are formed in the straight part.
Further, preferably, the flat portion is formed with a first bar-shaped groove extending in the first direction; the first structural member comprises a plurality of fixing holes arranged along a first direction; the second structural member is fixed with the first structural member through the fixing member; the fixing piece is configured to penetrate through the first strip-shaped groove and match with the fixing hole.
Further, preferably, the vertical portion is formed with a second bar-shaped groove extending in a second direction; the locking piece is arranged on the second strip-shaped groove and can drive the probe to move along the slotting direction of the second strip-shaped groove.
In addition, preferably, the probe supporting device further comprises a connecting piece for installing and fixing the probe and an adapter piece for enabling the connecting piece to be matched with the locking piece; the connector is configured to locate the probe within the concentric cone TEM chamber cavity test zone.
In addition, preferably, the connecting piece comprises a rod body and an arc-shaped part formed at one end of the rod body; the end part of the rod body, which is far away from the arc-shaped part, is matched with the locking piece and the adapter; an arc-shaped guide groove is formed on the arc-shaped part; the probe is arranged on the arc-shaped guide groove and can move along the extending direction of the arc-shaped guide groove.
Furthermore, preferably, the locking piece is combined and fixed with the probe; the probe sensing part is positioned in the concentric cone TEM chamber cavity testing area.
Furthermore, preferably, the first structural member includes graduations thereon.
Furthermore, preferably, the vertical portion includes graduations thereon.
The beneficial effects of the invention are as follows:
according to the invention, the locking piece is matched with the moving mechanism positioned outside the concentric cone TEM, so that the processing difficulty is reduced, the operation is more convenient, the influence of the supporting device and the probe on the test can be reduced, meanwhile, the supporting device can drive the probe for measuring the field intensity of the test area in the cavity of the concentric cone TEM to move along the first direction or the second direction, the probe has a certain degree of freedom for adjustment, the requirement of the probe in the test is fully met, the adaptability of the probe to the field intensity change is enhanced, and the whole structure is simple.
Drawings
The following describes the embodiments of the present invention in further detail with reference to the drawings.
FIG. 1 is a cross-sectional view of the probe support device of the present invention disposed on a concentric cone TEM chamber.
Fig. 2 is one of the installation schematic views of the probe supporting device of the present invention.
FIG. 3 is a second schematic view of the installation of the probe support device of the present invention.
Fig. 4 is a schematic structural view of the probe supporting device of the present invention.
Fig. 5 is a schematic structural view of a second structural member of the present invention.
Fig. 6 is a schematic structural view of the connector of the present invention.
Fig. 7 is a schematic structural view of the adaptor of the present invention.
Detailed Description
Various exemplary embodiments of the present invention will now be described in detail with reference to the accompanying drawings. It should be noted that: the relative arrangement of the components and steps, numerical expressions and numerical values set forth in these embodiments do not limit the scope of the present invention unless it is specifically stated otherwise.
The following description of at least one exemplary embodiment is merely exemplary in nature and is in no way intended to limit the invention, its application, or uses.
Techniques and equipment known to those of ordinary skill in the relevant art may not be discussed in detail, but should be considered part of the specification where appropriate.
In all examples shown and discussed herein, any specific values should be construed as merely illustrative, and not a limitation. Thus, other examples of exemplary embodiments may have different values.
It should be noted that: like reference numerals and letters denote like items in the following figures, and thus once an item is defined in one figure, no further discussion thereof is necessary in subsequent figures.
In the prior art, the probe and the probe supporting device are generally all configured in the cavity of the concentric cone TEM chamber, so that the influence of the probe and the probe supporting device on the field is increased, and the final field intensity measurement result is further affected. In order to be able to reduce the influence of the probe support device and the probe itself on the field. The present invention provides a probe supporting device, as shown in fig. 1 to 7, specifically, the probe supporting device 10 includes: a displacement mechanism located outside of concentric cone TEM chamber 20; and a locking member 13 for disposing the probe 30 on the moving mechanism; the moving mechanism is configured to enable the locking member 13 to move along a first direction or a second direction so as to drive the probe 30 for measuring the field intensity of the testing area in the cavity of the concentric cone TEM chamber 20 to move along the first direction or the second direction, thereby realizing the adjustment of the probe 30 in two degrees of freedom in the first direction and the second direction, realizing the linear adjustment of the probe position and enhancing the adaptability of the probe to the field intensity change; in the above embodiment, referring to fig. 4, the first direction is the first direction, and the Y direction is the second direction, which are perpendicular to the first direction and the second direction in the same plane.
