CN105485496A - Probe support device - Google Patents
Probe support device Download PDFInfo
- Publication number
- CN105485496A CN105485496A CN201510958846.0A CN201510958846A CN105485496A CN 105485496 A CN105485496 A CN 105485496A CN 201510958846 A CN201510958846 A CN 201510958846A CN 105485496 A CN105485496 A CN 105485496A
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- CN
- China
- Prior art keywords
- probe
- base
- cross bar
- link
- groove
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
- F16M—FRAMES, CASINGS OR BEDS OF ENGINES, MACHINES OR APPARATUS, NOT SPECIFIC TO ENGINES, MACHINES OR APPARATUS PROVIDED FOR ELSEWHERE; STANDS; SUPPORTS
- F16M13/00—Other supports for positioning apparatus or articles; Means for steadying hand-held apparatus or articles
- F16M13/02—Other supports for positioning apparatus or articles; Means for steadying hand-held apparatus or articles for supporting on, or attaching to, an object, e.g. tree, gate, window-frame, cycle
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
- F16M—FRAMES, CASINGS OR BEDS OF ENGINES, MACHINES OR APPARATUS, NOT SPECIFIC TO ENGINES, MACHINES OR APPARATUS PROVIDED FOR ELSEWHERE; STANDS; SUPPORTS
- F16M11/00—Stands or trestles as supports for apparatus or articles placed thereon Stands for scientific apparatus such as gravitational force meters
- F16M11/02—Heads
- F16M11/04—Means for attachment of apparatus; Means allowing adjustment of the apparatus relatively to the stand
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
Abstract
The invention discloses a probe support device which is applied in a concentric tapered TEM (Transverse Electromagnetic Mode) chamber. The probe support device comprises a base (1), a cross rod (2), a connecting piece (3) and a connecting piece locking screw (4). The probe support device cooperates with a shield door on the inner surface of an outer cone of the concentric tapered TEM chamber to achieve the purpose of placing a probe in the chamber. Besides, the probe can move in the axial direction of the cross rod, rotate in grooves and move on a connecting rod, that is, the probe has certain degrees of freedom in the chamber, and thus the probe is adapted to the change of a testing area to a certain degree.
Description
Technical field
The application relates to test and field tests, particularly relates to a kind of probe support device.
Background technique
In Radio Measurement field, electric field strength is one of wireless basic parameter, so the accuracy of electric field intensity measuremenrt, quite important in test with field tests.And in order to field intensity probe can be made can accurately to measure field intensity, general before measuring or all need before dispatching from the factory to calibrate field intensity probe, so directly can affect the calibration result of field intensity probe to the calibration accuracy of field intensity probe, thus affect the measurement accuracy of field intensity probe.
When generally the electric field strength of different frequency range being calibrated, transverse electromagnetic mode (TransverseElectromagneticMode can be adopted respectively, TEM) room method, gigahertz (GHZ) transverse electromagnetic mode (GigahertzTransverseElectromagneticMode, GTEM) room method, based on the standard magnetic field method of angle pyramidal horn antenna, field intensity probe is calibrated.But, wherein TEM room method (namely traditional TEM room method) and GTEM room method cannot carry out accurate calibration in the frequency range of more than 1GHz, and low based on the standard magnetic field method efficiency of horn antenna, cost is high, and the covering frequency range of single pyramid horn antenna is narrow, so the calibration requirements of a large amount of field intensity probe frequency sweep cannot be met.Current concentric tapered TEM indoor can produce the electromagnetic field meeting wide band calibration, and field intensity probe, as the carrier of induced field strength, needs to be placed on concentric tapered TEM indoor when carrying out Field strength calibration.
The demand of calibration can be met in concentric tapered TEM chamber body, but be limited to the cavity geometry of concentric tapered TEM room, test section shape uneven in cavity, so how in limited space the field intensity probe of the suitable volume of layout be a key issue, but prior art does not also solve the problem of how to place field intensity probe in concentric tapered TEM chamber body.
Summary of the invention
The embodiment of the present application provides a kind of probe support device, by coordinating with shielded gate, thus reaches the object that also can regulate probe positions in the indoor placement of concentric tapered TEM.
The embodiment of the present application adopts following technical proposals:
A kind of probe support device, comprise: a kind of probe support device, it is characterized in that, described application of installation is indoor in concentric tapered TEM, and described device comprises: base (1), cross bar (2), link (3), link lock screw (4);
Described base (1) entirety is hollow structure, and its one end is designed to the groove structure of some deciles, and base (1) the other end coordinates with shielded gate;
Described cross bar (2) is designed with at least two strip bulges (21) around, coordinate with the groove structure of base (1) one end, formation free-standing connects, make cross bar (2) that the displacement of certain distance can be done along the axis of base (1), and cross bar (2) can rotate with certain stepping angle;
Have the groove that can pass through for probe lock screw (6) in the middle of link (3), field intensity probe (5) can be fixed by any point by described probe lock screw (6) on the groove of link (3); Link (3) is fixed by link lock screw (4) and cross bar (2).
Preferably, one end of described base (1) is designed to the groove structure of eight equal parts; Described four strip bulges (22) stating design adjacent orthogonal relation around cross bar (2), form free-standing with base (1) and are connected, cross bar (2) can be rotated with certain stepping angle.
Preferably, link (3) is circular connector, and groove is circular groove, and the radian of described annular is 360 °/and n, n are the number of the indoor probe supportive device of concentric tapered TEM.
Preferably, described base (1) the other end is identical with the surface of contact of shielded gate.
Preferably, the nonmetallic material that all parts all adopt permittivity to be less than appointment permittivity threshold value are made.
The technique scheme that the embodiment of the present application adopts can reach following beneficial effect: this device is made up of base, cross bar, link and link lock screw, and by coordinating with the shielded gate being placed in the outdoor cone internal surface of concentric tapered TEM, thus reach the object of placing probe in chamber interior.In addition, owing to carrying out rotating in displacement, groove in the axis of cross bar, and at the enterprising line displacement of connecting rod, also in cavity, just possessed certain degrees of freedom, had certain adaptive capacity to the change of test section.
Accompanying drawing explanation
Accompanying drawing described herein is used to provide further understanding of the present application, and form a application's part, the schematic description and description of the application, for explaining the application, does not form the improper restriction to the application.In the accompanying drawings:
The structural representation of the probe support device that Fig. 1 provides for the embodiment of the present application;
The structural representation of the cross bar 2 with at least two strip bulges that Fig. 2 provides for the embodiment of the present application;
The right elevation of the base 1 that Fig. 3 provides for the embodiment of the present application;
The rear view of the base 1 that Fig. 4 provides for the embodiment of the present application;
The structural representation of the cross bar 2 with four strip bulges that Fig. 5 provides for the embodiment of the present application;
What Fig. 6 provided for the embodiment of the present application carries out with shielded gate the schematic diagram that coordinates;
Fig. 7 for the embodiment of the present application provide by coordinating with shielded gate, utilize probe support device by the schematic diagram of probe placement in concentric tapered TEM indoor.
Embodiment
For making the object of the application, technological scheme and advantage clearly, below in conjunction with the application's specific embodiment and corresponding accompanying drawing, technical scheme is clearly and completely described.Obviously, described embodiment is only some embodiments of the present application, instead of whole embodiments.Based on the embodiment in the application, those of ordinary skill in the art are not making the every other embodiment obtained under creative work prerequisite, all belong to the scope of the application's protection.
Below in conjunction with accompanying drawing, describe the technological scheme that each embodiment of the application provides in detail.
As previously mentioned, the demand of calibration can be met in concentric tapered TEM chamber body, but be limited to the cavity geometry of concentric tapered TEM room, test section shape uneven in cavity, thus how in limited space the field intensity probe of the suitable volume of layout be a key issue.And because the required precision of the outdoor cone internal surface of concentric tapered TEM and internal cones outer surface is very high, the design how carrying out field intensity probe support device under the prerequisite ensureing surface accuracy is a difficult point; In addition, the change due to operating conditions causes the change testing homogeneity range, and this just requires that field intensity probe possesses certain degrees of freedom in cavity.But prior art does not also have a kind of scheme to address these problems.The embodiment of the present application provides a kind of probe support device, by coordinating with the shielded gate being placed in the outdoor cone internal surface of concentric tapered TEM, thus reaches the object that also can regulate probe positions in the indoor placement of concentric tapered TEM.
As shown in Figure 1, this device comprises: base 1, cross bar 2, link 3, link lock screw 4.
Particularly, base 1 entirety is hollow structure, and its one end is designed to the groove structure of some deciles, and base 1 the other end coordinates with the shielded gate 7 being placed in the outdoor cone internal surface of concentric tapered TEM.
Be designed with at least two strip bulges 21 as shown in Figure 2 around cross bar 2, coordinate with the groove structure of base 1 one end, form free-standing and connect, and cross bar 2 can do the displacement of certain distance along the axis of base 1;
In one embodiment, as the right elevation of the base 1 in Fig. 1, base 1 as shown in Figure 3 and the rear view of base 1 as shown in Figure 4, one end of base 1 is designed to the groove structure of eight equal parts, be connected for forming free-standing with the strip bulge that cross bar 2 surrounding designs, make can the spread out axis of base 1 of cross bar 2 do the displacement of certain distance, and can rotate with certain stepping angle.Usually, based on the base 1 with eight equal parts groove structure, as shown in Figure 5, in order to improve stability, four strip bulges 22 of adjacent orthogonal relation can be designed around cross bar 2, form free-standing with base 1 and be connected, cross bar 2 can be rotated with certain stepping angle.
Have the groove that can pass through for probe lock screw 6 in the middle of link 3, field intensity probe 5 can be fixed by any point by probe lock screw 6 on the groove of link 3, and link 3 is fixed by link lock screw 4 and cross bar 2.
Because the indoor each plane of concentric tapered TEM is circular, so in one embodiment, as shown in Figure 5, link 3 can be designed as circular connector, groove is circular groove, in order to make the sphere of activities of field intensity probe cover whole circumference, the radian of annular can be designed as 360 °/n, n are the number of the indoor probe supportive device of concentric tapered TEM.
In one embodiment, the other end of base 1 can be identical with the surface of contact of shielded gate 7, as Fig. 2 and Fig. 3, such as, it is indoor that shielded gate 7 is placed in concentric tapered TEM, so shielded gate can be set to arc shaped surface, thus the other end of base 1 also can be designed to the arc shaped surface identical with shielded gate 7 surface of contact, and then can ensure that base 1 has as far as possible large surface of contact when contacting with shielded gate 7, and to provide firm connection, can with reference to carrying out with shielded gate the schematic diagram that coordinates shown in Fig. 6.In addition, also the surface of contact of shielded gate and base can be set to plane, ensure that base has as far as possible large surface of contact when contacting with shielded gate.
In one embodiment, in order to reduce the interference of parts to electric field of probe support device, all parts can all adopt permittivity to be less than to specify the nonmetallic material of permittivity threshold value (such as 3.5 or 2.8 etc.) to make, and nonmetallic material can select the material such as polyoxymethylene, teflon.
It should be noted that, in actual applications, as shown in Figure 7, concentric tapered TEM room is the mode with Fig. 7, namely vertically downward, and is levels with the cross bar 2 that base 1 cooperatively interacts, so can not cause coming off of vertical direction.
This device adopting embodiment 1 to provide, is made up of base, cross bar, link and link lock screw, and by coordinating with the shielded gate being placed in the outdoor cone internal surface of concentric tapered TEM, thus reach the object of placing probe in chamber interior.In addition, owing to carrying out rotating in displacement, groove in the axis of cross bar, and at the enterprising line displacement of connecting rod, also in cavity, just possessed certain degrees of freedom, had certain adaptive capacity to the change of test section.
Obviously, the above embodiment of the present invention is only for example of the present invention is clearly described, and is not the restriction to embodiments of the present invention.For those of ordinary skill in the field, can also make other changes in different forms on the basis of the above description.Here cannot give exhaustive to all mode of executions.Every belong to technological scheme of the present invention the apparent change of extending out or variation be still in the row of protection scope of the present invention.
Claims (5)
1. a probe support device, is characterized in that, described application of installation is indoor in concentric tapered TEM, and described device comprises: base (1), cross bar (2), link (3), link lock screw (4);
Described base (1) entirety is hollow structure, and its one end is designed to the groove structure of some deciles, and base (1) the other end coordinates with shielded gate;
Described cross bar (2) is designed with at least two strip bulges (21) around, coordinate with the groove structure of base (1) one end, formation free-standing connects, make cross bar (2) that the displacement of certain distance can be done along the axis of base (1), and cross bar (2) can rotate with certain stepping angle;
Have the groove that can pass through for probe lock screw (6) in the middle of link (3), field intensity probe (5) can be fixed by any point by described probe lock screw (6) on the groove of link (3); Link (3) is fixed by link lock screw (4) and cross bar (2).
