CN113678227B - 高分辨率成像设备和方法 - Google Patents

高分辨率成像设备和方法 Download PDF

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CN113678227B
CN113678227B CN201980053879.7A CN201980053879A CN113678227B CN 113678227 B CN113678227 B CN 113678227B CN 201980053879 A CN201980053879 A CN 201980053879A CN 113678227 B CN113678227 B CN 113678227B
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sample
laser
ionization
charged particle
ablation
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CN113678227A (zh
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保罗·科克姆
亚历山大·洛博达
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University of Ottawa
Standard Biotools Canada Inc
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University of Ottawa
Fluidigm Canada Inc
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0459—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for solid samples
    • H01J49/0463—Desorption by laser or particle beam, followed by ionisation as a separate step
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/48—Biological material, e.g. blood, urine; Haemocytometers
    • G01N33/50—Chemical analysis of biological material, e.g. blood, urine; Testing involving biospecific ligand binding methods; Immunological testing
    • G01N33/68—Chemical analysis of biological material, e.g. blood, urine; Testing involving biospecific ligand binding methods; Immunological testing involving proteins, peptides or amino acids
    • G01N33/6803—General methods of protein analysis not limited to specific proteins or families of proteins
    • G01N33/6848—Methods of protein analysis involving mass spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/48—Biological material, e.g. blood, urine; Haemocytometers
    • G01N33/50—Chemical analysis of biological material, e.g. blood, urine; Testing involving biospecific ligand binding methods; Immunological testing
    • G01N33/68—Chemical analysis of biological material, e.g. blood, urine; Testing involving biospecific ligand binding methods; Immunological testing involving proteins, peptides or amino acids
    • G01N33/6803—General methods of protein analysis not limited to specific proteins or families of proteins
    • G01N33/6848—Methods of protein analysis involving mass spectrometry
    • G01N33/6851—Methods of protein analysis involving laser desorption ionisation mass spectrometry
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/02—Objectives
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/26—Stages; Adjusting means therefor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/33—Immersion oils, or microscope systems or objectives for use with immersion fluids
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    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
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    • H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
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    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
    • H—ELECTRICITY
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    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0004—Imaging particle spectrometry
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    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0031—Step by step routines describing the use of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/025—Detectors specially adapted to particle spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0409—Sample holders or containers
    • H01J49/0418—Sample holders or containers for laser desorption, e.g. matrix-assisted laser desorption/ionisation [MALDI] plates or surface enhanced laser desorption/ionisation [SELDI] plates
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
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    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/142—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using a solid target which is not previously vapourised
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    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H—ELECTRICITY
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    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/164—Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Molecular Biology (AREA)
  • Optics & Photonics (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Urology & Nephrology (AREA)
  • Hematology (AREA)
  • Immunology (AREA)
  • Biomedical Technology (AREA)
  • Plasma & Fusion (AREA)
  • Biochemistry (AREA)
  • Biophysics (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Proteomics, Peptides & Aminoacids (AREA)
  • Biotechnology (AREA)
  • General Health & Medical Sciences (AREA)
  • Microbiology (AREA)
  • Pathology (AREA)
  • Cell Biology (AREA)
  • Oil, Petroleum & Natural Gas (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Microscoopes, Condenser (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
CN201980053879.7A 2018-06-18 2019-06-18 高分辨率成像设备和方法 Active CN113678227B (zh)

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US201862686341P 2018-06-18 2018-06-18
US62/686,341 2018-06-18
US201962792759P 2019-01-15 2019-01-15
US62/792,759 2019-01-15
PCT/US2019/037644 WO2019246033A1 (en) 2018-06-18 2019-06-18 High resolution imaging apparatus and method

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EP (1) EP3807922A4 (enExample)
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Families Citing this family (46)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA3104126A1 (en) 2018-06-18 2019-12-26 Fluidigm Canada Inc. High resolution imaging apparatus and method
EP3911760A4 (en) * 2019-01-15 2022-10-12 Fluidigm Canada Inc. DIRECT IONIZATION IN IMAGING MASS SPECTROMETRY
JP7126623B2 (ja) * 2019-01-29 2022-08-26 コリア リサーチ インスティチュート オブ スタンダーズ アンド サイエンス Ｌｄｉ－ｍｓを用いた血液中の有機物の測定方法およびそのための装置
US20210183632A1 (en) * 2019-04-11 2021-06-17 Exum Instruments Mass spectrometry of samples including coaxial desorption/ablation and image capture
US11164734B2 (en) * 2019-04-11 2021-11-02 Exum Instruments Laser desorption, ablation, and ionization system for mass spectrometry analysis of samples including organic and inorganic materials
NL2023384B1 (en) * 2019-06-26 2021-02-01 Confocal Nl B V Re-scan microscope system and method
DE102019005364B3 (de) * 2019-07-31 2020-10-08 Carl Zeiss Multisem Gmbh System-Kombination eines Teilchenstrahlsystem und eines lichtoptischen Systems mit kollinearer Strahlführung sowie Verwendung der System-Kombination
CN111161998B (zh) * 2020-02-10 2025-06-17 浙江迪谱诊断技术有限公司 一种激光同轴离子激发装置
JP7471575B2 (ja) * 2020-04-23 2024-04-22 株式会社Sumco 試料導入装置、誘導結合プラズマ分析装置および分析方法
JP7279859B2 (ja) * 2020-05-27 2023-05-23 株式会社島津製作所 質量分析方法及び質量分析装置
US11796721B2 (en) * 2020-06-09 2023-10-24 IonQ, Inc. Parabolic Cassegrain-type reflector for ablation loading
US12013521B2 (en) * 2020-06-29 2024-06-18 Mgi Tech Co., Ltd. Systems and methods for optical scanning and imaging through a fluid medium for nucleic acid sequencing
US12181481B2 (en) 2020-10-29 2024-12-31 Ambergen, Inc. Photocleavable mass-tags for multiplexed mass spectrometric imaging of tissues using biomolecular probes
CN116670497A (zh) 2020-11-11 2023-08-29 乔治·梅森研究基金会股份有限公司 激光捕获显微切割可视化化学物质
WO2022125528A1 (en) * 2020-12-08 2022-06-16 Shine Technologies, Llc Isothermal ion source with auxiliary heaters
EP3958035A1 (en) * 2021-02-02 2022-02-23 Leica Microsystems CMS GmbH Lens assembly for microscopic imaging and corresponding microscope and imaging method
EP4047346A1 (en) 2021-02-19 2022-08-24 Sartorius BioAnalytical Instruments, Inc. Flow cytometry evaluation with fluid sample monitoring beads having size-sensitive fluorescent hydrogel
DE102021105327B3 (de) * 2021-03-05 2022-05-12 Bruker Daltonics GmbH & Co. KG Desorptions-Ionenquelle mit Postdesorptions-Ionisierung in Transmissionsgeometrie
JP2024511743A (ja) * 2021-03-15 2024-03-15 ザ ガバニング カウンシル オブ ザ ユニバーシティ オブ トロント 標識レベルの制御を備えた金属標識ポリマーマイクロビーズ
US20240203722A1 (en) * 2021-04-14 2024-06-20 Kimia Analytics Inc A system to generate a high yield of negative ions for icp-ms
WO2022222100A1 (zh) * 2021-04-22 2022-10-27 北京航空航天大学 利用皮秒电脉冲的磁动力学测试系统
DE102021112503B4 (de) * 2021-05-12 2025-03-27 Carl Zeiss Microscopy Gmbh Teilchenstrahlvorrichtung mit einer Ablenkeinheit
GB2607713B (en) 2021-05-26 2023-09-20 Thermo Fisher Scient Bremen Gmbh Systems and methods for imaging and ablating a sample
CN113504173B (zh) * 2021-06-29 2022-09-20 中国科学院长春光学精密机械与物理研究所 一种euv多层膜光学元件的综合测试装置及其测试方法
US11893786B1 (en) * 2021-08-17 2024-02-06 Amazon Technologies, Inc. Scan-free barcode reading
CN116432694B (zh) * 2021-12-30 2025-10-31 浙江舜宇智能光学技术有限公司 基于消除tof多路径的神经网络模型的压缩方法和装置
CN114359251B (zh) * 2022-01-11 2025-06-03 招商局重庆交通科研设计院有限公司 一种混凝土表面破损的自动识别方法
CN114509493B (zh) * 2022-02-28 2025-07-08 中国科学院地球化学研究所 La-icp-ms动态变形束斑的测试方法与设备
CN114674809B (zh) * 2022-03-23 2025-04-01 中国科学院合肥物质科学研究院 具有自动对焦与微区成像功能的libs分析装置及应用
CN114839979A (zh) * 2022-04-22 2022-08-02 新疆大学 一种基于srp的多机器人羽流寻源相对导航策略
TWI799345B (zh) * 2022-09-01 2023-04-11 國立清華大學 反射掃描式同調光繞射顯影方法及系統
WO2024052232A1 (en) * 2022-09-05 2024-03-14 University Of Surrey Electron spectroscopy apparatus and methods
EP4526915B1 (en) * 2022-09-23 2025-08-06 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. Electron beam apparatus and method for generating a pulsed electron beam and applications thereof
DE102022131740B4 (de) * 2022-11-30 2026-02-12 Bruker Daltonics GmbH & Co. KG Verfahren zum Desorbieren und Ionisieren von Probenmaterial
WO2024177957A1 (en) * 2023-02-20 2024-08-29 The Brigham And Women’S Hospital, Inc. System and method for mass spectrometry analysis, imaging and quantitation of metals
WO2024215607A2 (en) 2023-04-11 2024-10-17 Avava, Inc. Motion-tracking and blur compensation for laser treatment device
US12467842B2 (en) 2023-07-07 2025-11-11 Trustees Of Boston University Widefield interferometric defocus-enhanced (WIDE) mid-infrared (MIR) photothermal microscopy
CN116973154A (zh) * 2023-07-18 2023-10-31 西湖大学 新的用于生物样品的膨胀蛋白组学分析的方法
CN117169792B (zh) * 2023-08-30 2024-05-14 华中科技大学 一种基于磁纳米粒子磁化响应的透射式高分辨率成像方法
CN117405763B (zh) * 2023-09-28 2026-05-15 中国地质大学（武汉） 一种单颗粒的元素与同位素分析系统与方法
US20250163571A1 (en) * 2023-11-17 2025-05-22 Fei Company Carbon containing precursors for beam-induced deposition
CN117538135B (zh) * 2024-01-09 2024-03-15 成都艾立本科技有限公司 基于纳米结构的气溶胶libs检测复合薄膜及检测方法
CN119149872B (zh) * 2024-11-20 2025-02-18 中国科学技术大学 一种用于激发激光等离子体光源的激光参数确定方法
WO2026137080A1 (en) * 2024-12-23 2026-07-02 Wainwright Alexander A C Systems and methods for sub-micron laser extraction for spatially-resolved mass spectrometry
CN120044685A (zh) * 2025-01-08 2025-05-27 北京大学 一种多光子显微成像探头、成像设备及成像方法
CN121253561B (zh) * 2025-12-08 2026-04-17 山东大学 分析Zn掺杂KDP晶体表面飞秒激光诱导损伤行为的方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105572216A (zh) * 2015-12-30 2016-05-11 大连民族大学 一种新型飞行时间二次离子质谱
WO2018026910A1 (en) * 2016-08-02 2018-02-08 Fluidigm Canada Inc. Sample imaging apparatus and method

Family Cites Families (49)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4988879A (en) * 1987-02-24 1991-01-29 The Board Of Trustees Of The Leland Stanford Junior College Apparatus and method for laser desorption of molecules for quantitation
US5225326A (en) 1988-08-31 1993-07-06 Research Development Foundation One step in situ hybridization assay
JPH039259A (ja) 1989-06-06 1991-01-17 Nippon Telegr & Teleph Corp <Ntt> 高繰り返しレーザ励起質量分折装置
JPH0378955A (ja) 1989-08-21 1991-04-04 Hitachi Ltd 固体表面検査方法および装置
JP3155570B2 (ja) * 1991-09-20 2001-04-09 株式会社日立製作所 収束イオンビーム質量分析方法及び収束イオンビーム質量分析複合装置
JPH05225950A (ja) * 1992-02-10 1993-09-03 Hitachi Ltd 質量分析計
JP3140577B2 (ja) * 1992-10-07 2001-03-05 日本電信電話株式会社 レーザイオン化中性粒子質量分析装置
JP2526412B2 (ja) * 1994-03-31 1996-08-21 工業技術院長 連続断面像を得るための顕微鏡用生体試料の作成方法
JPH07294459A (ja) * 1994-04-21 1995-11-10 Nippon Steel Corp スパッタ中性粒子質量分析方法
EP0970505B1 (en) 1998-01-23 2003-07-23 Micromass Limited Time of flight mass spectrometer and detector therefor and spectrometry method
JP2000162164A (ja) 1998-11-26 2000-06-16 Hitachi Ltd 共鳴レーザイオン化中性粒子質量分析装置および分析方法
JP3683156B2 (ja) 2000-03-09 2005-08-17 トヨタ自動車株式会社 固体物質の表面分析方法
JP2002116184A (ja) 2000-10-10 2002-04-19 Hitachi Ltd 半導体デバイス異物分析装置およびシステム
WO2003052399A2 (en) * 2001-12-14 2003-06-26 Mds Inc., D.B.A. Mds Sciex Method of chemical of ionization at reduced pressures
US7576928B2 (en) * 2003-10-31 2009-08-18 Hamamatsu Photonics K.K. Solid immersion lens holder
EP2256535B1 (en) * 2004-02-16 2012-07-04 Olympus Corporation retention mechanism for immersion medium, and manufacturing method thereof
US7994474B2 (en) * 2004-02-23 2011-08-09 Andreas Hieke Laser desorption ionization ion source with charge injection
US20100090101A1 (en) * 2004-06-04 2010-04-15 Ionwerks, Inc. Gold implantation/deposition of biological samples for laser desorption two and three dimensional depth profiling of biological tissues
WO2005121864A2 (en) 2004-06-07 2005-12-22 Fluidigm Corporation Optical lens system and method for microfluidic devices
WO2006090138A2 (en) 2005-02-25 2006-08-31 Micromass Uk Limited Mass spectrometer
US20100092972A1 (en) 2007-03-16 2010-04-15 Human Genetic Signatures Pty Ltd. Assay for gene expression
EP1975592A1 (en) 2007-03-28 2008-10-01 F. Hoffmann-la Roche AG Sorption micro-array
WO2010085720A1 (en) * 2009-01-23 2010-07-29 Ionwerks, Inc. Post-ionization of neutrals for ion mobility otofms identification of molecules and elements desorbed from surfaces
EP2391877B1 (en) * 2009-02-02 2019-05-15 Light Matter Interaction Inc. Soft ablative desorption method and system
GB201002447D0 (en) 2010-02-12 2010-03-31 Micromass Ltd Mass spectrometer
JP2011233248A (ja) 2010-04-23 2011-11-17 Tokyo Institute Of Technology レーザイオン化質量分析装置
ES2465948T3 (es) 2010-04-30 2014-06-09 Exiqon A/S Procedimiento de hibridación in situ y tampón
US8723108B1 (en) 2012-10-19 2014-05-13 Agilent Technologies, Inc. Transient level data acquisition and peak correction for time-of-flight mass spectrometry
US9383338B2 (en) 2012-12-14 2016-07-05 Micromass Uk Limited Correction of time of flight MS ADC data on push by push basis
KR102244494B1 (ko) * 2013-02-09 2021-04-27 엘레멘탈 사이언티픽 레이저스 엘엘씨 챔버 내 유체 핸들링 시스템 및 이를 사용하여 유체를 핸들링하는 방법들
CN105074419B (zh) 2013-02-14 2019-02-01 伊雷克托科学工业股份有限公司 用于组成分析系统的雷射剥蚀单元和火炬系统
KR20150134373A (ko) 2013-03-22 2015-12-01 에테하 취리히 레이저 어블레이션 셀
RU2637795C2 (ru) 2013-04-17 2017-12-07 Флуидигм Кэнада Инк. Анализ образцов для масс-цитометрии
DE102013208959A1 (de) 2013-05-15 2014-11-20 Carl Zeiss Microscopy Gmbh Vorrichtung zur massenselektiven Bestimmung eines Ions
JP2015087237A (ja) 2013-10-30 2015-05-07 キヤノン株式会社 質量分布計測方法及び質量分布計測装置
EP3108218A4 (en) 2014-02-21 2017-11-15 Massachusetts Institute Of Technology Expansion microscopy
GB201403625D0 (en) * 2014-02-28 2014-04-16 Asrepresented By The Sec Dep Of Health And Human Services The Multiplexed imaging of tissue samples by mass cytometry
JP6316041B2 (ja) 2014-03-18 2018-04-25 株式会社東芝 スパッタ中性粒子質量分析装置
US20150279645A1 (en) 2014-03-27 2015-10-01 Kabushiki Kaisha Toshiba Mass spectroscope and mass spectrometry
WO2016090356A1 (en) * 2014-12-05 2016-06-09 Fluidigm Canada Inc. Mass cytometry imaging
CN104697967B (zh) * 2015-03-17 2017-07-11 北京理工大学 高空间分辨激光双轴共焦光谱‑质谱显微成像方法与装置
CA2981496C (en) * 2015-04-23 2023-09-05 The Board Of Trustees Of The Leland Stanford Junior University Method for multiplexed sample analysis by photoionizing secondary sputtered neutrals
US20170023482A1 (en) * 2015-07-20 2017-01-26 United States Of America, As Represented By The Secretary Of Commerce Simultaneous plural color broadband coherent anti-stokes raman scattering microscope and imaging
US20170253918A1 (en) 2016-03-01 2017-09-07 Expansion Technologies Combining protein barcoding with expansion microscopy for in-situ, spatially-resolved proteomics
US20170276578A1 (en) 2016-03-22 2017-09-28 University Of Washington Expansion microscopy methods and kits
GB2556074A (en) * 2016-11-17 2018-05-23 Micromass Ltd Axial atmospheric pressure photo-ionization imaging source and inlet device
CN108133879B (zh) * 2017-12-21 2020-04-03 厦门大学 用于微纳尺度形貌及化学信息同时原位获得的近场离子源
CA3104126A1 (en) 2018-06-18 2019-12-26 Fluidigm Canada Inc. High resolution imaging apparatus and method
US20210333173A1 (en) * 2018-09-10 2021-10-28 Fluidigm Canada Inc. High speed modulation sample imaging apparatus and method

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105572216A (zh) * 2015-12-30 2016-05-11 大连民族大学 一种新型飞行时间二次离子质谱
WO2018026910A1 (en) * 2016-08-02 2018-02-08 Fluidigm Canada Inc. Sample imaging apparatus and method

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