In one embodiment, the moving mechanism includes a first structural member 14 disposed along a first direction and a second structural member 15 disposed on the first structural member 14 and movable along the first direction; the first structural member 14 is configured to be combined and fixed with the shielding door 21, and the first structural member 14 is mounted on the outer side of the shielding door 21 through a screw, it should be noted that, as can be seen from fig. 2, the right side of the shielding door 21 is the outer side of the shielding door 21, and the left side of the shielding door 21 is the inner side of the shielding door 21, which has the advantages that the moving mechanism can be completely arranged on the outer side of the shielding door 21, the influence of the moving mechanism on the field is reduced as much as possible, and the accuracy of the probe in field intensity measurement is ensured; as can be seen in fig. 2, the probe 30 is located inside the shield door 21, i.e., the probe 30 is located within the cavity of the concentric cone TEM chamber 20.
With respect to the specific manner of fitting the second structural member 15 to the first structural member 14, referring to fig. 5, further, the second structural member 15 includes a straight portion 151 disposed along the first direction and a vertical portion 152 disposed along the second direction; the straight portion 151 is formed with limiting sliding grooves for being clamped to two opposite sides of the first structural member 14, so that the second structural member 15 is ensured not to deviate when moving on the first structural member 14.
In the above-described embodiment, as shown in fig. 4, specifically, the flat portion 151 is formed with a first bar-shaped groove 154 extending in the first direction; the first structural member 14 includes a plurality of fixing holes arranged along a first direction; the second structural member 15 is fixed with the first structural member 14 by a fixing member 16; the fixing member 16 is configured to penetrate through the first bar-shaped groove 154 and cooperate with the fixing hole, through the above arrangement, the second structural member 15 and the first structural member 14 can be fixed after the position of the probe 30 is adjusted, so as to ensure the stability of the probe 30 during measurement, and the first bar-shaped groove 154 can be utilized to enable the second structural member 15 to be finely adjusted on the first structural member 14 within a certain scale range, so that the accuracy of position adjustment is improved.
In order to enable the probe 30 to move up and down in the Y direction, the vertical portion 152 is formed with a second bar-shaped groove 153 extending in a second direction; the locking member 13 is disposed on the second slot 153 and can drive the probe 30 to move along the slotting direction of the second slot 153.
In one embodiment, as shown in connection with fig. 2, the probe supporting device 10 further includes a connector 11 for mounting and fixing the probe 30 and an adapter 12 for engaging the connector 11 with the locking member 13; the connector 11 is configured to locate the probe 30 within the testing region of the cavity of the concentric cone TEM chamber 20. In this embodiment, the probe 30 is a small volume probe that can extend entirely into the cavity of the concentric cone TEM chamber 20 for field strength measurement, and the locking member 13 can be a locking screw by which the connector 11 can be secured to the second structural member 15.
Further, as to the specific structure of the connecting member 11, referring to fig. 6, the connecting member 11 includes a rod 111 and an arc portion 112 formed at one end of the rod 111; the end part of the rod body 111 away from the arc-shaped part 112 is matched with the locking piece 13 and the adapter piece 12; an arc-shaped guide groove 113 is formed on the arc-shaped portion 112; the probe 30 is disposed on the arc-shaped guide slot 113 and can move along the extending direction of the arc-shaped guide slot 113; rod 111 passes through shield door 21 to locate probe 30 within the cavity of concentric cone TEM chamber 20; the arrangement of the arc-shaped guide groove 113 has the advantages that on the basis that the probe 30 has two degrees of freedom adjustment in the X direction and the Y direction, one degree of freedom adjustment for movement along the arc-shaped extending direction is added, so that the probe 30 has the capability of adjusting in three degrees of freedom at the same time, and the adaptability of the probe to field intensity change is further enhanced; in particular, the probe 30 is rotatable about a concentric cone TEM chamber axis.
In one embodiment, referring to fig. 3, the locking member 13 is directly combined with and fixed to the probe, and the probe is a large-volume probe; and the probe sensing part 31 is positioned in the concentric cone TEM chamber cavity testing area to measure the field intensity of the testing area.
In addition, as shown in fig. 4 and 5, in order to facilitate determining the position coordinates of the probe, graduations are included on the vertical portion 152 of the first structural member 14 and the second structural member 15.
In summary, the invention reduces the processing difficulty by the cooperation of the locking piece and the moving mechanism positioned outside the concentric cone TEM, so that the operation is more convenient, the influence of the supporting device and the probe on the test can be reduced, and meanwhile, the supporting device can drive the probe for measuring the field intensity of the test area in the cavity of the concentric cone TEM to move along the first direction or the second direction, so that the probe has a certain degree of freedom for adjustment, the requirement of the probe in the test is fully met, the adaptability of the probe to the field intensity change is enhanced, and the whole structure is simple.
It should be understood that the foregoing examples of the present invention are provided merely for clearly illustrating the present invention and are not intended to limit the embodiments of the present invention, and that various other changes and modifications may be made therein by one skilled in the art without departing from the spirit and scope of the present invention as defined by the appended claims.

