CN115166378A

CN115166378A - Measurement auxiliary device

Info

Publication number: CN115166378A
Application number: CN202210560754.7A
Authority: CN
Inventors: 黄承祖; 刘星汛; 崔腾林; 彭博; 赵鹏
Original assignee: Beijing Institute of Radio Metrology and Measurement
Current assignee: Beijing Institute of Radio Metrology and Measurement
Priority date: 2022-05-23
Filing date: 2022-05-23
Publication date: 2022-10-11

Abstract

The invention provides a measurement auxiliary device, which comprises a supporting piece fixed in a concentric cone TEM chamber; and a probe adjustment assembly disposed on the support; the probe adjusting assembly comprises a base fixed on the supporting piece; the supporting seat can move on the base along the first direction or the second direction and is used for fixing the probe; the supporting seat is configured to enable the probe to move along a third direction; in the same plane, the first direction is vertical to the second direction; the third direction is perpendicular to both the first direction and the second direction. The auxiliary measuring device is simple in structure and small in size, and can reduce the influence of the device on a field to the maximum extent; meanwhile, the probe has the capability of moving and adjusting in three degrees of freedom on the auxiliary device, so that the adaptability of the probe to the change of a test area is greatly enhanced.

Description

Measurement auxiliary device

Technical Field

The invention relates to the technical field of radio measurement. And more particularly, to a measurement assistance device.

Background

The field intensity is one of the basic parameters of radio, the accuracy of the field intensity measurement result is directly influenced by the calibration precision of the field intensity parameters, and the field defense science and technology industry always pays great attention to the field intensity and the calibration work of the field intensity probe. On the basis of accurate calibration, the national defense science and technology industry puts forward a new requirement on the broadband calibration of field intensity parameters, and the frequency band is 10 kHz-40 GHz.

The method comprises the steps of adopting a TEM room method, a GTEM room method, a standard field method based on a pyramid horn antenna and the like internationally, covering a frequency band of 10 kHz-40 GHz together, wherein the calibration method of the TEM room and the GTEM room is limited by a calibration frequency band and cannot finish accurate calibration in a frequency band above 1GHz, and the standard field method based on the pyramid horn antenna is low in efficiency, high in cost, narrow in coverage frequency band of a single antenna and cannot meet the calibration requirement of large-batch field intensity probe frequency sweeping of a national defense and military project system.

At present, the system capable of generating the broadband electromagnetic field is generally considered to be a concentric cone TEM chamber broadband field intensity calibration system, and the system can meet the requirements of full-band and broadband frequency sweep calibration of a field intensity probe.

The field uniformity test is an important item in performance evaluation of concentric cone TEM cells. This places requirements on the calibration of the field homogeneity region of a concentric cone TEM cell.

Limited by the cavity shape of the concentric cone TEM chamber, the test zones are not uniform in shape within the cavity. When the uniform area is calibrated, how to arrange field intensity probes with a certain volume in a limited space is a key problem; in addition, because the precision requirements of the inner surface of the outdoor cone and the outer surface of the inner cone of the concentric cone TEM are very high, the design of the field intensity probe supporting device on the premise of ensuring the surface precision is a difficult point; meanwhile, the measurement auxiliary device itself can directly influence the calibration result of the uniform area, and especially, the selection of the material is very critical.

The concentric conical TEM chamber is used as an emerging technology device, and the traditional measurement auxiliary device is not suitable for use.

Disclosure of Invention

In view of the above problems, the present invention provides a measurement assisting device, which has a simple structure and a small volume, and can maximally reduce the influence of the device on the field; meanwhile, the probe has the capability of moving and adjusting in three degrees of freedom on the auxiliary device, so that the adaptability of the probe to the change of a test area is greatly enhanced.

In order to achieve the purpose, the invention adopts the following technical scheme:

the invention provides a measurement auxiliary device, comprising:

a support member secured within the concentric cone TEM chamber; and

a probe adjustment assembly disposed on the support;

the probe adjusting assembly comprises a base fixed on the supporting piece; the supporting seat can move on the base along the first direction or the second direction and is used for fixing the probe;

the supporting seat is configured to enable the probe to move along a third direction;

in the same plane, the first direction is vertical to the second direction; the third direction is perpendicular to both the first direction and the second direction.

Furthermore, it is preferable that the supporting member has a circular truncated cone shape.

In addition, it is preferable that the support member includes a fixing groove formed by an upper surface of the support member being depressed inward;

the base comprises a bearing part and a fixing part which is fixedly combined with the bearing part; the fixing part is combined and fixed in the fixing groove.

In addition, preferably, a plurality of inserting holes are formed on the bearing part;

the supporting seat comprises a main body and an inserting part formed at one end of the main body; the inserting part can be inserted and fixed in the inserting hole.

In addition, it is preferable that the horizontal cross-sections of the insertion part and the insertion hole are non-circular.

In addition, preferably, a fixing hole for fixing the probe is formed on the support seat; the axis of the fixing hole is horizontally arranged.

Furthermore, it is preferable that the support base is adjustable in length in a third direction to allow the probe to move in the third direction.

In addition, preferably, the support member, the base and the support seat are all made of non-metal foam materials.

The invention has the beneficial effects that:

according to the invention, through the matching of the supporting piece and the probe adjusting component arranged on the supporting piece, the supporting piece fixes the probe adjusting component in the cavity of the concentric cone TEM chamber, and the probe adjusting component enables the probe to have the adjusting capability on three degrees of freedom, so that the requirement of the field uniformity test of the concentric cone TEM chamber is met, the problem of the field uniformity test of the concentric cone TEM chamber is solved, and the measurement auxiliary device has a simple structure, is convenient to use and is simple to operate.

Drawings

The following describes embodiments of the present invention in further detail with reference to the accompanying drawings.

FIG. 1 is a schematic view of a measurement aid of the present invention mounted within a concentric cone TEM cell.

FIG. 2 is a schematic view of the probe adjustment assembly of the present invention.

Fig. 3 is a schematic structural view of the support member of the present invention.

Fig. 4 is a bottom view of the support base of the present invention.

Detailed Description

Various exemplary embodiments of the present invention will now be described in detail with reference to the accompanying drawings. It should be noted that: the relative arrangement of the components and steps, the numerical expressions and numerical values set forth in these embodiments do not limit the scope of the present invention unless specifically stated otherwise.

The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the invention, its application, or uses.

Techniques and apparatus known to those of ordinary skill in the relevant art may not be discussed in detail, but are intended to be considered a part of the specification where appropriate.

In all examples shown and discussed herein, any particular value should be construed as exemplary only and not as limiting. Thus, other examples of the exemplary embodiments may have different values.

It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, further discussion thereof is not required in subsequent figures.

To meet the requirements of the concentric cone TEM cell field uniformity test. The invention provides a measurement auxiliary device, which is shown in a combined manner in figures 1 to 4, and specifically comprises: a support 20 secured within the concentric cone TEM cell 10; and a probe adjustment assembly 30 disposed on the support 20; the probe adjustment assembly 30 includes a base 31 fixed to the support member 20; and a support base 32 movable on the base 31 in a first direction or a second direction for fixing a probe 33; the support base 32 is configured to allow movement of the probe 33 in a third direction; in the same plane, the first direction is vertical to the second direction; the third direction is perpendicular to both the first direction and the second direction, and it can be understood from fig. 2 that the first direction is an X direction, the second direction is a Y direction, and the third direction is a Z direction.

In the above embodiment, in order to match the cavity shape of the concentric cone TEM chamber 10 and to be able to be fixed in the concentric cone TEM chamber 10, the support 20 is truncated cone-shaped, that is, the support 20 is fixed at a corresponding position of the concentric cone TEM chamber 10 by its own taper, so that the probe adjustment assembly 30 can be stably configured in the concentric cone TEM chamber 10.

In a specific embodiment, the supporting member 20 includes a fixing groove 21 formed by recessing the upper surface of the supporting member 20 inward; the base 31 comprises a bearing part 311 and a fixing part 312 fixedly combined with the bearing part 311; the fixing portion 312 is fixed in the fixing groove 21. The fixing portion 312 is fixed in the fixing groove 21, so that the probe adjustment assembly 30 is stably fixed on the support member 20, specifically, the fixing portion 312 is a rectangular protrusion formed by an outward protrusion of the bottom surface of the bearing portion 311, the fixing groove 21 is a rectangular groove matched with the fixing portion, and the support member 20 includes four rectangular grooves uniformly arranged.

Further, regarding the matching manner between the supporting seat 32 and the base 31, specifically, a plurality of inserting holes 3111 are formed on the bearing portion 311 and are uniformly distributed at equal intervals; the support seat 32 comprises a main body 321 and an insertion part 322 formed at one end of the main body 321; the inserting portion 322 can be inserted and fixed in the inserting hole 3111 to fix the supporting seat 32 on the base 31, and the supporting seat 32 can be inserted into different inserting holes 3111 according to actual test requirements, so that the position of the probe 33 in the X direction and the Y direction can be adjusted, the probe 33 can be located at different positions in the concentric cone TEM chamber 10, and data of corresponding positions can be collected.

In the above embodiment, in order to prevent the supporting seat 32 from rotating around its own axis when being inserted and fixed to the base 31, the horizontal cross section of the insertion portion 322 and the insertion hole 3111 is non-circular, that is, the insertion hole 3111 is a special-shaped hole, for example, a semicircular hole, a multi-semicircular hole, etc., by the above arrangement, it can be ensured that the supporting seat 32 will not rotate around its own axis after being fixed, so as to ensure that the directions of the probes 33 fixed on the supporting seat 32 are the same when the supporting seat 32 is at different insertion holes 3111.

In one embodiment, the supporting seat 32 is formed with a fixing hole for fixing the probe 33; the axis of the fixing hole is horizontally arranged.

In a specific embodiment, the supporting seat 32 can adjust its length along the third direction so that the probe 33 can move along the third direction, and the positioning of the probe 33 at different positions in the Z direction can be realized by designing the supporting seats 32 with different lengths, specifically, the supporting seat 32 can be an expansion link, and the position of the probe 33 in the Z direction can be adjusted by adjusting the expansion length of the expansion link and fixing the expansion link.

In order to reduce the influence of the material of the measurement assisting apparatus on the calibration result of the uniform region, the materials of the supporting member 20, the base 31 and the supporting seat 32 are all non-metallic foam materials with low dielectric constant.

In summary, the supporting member fixes the probe adjusting assembly in the cavity of the concentric cone TEM chamber through the cooperation of the supporting member and the probe adjusting assembly configured on the supporting member, and the probe adjusting assembly enables the probe to have the adjusting capability in three degrees of freedom, so as to meet the requirement of the field uniformity test of the concentric cone TEM chamber, and solve the problem of the field uniformity test of the concentric cone TEM chamber.

It should be understood that the above-mentioned embodiments of the present invention are only examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention, and it will be obvious to those skilled in the art that other variations or modifications may be made on the basis of the above description, and all embodiments may not be exhaustive, and all obvious variations or modifications may be included within the scope of the present invention.

Claims

1. A measurement assistance apparatus, comprising:

a support member secured within the concentric cone TEM chamber; and

a probe adjustment assembly disposed on the support;

2. The measurement aid of claim 1, wherein the support is frustoconical.

3. The measurement aid of claim 1, wherein the support member includes a fixing groove formed by an upper surface of the support member being depressed inward;

4. The measurement aid of claim 3, wherein the bearing portion has a plurality of insertion holes formed therein;

5. A measurement aid according to claim 4 wherein the horizontal cross-sections of the spigot and socket are non-circular.

6. The measurement assisting device according to claim 1, wherein a fixing hole for fixing the probe is formed in the support base; the axis of the fixing hole is horizontally arranged.

7. The measurement aid of claim 1, wherein the support base is adjustable in length in a third direction to allow movement of the probe in the third direction.

8. The auxiliary measurement device of claim 4, wherein the support member, the base and the support base are made of non-metallic foam.