CN115076530A

CN115076530A - Probe strutting arrangement

Info

Publication number: CN115076530A
Application number: CN202210560728.4A
Authority: CN
Inventors: 黄承祖; 刘星汛; 崔腾林; 彭博; 赵鹏
Original assignee: Beijing Institute of Radio Metrology and Measurement
Current assignee: Beijing Institute of Radio Metrology and Measurement
Priority date: 2022-05-23
Filing date: 2022-05-23
Publication date: 2022-09-20
Anticipated expiration: 2042-05-23
Also published as: CN115076530B

Abstract

The invention provides a probe supporting device, which comprises a moving mechanism positioned outside a concentric cone TEM chamber; and a locking member for disposing the probe on the moving mechanism; the moving mechanism is configured to enable the locking piece to move along a first direction or a second direction so as to drive the probe used for measuring the field intensity in the cavity of the concentric cone TEM chamber to move along the first direction or the second direction; the first direction and the second direction are perpendicular in the same plane. The probe supporting device is simple in structure and convenient to operate, can reduce the influence of the probe supporting device and the probe on a field, and meanwhile has a certain degree of freedom, so that the adaptability of the probe to field intensity change is enhanced.

Description

Probe strutting arrangement

Technical Field

The invention relates to the technical field of radio measurement. And more particularly, to a probe supporting device.

Background

The field intensity is one of the basic parameters of radio, the accuracy of the field intensity measurement result is directly influenced by the calibration precision of the field intensity parameters, and the field defense science and technology industry always pays great attention to the field intensity and the calibration work of the field intensity probe. On the basis of accurate calibration, the national defense science and technology industry puts forward new requirements on broadband calibration of field intensity parameters, and the frequency band is 10 kHz-40 GHz.

The method comprises the steps of adopting a TEM room method, a GTEM room method, a standard field method based on a pyramid horn antenna and the like internationally, covering a frequency band of 10 kHz-40 GHz together, wherein the calibration method of the TEM room and the GTEM room is limited by a calibration frequency band and cannot finish accurate calibration in a frequency band above 1GHz, and the standard field method based on the pyramid horn antenna is low in efficiency, high in cost, narrow in coverage frequency band of a single antenna and cannot meet the calibration requirement of large-batch field intensity probe frequency sweeping of a national defense and military project system.

At present, the system capable of generating the broadband electromagnetic field is generally considered to be a concentric cone TEM chamber broadband field intensity calibration system, and the system can meet the requirements of full-band and broadband frequency sweep calibration of a field intensity probe.

The calibration of the field intensity probe is carried out in a cavity of a concentric cone TEM chamber, and is limited by the shape of the cavity of the concentric cone TEM chamber, the shape of a test area in the cavity is not uniform, and a key problem is how to arrange the field intensity probe with a certain volume in a limited space; moreover, because the precision requirements of the inner surface of the outdoor cone and the outer surface of the inner cone of the concentric cone TEM are very high, the design of the field intensity probe supporting device under the premise of ensuring the surface precision is a difficult point; meanwhile, the change of the working condition causes the change of the uniform test area, so that the field intensity probe is required to have certain degree of freedom in the cavity.

The concentric cone TEM chamber is used as emerging technical equipment, the traditional probe supporting device is not suitable, the existing probe supporting device applied to the concentric cone TEM chamber is required to be subjected to the opening and closing operation of a shielding door when the position is adjusted every time, the operation is complex and inconvenient, meanwhile, a probe base is generally made of metal, and the field can be disturbed when the metal material is placed in a test area, so that the calibration result is influenced.

Disclosure of Invention

In order to solve the problems, the invention provides the probe supporting device which is simple in structure and convenient to operate, can reduce the influence of the probe supporting device and the probe on a field, has a certain degree of freedom, and enhances the adaptability of the probe to field intensity change.

In order to achieve the purpose, the invention adopts the following technical scheme:

the invention provides a probe supporting device, comprising:

a moving mechanism located outside the concentric cone TEM chamber; and

a locking member for disposing the probe on the moving mechanism;

the moving mechanism is configured to enable the locking piece to move along a first direction or a second direction so as to drive the probe used for measuring the field intensity of the test area in the cavity of the concentric cone TEM chamber to move along the first direction or the second direction;

the first direction and the second direction are perpendicular in the same plane.

In addition, it is preferable that the moving mechanism includes a first structural member provided in the first direction and a second structural member disposed on the first structural member and movable in the first direction; the first structural member is configured to be fixed in conjunction with a screen door.

Further, it is preferable that the second structural member includes a straight portion provided in a first direction and a vertical portion provided in a second direction;

the straight portion is formed with the spacing spout that is used for the joint in first structural component two contrasides.

Furthermore, it is preferable that a first bar-shaped groove extending in a first direction is formed on the straight portion; the first structural member comprises a plurality of fixing holes arranged along a first direction; the second structural part is fixed with the first structural part through a fixing part; the fixing member is configured to penetrate the first bar-shaped groove and to be engaged with the fixing hole.

Furthermore, it is preferable that a second strip-shaped groove extending in a second direction is formed on the vertical portion; the locking piece is arranged on the second strip-shaped groove and can drive the probe to move along the slotting direction of the second strip-shaped groove.

In addition, it is preferable that the probe supporting device further comprises a connecting piece for installing and fixing the probe and an adapter piece for matching the connecting piece with the locking piece; the connector is configured to position the probe within a concentric cone TEM chamber cavity test zone.

In addition, it is preferable that the connector includes a rod body and an arc-shaped portion formed at one end of the rod body; the end part of the rod body far away from the arc-shaped part is matched with the locking piece and the adapter piece; an arc-shaped guide groove is formed on the arc-shaped part; the probe is arranged on the arc-shaped guide groove and can move along the extension direction of the arc-shaped guide groove.

Furthermore, it is preferable that the locking member is fixed in combination with the probe; the probe sensing part is positioned in the cavity testing area of the concentric cone TEM chamber.

Furthermore, preferably, the first structural member includes a scale.

Furthermore, it is preferable that the vertical portion includes a scale.

The invention has the beneficial effects that:

according to the invention, through the matching of the locking piece and the moving mechanism positioned outside the concentric cone TEM chamber, the processing difficulty is reduced, the operation is more convenient, the influence of the supporting device and the probe on the test can be reduced, and meanwhile, the supporting device can drive the probe for measuring the field intensity of the test area in the cavity of the concentric cone TEM chamber to move along the first direction or the second direction, so that the probe has a certain degree of freedom for adjustment, the requirement of the probe during the test is fully met, the adaptability of the probe to the field intensity change is enhanced, and the integral structure is simple.

Drawings

The following describes embodiments of the present invention in further detail with reference to the accompanying drawings.

FIG. 1 is a cross-sectional view of a probe support device of the present invention disposed on a concentric cone TEM cell.

FIG. 2 is one of the schematic views of the installation of the probe support device of the present invention.

Fig. 3 is a second schematic view of the installation of the probe supporting device of the present invention.

Fig. 4 is a schematic structural view of the probe supporting device of the present invention.

Fig. 5 is a schematic view of a second structural member of the present invention.

Fig. 6 is a schematic view of the structure of the connector of the present invention.

Fig. 7 is a schematic structural view of the adaptor of the present invention.

Detailed Description

Various exemplary embodiments of the present invention will now be described in detail with reference to the accompanying drawings. It should be noted that: the relative arrangement of the components and steps, the numerical expressions and numerical values set forth in these embodiments do not limit the scope of the present invention unless specifically stated otherwise.

The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the invention, its application, or uses.

Techniques and apparatus known to those of ordinary skill in the relevant art may not be discussed in detail, but are intended to be considered a part of the specification where appropriate.

In all examples shown and discussed herein, any particular value should be construed as merely illustrative, and not limiting. Thus, other examples of the exemplary embodiments may have different values.

It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, further discussion thereof is not required in subsequent figures.

In the prior art, the probe and probe support are typically all disposed within a concentric cone TEM chamber cavity, which increases the effect of the probe and probe support on the field and thus the final field strength measurement. In order to be able to reduce the influence of the probe support and the probe itself on the field. The invention provides a probe supporting device, which is shown in fig. 1 to 7, and specifically the probe supporting device 10 comprises: a translation mechanism located outside the concentric cone TEM cell 20; and a locking member 13 for disposing the probe 30 on the moving mechanism; the moving mechanism is configured to enable the locking member 13 to move in the first direction or the second direction so as to drive the probe 30 for measuring the field intensity of the test area in the cavity of the concentric cone TEM chamber 20 to move in the first direction or the second direction, so that the adjustment of the probe 30 in two degrees of freedom in the first direction and the second direction is realized, the position of the probe can be linearly adjusted, and the adaptability of the probe to the field intensity change is enhanced; in the same plane, the first direction and the second direction are perpendicular, and in the above embodiment, reference is made to fig. 4, where the X direction is the first direction and the Y direction is the second direction.

In one embodiment, the moving mechanism includes a first structural member 14 disposed along a first direction and a second structural member 15 disposed on the first structural member 14 and capable of moving along the first direction; the first structural component 14 is configured to be fixedly combined with the shield door 21, the first structural component 14 is installed on the outer side of the shield door 21 through a screw, and it can be seen from fig. 2 that the right side of the shield door 21 is the outer side of the shield door 21, and the left side of the shield door 21 is the inner side of the shield door 21, which has the advantages that the moving mechanism can be completely arranged on the outer side of the shield door 21, the influence of the moving mechanism on the field is reduced as much as possible, and the accuracy of the probe in field intensity measurement is ensured; as can be seen from fig. 2, the probe 30 is located inside the shield door 21, i.e. the probe 30 is located inside the concentric cone TEM chamber 20.

With respect to a specific manner of matching the second structural member 15 with the first structural member 14, referring to fig. 5, further, the second structural member 15 includes a straight portion 151 disposed along a first direction and a vertical portion 152 disposed along a second direction; the straight portion 151 is formed with a limiting sliding groove for being clamped to two opposite sides of the first structural member 14, so that the second structural member 15 is prevented from shifting when moving on the first structural member 14.

In the above embodiment, as shown in fig. 4, in particular, the straight portion 151 is formed with a first bar-shaped groove 154 extending in a first direction; the first structural member 14 includes a plurality of fixing holes arranged along a first direction; the second structural member 15 is fixed with the first structural member 14 through a fixing member 16; the fixing member 16 is configured to penetrate through the first bar-shaped groove 154 and cooperate with the fixing hole, and by the above arrangement, after the position of the probe 30 is adjusted, the second structural member 15 and the first structural member 14 can be fixed, so as to ensure the stability of the probe 30 during measurement, and the first bar-shaped groove 154 can be used to finely adjust the second structural member 15 on the first structural member 14 within a certain scale range, thereby improving the accuracy during position adjustment.

In order to enable the probe 30 to move up and down along the Y direction, a second strip-shaped groove 153 extending along the second direction is formed on the vertical portion 152; the locking member 13 is disposed on the second bar-shaped groove 153 and can drive the probe 30 to move along the slotting direction of the second bar-shaped groove 153.

In one embodiment, as shown in fig. 2, the probe supporting device 10 further includes a connecting member 11 for mounting the fixed probe 30 and an adapter member 12 for engaging the connecting member 11 with the locking member 13; the connecting member 11 is configured to allow the probe 30 to be located in the cavity test area of the concentric cone TEM chamber 20, in this embodiment, the probe 30 is a small-sized probe and can fully extend into the cavity of the concentric cone TEM chamber 20 for field intensity measurement, and the locking member 13 can be a locking screw, through which the connecting member 11 can be fixed on the second structural member 15.