Claims (8)

1. A probe support device, comprising:
a moving mechanism located outside the concentric cone TEM; and
a locking member for disposing the probe on the moving mechanism;
the moving mechanism is configured to enable the locking piece to move along a first direction or a second direction so as to drive the probe for measuring the field intensity of the testing area in the cavity of the concentric cone TEM chamber to move along the first direction or the second direction;
in the same plane, the first direction and the second direction are vertical;
the moving mechanism comprises a first structural member arranged along a first direction and a second structural member which is arranged on the first structural member and can move along the first direction; the first structural member is configured to be fixed in combination with a shield door;
the second structural member comprises a straight part arranged along a first direction and a vertical part arranged along a second direction;
and limiting sliding grooves used for being clamped on two opposite sides of the first structural member are formed in the straight part.
2. The probe support device of claim 1 wherein the straight portion has a first slot formed therein extending in a first direction; the first structural member comprises a plurality of fixing holes arranged along a first direction; the second structural member is fixed with the first structural member through the fixing member; the fixing piece is configured to penetrate through the first strip-shaped groove and match with the fixing hole.
3. The probe support device of claim 1 wherein the upright portion has a second slot formed therein extending in a second direction; the locking piece is arranged on the second strip-shaped groove and can drive the probe to move along the slotting direction of the second strip-shaped groove.
4. The probe support device of claim 1 further comprising a connector for mounting a stationary probe and an adapter for mating the connector with the locking member; the connector is configured to locate the probe within the concentric cone TEM chamber cavity test zone.
5. The probe support device of claim 4 wherein the connector comprises a rod and an arcuate portion formed at one end of the rod; the end part of the rod body, which is far away from the arc-shaped part, is matched with the locking piece and the adapter; an arc-shaped guide groove is formed on the arc-shaped part; the probe is arranged on the arc-shaped guide groove and can move along the extending direction of the arc-shaped guide groove.
6. The probe support device of claim 1 wherein the locking member is fixedly coupled to the probe; the probe sensing part is positioned in the concentric cone TEM chamber cavity testing area.
7. The probe support device of claim 1 wherein the first structural member includes graduations thereon.
8. The probe support device of claim 1 wherein the upright portion includes graduations thereon.
CN202210560728.4A 2022-05-23 2022-05-23 Probe supporting device Active CN115076530B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202210560728.4A CN115076530B (en) 2022-05-23 2022-05-23 Probe supporting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202210560728.4A CN115076530B (en) 2022-05-23 2022-05-23 Probe supporting device

Publications (2)

Publication Number Publication Date
CN115076530A CN115076530A (en) 2022-09-20
CN115076530B true CN115076530B (en) 2023-11-28

Family

ID=83249910

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202210560728.4A Active CN115076530B (en) 2022-05-23 2022-05-23 Probe supporting device

