CN109596898B - Probe supporting device and concentric conical TEM chamber - Google Patents
Probe supporting device and concentric conical TEM chamber Download PDFInfo
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- CN109596898B CN109596898B CN201811546847.4A CN201811546847A CN109596898B CN 109596898 B CN109596898 B CN 109596898B CN 201811546847 A CN201811546847 A CN 201811546847A CN 109596898 B CN109596898 B CN 109596898B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
- G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
- G01R29/0821—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells
- G01R29/0828—TEM-cells
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- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The embodiment of the application provides a probe supporting device and a concentric conical TEM chamber, wherein the probe supporting device comprises: a base and a support frame; the support frame is fixed on the base through a lifting mechanism; the lifting mechanism can drive the support frame to move up and down relative to the base; the supporting frame is provided with an omnidirectional rotating platform, and the probe is fixed in the center of the omnidirectional rotating platform through a fastener. The technical scheme has the advantages of simple structure, small volume, no damage to the surface of the cone, good adaptability of a test area, convenient operation and high feasibility, and can complete the calibration of the omni-directional parameters of the field intensity probe.
Description
Technical Field
The application relates to the field of experimental tests, in particular to a probe supporting device and a concentric conical TEM chamber.
Background
In the field of national defense science and technology industry, the field intensity probe has huge use amount, wide sources, and various countries, manufacturers and specifications. A plurality of field intensity probes are widely applied to the fields of electromagnetic radiation hazard measurement, military product electromagnetic compatibility test, electromagnetic measurement field performance evaluation and the like, and relate to a frequency band of 10 kHz-40 GHz. The field strength and the calibration of the field strength probe are considerably emphasized. In recent years, a new need has arisen for wideband calibration of field strength parameters based on accurate calibration.
The field intensity probes are calibrated by adopting methods such as a TEM (transmission electron microscope) chamber method, a GTEM (GTEM) chamber method, a standard field method based on a pyramid horn antenna and the like in different frequency bands of a Beijing radio measurement test institute, the frequency bands of 10kHz to 40GHz are covered together, but the method cannot meet the calibration requirement of 6 frequency sweeps of large-scale field intensity probes of a national defense and military system. At present, the system capable of generating the broadband electromagnetic field is generally considered to be a concentric conical TEM chamber broadband field intensity calibration system, and the system can meet the requirements of full-band and broadband sweep frequency calibration of a field intensity probe.
The problems to be solved when the concentric conical TEM chamber broadband field intensity calibration system is used for calibrating the field intensity probe mainly comprise that: 1. how to arrange a considerable volume of field strength probes in a limited space; 2. how to arrange the field intensity probes on the premise of not damaging the surfaces of the inner conductor and the outer conductor; 3. the change of the working condition causes the change of the test uniform area, and the field intensity probe is required to have certain degree of freedom in the cavity.
The concentric conical TEM chamber is used as an emerging technology device, and the traditional probe supporting device is not suitable for use. ZL201510958846.0 discloses a probe supporting device which can partially solve the above problems, but still has the following disadvantages: 1. the outer cone surface is damaged; 2. the adaptability of the test area in the vertical direction is poor; 3. the layout is too ideal, the filling between the inner conductor and the outer conductor is not considered, and the practical feasibility is not high; 4. the position adjustment can be operated only from another opening, and the operability is poor; 5. the omni-directional parameters of the field strength probe cannot be calibrated.
Disclosure of Invention
To address one of the above issues, the present application provides a probe support device and a concentric conical TEM cell.
According to a first aspect of embodiments of the present application, there is provided a probe supporting device, the device comprising: a base 18 and a support; the support frame is fixed on the base 18 through a lifting mechanism; the lifting mechanism can drive the supporting frame to move up and down relative to the base 18;
the supporting frame is provided with an omnidirectional rotating platform 10, and the probe is fixed in the center of the omnidirectional rotating platform 10 through a fastener.
Preferably, the lifting mechanism includes: a fixed vertical rod 15 and a movable vertical rod 14 sleeved in the fixed vertical rod 15;
the fixed vertical rod 15 is fixed with the base 18; one end of the movable vertical rod 14 is fixed with the support frame.
Preferably, the lifting mechanism is provided with an adjusting knob 16.
Preferably, the support frame comprises: the transverse plate 11, the vertical plate 8 and the gland 9;
the transverse plate 11 is fixed with the lifting mechanism; the vertical plate 8 is vertically fixed with the transverse plate 11;
the vertical plate 8 is provided with a groove for accommodating the omnidirectional rotating platform 10, and the gland 9 fixes the omnidirectional rotating platform 10 in the groove of the vertical plate 8.