2. device as claimed in claim 1, it is characterized in that, one end of described base (1) is designed to the groove structure of eight equal parts; Described four strip bulges (22) stating design adjacent orthogonal relation around cross bar (2), form free-standing with base (1) and are connected, cross bar (2) can be rotated with certain stepping angle.
3. device as claimed in claim 1, it is characterized in that, link (3) is circular connector, and groove is circular groove, and the radian of described annular is 360 °/and n, n are the number of the indoor probe supportive device of concentric tapered TEM.
4. device as claimed in claim 1, it is characterized in that, described base (1) the other end is identical with the surface of contact of shielded gate.
5. device as claimed in claim 1, is characterized in that, the nonmetallic material that all parts all adopt permittivity to be less than appointment permittivity threshold value are made.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510958846.0A CN105485496B (en) | 2015-12-17 | 2015-12-17 | A kind of probe support device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510958846.0A CN105485496B (en) | 2015-12-17 | 2015-12-17 | A kind of probe support device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105485496A true CN105485496A (en) | 2016-04-13 |
| CN105485496B CN105485496B (en) | 2017-08-25 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510958846.0A Active CN105485496B (en) | 2015-12-17 | 2015-12-17 | A kind of probe support device |
Country Status (1)
| Country | Link |
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| CN (1) | CN105485496B (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109596898A (en) * | 2018-12-18 | 2019-04-09 | 北京无线电计量测试研究所 | A kind of probe support device and the room concentric tapered TEM |
| CN109655689A (en) * | 2018-12-20 | 2019-04-19 | 西北核技术研究所 | A kind of low disturbance support construction for the cell TEM |
| CN115076530A (en) * | 2022-05-23 | 2022-09-20 | 北京无线电计量测试研究所 | Probe strutting arrangement |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6313800B1 (en) * | 1997-12-31 | 2001-11-06 | Henry D. Kallina | Adjustable broadband antenna |
| CN2864685Y (en) * | 2006-01-05 | 2007-01-31 | 厦门大学 | Microwave coplanar waveguide testing jig |
| CN200968972Y (en) * | 2006-11-17 | 2007-10-31 | 中国舰船研究设计中心 | Tunable test probe bracket |
| CN102338812A (en) * | 2010-07-21 | 2012-02-01 | 神讯电脑(昆山)有限公司 | Sensitive rod testing bracket |
| CN102829296A (en) * | 2012-08-27 | 2012-12-19 | 北京无线电计量测试研究所 | Supporting device for correcting uniformity of transient electromagnetic field |
-
2015
- 2015-12-17 CN CN201510958846.0A patent/CN105485496B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6313800B1 (en) * | 1997-12-31 | 2001-11-06 | Henry D. Kallina | Adjustable broadband antenna |
| CN2864685Y (en) * | 2006-01-05 | 2007-01-31 | 厦门大学 | Microwave coplanar waveguide testing jig |
| CN200968972Y (en) * | 2006-11-17 | 2007-10-31 | 中国舰船研究设计中心 | Tunable test probe bracket |
| CN102338812A (en) * | 2010-07-21 | 2012-02-01 | 神讯电脑(昆山)有限公司 | Sensitive rod testing bracket |
| CN102829296A (en) * | 2012-08-27 | 2012-12-19 | 北京无线电计量测试研究所 | Supporting device for correcting uniformity of transient electromagnetic field |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109596898A (en) * | 2018-12-18 | 2019-04-09 | 北京无线电计量测试研究所 | A kind of probe support device and the room concentric tapered TEM |
| CN109655689A (en) * | 2018-12-20 | 2019-04-19 | 西北核技术研究所 | A kind of low disturbance support construction for the cell TEM |
| CN109655689B (en) * | 2018-12-20 | 2020-11-17 | 西北核技术研究所 | Low-disturbance supporting structure for TEM cell |
| CN115076530A (en) * | 2022-05-23 | 2022-09-20 | 北京无线电计量测试研究所 | Probe strutting arrangement |
| CN115076530B (en) * | 2022-05-23 | 2023-11-28 | 北京无线电计量测试研究所 | Probe supporting device |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105485496B (en) | 2017-08-25 |
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