CN211086378U - Thimble type integrated circuit test fixture - Google Patents
Thimble type integrated circuit test fixture Download PDFInfo
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- CN211086378U CN211086378U CN201921911998.5U CN201921911998U CN211086378U CN 211086378 U CN211086378 U CN 211086378U CN 201921911998 U CN201921911998 U CN 201921911998U CN 211086378 U CN211086378 U CN 211086378U
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Abstract
The utility model discloses an integrated circuit test fixture of thimble type, including base, press platform, lid, standing groove and adsorption structure, the turning position department of base bottom all is equipped with adsorption structure, and the central point department of putting at base top is equipped with the standing groove to the lid is installed at the top of base, the both sides of lid bottom all are equipped with location structure, and the inside central point department of putting of lid is equipped with logical groove, all are fixed with the loading board on two inside walls that lead to the groove to inside being equipped with of leading to between the adjacent loading board presses the platform, the central point department of putting of pressing platform bottom is equipped with buffer structure, and all is equipped with the spacing groove on the loading board outer wall of pressing a both sides, and the one end of spacing inslot portion is equipped with the stopper. The utility model discloses not only reduced when test fixture uses because of the dynamics too big to placing in the phenomenon that the inside chip of standing groove caused the damage, improved the stability when test fixture uses, improved the accurate nature when test fixture uses moreover.
Description
Technical Field
The utility model relates to a test fixture technical field specifically is an integrated circuit test fixture of thimble type.
Background
The technology and development trend of the existing electronic packaging is to have higher electrical performance and thermal performance, and the electronic packaging has the characteristic requirements of light weight, thinness, small size, mass production, and convenience in installation and use, and the miniaturization and high-density packaging forms of devices are more and more, so that the devices need to be tested and processed, and corresponding test jigs need to be used.
The existing test fixtures on the market are various in types and can basically meet the use requirements of people, but certain defects still exist, and the specific problems are as follows.
(1) The existing test fixture is inconvenient to buffer the thimble, so that a chip is easy to damage due to high strength in the test process, and people are often troubled;
(2) the existing test fixture is inconvenient for positioning the base, so that the base is easy to deviate, and the stability is general;
(3) the existing test fixture is inconvenient for enabling the cover body and the base to be in a horizontal structure, so that certain deviation is easy to occur, and the test accuracy is general.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide an integrated circuit test fixture of thimble type to it is not convenient for cushion, is not convenient for fix a position and is not convenient for make lid and base be the problem of horizontal structure to the thimble to propose test fixture in solving above-mentioned background art.
In order to achieve the above object, the utility model provides a following technical scheme: the utility model provides an integrated circuit test fixture of thimble type, includes the base, presses platform, lid, standing groove and adsorption structure, the turning position department of base bottom all is equipped with adsorption structure, and the central point department of putting at base top is equipped with the standing groove to the lid is installed at the top of base, the both sides of lid bottom all are equipped with location structure, and the inside central point department of putting of lid is equipped with logical groove, all are fixed with the loading board on leading to two inside walls to the logical inslot portion between the adjacent loading board is equipped with presses the platform, the central point department of putting of pressing the platform bottom is equipped with buffer structure, and all is equipped with the spacing groove on the loading board outer wall of pressing a both sides, and the one end of spacing inslot portion is equipped with the stopper, the one end of stopper extend to the outside of spacing groove and with the outer wall fixed connection of pressing.
Preferably, a return spring is installed on the outer wall of the bearing plate above the pressing table through a support plate, and the bottom end of the return spring is fixedly connected with the top end of the pressing table.
Preferably, location structure's inside is equipped with first through-hole, second through-hole, pilot pin, constant head tank and locating plate in proper order, the both sides of lid bottom all are equipped with the constant head tank, and are equipped with the second through-hole on the inner wall of first through-hole one side, and the one end of second through-hole extends to the outside of lid.
Preferably, a positioning plate is arranged at the center of the inside of the positioning groove, and the bottom end of the positioning plate extends to the outside of the positioning groove and is fixedly connected with the top end of the base.
Preferably, a first through hole is formed in the center of the inside of the positioning plate, a positioning bolt is arranged inside the first through hole, and one end of the positioning bolt penetrates through the second through hole and extends to the outside of the cover body.
Preferably, the inside of buffer structure is equipped with dovetail, expanding spring, spacing dish and thimble in proper order, the central point department of putting of pressing the platform bottom is equipped with the dovetail, and the bottom of the inside dovetail is equipped with spacing dish.