Preferably, the transverse plate 11 is provided with a long slot hole for adjusting the fixing position;
the transverse plate 11 is fixed on the lifting mechanism by a fastener through adjusting the fixing position of the long slotted hole.
Preferably, the gland 9 is provided with scale marks; and/or, the base 18 is provided with scale marks.
Preferably, the probe supporting device is made of non-metal materials.
Preferably, the omnidirectional rotating platform 10 is provided with an adjusting hole.
According to a second aspect of an embodiment of the present application, there is provided a concentric conical TEM chamber comprising: the device comprises an outer cone 1, an inner cone 2 and a supporting and positioning medium 3 arranged between the outer cone 1 and the inner cone 2;
the top of the inner cone 2 is provided with a terminal load 5;
the probe supporting device is arranged on the supporting and positioning medium 3.
Preferably, a shielding door 4 is arranged on the outer cone 1.
The technical scheme has the advantages of simple structure, small volume, no damage to the surface of the cone, good adaptability of a test area, convenient operation and high feasibility, and can complete the calibration of the omni-directional parameters of the field intensity probe.
Drawings
The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the application and together with the description serve to explain the application and not to limit the application. In the drawings:
fig. 1 shows a schematic view of a probe supporting device according to the present scheme;
FIG. 2 shows a cross-sectional view of the probe support device of the present solution;
FIG. 3 shows a front view of the probe support device of the present solution;
FIG. 4 shows a schematic of a concentric conical TEM cell according to the present scheme;
figure 5 shows a top view of a concentric conical TEM cell according to the present scheme.
Reference numerals
1. The device comprises an outer cone, 2, an inner cone, 3, a supporting and positioning medium, 4, a shielding door, 5, a terminal load, 6, a field intensity probe, 7, a field intensity probe locking screw, 8, a vertical plate, 9, a gland, 10, an omni-directional rotating platform, 11, a transverse plate, 12, a nut, 13, a gasket, 14, a movable vertical rod, 15, a fixed vertical rod, 16, an adjusting knob, 17, a vertical rod fixing screw, 18 and a base.
Detailed Description
In order to make the technical solutions and advantages of the embodiments of the present application more apparent, the following further detailed description of the exemplary embodiments of the present application with reference to the accompanying drawings makes it clear that the described embodiments are only a part of the embodiments of the present application, and are not exhaustive of all embodiments. It should be noted that the embodiments and features of the embodiments in the present application may be combined with each other without conflict.
The core idea of the scheme is that an omnidirectional rotating platform 10 is added on a supporting frame of the probe, and the omnidirectional parameter calibration of the field intensity probe 6 is realized by utilizing the omnidirectional rotating platform 10; simultaneously, for the support frame increases elevating gear to improve the adaptability to the test area.
As shown in fig. 1 to 3, the present application discloses a probe supporting device, including: a support frame fixed on the base 18. The support frame is L type, and the probe passes through the fastener to be fixed on the support frame. In order to increase the adaptability of the supporting device, the supporting frame is fixed on the base 18 by selectively using a lifting mechanism; under the drive of the lifting mechanism, the height of the support frame can be adjusted according to the position of the test area. In addition, still be equipped with the omnidirectional revolving stage 10 on the support frame, the probe passes through the fastener to be fixed the centre of omnidirectional revolving stage 10 adjusts the probe through omnidirectional revolving stage 10 to realize the omnidirectional parameter calibration of probe.
In this scheme, elevating system includes: a fixed vertical bar 15 and a movable vertical bar 14; the fixed vertical rod 15 is sleeved outside the movable vertical rod 14, and the movable vertical rod 14 moves relative to the fixed vertical rod 15; the fixed vertical rod 15 is fixed with the base 18 through a vertical rod fixing screw 17; one end of the movable vertical rod 14 is fixed with the support frame through a nut 12. In order to prevent the nut 12 from being damaged by pressure against the support, a spacer 13 is provided between the nut 12 and the support. In addition, in order to facilitate adjustment of the elevating mechanism, an adjusting knob 16 is provided on the elevating mechanism, and the height of the elevating mechanism is adjusted by rotating the adjusting knob 16.
