CN113838789A - 一种芯片自动供给装置及供给方法 - Google Patents
一种芯片自动供给装置及供给方法 Download PDFInfo
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- CN113838789A CN113838789A CN202111416889.8A CN202111416889A CN113838789A CN 113838789 A CN113838789 A CN 113838789A CN 202111416889 A CN202111416889 A CN 202111416889A CN 113838789 A CN113838789 A CN 113838789A
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- chip
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67721—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations the substrates to be conveyed not being semiconductor wafers or large planar substrates, e.g. chips, lead frames
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
- H01L21/681—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment using optical controlling means
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68742—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a lifting arrangement, e.g. lift pins
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Power Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Description
Claims (8)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202111416889.8A CN113838789B (zh) | 2021-11-26 | 2021-11-26 | 一种芯片自动供给装置及供给方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CN202111416889.8A CN113838789B (zh) | 2021-11-26 | 2021-11-26 | 一种芯片自动供给装置及供给方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN113838789A true CN113838789A (zh) | 2021-12-24 |
CN113838789B CN113838789B (zh) | 2022-03-08 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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CN202111416889.8A Active CN113838789B (zh) | 2021-11-26 | 2021-11-26 | 一种芯片自动供给装置及供给方法 |
Country Status (1)
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CN (1) | CN113838789B (zh) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114932089A (zh) * | 2022-04-27 | 2022-08-23 | 泉州兰姆达仪器设备有限公司 | 一种激光芯片测试分选机的上料机构及其工作方法 |
CN117500260A (zh) * | 2023-10-30 | 2024-02-02 | 深圳市路远智能装备有限公司 | 一种帽头更换机构及方法 |
CN117500260B (zh) * | 2023-10-30 | 2024-06-11 | 深圳市路远智能装备有限公司 | 一种帽头更换机构及方法 |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101740451A (zh) * | 2009-12-23 | 2010-06-16 | 东莞华中科技大学制造工程研究院 | 芯片分拣设备的顶针机构 |
CN102074458A (zh) * | 2010-11-19 | 2011-05-25 | 华中科技大学 | 一种芯片剥离装置 |
CN102931122A (zh) * | 2012-11-13 | 2013-02-13 | 潍坊永昱电控科技有限公司 | 一种led晶片自动分选机的校准方法 |
CN103077915A (zh) * | 2013-01-09 | 2013-05-01 | 广东志成华科光电设备有限公司 | 一种芯片分选设备的可调节双摆臂系统三心对位方法 |
CN105140156A (zh) * | 2015-08-26 | 2015-12-09 | 华中科技大学 | 一种面向柔性芯片的多顶针剥离装置及剥离方法 |
CN208622692U (zh) * | 2018-06-26 | 2019-03-19 | 肇庆市利拓邦电子科技有限公司 | 一种rfid倒封装晶圆拾取装置 |
CN209266381U (zh) * | 2019-02-19 | 2019-08-16 | 深圳市昌富祥智能科技有限公司 | 一种用于半导体装片的芯片取放装置 |
-
2021
- 2021-11-26 CN CN202111416889.8A patent/CN113838789B/zh active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101740451A (zh) * | 2009-12-23 | 2010-06-16 | 东莞华中科技大学制造工程研究院 | 芯片分拣设备的顶针机构 |
CN102074458A (zh) * | 2010-11-19 | 2011-05-25 | 华中科技大学 | 一种芯片剥离装置 |
CN102931122A (zh) * | 2012-11-13 | 2013-02-13 | 潍坊永昱电控科技有限公司 | 一种led晶片自动分选机的校准方法 |
CN103077915A (zh) * | 2013-01-09 | 2013-05-01 | 广东志成华科光电设备有限公司 | 一种芯片分选设备的可调节双摆臂系统三心对位方法 |
CN105140156A (zh) * | 2015-08-26 | 2015-12-09 | 华中科技大学 | 一种面向柔性芯片的多顶针剥离装置及剥离方法 |
CN208622692U (zh) * | 2018-06-26 | 2019-03-19 | 肇庆市利拓邦电子科技有限公司 | 一种rfid倒封装晶圆拾取装置 |
CN209266381U (zh) * | 2019-02-19 | 2019-08-16 | 深圳市昌富祥智能科技有限公司 | 一种用于半导体装片的芯片取放装置 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114932089A (zh) * | 2022-04-27 | 2022-08-23 | 泉州兰姆达仪器设备有限公司 | 一种激光芯片测试分选机的上料机构及其工作方法 |
CN117500260A (zh) * | 2023-10-30 | 2024-02-02 | 深圳市路远智能装备有限公司 | 一种帽头更换机构及方法 |
CN117500260B (zh) * | 2023-10-30 | 2024-06-11 | 深圳市路远智能装备有限公司 | 一种帽头更换机构及方法 |
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CN113838789B (zh) | 2022-03-08 |
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Inventor after: Niu Chaofan Inventor after: Du Haiyang Inventor after: Zhao Lina Inventor after: Guo Yan Inventor after: Lv Chenhong Inventor after: Cao Qing Inventor after: Zhou Zibo Inventor before: Niu Chaofan Inventor before: Du Haiyang Inventor before: Zhao Lina Inventor before: Guo Yan Inventor before: Lv Chenhong Inventor before: Cao Qing Inventor before: Zhou Zibo |
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