Preferably, the central position of the top end of the limiting disc is provided with an expansion spring, the top end of the expansion spring is fixedly connected with the top of the dovetail groove, the central position of the bottom end of the limiting disc is provided with an ejector pin, and the bottom end of the ejector pin extends to the outside of the dovetail groove.
Preferably, an I-shaped fastener, a fastening groove, a micro sucker and a placing groove are sequentially arranged in the adsorption structure, the placing groove is arranged at the corner position of the bottom of the base, and the fastening groove is arranged in the base above the placing groove.
Preferably, a micro suction cup is fixed at the bottom end inside the placement groove, an i-shaped fastener is arranged at the center of the top end of the micro suction cup, and the top end of the i-shaped fastener extends into the fastening groove and is fixedly connected with the top of the fastening groove.
Compared with the prior art, the beneficial effects of the utility model are that: the thimble type integrated circuit test fixture not only reduces the phenomenon that a chip placed in the placing groove is damaged due to overlarge force when the test fixture is used, improves the stability when the test fixture is used, but also improves the accuracy when the test fixture is used;
(1) the dovetail groove, the telescopic spring, the limiting disc and the ejector pin are arranged, the limiting disc moves upwards in the dovetail groove under the elastic action of the telescopic spring, and the ejector pin moves upwards with the step to facilitate buffering treatment, so that the phenomenon that a chip placed in the placing groove is damaged due to overlarge force when the test fixture is used is reduced;
(2) the I-shaped fastener, the fastening groove, the micro sucker and the placing groove are arranged, the micro sucker is positioned and arranged inside the placing groove through the I-shaped fastener inside the fastening groove, when the base is in contact with the placing surface, the micro sucker can be adsorbed to the placing surface so as to position the base, the phenomenon of deviation of the base is avoided, and therefore the stability of the test fixture during use is improved;
(3) through being provided with first through-hole, second through-hole, pilot pin, constant head tank and locating plate, through detaining the locating plate into the inside to the constant head tank, run through second through-hole and first through-hole with the pilot pin simultaneously to set up the lid location in the top of base, and make both be horizontal structure, avoid it to appear certain deviation, thereby improved the accurate nature when test fixture uses.
Drawings
Fig. 1 is a schematic front view of a cross-sectional structure of the present invention;
FIG. 2 is a schematic view of the positioning structure of the present invention in cross section and enlarged structure;
FIG. 3 is a schematic view of a cross-sectional enlarged structure of the buffering structure of the present invention;
FIG. 4 is a schematic view of the cross-sectional enlarged structure of the adsorption structure of the present invention;
fig. 5 is a schematic top view of the present invention.
In the figure: 1. a base; 2. a carrier plate; 3. a return spring; 4. a through groove; 5. a pressing table; 6. a limiting block; 7. a cover body; 8. a positioning structure; 801. a first through hole; 802. a second through hole; 803. positioning bolts; 804. positioning a groove; 805. positioning a plate; 9. a limiting groove; 10. a buffer structure; 1001. a dovetail groove; 1002. a tension spring; 1003. a limiting disc; 1004. a thimble; 11. a placement groove; 12. an adsorption structure; 1201. a drum fastener; 1202. a fastening groove; 1203. a micro-sucker; 1204. and (5) placing the groove.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Referring to fig. 1-5, the present invention provides an embodiment: a thimble type integrated circuit test fixture comprises a base 1, a pressing table 5, a cover body 7, a placing groove 11 and an adsorption structure 12, wherein the adsorption structure 12 is arranged at the corner position of the bottom of the base 1, an I-shaped fastener 1201, a fastening groove 1202, a micro sucker 1203 and a placing groove 1204 are sequentially arranged in the adsorption structure 12, the placing groove 1204 is arranged at the corner position of the bottom of the base 1, the fastening groove 1202 is arranged in the base 1 above the placing groove 1204, the micro sucker 1203 is fixed at the bottom end in the placing groove 1204, the I-shaped fastener 1201 is arranged at the central position of the top end of the micro sucker 1203, and the top end of the I-shaped fastener 1201 extends into the fastening groove 1202 and is fixedly connected with the top of the fastening groove 1202;
the micro sucker 1203 is positioned and arranged inside the placing groove 1204 through the I-shaped fastener 1201 inside the fastening groove 1202, when the base 1 is contacted with the placing surface, the micro sucker 1203 can be adsorbed with the placing surface, so that the base 1 is positioned, the phenomenon of offset is avoided, and the stability of the test fixture is improved;
a placing groove 11 is arranged at the center of the top of the base 1, a cover 7 is mounted at the top of the base 1, positioning structures 8 are arranged on two sides of the bottom of the cover 7, a first through hole 801, a second through hole 802, a positioning bolt 803, a positioning groove 804 and a positioning plate 805 are sequentially arranged in the positioning structures 8, the positioning groove 804 is arranged on two sides of the bottom of the cover 7, the second through hole 802 is arranged on the inner wall of one side of the first through hole 801, one end of the second through hole 802 extends to the outside of the cover 7, the positioning plate 805 is arranged at the center of the inside of the positioning groove 804, the bottom end of the positioning plate 805 extends to the outside of the positioning groove 804 and is fixedly connected with the top end of the base 1, the first through hole 801 is arranged at the center of the inside of the positioning plate 805, the positioning bolt 803 is arranged in the inside of the first through hole 801, and one;
the positioning plate 805 is buckled into the positioning groove 804, and the positioning bolt 803 penetrates through the second through hole 802 and the first through hole 801, so that the cover 7 is positioned at the top end of the base 1 and is in a horizontal structure, thereby avoiding certain deviation and improving the use accuracy of the test fixture;
a through groove 4 is formed in the center of the inner part of the cover body 7, the bearing plates 2 are fixed on the two inner side walls of the through groove 4, a pressing table 5 is arranged in the through groove 4 between the adjacent bearing plates 2, a return spring 3 is arranged on the outer wall of the bearing plate 2 above the pressing table 5 through a support plate, and the bottom end of the return spring 3 is fixedly connected with the top end of the pressing table 5 so as to enable the pressing table 5 to be reset to the original position;
a buffer structure 10 is arranged at the central position of the bottom of the pressing table 5, a dovetail groove 1001, a telescopic spring 1002, a limiting disc 1003 and an ejector pin 1004 are sequentially arranged in the buffer structure 10, the dovetail groove 1001 is arranged at the central position of the bottom of the pressing table 5, the limiting disc 1003 is arranged at the bottom end of the interior of the dovetail groove 1001, the telescopic spring 1002 is arranged at the central position of the top end of the limiting disc 1003, the top end of the telescopic spring 1002 is fixedly connected with the top of the dovetail groove 1001, the ejector pin 1004 is arranged at the central position of the bottom end of the limiting disc 1003, and the bottom end of the ejector pin 1004 extends to the outside of;
through the elastic action of the telescopic spring 1002, the limiting disc 1003 moves upwards in the dovetail groove 1001, and the ejector pin 1004 moves upwards in a stepping mode so as to buffer, and the phenomenon that a chip placed in the placing groove 11 is damaged due to overlarge force is reduced;
and all be equipped with spacing groove 9 on pressing the loading board 2 outer wall of platform 5 both sides to the inside one end of spacing groove 9 is equipped with stopper 6, and the one end of stopper 6 extends to the outside of spacing groove 9 and with the outer wall fixed connection of pressing platform 5.
The working principle is as follows: when the testing jig is used, firstly, the chip is placed in the placing groove 11, the positioning plate 805 is buckled into the positioning groove 804, the positioning bolt 803 penetrates through the second through hole 802 and the first through hole 801, so that the cover body 7 is positioned and arranged at the top end of the base 1, the two are in a horizontal structure, certain deviation is avoided, the use accuracy of the testing jig is improved, the micro suction cup 1203 is positioned and arranged in the placing groove 1204 through the I-shaped fastener 1201 in the fastening groove 1202, when the base 1 is contacted with the placing surface, the micro suction cup 1203 is adsorbed with the placing surface, so that the base 1 is positioned, the deviation phenomenon is avoided, the stability of the testing jig is improved, then the limiting block 6 moves downwards in the limiting groove 9 by pressing the pressing table 5, the thimble 1004 is driven by the pressing table 5 to synchronously move downwards, so as to test the chip, meanwhile, due to the combined action of the return spring 3, the pressing table 5 can be reset to the original position, finally, the limiting disc 1003 moves upwards in the dovetail groove 1001 under the elastic action of the telescopic spring 1002, the ejector pin 1004 can move upwards in a stepping mode so as to perform buffering treatment, the phenomenon that damage is caused to chips placed in the placing groove 11 due to overlarge force is reduced, and the use of the test jig is completed.
It is obvious to a person skilled in the art that the invention is not restricted to details of the above-described exemplary embodiments, but that it can be implemented in other specific forms without departing from the spirit or essential characteristics of the invention. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.
Claims (9)
1. The utility model provides an integrated circuit test fixture of thimble type, includes base (1), presses platform (5), lid (7), standing groove (11) and adsorption structure (12), its characterized in that: the corners of the bottom of the base (1) are provided with adsorption structures (12), the center of the top of the base (1) is provided with a placement groove (11), a cover body (7) is arranged at the top of the base (1), positioning structures (8) are arranged at two sides of the bottom of the cover body (7), a through groove (4) is arranged at the central position inside the cover body (7), bearing plates (2) are fixed on the two inner side walls of the through groove (4), and a pressing platform (5) is arranged in the through groove (4) between the adjacent bearing plates (2), a buffer structure (10) is arranged at the central position of the bottom of the pressing platform (5), and the outer walls of the bearing plates (2) at the two sides of the pressing platform (5) are provided with limit grooves (9), and the one end of spacing groove (9) inside is equipped with stopper (6), and the one end of stopper (6) extends to the outside of spacing groove (9) and with the outer wall fixed connection of pressing platform (5).
2. The ejector pin type ic testing fixture of claim 1, wherein: reset spring (3) is installed through the extension board on pressing the loading board (2) outer wall of platform (5) top, the bottom of reset spring (3) and the top fixed connection who presses platform (5).
3. The ejector pin type ic testing fixture of claim 1, wherein: the inside of location structure (8) is equipped with first through-hole (801), second through-hole (802), pilot pin (803), constant head tank (804) and locating plate (805) in proper order, the both sides of lid (7) bottom all are equipped with constant head tank (804), and are equipped with second through-hole (802) on the inner wall of first through-hole (801) one side, and the one end of second through-hole (802) extends to the outside of lid (7).
4. The ejector pin type IC test fixture of claim 3, wherein: a positioning plate (805) is arranged at the center of the inside of the positioning groove (804), and the bottom end of the positioning plate (805) extends to the outside of the positioning groove (804) and is fixedly connected with the top end of the base (1).
5. The ejector pin type IC testing fixture of claim 4, wherein: a first through hole (801) is formed in the center of the inner portion of the positioning plate (805), a positioning bolt (803) is arranged in the first through hole (801), and one end of the positioning bolt (803) penetrates through the second through hole (802) and extends to the outer portion of the cover body (7).
6. The ejector pin type ic testing fixture of claim 1, wherein: the buffer structure is characterized in that a dovetail groove (1001), a telescopic spring (1002), a limiting disc (1003) and an ejector pin (1004) are sequentially arranged in the buffer structure (10), the dovetail groove (1001) is arranged at the center of the bottom of the pressing table (5), and the limiting disc (1003) is arranged at the bottom end of the interior of the dovetail groove (1001).
7. The ejector pin type IC test fixture of claim 6, wherein: the center position department at spacing dish (1003) top is equipped with expanding spring (1002), and the top of expanding spring (1002) and the top fixed connection of dovetail (1001), and the center position department of spacing dish (1003) bottom is equipped with thimble (1004), and the bottom of thimble (1004) extends to the outside of dovetail (1001).
8. The ejector pin type ic testing fixture of claim 1, wherein: the inner part of the adsorption structure (12) is sequentially provided with an I-shaped fastener (1201), a fastening groove (1202), a miniature sucker (1203) and a placing groove (1204), the corner positions of the bottom of the base (1) are all provided with the placing groove (1204), and the inner part of the base (1) above the placing groove (1204) is all provided with the fastening groove (1202).
9. The ejector pin type ic testing fixture of claim 8, wherein: the bottom end in the placing groove (1204) is fixed with a miniature suction cup (1203), the center position of the top end of the miniature suction cup (1203) is provided with an I-shaped fastener (1201), and the top end of the I-shaped fastener (1201) extends to the inside of the fastening groove (1202) and is fixedly connected with the top of the fastening groove (1202).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921911998.5U CN211086378U (en) | 2019-11-07 | 2019-11-07 | Thimble type integrated circuit test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921911998.5U CN211086378U (en) | 2019-11-07 | 2019-11-07 | Thimble type integrated circuit test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN211086378U true CN211086378U (en) | 2020-07-24 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201921911998.5U Active CN211086378U (en) | 2019-11-07 | 2019-11-07 | Thimble type integrated circuit test fixture |
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| Country | Link |
|---|---|
| CN (1) | CN211086378U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111983424A (en) * | 2020-07-30 | 2020-11-24 | 华润赛美科微电子(深圳)有限公司 | Test fixture and test equipment |
-
2019
- 2019-11-07 CN CN201921911998.5U patent/CN211086378U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111983424A (en) * | 2020-07-30 | 2020-11-24 | 华润赛美科微电子(深圳)有限公司 | Test fixture and test equipment |
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