In this scheme, the support frame includes: the transverse plate 11, the vertical plate 8 and the gland 9; the transverse plate 11 is fixed with the lifting mechanism; the vertical plate 8 and the transverse plate 11 are vertically fixed to form a support frame with an L-shaped structure. The vertical plate 8 is provided with a groove for accommodating the omnidirectional rotating platform 10, and the gland 9 fixes the omnidirectional rotating platform 10 in the groove of the vertical plate 8. Wherein, in order to optimize the structure, the upper sides of the vertical plate 8 and the cover plate are processed into a semicircle matched with the omnidirectional rotating platform 10. In addition, a long slot hole for adjusting the fixed position is arranged on the transverse plate 11; the transverse plate 11 is fixed on the lifting mechanism by a fastener through adjusting the fixing position of the long slotted hole. In addition, the omnidirectional rotating platform 10 is provided with an adjusting hole.
As shown in fig. 4 and 5, the present application further discloses a concentric conical TEM cell comprising: the device comprises an outer cone 1, an inner cone 2 and a supporting and positioning medium 3 arranged between the outer cone 1 and the inner cone 2; the top of the inner cone 2 is provided with a terminal load 5; the probe supporting device is arranged on the supporting and positioning medium 3. And a shielding door 4 is arranged on the outer cone 1.
The present solution is further illustrated by the following examples.
As shown in fig. 1 to 3, the present example provides a probe supporting device. The probe support device of this example is arranged in position within a concentric conical TEM cell, as shown in figures 4 and 5. The probe supporting device is placed on the supporting and positioning medium 3, and the position can be conveniently adjusted through the shielding door 4.
Specifically, as shown in fig. 1, the probe supporting device includes: the field intensity probe locking screw 7, a vertical plate 8, a gland 9, an omnidirectional rotating platform 10, a transverse plate 11, a nut 12, a gasket 13, a movable vertical rod 14, a fixed vertical rod 15, a hand-screwed screw, a vertical rod fixing screw 17 and a base 18.
In this example, the base 18 of the probe support device is placed in a corresponding circular hole in the terminal load 5, and the probe support device can rotate along the axis of the base 18, so as to drive the field strength probe 6 to reach different cross-sectional positions of the test area.
In this example, the end face of the base 18 of the probe supporting device is designed with scale marks, when the position of the field strength probe 6 at the cross section of the test area is determined, the current scale value is recorded, and the subsequent field strength probes 6 to be calibrated all take the current scale value as the standard, thereby realizing the function of positioning the cross section position.
In this example, the movable vertical bar 14 of the probe support means is movable up and down along the fixed vertical bar 15 and is fixed in its vertical position by means of a thumb screw, so that the field strength probes 6 reach different height positions of the test zone.
In this example, the transverse plate 11 of the probe supporting device is provided with a slotted hole, and the movable vertical rod 14 can be adjusted at different positions of the slotted hole through the gasket 13 and the nut 12, so that the heads of the field intensity probes 6 with different lengths can be ensured to be at the same position of the test area.
In this embodiment, the omnidirectional rotary table 10 of the probe supporting device is designed with an indicating arrow and an adjusting hole, and the gland 9 is designed with a scale mark. The omnidirectional rotating platform 10 is in contact with the vertical plate 8 through the gland 9, the omnidirectional rotating platform 10 can be guaranteed to easily rotate between the gland 9 and the vertical plate 8 through machining errors, and the gland 9 and the vertical plate 8 are fixed together through screws. The field intensity probe 6 is connected with the omnidirectional rotary table 10 through a field intensity probe locking screw 7. The omnidirectional rotating platform 10 is rotated through the adjusting hole designed on the omnidirectional rotating platform 10, so that the field intensity probe 6 is driven to rotate, and the omnidirectional parameter calibration of the field intensity probe 6 can be completed by rotating for a circle according to the required stepping angle.
In this example, the probe support device is made entirely of a non-metal, preferably polytetrafluoroethylene.
In summary, the advantages of the scheme are as follows:
1. according to the scheme, the probe supporting device is arranged on a supporting and positioning medium 3 in a concentric conical TEM chamber, and the position can be conveniently adjusted through the shielding door 4.
2. In the scheme, the base 18 of the probe supporting device is placed in a corresponding round hole on the terminal load 5, and the probe supporting device can rotate along the axis of the base 18, so that the field intensity probe 6 is driven to reach different cross section positions of a test area.
3. In the scheme, the scale marks are designed on the end face of the base 18 of the probe supporting device, when the position of the cross section of the test area of the field intensity probe 6 is determined, the current scale value is recorded, and the subsequent field intensity probe 6 to be calibrated is based on the current scale value, so that the function of positioning the position of the cross section is realized.
4. In the scheme, the movable vertical rod 14 of the probe supporting device can move up and down along the fixed vertical rod 15 and is fixed in the vertical position through the hand-screwed screw, so that the field intensity probes 6 reach different height positions of the test area.