Further, regarding the specific structure of the connecting member 11, referring to fig. 6, the connecting member 11 includes a rod 111 and an arc portion 112 formed at one end of the rod 111; the end part of the rod body 111 far away from the arc-shaped part 112 is matched with the locking piece 13 and the adapter piece 12; an arc-shaped guide groove 113 is formed on the arc-shaped part 112; the probe 30 is disposed on the arc-shaped guide groove 113 and can move along the extending direction of the arc-shaped guide groove 113; the rod body 111 penetrates through the shielding door 21 to enable the probe 30 to be positioned in the cavity of the concentric cone TEM chamber 20; the arc-shaped guide groove 113 has the advantages that on the basis that the probe 30 has two degrees of freedom adjustment in the X direction and the Y direction, the degree of freedom adjustment moving along the arc-shaped extension direction is added, so that the probe 30 has the adjustment capability in three degrees of freedom simultaneously, and the adaptability of the probe to field intensity change is further enhanced; in particular, the probe 30 is capable of rotation about a concentric cone TEM cell axis.

In one embodiment, as shown in fig. 3, the retaining member 13 is directly engaged with the probe to be fixed, in this case a large-volume probe; and the probe induction part 31 is positioned in the cavity test area of the concentric cone TEM chamber to measure the field intensity of the test area.

In addition, as shown in fig. 4 and 5, in order to determine the position coordinates of the probe, the first structural member 14 and the vertical portion 152 of the second structural member 15 include scales.

In conclusion, the invention reduces the processing difficulty through the matching of the locking part and the moving mechanism positioned outside the concentric cone TEM chamber, so that the operation is more convenient, the influence of the supporting device and the probe on the test can be reduced, and simultaneously the supporting device can drive the probe for measuring the field intensity of the test area in the cavity of the concentric cone TEM chamber to move along the first direction or the second direction, so that the probe has certain degree of freedom for adjustment, the requirement of the probe during the test is fully met, the adaptability of the probe to the field intensity change is enhanced, and the integral structure is simple.

It should be understood that the above-mentioned embodiments of the present invention are only examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention, and it will be obvious to those skilled in the art that other variations or modifications may be made on the basis of the above description, and all embodiments may not be exhaustive, and all obvious variations or modifications may be included within the scope of the present invention.

Claims

1. A probe support device, comprising:

a moving mechanism located outside the concentric cone TEM chamber; and

a locking member for disposing the probe on the moving mechanism;

2. The probe support device of claim 1, wherein the movement mechanism comprises a first structure disposed in a first direction and a second structure disposed on the first structure and movable in the first direction; the first structural member is configured to be fixed in conjunction with a screen door.

3. The probe support device of claim 2, wherein the second structural member comprises a straight portion disposed in a first direction and a vertical portion disposed in a second direction;

4. The probe supporting device according to claim 3, wherein the straight portion is formed with a first linear groove extending in a first direction; the first structural member comprises a plurality of fixing holes arranged along a first direction; the second structural part is fixed with the first structural part through a fixing part; the fixing member is configured to penetrate the first bar-shaped groove and to be engaged with the fixing hole.

5. The probe supporting device according to claim 3, wherein the vertical portion is formed with a second strip-shaped groove extending in a second direction; the locking piece is arranged on the second strip-shaped groove and can drive the probe to move along the slotting direction of the second strip-shaped groove.

6. The probe support apparatus of claim 1, further comprising a connector for mounting a fixed probe and an adapter for engaging the connector with the retaining member; the connector is configured to position the probe within a concentric cone TEM chamber cavity test zone.

7. The probe support device of claim 6, wherein the connector comprises a shaft and an arcuate portion formed at one end of the shaft; the end part of the rod body far away from the arc-shaped part is matched with the locking piece and the adapter piece; an arc-shaped guide groove is formed on the arc-shaped part; the probe is arranged on the arc-shaped guide groove and can move along the extension direction of the arc-shaped guide groove.

8. The probe support device of claim 1, wherein the retaining member is fixed in combination with the probe; the probe sensing part is positioned in the cavity testing area of the concentric cone TEM chamber.

9. The probe support device of claim 2, wherein the first structure includes a scale thereon.

10. The probe support device of claim 3, wherein the vertical portion includes a scale thereon.