Country Status (1)

Country Link
CN (1) CN115076530B (en)

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005178963A (en) * 2003-12-18 2005-07-07 Murakami Corp Display rise and fall adjusting device
CN105485496A (en) * 2015-12-17 2016-04-13 北京无线电计量测试研究所 Probe support device
CN108828485A (en) * 2018-03-19 2018-11-16 北京无线电计量测试研究所 A kind of field intensity probe omni-directional calibration system, method and holder device
CN208443420U (en) * 2018-08-10 2019-01-29 机械工业第六设计研究院有限公司 Universal adjusting type mounting frame for sensor
CN109596898A (en) * 2018-12-18 2019-04-09 北京无线电计量测试研究所 A kind of probe support device and the room concentric tapered TEM
CN112213534A (en) * 2020-08-28 2021-01-12 南京瑞贻电子科技有限公司 Supporting device with signal shielding function for wave recorder and supporting method
CN214889860U (en) * 2021-02-07 2021-11-26 福州英迪格成像技术有限公司 But fixed bolster of multi-angle rotating and removal
CN216485466U (en) * 2021-11-02 2022-05-10 上海安平静电科技有限公司 Electrostatic sensor testing device

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005178963A (en) * 2003-12-18 2005-07-07 Murakami Corp Display rise and fall adjusting device
CN105485496A (en) * 2015-12-17 2016-04-13 北京无线电计量测试研究所 Probe support device
CN108828485A (en) * 2018-03-19 2018-11-16 北京无线电计量测试研究所 A kind of field intensity probe omni-directional calibration system, method and holder device
CN208443420U (en) * 2018-08-10 2019-01-29 机械工业第六设计研究院有限公司 Universal adjusting type mounting frame for sensor
CN109596898A (en) * 2018-12-18 2019-04-09 北京无线电计量测试研究所 A kind of probe support device and the room concentric tapered TEM
CN112213534A (en) * 2020-08-28 2021-01-12 南京瑞贻电子科技有限公司 Supporting device with signal shielding function for wave recorder and supporting method
CN214889860U (en) * 2021-02-07 2021-11-26 福州英迪格成像技术有限公司 But fixed bolster of multi-angle rotating and removal
CN216485466U (en) * 2021-11-02 2022-05-10 上海安平静电科技有限公司 Electrostatic sensor testing device

Also Published As

Publication number Publication date
CN115076530A (en) 2022-09-20

Similar Documents

Publication Publication Date Title
CN101578528A (en) Test system and daughter unit
US7969367B2 (en) Antenna coupler
CN107270839B (en) Device and method for measuring coaxiality of rotator in hole
CN110018361B (en) Phased array antenna gain noise temperature ratio measuring method and system
US20130015997A1 (en) Distance measuring device and method for determining a distance, and a suitable reflective member
EP3044830B1 (en) Waveguide probe for nondestructive material characterization
CN115076530B (en) Probe supporting device
Boehm et al. Accuracy evaluation for antenna measurements at mm-wave frequencies
CN113156224B (en) OTA test darkroom
CN109596898B (en) Probe supporting device and concentric conical TEM chamber
CN117388583A (en) Compact range antenna feed source pose adjustment method
CN105485496B (en) A kind of probe support device
Le Coq et al. IETR millimeter-wave Compact Antenna Test Range implementation and validation
CN113358936A (en) Resistance measuring device for conductive adhesive tape in shielding cover
CN110568269A (en) test system
CN212588338U (en) Millimeter wave test assembly capable of accurately adjusting test position and camera bellows provided with same
CN213843399U (en) Electrically small antenna measuring device
CN116827452B (en) Internet of things communication terminal antenna debugging device
CN212146050U (en) Tablet personal computer test fixture
CN115166378A (en) Measurement auxiliary device
CN218181080U (en) Magnetron magnetic field distribution measuring device
CN217820602U (en) Compact range and spherical surface near-field composite antenna test system
CN218496032U (en) Displacement meter
CN217820043U (en) Quick detection device of base station antenna
CN214473624U (en) Multi-probe bow rack test system

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant