CN105485496B - A kind of probe support device - Google Patents
A kind of probe support device Download PDFInfo
- Publication number
- CN105485496B CN105485496B CN201510958846.0A CN201510958846A CN105485496B CN 105485496 B CN105485496 B CN 105485496B CN 201510958846 A CN201510958846 A CN 201510958846A CN 105485496 B CN105485496 B CN 105485496B
- Authority
- CN
- China
- Prior art keywords
- base
- connector
- cross bar
- probe
- groove
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
- F16M—FRAMES, CASINGS OR BEDS OF ENGINES, MACHINES OR APPARATUS, NOT SPECIFIC TO ENGINES, MACHINES OR APPARATUS PROVIDED FOR ELSEWHERE; STANDS; SUPPORTS
- F16M13/00—Other supports for positioning apparatus or articles; Means for steadying hand-held apparatus or articles
- F16M13/02—Other supports for positioning apparatus or articles; Means for steadying hand-held apparatus or articles for supporting on, or attaching to, an object, e.g. tree, gate, window-frame, cycle
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
- F16M—FRAMES, CASINGS OR BEDS OF ENGINES, MACHINES OR APPARATUS, NOT SPECIFIC TO ENGINES, MACHINES OR APPARATUS PROVIDED FOR ELSEWHERE; STANDS; SUPPORTS
- F16M11/00—Stands or trestles as supports for apparatus or articles placed thereon Stands for scientific apparatus such as gravitational force meters
- F16M11/02—Heads
- F16M11/04—Means for attachment of apparatus; Means allowing adjustment of the apparatus relatively to the stand
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
Abstract
A kind of probe support device of disclosure, the device is applied in concentric tapered TEM rooms, and described device includes：Base (1), cross bar (2), connector (3), connector lock-screw (4).The device is coordinated by the shield door with being placed in cone inner surface outside concentric tapered TEM rooms, so as to reach the purpose that probe is placed in chamber interior.Further, since can be rotated in the axial direction progress displacement of cross bar (2), groove, and moved in the enterprising line position of connecting rod, also just possess certain free degree in cavity, have certain adaptability to the change of test section.
Description
Technical field
The application is related to experiment and testing field, more particularly to a kind of probe support device.
Background technology
In Radio Measurement field, electric-field intensity is one of basic parameter of radio, so electric field intensity measuremenrt
Accuracy, experiment with it is quite important in testing field.And in order to make field intensity probe to measure field strength, typically exist
It is required for calibrating field intensity probe before measurement or before dispatching from the factory, so the calibration accuracy to field intensity probe can directly affect field
The calibration result popped one's head in by force, so as to influence the measurement accuracy of field intensity probe.
When the general electric-field intensity to different frequency range is calibrated, transverse electromagnetic mode (Transverse can be respectively adopted
Electromagnetic Mode, TEM) room method, gigahertz (GHZ) transverse electromagnetic mode (Gigahertz Transverse
Electromagnetic Mode, GTEM) room method, the standard magnetic field method based on angle pyramidal horn antenna come to field intensity probe carry out school
It is accurate.But, wherein TEM rooms method (i.e. traditional TEM rooms method) and GTEM rooms method can not carry out accurate school in more than 1GHz frequency range
Standard, and standard magnetic field method efficiency based on horn antenna is low, cost is high, and the covering frequency range of single pyramid horn antenna is narrow,
So the calibration requirements of a large amount of field intensity probe frequency sweeps can not be met.It can be produced in current concentric tapered TEM rooms and meet broadband
The electromagnetic field of calibration, field intensity probe needs to be placed on concentric tapered TEM as the carrier of induced field strength when carrying out Field strength calibration
It is indoor.
The demand of calibration can be met in concentric tapered TEM chamber bodies, but is limited to the cavity shape of concentric tapered TEM rooms
Shape, test section shape and uneven in cavity, so the field intensity probe of suitable volume how is laid out in limited space is
One key issue, but prior art do not address how also in concentric tapered TEM chamber bodies place field intensity probe the problem of.
The content of the invention
The embodiment of the present application provides a kind of probe support device, by being coordinated with shield door, so as to reach concentric
Placed in taper TEM rooms and the purpose of probe positions can be adjusted.
The embodiment of the present application uses following technical proposals：
A kind of probe support device, including：A kind of probe support device, it is characterised in that described device is applied to concentric
In taper TEM rooms, described device includes：Base (1), cross bar (2), connector (3), connector lock-screw (4)；
The base (1) generally hollow structure, its one end is designed to the groove structure of some deciles, and base (1) is another
End is coordinated with shield door；
At least two strip bulges (21) are designed with around the cross bar (2), are carried out with the groove structure of base (1) one end
Coordinate, form free-standing connection so that cross bar (2) can do the displacement of certain distance, and cross bar along the axial direction of base (1)
(2) it can be rotated with certain stepping angle；
The groove for being available for probe lock-screw (6) to pass through is provided with the middle of connector (3), the probe lock-screw (6) can
Any point is fixed by field intensity probe (5) on the groove of connector (3)；Connector (3) passes through connector lock-screw (4) and horizontal stroke
Bar (2) is fixed.
Preferably, one end of the base (1) is designed to the groove structure of eight equal parts；Design phase around the cross bar (2)
Four strip bulges (21) of adjacent orthogonality relation, are connected with base (1) formation free-standing, make cross bar (2) can be with certain
Stepping angle is rotated.
Preferably, connector (3) is circular connector, and groove is annular groove, the annular radian of the circular connector
For 360 °/n, n is the number of probe support device in concentric tapered TEM rooms.
Preferably, base (1) other end is identical with the contact surface of shield door.
Preferably, all parts are less than using dielectric constant specifies the nonmetallic materials of dielectric constant threshold value to be made.
The above-mentioned technical proposal that the embodiment of the present application is used can reach following beneficial effect：The device by base, cross bar,
Connector and connector lock-screw composition, and pass through the shield door with being placed in cone inner surface outside concentric tapered TEM rooms
Coordinated, so as to reach the purpose that probe is placed in chamber interior.Further, since line position can be entered in the axial direction of cross bar
Rotated, and moved in the enterprising line position of connecting rod in shifting, groove, also just possess certain free degree in cavity, to surveying
The change in examination area has certain adaptability.
Brief description of the drawings
Accompanying drawing described herein is used for providing further understanding of the present application, constitutes the part of the application, this Shen
Schematic description and description please is used to explain the application, does not constitute the improper restriction to the application.In the accompanying drawings：
The structural representation for the probe support device that Fig. 1 provides for the embodiment of the present application；
The structural representation for the cross bar 2 with least two strip bulges that Fig. 2 provides for the embodiment of the present application；
The right view for the base 1 that Fig. 3 provides for the embodiment of the present application；
The rearview for the base 1 that Fig. 4 provides for the embodiment of the present application；
The structural representation for the cross bar 2 with four strip bulges that Fig. 5 provides for the embodiment of the present application；
The schematic diagram coordinated with shield door that Fig. 6 provides for the embodiment of the present application；
Fig. 7 for the embodiment of the present application provide by being coordinated with shield door, probe is put using probe support device
Put the schematic diagram in concentric tapered TEM rooms.
Embodiment
To make the purpose, technical scheme and advantage of the application clearer, below in conjunction with the application specific embodiment and
Technical scheme is clearly and completely described corresponding accompanying drawing.Obviously, described embodiment is only the application one
Section Example, rather than whole embodiments.Based on the embodiment in the application, those of ordinary skill in the art are not doing
Go out the every other embodiment obtained under the premise of creative work, belong to the scope of the application protection.
Below in conjunction with accompanying drawing, the technical scheme that each embodiment of the application is provided is described in detail.
As it was previously stated, the demand of calibration can be met in concentric tapered TEM chamber bodies, but it is limited to concentric tapered TEM
The cavity geometry of room, test section shape and uneven in cavity, so how to be laid out suitable volume in limited space
Field intensity probe is a key issue.And due to the precision of cone inner surface and inner cone external surface outside concentric tapered TEM rooms
It is required that very high, the design that field intensity probe support meanss how are carried out on the premise of surface accuracy is ensured is a difficult point；In addition,
Because the change of condition of work causes the change of test homogeneity range, this requires field intensity probe to possess certain freedom in cavity
Degree.But prior art can also solve these problems without a kind of scheme.The embodiment of the present application provides a kind of probe support
Device, is coordinated by the shield door with being placed in cone inner surface outside concentric tapered TEM rooms, so as to reach in concentric tapered
Placed in TEM rooms and the purpose of probe positions can be adjusted.
As shown in figure 1, the device includes：Base 1, cross bar 2, connector 3, connector lock-screw 4.
Specifically, the generally hollow structure of base 1, its one end is designed to the groove structure of some deciles, the other end of base 1
Coordinated with the shield door 7 that is placed in cone inner surface outside concentric tapered TEM rooms.
At least two strip bulges 21 as shown in Figure 2 are designed with around cross bar 2, are entered with the groove structure of the one end of base 1
Row coordinates, and forms free-standing connection, and cross bar 2 can do the displacement of certain distance along the axial direction of base 1；
In one embodiment, such as the base 1 in Fig. 1, the right view of base 1 as shown in Figure 3 and as shown in Figure 4
Base 1 rearview, one end of base 1 is designed to the groove structure of eight equal parts, and the bar shaped for designing with the surrounding of cross bar 2 is convex
Rise and form free-standing connection so that cross bar 2 can do the displacement of certain distance along the axial direction of base 1, and can be with certain
Stepping angle rotated.Usually, based on the base 1 with eight equal parts groove structure, as shown in figure 5, in order to improve stabilization
Property, four strip bulges 21 of adjacent orthogonal relation can be designed around cross bar 2, are connected with the formation free-standing of base 1, are made
Cross bar 2 can be rotated with certain stepping angle.
The groove for being available for probe lock-screw 6 to pass through is provided with the middle of connector 3, probe lock-screw 6 can be in connector 3
Any point fixes field intensity probe 5 on groove, and connector 3 is fixed by connector lock-screw 4 with cross bar 2.
Because each plane is circular in concentric tapered TEM rooms, so in one embodiment, as shown in fig. 6,
Connector 3 can be designed as circular connector, and groove is annular groove, in order that the whole circle of scope of activities covering of field intensity probe
Week, the annular radian of circular connector can be designed as 360 °/n, and n is of probe support device in concentric tapered TEM rooms
Number.
In one embodiment, the other end of base 1 can be identical with the contact surface of shield door 7, such as Fig. 2 and Fig. 3, than
Such as, shield door 7 is placed in concentric tapered TEM rooms, it is possible to which shield door is set into arcwall face, so as to by base 1
The other end be also designed to the contact surface identical arcwall face of shield door 7, and then when ensure that base 1 is contacted with shield door 7
There is as far as possible big contact surface, to provide firm connection, be referred to the schematic diagram coordinated with shield door shown in Fig. 6.
Alternatively, it is also possible to which the contact surface of shield door and base is set into plane, it is ensured that have as far as possible big when base is contacted with shield door
Contact surface.
In one embodiment, in order to reduce interference of the part to electric field of probe support device, all parts can be with
It is made of the nonmetallic materials for being less than specified dielectric constant threshold value (such as 3.5 or 2.8 etc.) using dielectric constant, it is nonmetallic
Material can be from materials such as polyformaldehyde, polytetrafluoroethylene (PTFE).
It should be noted that in actual applications, as shown in fig. 7, concentric tapered TEM rooms are in the way of Fig. 7, i.e., it is vertical
Downward, and the cross bar 2 cooperated with base 1 is level, so not resulting in coming off for vertical direction.
The device provided using embodiment 1, is made up of, and lead to base, cross bar, connector and connector lock-screw
Cross and coordinated with being placed in the shield door of cone inner surface outside concentric tapered TEM rooms, placed so as to reach in chamber interior
The purpose of probe.Further, since can be rotated in the axial direction progress displacement of cross bar, groove, and it is enterprising in connecting rod
Line position is moved, and also just possesses certain free degree in cavity, has certain adaptability to the change of test section.
Obviously, the above embodiment of the present invention is only intended to clearly illustrate example of the present invention, and is not pair
The restriction of embodiments of the present invention.For those of ordinary skill in the field, may be used also on the basis of the above description
To make other changes in different forms.Here all embodiments can not be exhaustive.It is every to belong to this hair
Row of the obvious changes or variations that bright technical scheme is extended out still in protection scope of the present invention.
Claims (5)
1. a kind of probe support device, it is characterised in that described device is applied in concentric tapered TEM rooms, and described device includes：
Base (1), cross bar (2), connector (3), connector lock-screw (4)；
The base (1) generally hollow structure, its one end is designed to the groove structure of some deciles, base (1) other end with
Shield door is coordinated；
At least two strip bulges (21) are designed with around the cross bar (2), are matched somebody with somebody with the groove structure of base (1) one end
Close, form free-standing connection so that cross bar (2) can do the displacement of certain distance, and cross bar (2) along the axial direction of base (1)
It can be rotated with certain stepping angle；
The groove for being available for probe lock-screw (6) to pass through is provided with the middle of connector (3), the probe lock-screw (6) can be even
Any point is fixed by field intensity probe (5) on the groove of fitting (3)；Connector (3) passes through connector lock-screw (4) and cross bar
(2) it is fixed.
2. device as claimed in claim 1, it is characterised in that one end of the base (1) is designed to the groove knot of eight equal parts
Structure；Four strip bulges (21) of adjacent orthogonal relation are designed around the cross bar (2), are connected with base (1) formation free-standing
Connect, cross bar (2) is rotated with certain stepping angle.
3. device as claimed in claim 1, it is characterised in that connector (3) is circular connector, and groove is annular groove, institute
The annular radian for stating circular connector is 360 °/n, and n is the number of probe support device in concentric tapered TEM rooms.
4. device as claimed in claim 1, it is characterised in that base (1) other end is identical with the contact surface of shield door.
5. device as claimed in claim 1, it is characterised in that all parts are less than using dielectric constant specifies dielectric constant
The nonmetallic materials of threshold value are made.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510958846.0A CN105485496B (en) | 2015-12-17 | 2015-12-17 | A kind of probe support device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510958846.0A CN105485496B (en) | 2015-12-17 | 2015-12-17 | A kind of probe support device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105485496A CN105485496A (en) | 2016-04-13 |
| CN105485496B true CN105485496B (en) | 2017-08-25 |
Family
ID=55672664
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510958846.0A Active CN105485496B (en) | 2015-12-17 | 2015-12-17 | A kind of probe support device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105485496B (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109596898B (en) * | 2018-12-18 | 2021-11-16 | 北京无线电计量测试研究所 | Probe supporting device and concentric conical TEM chamber |
| CN109655689B (en) * | 2018-12-20 | 2020-11-17 | 西北核技术研究所 | Low-disturbance supporting structure for TEM cell |
| CN115076530B (en) * | 2022-05-23 | 2023-11-28 | 北京无线电计量测试研究所 | Probe supporting device |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6313800B1 (en) * | 1997-12-31 | 2001-11-06 | Henry D. Kallina | Adjustable broadband antenna |
| CN2864685Y (en) * | 2006-01-05 | 2007-01-31 | 厦门大学 | Microwave coplanar waveguide testing jig |
| CN200968972Y (en) * | 2006-11-17 | 2007-10-31 | 中国舰船研究设计中心 | Tunable test probe bracket |
| CN102338812A (en) * | 2010-07-21 | 2012-02-01 | 神讯电脑(昆山)有限公司 | Sensitive rod testing bracket |
| CN102829296A (en) * | 2012-08-27 | 2012-12-19 | 北京无线电计量测试研究所 | Supporting device for correcting uniformity of transient electromagnetic field |
-
2015
- 2015-12-17 CN CN201510958846.0A patent/CN105485496B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6313800B1 (en) * | 1997-12-31 | 2001-11-06 | Henry D. Kallina | Adjustable broadband antenna |
| CN2864685Y (en) * | 2006-01-05 | 2007-01-31 | 厦门大学 | Microwave coplanar waveguide testing jig |
| CN200968972Y (en) * | 2006-11-17 | 2007-10-31 | 中国舰船研究设计中心 | Tunable test probe bracket |
| CN102338812A (en) * | 2010-07-21 | 2012-02-01 | 神讯电脑(昆山)有限公司 | Sensitive rod testing bracket |
| CN102829296A (en) * | 2012-08-27 | 2012-12-19 | 北京无线电计量测试研究所 | Supporting device for correcting uniformity of transient electromagnetic field |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105485496A (en) | 2016-04-13 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN105485496B (en) | A kind of probe support device | |
| US10483636B1 (en) | Electromagnetic wave shield box | |
| CN102484320A (en) | Cross-dipole Antenna | |
| CN105244570A (en) | Design method of active frequency selection surface | |
| CN105527598B (en) | A kind of field sensor calibration system and method | |
| Zheng et al. | Calibration loop antenna for multiple probe antenna measurement system | |
| CN110954754B (en) | Concentric cone TEM chamber field uniformity calibration method | |
| CN105162929A (en) | Test system and test device used by the same | |
| CN103105540B (en) | Coaxial high-voltage pulse probe with sensitivity coefficient adjustable | |
| CN109596898B (en) | Probe supporting device and concentric conical TEM chamber | |
| US20120161803A1 (en) | Apparatus and method for near field scan calibration | |
| US9234928B2 (en) | Electric field probe | |
| CN108508242B (en) | Flange coaxial device for testing shielding effectiveness of material | |
| CN104237575A (en) | Coaxial fixture for testing of electromagnetic property of material | |
| CN218896811U (en) | Antenna device and test system | |
| KR100243090B1 (en) | Y-transverse electromagnetic cell | |
| CN206114774U (en) | FSS structure for real -time calibration | |
| KR20140075533A (en) | Transverse electromagnetic cell | |
| CN204086315U (en) | Circuit board transmission line test connector | |
| JP3187790B2 (en) | Linear coupled transmission line cell | |
| Stokes et al. | Traceable S-parameter measurements up to 90 GHz in 1.35 mm coaxial | |
| CN115166378A (en) | Measurement auxiliary device | |
| JP2007235317A (en) | Antenna system | |
| Schulz et al. | Characterization of a beam steering lens antenna for industrial radar measurements in harsh environments | |
| CN206575618U (en) | Test device for radio communication |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |