CN113640645B - IC testing device for integrated circuit - Google Patents
IC testing device for integrated circuit Download PDFInfo
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- CN113640645B CN113640645B CN202110857736.0A CN202110857736A CN113640645B CN 113640645 B CN113640645 B CN 113640645B CN 202110857736 A CN202110857736 A CN 202110857736A CN 113640645 B CN113640645 B CN 113640645B
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- 238000012360 testing method Methods 0.000 title claims abstract description 26
- 239000000523 sample Substances 0.000 claims abstract description 31
- 238000006073 displacement reaction Methods 0.000 claims description 51
- 238000010030 laminating Methods 0.000 claims description 46
- 238000012545 processing Methods 0.000 claims description 5
- 239000012790 adhesive layer Substances 0.000 claims 1
- 238000009434 installation Methods 0.000 description 20
- 238000005457 optimization Methods 0.000 description 7
- 230000000694 effects Effects 0.000 description 5
- 238000012856 packing Methods 0.000 description 5
- 239000000084 colloidal system Substances 0.000 description 4
- 239000003292 glue Substances 0.000 description 4
- 239000002131 composite material Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 241000489982 Lagodon rhomboides Species 0.000 description 1
- 239000011449 brick Substances 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention discloses an integrated circuit IC testing device, which structurally comprises a display screen, an operator, a base and telescopic rods, wherein the telescopic rods are arranged on two sides of the base and are connected with the base, the operator is provided with the display screen, the display screen is in clearance fit with the operator, the operator is provided with a driving box, a temperature control body, an operating box, a clamping device, a placing block and a processor, the two sides of the driving box are respectively provided with the temperature control body, the regulator is split under the cooperation of a clamping body, the working blocks of the regulator are split into a plurality of independent working plates by an integral structure, the independent testing working blocks have smaller volumes, the probe working blocks to be tested are adjusted according to the specification of an integrated circuit, and during testing, the connecting block volumes of probes are reduced, and the connecting blocks of the probes can not be easily contacted with pins to press the extended pins, so that the pins are bent.
Description
Technical Field
The present invention relates to the field of integrated circuit testing, and more particularly, to an integrated circuit IC testing apparatus.
Background
An integrated circuit IC is formed by placing a large number of integrated circuits formed by microelectronic components, such as transistors, resistors, capacitors and the like, on a plastic substrate to form a chip, so that almost all the chips seen so far can be called as IC chips, and the integrated circuit IC makes electronic elements progress toward microminiaturization, low power consumption and high reliability;
The pins of the integrated circuit IC are of a slender structure, the slender pins are directly perpendicular to the assembly plate surface of the integrated circuit and extend out of the assembly plate surface of the integrated circuit, the whole connection plate surface of the probe is large in size, and when the integrated circuit IC is tested, if the size of the integrated circuit is smaller than that of the connection plate surface of the probe, the connection plate surface of the probe is easily contacted with the extended pins in the pressing process of the probe structure, so that the pins of the integrated circuit IC are pressed, and the pins of the integrated circuit IC are bent.
Disclosure of Invention
Aiming at the defects of the prior art, the invention is realized by the following technical scheme: the integrated circuit testing device structurally comprises a display screen, an operator, a base and telescopic rods, wherein the telescopic rods are arranged on two sides of the base and are connected with the base, the display screen is arranged on the operator, and the display screen is in clearance fit with the operator;
The manipulator is equipped with driving box, control by temperature change body, control box, clamp, place piece, treater, the both sides of driving box all are equipped with the control by temperature change body, control by temperature change body and driving box swing joint, the control box is installed on the driving box, driving box and control box activity block, the inside treater that is equipped with of control box, the treater is connected with the control box, the both sides of placing the piece all are equipped with the clamp, the clamp with place the piece gomphosis, be equipped with sliding groove on the base, the clamp passes through sliding plate and sliding groove sliding connection.
As the further optimization of this technical scheme, the treater is equipped with buckle body, treatment board, regulator, equipment chamber, equipment axle, be equipped with the regulator on the treatment board, regulator and treatment board swing joint, be equipped with the equipment axle on the treatment board, equipment axle and treatment board swing joint, the equipment axle is installed on the equipment chamber, equipment chamber and equipment axle clearance fit, the inside buckle body that is equipped with of regulator, the buckle body is connected with the regulator, the regulator is square structure piece, be equipped with the recess on the equipment chamber, be equipped with the slip track on the recess wall of equipment chamber, the one end of equipment chamber is installed on the operation box, the buckle body is square connecting plate, the both sides of buckle body connecting plate all are equipped with the sliding block, the sliding block gomphosis of the buckle body is on the slip track, the opposite side of the buckle body is equipped with square recess.
As the further optimization of this technical scheme, the regulator is equipped with push piece, mounting panel, probe body, push axle, installation piece, the both sides of push piece all are equipped with the push axle, push axle and push piece sliding connection, be equipped with the installation piece on the push axle, installation piece and push axle swing joint, be equipped with the mounting panel on the probe body, the mounting panel is connected with the probe body, the spliced pole of push piece runs through a connecting block that is equipped with the fretwork mouth, the installation piece is connected with the push piece through the connecting axle body, the inside of push piece is equipped with the sliding plate, the one end of the sliding plate of push piece is equipped with square connecting block, the square connecting block both sides of push piece all are equipped with the sliding cavity, a slider is inlayed to the sliding cavity inside of push piece.
As the further optimization of this technical scheme, be equipped with the slip post on the mounting panel, the both sides of mounting panel slip cylinder all are equipped with the slide, be equipped with the slip chamber on the slip cylinder of mounting panel, the slip intracavity portion of mounting panel is equipped with the slip connecting axle, the connecting plate piece of mounting panel is equipped with the buckle notch with the one end of slip cylinder laminating and towards the one end of installing the piece, the connecting plate piece and the slip post clearance fit of installing the piece.
As the further optimization of this technical scheme, the clamp is equipped with displacement case, displacement piece, support, laminating ware, extends the axle, extends the body, extend the internal portion and be equipped with the extension axle, extend the body and extend the axle clearance fit, be equipped with the displacement case on the extension body, displacement case and extension body swing joint, the inside of displacement case is equipped with the displacement piece, displacement piece and displacement case sliding connection, be equipped with the support on the displacement piece, support and displacement piece swing joint, the laminating ware is installed on the displacement piece, the displacement piece is connected with the laminating ware.
As the further optimization of this technical scheme, be equipped with the slip cavity on the support, the inside of support slip cavity is equipped with the connecting axle body, be equipped with the slip recess on the wall body of the slip cavity of support, the connecting axle body other end of support is equipped with the composite board, through loose axle and connecting axle body swing joint on the composite board of support, be equipped with the protruding piece of circular arc on the composite board of support, the support passes through loose axle and displacement piece swing joint, one side of displacement piece orientation displacement box is equipped with the connecting rod, be equipped with the slip post on the connecting rod of displacement piece, displacement box inside is equipped with the spliced pole, and be equipped with the slip track on the spliced pole, the spliced pole of displacement box runs through the slip post, be equipped with the slide on the extension axle, be equipped with the arc recess on the extension.
As the further optimization of this technical scheme, the laminating ware is equipped with skew piece, laminating board, skew axle, presses the body, presses the chamber, the both sides of skew axle all are equipped with the skew piece, skew piece and skew axle sliding connection, install the laminating board on the skew axle, laminating board and skew axle swing joint, press the chamber to establish on the laminating board, the laminating board is connected with pressing the chamber, press the last pressing body that is equipped with of pressing the chamber, press the body with press the chamber clearance fit, the surface of laminating board is equipped with the soft glue film, the inside of laminating board is equipped with the arc recess, the extension the inside movable ball that has the sponge of packing of arc recess of laminating board, be equipped with the protruding piece of colloid on the laminating board, and protruding piece inside filling gas, the laminating board passes through the connecting axle gomphosis of ring on the skew piece.
As the further optimization of this technical scheme, press the body and be convex connecting block, the one end of pressing the body is equipped with the spliced pole, be equipped with circular connecting block on the spliced pole of pressing the body, press the circular connecting block gomphosis of the body and press the intracavity portion, press the circular connecting block surface of the body to be equipped with the colloid layer, press intracavity portion to be equipped with movable ball, and the ball is inside to be filled with the rubber block, press the circular arc of the body to connect the connecting block surface to be equipped with the soft glue film, and the inside packing has the sponge layer.
Advantageous effects
Compared with the prior art, the integrated circuit IC testing device has the following advantages:
1. the regulator is split under the cooperation of the buckle body, the working plate block is split into a plurality of independent working plates by the integral structure, the independent test working plate block has smaller volume, the probe working block to be tested is adjusted according to the specification of the integrated circuit, and when in test, the connecting plate block of the probe is reduced in volume, and the connecting plate block of the probe can not press the extended pins due to easy contact with the pins, so that the pins are bent.
2. According to the invention, the extended pins can be wrapped by the clamping of the bonding plate, the pins are protected, a certain clamping supporting force is provided for the pins, when the connecting plate of the probe is pressed down, the connecting plate of the probe firstly acts on the clamping structure, the pressed down pressure is absorbed by the assembly structure on the bonding plate, the pressure born by the pins is reduced, and the pins cannot be easily bent.
Drawings
Other features, objects and advantages of the present invention will become more apparent upon reading of the detailed description of non-limiting embodiments, given with reference to the accompanying drawings in which:
FIG. 1 is a schematic diagram showing the overall structure of an integrated circuit IC testing device according to the present invention.
Fig. 2 is a schematic view of the structure of the manipulator of the present invention.
FIG. 3 is a schematic diagram of a processor according to the present invention.
Fig. 4 is a schematic diagram of a regulator according to the present invention.
Fig. 5 is a schematic view of the structure of the clutch of the present invention.
Fig. 6 is a schematic view of the structure of the laminator of the invention.
In the figure: the display screen 1, the manipulator 2, the base 3, the telescopic rod 4, the driving box 2a, the temperature control body 2b, the operating box 2c, the clamp 2d, the placing block 2e, the processor 2f, the clamping body f1, the processing plate f2, the regulator f3, the assembly cavity f4, the assembly shaft f5, the pushing block f31, the mounting plate f32, the probe body f33, the pushing shaft f34, the mounting block f35, the displacement box d1, the displacement block d2, the bracket d3, the laminating body d4, the extension shaft d5, the extension body d6, the offset block d41, the laminating plate d42, the offset shaft d43, the pressing body d44 and the pressing cavity d45.
Detailed Description
In order that the manner in which the invention is accomplished, as well as the manner in which it is characterized and attained and the effects thereof, a more particular description of the invention will be rendered by reference to the appended drawings.
Example 1
Referring to fig. 1-4, an integrated circuit IC testing device structurally comprises a display screen 1, an operator 2, a base 3 and a telescopic rod 4, wherein the telescopic rods 4 are arranged on two sides of the base 3, the telescopic rod 4 is connected with the base 3, the operator 2 is provided with the display screen 1, and the display screen 1 is in clearance fit with the operator 2;
The manipulator 2 is equipped with driving case 2a, control by temperature change body 2b, operation box 2c, clamp 2d, place piece 2e, treater 2f, the both sides of driving case 2a all are equipped with control by temperature change body 2b, control by temperature change body 2b and driving case 2a swing joint, operation box 2c installs on driving case 2a, driving case 2a and operation box 2c activity block, the inside treater 2f that is equipped with of operation box 2c, treater 2f is connected with operation box 2c, the both sides of placing piece 2e all are equipped with clamp 2d, clamp 2d and place piece 2e gomphosis, be equipped with the sliding groove on the base 3, clamp 2d passes through sliding plate and sliding groove sliding connection, realizes the test of integrated circuit.
The processor 2f is equipped with buckle body f1, treatment board f2, regulator f3, equipment chamber f4, equipment axle f5, be equipped with regulator f3 on the treatment board f2, regulator f3 and treatment board f2 swing joint, be equipped with equipment axle f5 on the treatment board f2, equipment axle f5 and treatment board f2 swing joint, equipment axle f5 installs on equipment chamber f4, equipment chamber f4 and equipment axle f5 clearance fit, regulator f3 inside is equipped with buckle body f1, buckle body f1 is connected with regulator f3, regulator f3 is square structure piece, be equipped with the recess on the equipment chamber f4, be equipped with the slip track on the recess wall of equipment chamber f4, the one end of equipment chamber f4 is installed on operation box 2c, buckle body f1 is square connecting plate, the both sides of buckle body f1 connecting plate all are equipped with the sliding block, the sliding block gomphosis of buckle body f1 is equipped with the integrated circuit of opposite side on the slip track, the realization integrated circuit of the regulation plate is equipped with the recess.
The adjuster f3 is equipped with push piece f31, mounting panel f32, probe body f33, push axle f34, installation piece f35, push piece f 31's both sides all are equipped with push axle f34, push axle f34 and push piece f31 sliding connection, be equipped with installation piece f35 on the push axle f34, installation piece f35 and push axle f34 swing joint, be equipped with mounting panel f32 on the probe body f33, mounting panel f32 is connected with probe body f33, the connecting cylinder of push piece f31 runs through a connecting block that is equipped with the fretwork mouth, installation piece f35 is connected with push piece f31 through the connecting axle body, the inside of installation piece f35 is equipped with the sliding plate, the one end of the sliding plate of installation piece f35 is equipped with square connecting block, the square connecting block both sides of installation piece f35 all are equipped with the sliding cavity, the sliding cavity inside of installation piece f35 inlays a slider, reduces the volume of test plate through the structure and disassembles.
The utility model discloses a test structure, including mounting panel f32, mounting panel f35, connecting plate and mounting panel f35, be equipped with the slip post on the mounting panel f32, the both sides of mounting panel f32 slip cylinder all are equipped with the slide, be equipped with the sliding chamber on the slip cylinder of mounting panel f32, the inside slip connecting axle that is equipped with of sliding chamber of mounting panel f32, the connecting plate piece of mounting panel f32 is equipped with the buckle notch with the one end that the slip cylinder laminated and towards the one end of mounting block f35, the connecting plate piece and the slip post clearance fit of mounting block f35 realize the further detection of test structure.
According to the size of the integrated circuit specification, the sliding block of the buckle body f1 slides along the sliding track, the other regulator f3 slides out, the regulator f3 on the split processing plate f2 is split into independent individuals, the assembly shaft f5 slides along the assembly cavity f4 to extend, the integrated circuit is tested through the regulator f3, the volume of the independent regulator f3 is reduced, during the pressing test, the connecting plate surface of the probe can not easily contact with a pin, the sliding column on the mounting plate f32 drives the probe body f33 to slide along the slideway, so that the range of the probe body f33 which can be tested is adjusted and enlarged, if the sliding column needs to extend again, the mounting block f35 overturns along the movable shaft between the mounting block f31, the sliding connecting shaft inside the cavity of the mounting block f35 extends out of the cavity and is buckled with the notch of the mounting plate f32, the sliding connecting shaft of the sliding column on the mounting plate f32 is further buckled with the square connecting plate f32 by utilizing the extension of the slider on the mounting block f35, the sliding column on the two sides of the mounting plate f32 slides along the cavity 32, and the sliding connecting shaft on the connecting plate is separated from the mounting plate f32, and the sliding column is connected with the sliding column f32 along the sliding column, so that the sliding column f is separated from the sliding column 32 along the edge of the sliding column 32, and the sliding column is further connected with the mounting plate f 31.
Example two
Referring to fig. 1-6, an integrated circuit IC testing device structurally comprises a display screen 1, an operator 2, a base 3 and a telescopic rod 4, wherein the telescopic rods 4 are arranged on two sides of the base 3, the telescopic rod 4 is connected with the base 3, the operator 2 is provided with the display screen 1, and the display screen 1 is in clearance fit with the operator 2;
The manipulator 2 is equipped with driving case 2a, control by temperature change body 2b, operation box 2c, clamp 2d, place piece 2e, treater 2f, the both sides of driving case 2a all are equipped with control by temperature change body 2b, control by temperature change body 2b and driving case 2a swing joint, operation box 2c installs on driving case 2a, driving case 2a and operation box 2c activity block, the inside treater 2f that is equipped with of operation box 2c, treater 2f is connected with operation box 2c, the both sides of placing piece 2e all are equipped with clamp 2d, clamp 2d and place piece 2e gomphosis, be equipped with the sliding groove on the base 3, clamp 2d passes through sliding plate and sliding groove sliding connection, realizes the test of integrated circuit.
The processor 2f is equipped with buckle body f1, treatment board f2, regulator f3, equipment chamber f4, equipment axle f5, be equipped with regulator f3 on the treatment board f2, regulator f3 and treatment board f2 swing joint, be equipped with equipment axle f5 on the treatment board f2, equipment axle f5 and treatment board f2 swing joint, equipment axle f5 installs on equipment chamber f4, equipment chamber f4 and equipment axle f5 clearance fit, regulator f3 inside is equipped with buckle body f1, buckle body f1 is connected with regulator f3, regulator f3 is square structure piece, be equipped with the recess on the equipment chamber f4, be equipped with the slip track on the recess wall of equipment chamber f4, the one end of equipment chamber f4 is installed on operation box 2c, buckle body f1 is square connecting plate, the both sides of buckle body f1 connecting plate all are equipped with the sliding block, the sliding block gomphosis of buckle body f1 is equipped with the integrated circuit of opposite side on the slip track, the realization integrated circuit of the regulation plate is equipped with the recess.
The adjuster f3 is equipped with push piece f31, mounting panel f32, probe body f33, push axle f34, installation piece f35, push piece f 31's both sides all are equipped with push axle f34, push axle f34 and push piece f31 sliding connection, be equipped with installation piece f35 on the push axle f34, installation piece f35 and push axle f34 swing joint, be equipped with mounting panel f32 on the probe body f33, mounting panel f32 is connected with probe body f33, the connecting cylinder of push piece f31 runs through a connecting block that is equipped with the fretwork mouth, installation piece f35 is connected with push piece f31 through the connecting axle body, the inside of installation piece f35 is equipped with the sliding plate, the one end of the sliding plate of installation piece f35 is equipped with square connecting block, the square connecting block both sides of installation piece f35 all are equipped with the sliding cavity, the sliding cavity inside of installation piece f35 inlays a slider, reduces the volume of test plate through the structure and disassembles.
The utility model discloses a test structure, including mounting panel f32, mounting panel f35, connecting plate and mounting panel f35, be equipped with the slip post on the mounting panel f32, the both sides of mounting panel f32 slip cylinder all are equipped with the slide, be equipped with the sliding chamber on the slip cylinder of mounting panel f32, the inside slip connecting axle that is equipped with of sliding chamber of mounting panel f32, the connecting plate piece of mounting panel f32 is equipped with the buckle notch with the one end that the slip cylinder laminated and towards the one end of mounting block f35, the connecting plate piece and the slip post clearance fit of mounting block f35 realize the further detection of test structure.
The clamp 2d is provided with a displacement box d1, a displacement block d2, a support d3, a laminating device d4, an extension shaft d5 and an extension body d6, the extension shaft d5 is arranged inside the extension body d6, the extension body d6 is in clearance fit with the extension shaft d5, the displacement box d1 is arranged on the extension body d6, the displacement box d1 is movably connected with the extension body d6, the displacement block d2 is arranged inside the displacement box d1, the displacement block d2 is in sliding connection with the displacement box d1, the support d3 is arranged on the displacement block d2, the support d3 is movably connected with the displacement block d2, the laminating device d4 is arranged on the displacement block d2, and the displacement block d2 is connected with the laminating device d4 to realize the clamp of pins.
The support d3 is provided with a sliding cavity, the inside of the support d3 sliding cavity is provided with a connecting shaft body, the wall body of the sliding cavity of the support d3 is provided with a sliding groove, the other end of the connecting shaft body of the support d3 is provided with a combined plate, the combined plate of the support d3 is movably connected with the connecting shaft body through a movable shaft, the combined plate of the support d3 is provided with an arc-shaped protruding block, the support d3 is movably connected with a displacement block d2 through the movable shaft, one side of the displacement block d2, facing the displacement box d1, of the displacement block d2 is provided with a connecting rod, the inside of the displacement box d1 is provided with a connecting column, the connecting column is provided with a sliding rail, the connecting column of the displacement box d1 penetrates through the sliding column, the extending shaft d5 is provided with a slide way, and the extending body d6 is provided with an arc-shaped groove to realize the support of the extending structure.
The laminating ware d4 is equipped with offset piece d41, laminating board d42, offset axle d43, presses body d44, presses chamber d45, offset piece d41 is all equipped with to the both sides of offset axle d43, offset piece d41 and offset axle d43 sliding connection, install laminating board d42 on the offset axle d43, laminating board d42 and offset axle d43 swing joint, press chamber d45 to establish on laminating board d42, laminating board d42 is connected with pressing chamber d45, be equipped with pressing body d44 on pressing chamber d45, pressing body d44 and pressing chamber d45 clearance fit, the surface of laminating board d42 is equipped with the soft glue film, the inside of laminating board d42 is equipped with the arc recess, the extension body the inside movable ball that has the sponge of packing of arc recess of laminating board d42 is equipped with the colloid protruding piece on the laminating board d42, and the inside gas that fills of protruding piece, laminating board d42 passes through the connection axis gomphosis of ring on laminating board d41, through the clamp pin and blocks.
The pressing body d44 is a circular arc-shaped connecting block, a connecting column is arranged at one end of the pressing body d44, a circular connecting block is arranged on the connecting column of the pressing body d44, the circular connecting block of the pressing body d44 is embedded in the pressing cavity d45, a colloid layer is arranged on the surface of the circular connecting block of the pressing body d44, the inside movable ball that is equipped with of pressing cavity d45, and the inside packing of ball has the rubber brick, pressing body d 44's circular arc connection connecting block surface is equipped with soft glue film, and inside packing has the sponge layer, prevents the pin fish tail through the laminating structure.
Install clamp 2d on the basis of embodiment one, at the during operation of equipment, laminating board d42 is the vertical state with offset piece d41 under the cooperation of circular arc connecting block, extend body d6 along the top of extension axle d5 slip certain height, make the pin is arranged in to the laminating ware d4, the sliding column on the displacement piece d2 connecting rod slides along the spliced pole on displacement case d1, make the clearance between laminating board d42 and the laminating board d42 lie in the top of pin, support d3 overturns along the loose axle, through the extension of connecting axle body, the slope is close to, extend body d6, in laminating along the loose axle upset through the combination board for the recess on the extension body d6 mutually, make extension body d6, support d3 and displacement piece d2 between constitute triangular structure, support the assembled structure after the extension, extension body d6 slides along extension axle d5, make laminating board d42 along offset axle d43 slip, with the clearance between laminating board d42 and the pin is located the top of pin, the extension board d6, the recess is pressed down by the recess and the pin 45 can prevent to press down the joint body d45 of the ball, prevent that the pressure of joint board d from being pressed down the pin from pressing down on the joint board surface 45, prevent the recess and the pin from being pressed down on the joint board, the side 45.
While there have been shown and described what are at present considered to be fundamental principles of the invention, the main features and advantages thereof, it will be understood by those skilled in the art that the present invention is not limited by the foregoing embodiments, which are described in the foregoing description only illustrate the principles of the invention, but are capable of other embodiments and modifications without departing from the spirit or essential features thereof, and therefore the scope of the invention is defined by the appended claims and their equivalents, rather than by the foregoing description.
Furthermore, it should be understood that although the present disclosure describes embodiments, not every embodiment is provided with a separate embodiment, and that this description is provided for clarity only, and that the disclosure is not limited to the embodiments described in detail below, and that the embodiments described in the examples may be combined as appropriate to form other embodiments that will be apparent to those skilled in the art.
Claims (1)
1. An integrated circuit IC testing apparatus, characterized in that: the structure of the device comprises a display screen (1), an operator (2), a base (3) and telescopic rods (4), wherein the telescopic rods (4) are arranged on two sides of the base (3), and the display screen (1) is in clearance fit with the operator (2);
The manipulator (2) is provided with a driving box (2 a), a temperature control body (2 b), an operation box (2 c), a clamp (2 d), a placing block (2 e) and a processor (2 f), wherein the two sides of the driving box (2 a) are respectively provided with the temperature control body (2 b), the driving box (2 a) is movably clamped with the operation box (2 c), the processor (2 f) is arranged in the operation box (2 c), and the clamp (2 d) is embedded with the placing block (2 e);
The processor (2 f) is provided with a buckle body (f 1), a processing plate (f 2), a regulator (f 3), an assembling cavity (f 4) and an assembling shaft (f 5), the regulator (f 3) is movably connected with the processing plate (f 2), the processing plate (f 2) is provided with the assembling shaft (f 5), the assembling cavity (f 4) is in clearance fit with the assembling shaft (f 5), and the buckle body (f 1) is arranged in the regulator (f 3);
The adjuster (f 3) is provided with a pushing block (f 31), a mounting plate (f 32), a probe body (f 33), a pushing shaft (f 34) and a mounting block (f 35), both sides of the pushing block (f 31) are respectively provided with the pushing shaft (f 34), the mounting block (f 35) is movably connected with the pushing shaft (f 34), and the mounting plate (f 32) is arranged on the probe body (f 33);
The mounting plate (f 32) is provided with a sliding column, and both sides of the sliding column of the mounting plate (f 32) are provided with slide ways;
The clamp device is characterized in that the clamp device (2 d) is provided with a displacement box (d 1), a displacement block (d 2), a support (d 3), a laminating device (d 4), an extension shaft (d 5) and an extension body (d 6), the extension shaft (d 5) is arranged in the extension body (d 6), the displacement box (d 1) is movably connected with the extension body (d 6), the displacement block (d 2) is arranged in the displacement box (d 1), the support (d 3) is movably connected with the displacement block (d 2), and the laminating device (d 4) is arranged on the displacement block (d 2);
a sliding cavity is arranged on the support (d 3), and a connecting shaft body is arranged in the sliding cavity of the support (d 3);
The laminating device (d 4) is provided with an offset block (d 41), a laminating plate (d 42), an offset shaft (d 43), a pressing body (d 44) and a pressing cavity (d 45), the offset block (d 41) is arranged on two sides of the offset shaft (d 43), the laminating plate (d 42) is movably connected with the offset shaft (d 43), the pressing cavity (d 45) is arranged on the laminating plate (d 42), and the pressing body (d 44) is in clearance fit with the pressing cavity (d 45);
The pressing body (d 44) is a circular arc-shaped connecting block, and a connecting column is arranged at one end of the pressing body (d 44);
The sliding block of the clamping body (f 1) slides along the sliding track, the sliding block slides out of the other regulator (f 3), the regulator (f 3) on the probe body (f 2) is split, the test structure is split into independent individuals, the assembly shaft (f 5) slides along the assembly cavity (f 4) to extend, the integrated circuit is tested through the regulator (f 3), the volume of the independent regulator (f 3) is reduced, the connecting plate surface of the probe can not easily contact with a pin during the pressing test, a sliding column on the mounting plate (f 32) drives the probe body (f 33) to slide along a slideway, so that the range which can be tested by the probe body (f 33) is adjusted and enlarged, if the sliding block (f 35) extends again along a movable shaft between the sliding block and the pushing block (f 31), a sliding connecting shaft in the cavity of the mounting block (f 35) extends out of the cavity and is buckled with a notch of the mounting plate (f 32), the sliding block (f 32) is further buckled with the extension of the sliding block on the square connecting plate, the sliding column on the mounting plate (f 32) drives the sliding column on the mounting plate (f 32) to slide along the sliding column (f 32) to be separated from the sliding column (f 32) along the sliding column, and the sliding column (f 32) is further separated from the sliding column (f 32) along the sliding column;
the attachment plate (d 42) is in a vertical state with the offset block (d 41) under the cooperation of the circular arc connecting block, the extension body (d 6) slides along the extension shaft (d 5) to a certain height, so that the attachment device (d 4) is arranged above the pins, the sliding column on the connecting rod of the displacement block (d 2) slides along the connecting column on the displacement box (d 1), a gap between the attachment plate (d 42) and the attachment plate (d 42) is positioned right above the pins, the support (d 3) is overturned along the movable shaft, the extension body (d 6) is obliquely close to the support, the extension body (d 6) is overturned along the movable shaft through the combination plate, the protruding block on the combination plate is attached to the groove on the extension body (d 6) along the movable shaft, so that a triangular structure is formed among the extension body (d 6), the support (d 3) and the displacement block (d 2), the support of the extended assembly structure is slid along the extension shaft (d 5), the attachment plate (d 42) is enabled to be attached to the pin groove (d) along the extension shaft (d 41) under the cooperation of the offset block (d 42), the protruding block (d) and the pin (d) is prevented from being covered by the pressure on the surface of the pin (d) of the pin, the contact pin (d) is prevented from being covered by the adhesive layer (44) and the contact pin (d) by the pressure pad, the contact pin (44) and the contact pin pad, the contact pad is pressed on the surface (44, the ball structure in the pressing cavity (d 45) is extruded, so that the pressure born by the pins can be further relieved, and the pins are prevented from being bent.
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