CN113640645A - Integrated circuit IC testing device - Google Patents
Integrated circuit IC testing device Download PDFInfo
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- CN113640645A CN113640645A CN202110857736.0A CN202110857736A CN113640645A CN 113640645 A CN113640645 A CN 113640645A CN 202110857736 A CN202110857736 A CN 202110857736A CN 113640645 A CN113640645 A CN 113640645A
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- 238000012360 testing method Methods 0.000 title claims abstract description 35
- 239000000523 sample Substances 0.000 claims abstract description 28
- 238000006073 displacement reaction Methods 0.000 claims description 49
- 238000003825 pressing Methods 0.000 claims description 26
- 238000010030 laminating Methods 0.000 claims description 11
- 238000009434 installation Methods 0.000 claims description 10
- 230000000694 effects Effects 0.000 claims description 6
- 238000012545 processing Methods 0.000 description 17
- 238000004026 adhesive bonding Methods 0.000 description 10
- 238000005457 optimization Methods 0.000 description 7
- 238000012856 packing Methods 0.000 description 4
- 239000000084 colloidal system Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 239000003292 glue Substances 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 241000489982 Lagodon rhomboides Species 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000001125 extrusion Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention discloses an integrated circuit IC testing device, which structurally comprises a display screen, an operator, a base and telescopic rods, wherein the telescopic rods are arranged on two sides of the base and connected with the base, the display screen is arranged on the operator and is in clearance fit with the operator, the operator is provided with a driving box, a temperature control body, an operating box, a clamping device, a placing block and a processor, the temperature control body is arranged on two sides of the driving box, an adjustor is split under the cooperation of a clamping body, the working plate is divided into a plurality of independent working plates by an integral structure, the independent testing working plate has smaller volume, the probe working block to be tested is adjusted according to the specification of the integrated circuit, during testing, the volume of the connecting plate of the probe is reduced, and the connecting plate of the probe cannot easily contact with the pin to press the extended pin to cause the pin to be bent.
Description
Technical Field
The invention relates to the field of integrated circuit testing, in particular to an Integrated Circuit (IC) testing device.
Background
An integrated circuit IC is an integrated circuit formed by a large number of microelectronic components such as transistors, resistors and capacitors and the like, which is put on a plastic substrate to form a chip, almost all chips seen today can be called IC chips, and the integrated circuit IC makes electronic elements step forward towards microminiaturization, low power consumption and high reliability;
some pins of the integrated circuit IC are of a relatively long and thin structure, the long and thin pins are directly perpendicular to an assembly plate surface of the integrated circuit and extend out of the assembly plate surface of the integrated circuit, the size of the whole connection plate surface of the probe is large, when the integrated circuit IC is tested, if the size of the integrated circuit is smaller than that of the probe connection plate surface, the connection plate surface of the probe structure is easily contacted with the extended pins in the pressing process, and therefore the pins are pressed, and the pins of the integrated circuit IC are bent.
Disclosure of Invention
Aiming at the defects of the prior art, the invention is realized by the following technical scheme: the integrated circuit testing device structurally comprises a display screen, an operator, a base and telescopic rods, wherein the telescopic rods are arranged on two sides of the base and connected with the base;
the manipulator is equipped with drive case, the temperature control body, control box, clamping device, places piece, treater, the both sides of drive case all are equipped with the temperature control body, the temperature control body and drive case swing joint, the control box is installed on the drive case, drive case and control box activity block, the inside treater that is equipped with of control box, the treater is connected with the control box, the both sides of placing the piece all are equipped with the clamping device, the clamping device with place the piece gomphosis, be equipped with the slip recess on the base, the clamping device passes through slip plate and slip recess sliding connection.
As a further optimization of the technical proposal, the processor is provided with a buckle body, a processing plate, a regulator, an assembly cavity and an assembly shaft, the processing plate is provided with a regulator which is movably connected with the processing plate, the processing plate is provided with an assembling shaft, the assembly shaft is movably connected with the processing plate, the assembly shaft is arranged on the assembly cavity, the assembly cavity is in clearance fit with the assembly shaft, a buckle body is arranged in the regulator and connected with the regulator, the regulator is a square structural block, the assembly cavity is provided with a groove, the groove wall body of the assembly cavity is provided with a sliding track, one end of the assembly cavity is arranged on the operation box, the buckle body is a square connecting plate, sliding blocks are arranged on two sides of the buckle body connecting plate, the sliding blocks of the buckle body are embedded on the sliding rail, and a square groove is formed in the other side of the buckle body.
As a further optimization of the technical scheme, the regulator is provided with a pushing block, a mounting plate, a probe body, a pushing shaft and a mounting block, the two sides of the pushing block are respectively provided with the pushing shaft, the pushing shaft is connected with the pushing block in a sliding manner, the mounting block is arranged on the pushing shaft and movably connected with the pushing shaft, the mounting plate is arranged on the probe body and connected with the probe body, a connecting cylinder of the pushing block penetrates through a connecting block provided with a hollow opening, the mounting block is connected with the pushing block through the connecting shaft body, a sliding plate is arranged inside the pushing block, one end of the sliding plate of the pushing block is provided with a square connecting block, sliding cavities are arranged on two sides of the square connecting block of the pushing block, and the sliding block is embedded in the sliding cavities of the pushing block.
As a further optimization of this technical scheme, be equipped with the slip post on the mounting panel, the both sides of mounting panel slip cylinder all are equipped with the slide, be equipped with the slip chamber on the slip cylinder of mounting panel, the slip intracavity portion of mounting panel is equipped with the sliding connection axle, the connection plate of mounting panel is equipped with the buckle notch with the one end of the laminating of slip cylinder and the one end of orientation installation piece, the connection plate and the slip post clearance fit of installation piece.
As a further optimization of the technical scheme, the clamping device is provided with a displacement box, a displacement block, a support, a laminating device, an extension shaft and an extension body, the extension shaft is arranged in the extension body, the extension body is in clearance fit with the extension shaft, the extension body is provided with the displacement box, the displacement box is movably connected with the extension body, the displacement block is arranged in the displacement box and is slidably connected with the displacement box, the support is arranged on the displacement block and is movably connected with the displacement block, the laminating device is arranged on the displacement block, and the displacement block is connected with the laminating device.
As a further optimization of the technical scheme, a sliding cavity is arranged on the support, a connecting shaft body is arranged inside the sliding cavity of the support, a sliding groove is formed in a wall body of the sliding cavity of the support, a composition board is arranged at the other end of the connecting shaft body of the support, the composition board of the support is movably connected with the connecting shaft body through a movable shaft, an arc protruding block is arranged on the composition board of the support, the support is movably connected with a displacement block through the movable shaft, a connecting rod is arranged on one side of the displacement block, which faces the displacement box, of the displacement block, a sliding column is arranged on the connecting rod of the displacement block, a connecting column is arranged inside the displacement box, a sliding track is arranged on the connecting column, the connecting column of the displacement box penetrates through the sliding column, a slide way is arranged on the extension shaft, and an arc groove is formed in the extension body.
As a further optimization of this technical scheme, the laminating device is equipped with skew piece, rigging board, offset shaft, presses the body, presses the chamber, the both sides of offset shaft all are equipped with the skew piece, skew piece and offset shaft sliding connection, install the rigging board on the offset shaft, rigging board and offset shaft swing joint, press the chamber to establish on the rigging board, the rigging board with press the chamber and be connected, it is equipped with on the chamber to press and presses the body, press the body and press chamber clearance fit, the surface of rigging board is equipped with the hose, the inside of rigging board is equipped with the arc recess, extend the body the arc recess internal packing of rigging board has the activity bobble of sponge, be equipped with the protruding piece of colloid on the rigging board, and protruding piece internal filling gas, the rigging board passes through the connection axis body gomphosis of ring on the skew piece.
As a further optimization of this technical scheme, press the body to be convex connecting block, the one end of pressing the body is equipped with the spliced pole, be equipped with circular connecting block on the spliced pole of pressing the body, the circular connecting block gomphosis of pressing the body is pressing intracavity portion, the circular connecting block surface of pressing the body is equipped with the colloid layer, it is equipped with the activity bobble to press intracavity portion, and bobble inside packing has the rubber block, the circular arc of pressing the body is connected the connecting block surface and is equipped with the soft glue layer, and inside packing has the sponge layer.
Advantageous effects
Compared with the prior art, the integrated circuit IC testing device has the following advantages:
1. the regulator is split under the matching of the clamping body, the working plate block is split into a plurality of independent working plates by an integral structure, the size of the independent testing working plate block is small, the probe working block to be tested is adjusted according to the specification of an integrated circuit, the size of a connecting plate block of the probe is reduced during testing, and the connecting plate block of the probe cannot easily contact with the pin to press the extended pin so as not to cause the bending of the pin.
2. The invention can clamp and wrap the extended pins by the clamping of the attaching plate, protect the pins and provide certain clamping supporting force for the pins, when the connecting plate of the probe is pressed downwards, the connecting plate of the probe acts on the clamping structure firstly, the pressing pressure is absorbed by the assembly structure on the attaching plate, the pressure on the pins is reduced, and the pins cannot be bent easily.
Drawings
Other features, objects and advantages of the invention will become more apparent upon reading of the detailed description of non-limiting embodiments with reference to the following drawings:
FIG. 1 is a schematic diagram of an overall structure of an IC testing apparatus according to the present invention.
Fig. 2 is a schematic structural diagram of the manipulator of the present invention.
FIG. 3 is a diagram of a processor according to the present invention.
Fig. 4 is a schematic view of the regulator of the present invention.
Fig. 5 is a schematic structural view of the clip device of the present invention.
FIG. 6 is a schematic view of the applicator of the present invention.
In the figure: the device comprises a display screen 1, an operator 2, a base 3, an expansion rod 4, a driving box 2a, a temperature control body 2b, an operation box 2c, a clamping device 2d, a placing block 2e, a processor 2f, a buckling body f1, a processing plate f2, a regulator f3, an assembly cavity f4, an assembly shaft f5, a pushing block f31, an installation plate f32, a probe body f33, a pushing shaft f34, an installation block f35, a displacement box d1, a displacement block d2, a bracket d3, an attaching device d4, an extension shaft d5, an extension body d6, a displacement block d41, an attaching plate d42, an offset shaft d43, a pressing body d44 and a pressing cavity d 45.
Detailed Description
In order to make the technical means, the original characteristics, the achieved purposes and the effects of the invention easy to understand, the following description and the accompanying drawings further illustrate the preferred embodiments of the invention.
Example one
Referring to fig. 1-4, an IC testing device structurally includes a display screen 1, an operator 2, a base 3, and telescopic rods 4, wherein the telescopic rods 4 are disposed on both sides of the base 3, the telescopic rods 4 are connected to the base 3, the operator 2 is provided with the display screen 1, and the display screen 1 is in clearance fit with the operator 2;
the manipulator 2 is provided with a driving box 2a, a temperature control body 2b, an operating box 2c, a clamping device 2d, a placing block 2e and a processor 2f, the two sides of the driving box 2a are respectively provided with the temperature control body 2b, the temperature control body 2b is movably connected with the driving box 2a, the operating box 2c is installed on the driving box 2a, the driving box 2a is movably clamped with the operating box 2c, the processor 2f is arranged in the operating box 2c, the processor 2f is connected with the operating box 2c, the clamping device 2d is arranged on the two sides of the placing block 2e, the clamping device 2d is embedded with the placing block 2e, a sliding groove is formed in the base 3, and the clamping device 2d is slidably connected with the sliding groove through a sliding plate, so that the test of the integrated circuit is realized.
The processor 2f is provided with a buckle body f1, a processing plate f2, a regulator f3, an assembly cavity f4 and an assembly shaft f5, the processing plate f2 is provided with a regulator f3, the regulator f3 is movably connected with the processing plate f2, the processing plate f2 is provided with an assembly shaft f5, the assembly shaft f5 is movably connected with the processing plate f2, the assembly shaft f5 is arranged on the assembly cavity f4, the assembly cavity f4 is in clearance fit with the assembly shaft f5, the regulator f3 is internally provided with a buckle body f1, the buckle body f1 is connected with the regulator f3, the regulator f3 is a square structural block, the assembly cavity f4 is provided with a groove, the groove of the assembly cavity f4 is provided with a sliding rail, one end of the assembly cavity f4 is arranged on the operation box 2c, the buckle body f1 is a square structural block, the buckle body f1 is provided with a square connecting plate, and the sliding rail bodies are embedded on two sides of the sliding block 1, the other side of the buckle body f1 is provided with a square groove, so that the adjustment of an integrated circuit test plate is realized.
The regulator f3 is provided with a pushing block f31, a mounting plate f32, a probe body f33, a pushing shaft f34 and a mounting block f35, both sides of the pushing block f31 are provided with a pushing shaft f34, the pushing shaft f34 is connected with the pushing block f31 in a sliding way, the pushing shaft f34 is provided with a mounting block f35, the mounting block f35 is movably connected with the pushing shaft f34, the probe body f33 is provided with a mounting plate f32, the mounting plate f32 is connected with the probe body f33, the connecting column of the pushing block f31 penetrates through a connecting block with a hollow opening, the mounting block f35 is connected with the pushing block f31 through a connecting shaft body, a sliding plate is arranged inside the mounting block f35, one end of the sliding plate of the mounting block f35 is provided with a square connecting block, sliding cavities are arranged on two sides of the square connecting block of the mounting block f35, a sliding block is embedded in the sliding cavity of the mounting block f35, and the size of the test plate is reduced through a disassembly structure.
Be equipped with the sliding column on the mounting panel f32, the both sides of mounting panel f32 slip cylinder all are equipped with the slide, be equipped with the slip chamber on mounting panel f 32's the slip cylinder, the slip intracavity portion of mounting panel f32 is equipped with the slip connecting axle, the connection plate of mounting panel f32 is equipped with the buckle notch with the one end of slip cylinder laminating and the one end of orientation installation piece f35, the connection plate and the sliding column clearance fit of installation piece f35 realize test structure's further detection.
According to the size of the integrated circuit specification, a sliding block of a buckling body f1 slides along a sliding rail and slides out of another adjustor f3, an adjustor f3 on a split processing board f2 splits a test structure into independent individuals, an assembling shaft f5 slides and extends along an assembling cavity f4, the integrated circuit is tested through an adjustor f3, the size of the independent adjustor f3 is reduced, a connecting board surface of a probe cannot be easily contacted with pins during a press-down test, a sliding column on the installing board f32 drives the probe body f33 to slide along a sliding rail, so that the testing range of the probe body f33 is adjusted and expanded, if the testing range is required to be expanded, the installing block f35 overturns along a movable shaft between the pushing block f31, the sliding in a cavity of the installing block f35 extends out of the cavity and is buckled with a notch of the installing board f32, and the sliding block f35 on the square connecting board is further buckled with the installing board f32, the sliding connecting shafts on the two sides of the sliding column on the mounting plate f32 slide along the cavity, the sliding connecting shafts are separated from the buckles for connecting the mounting plate f32 with the plate, the mounting plate f32 is separated from the connection with the sliding column, and the pushing block f31 slides along the pushing shaft f34, so that the probe is close to the edge of the integrated circuit for further testing.
Example two
Referring to fig. 1-6, an IC testing device structurally includes a display screen 1, an operator 2, a base 3, and telescopic rods 4, wherein the telescopic rods 4 are disposed on both sides of the base 3, the telescopic rods 4 are connected to the base 3, the operator 2 is provided with the display screen 1, and the display screen 1 is in clearance fit with the operator 2;
the manipulator 2 is provided with a driving box 2a, a temperature control body 2b, an operating box 2c, a clamping device 2d, a placing block 2e and a processor 2f, the two sides of the driving box 2a are respectively provided with the temperature control body 2b, the temperature control body 2b is movably connected with the driving box 2a, the operating box 2c is installed on the driving box 2a, the driving box 2a is movably clamped with the operating box 2c, the processor 2f is arranged in the operating box 2c, the processor 2f is connected with the operating box 2c, the clamping device 2d is arranged on the two sides of the placing block 2e, the clamping device 2d is embedded with the placing block 2e, a sliding groove is formed in the base 3, and the clamping device 2d is slidably connected with the sliding groove through a sliding plate, so that the test of the integrated circuit is realized.
The processor 2f is provided with a buckle body f1, a processing plate f2, a regulator f3, an assembly cavity f4 and an assembly shaft f5, the processing plate f2 is provided with a regulator f3, the regulator f3 is movably connected with the processing plate f2, the processing plate f2 is provided with an assembly shaft f5, the assembly shaft f5 is movably connected with the processing plate f2, the assembly shaft f5 is arranged on the assembly cavity f4, the assembly cavity f4 is in clearance fit with the assembly shaft f5, the regulator f3 is internally provided with a buckle body f1, the buckle body f1 is connected with the regulator f3, the regulator f3 is a square structural block, the assembly cavity f4 is provided with a groove, the groove of the assembly cavity f4 is provided with a sliding rail, one end of the assembly cavity f4 is arranged on the operation box 2c, the buckle body f1 is a square structural block, the buckle body f1 is provided with a square connecting plate, and the sliding rail bodies are embedded on two sides of the sliding block 1, the other side of the buckle body f1 is provided with a square groove, so that the adjustment of an integrated circuit test plate is realized.
The regulator f3 is provided with a pushing block f31, a mounting plate f32, a probe body f33, a pushing shaft f34 and a mounting block f35, both sides of the pushing block f31 are provided with a pushing shaft f34, the pushing shaft f34 is connected with the pushing block f31 in a sliding way, the pushing shaft f34 is provided with a mounting block f35, the mounting block f35 is movably connected with the pushing shaft f34, the probe body f33 is provided with a mounting plate f32, the mounting plate f32 is connected with the probe body f33, the connecting column of the pushing block f31 penetrates through a connecting block with a hollow opening, the mounting block f35 is connected with the pushing block f31 through a connecting shaft body, a sliding plate is arranged inside the mounting block f35, one end of the sliding plate of the mounting block f35 is provided with a square connecting block, sliding cavities are arranged on two sides of the square connecting block of the mounting block f35, a sliding block is embedded in the sliding cavity of the mounting block f35, and the size of the test plate is reduced through a disassembly structure.
Be equipped with the sliding column on the mounting panel f32, the both sides of mounting panel f32 slip cylinder all are equipped with the slide, be equipped with the slip chamber on mounting panel f 32's the slip cylinder, the slip intracavity portion of mounting panel f32 is equipped with the slip connecting axle, the connection plate of mounting panel f32 is equipped with the buckle notch with the one end of slip cylinder laminating and the one end of orientation installation piece f35, the connection plate and the sliding column clearance fit of installation piece f35 realize test structure's further detection.
The clamp 2d is provided with a displacement box d1, a displacement block d2, a support d3, an applicator d4, an extension shaft d5 and an extension body d6, the extension shaft d5 is arranged inside the extension body d6, the extension body d6 is in clearance fit with the extension shaft d5, the extension body d6 is provided with a displacement box d1, the displacement box d1 is movably connected with the extension body d6, the displacement block d2 is arranged inside the displacement box d1, the displacement block d2 is in sliding connection with the displacement box d1, the displacement block d2 is provided with a support d3, the support d3 is movably connected with the displacement block d2, the applicator d4 is mounted on the displacement block d2, and the displacement block d2 is connected with the applicator d4, so that clamping of pins is achieved.