5. In the scheme, the transverse plate 11 of the probe supporting device is provided with the slotted hole, and the movable vertical rod 14 can be adjusted at different positions of the slotted hole through the gasket 13 and the nut 12, so that the heads of the field intensity probes 6 with different lengths can be ensured to be positioned at the same position of a test area.
6. In this scheme, the omnidirectional rotating platform 10 of the probe supporting device is provided with an indication arrow and 4 adjusting holes, and the gland 9 is provided with scale marks. The omnidirectional rotating platform 10 is in contact with the vertical plate 8 through the gland 9, the omnidirectional rotating platform 10 can be guaranteed to easily rotate between the gland 9 and the vertical plate 8 through machining errors, and the gland 9 and the vertical plate 8 are fixed together through screws. The field intensity probe 6 is connected with the omnidirectional rotary table 10 through a field intensity probe locking screw 7. The omnidirectional rotating platform 10 is rotated through the adjusting hole designed on the omnidirectional rotating platform 10, so that the field intensity probe 6 is driven to rotate, and the omnidirectional parameter calibration of the field intensity probe 6 can be completed by rotating for a circle according to the required stepping angle.
While the preferred embodiments of the present application have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. Therefore, it is intended that the appended claims be interpreted as including preferred embodiments and all alterations and modifications as fall within the scope of the application.
It will be apparent to those skilled in the art that various changes and modifications may be made in the present application without departing from the spirit and scope of the application. Thus, if such modifications and variations of the present application fall within the scope of the claims of the present application and their equivalents, the present application is intended to include such modifications and variations as well.
Claims (7)
1. A probe support device, the device comprising: a base (18) and a support; the support frame is fixed on the base (18) through a lifting mechanism; the lifting mechanism can drive the supporting frame to move up and down relative to the base (18);
an omnidirectional rotating platform (10) is arranged on the supporting frame, and the probe is fixed in the center of the omnidirectional rotating platform (10) through a fastener;
the support frame includes: the horizontal plate (11), the vertical plate (8) and the gland (9);
the transverse plate (11) is fixed with the lifting mechanism; the vertical plate (8) is vertically fixed with the transverse plate (11);
the vertical plate (8) is provided with a groove for accommodating the omnidirectional rotating platform (10), the gland (9) fixes the omnidirectional rotating platform (10) in the groove of the vertical plate (8), the omnidirectional rotating platform (10) is provided with an adjusting hole, the omnidirectional rotating platform can rotate between the gland and the vertical plate, and the omnidirectional rotating platform is rotated through the adjusting hole so as to drive the probe to rotate;
the transverse plate (11) is provided with a long slot hole for adjusting the fixed position;
the transverse plate (11) adjusts the fixing position of the lifting mechanism on the long slotted hole through the long slotted hole and is fixed on the lifting mechanism by a fastener;
the support frame can rotate along the axis of the base, and the base (18) is provided with scale marks.
2. The probe support device of claim 1, wherein the lift mechanism comprises: a fixed vertical rod (15) and a movable vertical rod (14) sleeved in the fixed vertical rod (15);
the fixed vertical rod (15) is fixed with the base (18); one end of the movable vertical rod (14) is fixed with the support frame.
3. The probe support device of claim 2, wherein the lifting mechanism is provided with an adjustment knob (16).
4. The probe support device of claim 1, wherein the probe support device is made of a non-metallic material.
5. Probe support device according to claim 1, wherein the gland (9) is provided with graduation marks.
6. A concentric conical TEM cell, comprising: the device comprises an outer cone (1), an inner cone (2) and a supporting and positioning medium (3) arranged between the outer cone (1) and the inner cone (2);
the top of the inner cone (2) is provided with a terminal load (5);
the supporting and positioning medium (3) is provided with a probe supporting device according to any one of claims 1 to 5.
7. Concentric conical TEM cell according to claim 6, characterized in that the outer cone (1) is provided with a screen door (4).
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| Application Number | Priority Date | Filing Date | Title |
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| CN201811546847.4A CN109596898B (en) | 2018-12-18 | 2018-12-18 | Probe supporting device and concentric conical TEM chamber |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201811546847.4A CN109596898B (en) | 2018-12-18 | 2018-12-18 | Probe supporting device and concentric conical TEM chamber |
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| CN109596898A CN109596898A (en) | 2019-04-09 |
| CN109596898B true CN109596898B (en) | 2021-11-16 |
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| CN109596898B (en) * | 2018-12-18 | 2021-11-16 | 北京无线电计量测试研究所 | Probe supporting device and concentric conical TEM chamber |
| CN115076530B (en) * | 2022-05-23 | 2023-11-28 | 北京无线电计量测试研究所 | Probe supporting device |
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