Be equipped with the sliding cavity on support d3, the inside of support d3 sliding cavity is equipped with the connection axis body, be equipped with the slip recess on the wall body of support d 3's the sliding cavity, the connection axis body other end of support d3 is equipped with the compoboard, pass through loose axle and connection axis body swing joint on the compoboard of support d3, be equipped with the protruding piece of circular arc on the compoboard of support d3, support d3 passes through loose axle and displacement piece d2 swing joint, displacement piece d2 is equipped with the connecting rod towards one side of displacement case d1, be equipped with the sliding column on displacement piece d 2's the connecting rod, the inside spliced pole that is equipped with of displacement case d1 is equipped with the slip track on the spliced pole, the spliced pole of displacement case d1 runs through the sliding column, be equipped with the slide on the extension axle d5, be equipped with the arc recess on the extension body d6, realize extending structure's support.
The gluing device d4 is provided with a deviation block d41, a gluing plate d42, a deviation shaft d43, a pressing body d44 and a pressing cavity d45, both sides of the deviation shaft d43 are provided with deviation blocks d41, the deviation block d41 is slidably connected with the deviation shaft d43, the deviation shaft d43 is provided with a gluing plate d42, the gluing plate d42 is movably connected with the deviation shaft d43, the pressing cavity d45 is arranged on the gluing plate d42, the gluing plate d42 is connected with the pressing cavity d42, the pressing cavity d42 is provided with a pressing body d42, the pressing body d42 is in clearance fit with the pressing cavity d42, the surface of the gluing plate d42 is provided with a soft glue layer, the inside of the gluing plate d42 is provided with an arc groove, the inside of the gluing plate d42 is filled with small sponge balls, the gluing plate d42 is provided with a convex block, and the convex block is connected with the shaft body d42 through a deviation filling ring, the pins are wrapped by the clamping plate.
Press body d44 to be convex connecting block, the one end of pressing body d44 is equipped with the spliced pole, be equipped with the circular shape connecting block on pressing the spliced pole of the body d44, press the circular shape connecting block gomphosis of the body d44 inside pressing chamber d45, the circular shape connecting block surface of pressing the body d44 is equipped with the colloid layer, press chamber d45 inside to be equipped with movable bobble, and the bobble is inside to be filled with the rubber block, the circular arc that presses the body d44 is connected the connecting block surface and is equipped with the hose glue layer, and the inside packing has the sponge layer, prevents the pin fish tail through laminated structure.
The clamping device 2d is installed on the basis of the first embodiment, when the device works, the attaching plate d42 is perpendicular to the offset block d41 under the matching of the circular arc connecting blocks, the extending body d6 slides along the extending shaft d5 for a certain height, the attaching device d4 is placed above the pins, the sliding column on the connecting rod of the displacement block d2 slides along the connecting column on the displacement box d1, so that the gap between the attaching plate d42 and the attaching plate d42 is positioned right above the pins, the bracket d3 is turned along the movable shaft, through the extension of the connecting shaft body, the extending body d6 is inclined and close, when the combining plate is turned along the movable shaft, the convex blocks on the combining plate are attached to the grooves on the extending body d6, so that a triangular structure is formed among the extending body d6, the bracket d3 and the displacement block d2, the extended assembly structure is supported, the extending body d6 slides along the extending shaft d5, so that the attaching plate d42 is matched under the offset block d41, slide along offset axis d43, live the pin clamping parcel, and the rubberized layer and the recess on rigging board d42 surface and the circular arc connecting block of pressing body d44 can be according to the sunken laminating pin of parcel of the structure of clamping pin, prevent that the pin from being pressed from both sides and hinder, and on the pressure of the connection face of probe was used to rigging board d42, partly was absorbed by the protruding piece on rigging board d42, and press body d44 along pressing chamber d45 and slide, the spheroid structure in chamber d45 is pressed in the extrusion, can further slow down the pressure that the pin received, prevent that the pin is crooked.
While there have been shown and described what are at present considered the fundamental principles of the invention, the essential features and advantages thereof, it will be understood by those skilled in the art that the present invention is not limited by the embodiments described above, which are merely illustrative of the principles of the invention, but rather, is capable of numerous changes and modifications in various forms without departing from the spirit or essential characteristics thereof, and it is intended that the invention be limited not by the foregoing descriptions, but rather by the appended claims and their equivalents.
Furthermore, it should be understood that although the present description refers to embodiments, not every embodiment may contain only a single embodiment, and such description is for clarity only, and those skilled in the art should integrate the description, and the embodiments may be combined as appropriate to form other embodiments understood by those skilled in the art.
Claims (8)
1. An Integrated Circuit (IC) testing device, comprising: the structure of the multifunctional operating device comprises a display screen (1), an operator (2), a base (3) and telescopic rods (4), wherein the telescopic rods (4) are arranged on two sides of the base (3), and the display screen (1) is in clearance fit with the operator (2);
the operation ware (2) are equipped with drive case (2a), the temperature control body (2b), control box (2c), clamping device (2d), place piece (2e), treater (2f), the both sides of drive case (2a) all are equipped with the temperature control body (2b), drive case (2a) and control box (2c) activity block, inside treater (2f) that is equipped with of control box (2c), clamping device (2d) with place piece (2e) gomphosis.
2. The Integrated Circuit (IC) testing device of claim 1, wherein: treater (2f) are equipped with buckle body (f1), handle board (f2), regulator (f3), equipment chamber (f4), equipment axle (f5), regulator (f3) and handle board (f2) swing joint, be equipped with equipment axle (f5) on handling board (f2), equipment chamber (f4) and equipment axle (f5) clearance fit, regulator (f3) inside is equipped with buckle body (f 1).
3. The Integrated Circuit (IC) testing device of claim 2, wherein: regulator (f3) are equipped with propelling movement piece (f31), mounting panel (f32), the probe body (f33), propelling movement axle (f34), installation piece (f35), the both sides of propelling movement piece (f31) all are equipped with propelling movement axle (f34), installation piece (f35) and propelling movement axle (f34) swing joint, be equipped with mounting panel (f32) on the probe body (f 33).
4. An Integrated Circuit (IC) testing apparatus according to claim 3, wherein: be equipped with the slip post on mounting panel (f32), the both sides of mounting panel (f32) slip post all are equipped with the slide.
5. The Integrated Circuit (IC) testing device of claim 1, wherein: clamp (2d) is equipped with displacement case (d1), displacement piece (d2), support (d3), laminating ware (d4), extension axle (d5), extension body (d6), extension body (d6) inside is equipped with extension axle (d5), displacement case (d1) and extension body (d6) swing joint, the inside of displacement case (d1) is equipped with displacement piece (d2), support (d3) and displacement piece (d2) swing joint, laminating ware (d4) is installed on displacement piece (d 2).
6. The Integrated Circuit (IC) testing device of claim 5, wherein: the support (d3) is provided with a sliding cavity, and a connecting shaft body is arranged inside the sliding cavity of the support (d 3).
7. The Integrated Circuit (IC) testing device of claim 5, wherein: laminating ware (d4) is equipped with skew piece (d41), rigging board (d42), offset shaft (d43), presses body (d44), presses chamber (d45), the both sides of offset shaft (d43) all are equipped with skew piece (d41), rigging board (d42) and offset shaft (d43) swing joint, press chamber (d45) to establish on rigging board (d42), press body (d44) and press chamber (d45) clearance fit.
8. The Integrated Circuit (IC) testing device of claim 7, wherein: the pressing body (d44) is an arc-shaped connecting block, and one end of the pressing body (d44) is provided with a connecting column.
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| CN113640645B (en) | 2024-04-30 |
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