CN213423232U

CN213423232U - Integrated circuit test probe card and test system protection structure

Info

Publication number: CN213423232U
Application number: CN202020702141.9U
Authority: CN
Inventors: 王�忠
Original assignee: Shanghai Magic Valley Ic Technology Co ltd
Current assignee: Shanghai Magic Valley Ic Technology Co ltd
Priority date: 2020-04-30
Filing date: 2020-04-30
Publication date: 2021-06-11
Anticipated expiration: 2030-04-30

Abstract

The utility model discloses an integrated circuit test probe card and test system protection architecture, which comprises a fixed block, be equipped with the sliding tray on the fixed block, it leads to the groove to be equipped with the installation in the fixed block, the installation leads to the inslot and is equipped with the rotation and adsorbs the piece, the inslot sliding connection has test probe in the installation leads to, be equipped with the pivot mechanism that is used for realizing connecting wire intercommunication test probe on the fixed block, be equipped with the coupling mechanism who is used for realizing two test probe connections on the fixed block. The utility model discloses rational in infrastructure, through setting up the fixed block, be connected test probe and connecting wire disconnect-type, avoid connecting wire and test probe's lug connection, avoid test probe to take place the condemned phenomenon of fusing because of the increase of connecting wire electric current, realize keeping fixed adjustable to the distance between the test probe through setting up link mechanism, reduce a plurality of distance circuits in the testing process, to the work load of test probe's distance regulation when reducing artifical test.

Description

Integrated circuit test probe card and test system protection structure

Technical Field

The utility model relates to an integrated circuit technical field especially relates to an integrated circuit test probe card and test system protection architecture.

Background

In semiconductor manufacturing, an integrated circuit chip needs to be tested after being processed, and the integrated circuit chip is usually tested by an integrated circuit testing system such as ATE (automatic Test Equipment). During the wafer testing process, since the chip area on the wafer is small and cannot be connected with ATE by a direct method to test the electrical parameters, a probe card with probes is introduced for switching.

The existing test probe is usually in direct contact with a connecting wire when in use, and when in test use, if the short circuit phenomenon occurs in a test circuit, the current at the tail end of the test probe is increased, the tail end of the test probe is melted, and the probe is scrapped. In addition, the existing test probe is usually separated when in use, the test of the circuit is realized by holding the probes at two ends, when a large number of repeat distance wafer circuits are tested in the circuit, the operation requirement on a user is strict, and the damage of the test probe can be caused by slight dislocation.

SUMMERY OF THE UTILITY MODEL

The utility model aims at solving the shortcoming that exists among the prior art, and the integrated circuit test probe card and test system protection architecture who proposes, it is through setting up the fixed block, be connected test probe and connecting wire disconnect-type, avoid connecting wire and test probe's lug connection, avoid test probe to take place fusing condemned phenomenon because of the increase of connecting wire electric current, realize keeping fixed adjustable to the distance between the test probe through setting up link mechanism, reduce a plurality of distance circuits in the testing process, to the work load of test probe's distance regulation when reducing artifical test.

In order to achieve the above purpose, the utility model adopts the following technical scheme:

the utility model provides an integrated circuit test probe card and test system protection architecture, includes the fixed block, be equipped with the sliding tray on the fixed block, be equipped with the logical groove of installation in the fixed block, the logical inslot of installation is equipped with the rotation and adsorbs the piece, the inslot sliding connection has test probe in the installation, be equipped with the pivot mechanism that is used for realizing connecting wire intercommunication test probe on the fixed block, be equipped with the coupling mechanism who is used for realizing two test probe connections on the fixed block, fixedly connected with installation piece on the fixed block, be equipped with on the installation piece and be used for realizing test probe pivoted link mechanism.

Preferably, pivot mechanism is including setting up the rotation groove on the fixed block, it is connected with the connecting axle to rotate the inslot internal rotation, fixedly connected with connecting block on the connecting axle, sliding connection has the joint pole on the connecting axle, joint pole end-to-end connection has the installation to lead to the groove.

Preferably, coupling mechanism is including setting up the spread groove on the fixed block and the butt joint piece that corresponds the spread groove, be equipped with the joint groove in the spread groove, sliding connection has the butt joint board in the spread groove, the end of butt joint board is equipped with the cooperation groove, the terminal fixedly connected with joint piece of butt joint board, fixedly connected with spring rod on the joint piece, spring rod sliding connection is in the butt joint inboard, joint piece sliding connection is in the joint inslot, fixedly connected with fixture block on the butt joint piece.

Preferably, link mechanism establishes the sleeve pipe at the connecting wire including the cover, it is connected with the head rod to rotate on the sleeve pipe, it is connected with the second connecting rod to rotate on the head rod, the terminal fixedly connected with of second connecting rod promotes the sleeve pipe, the lower terminal surface fixedly connected with sliding block of second connecting rod, sliding block sliding connection is in the sliding tray.

Preferably, the fixing block is made of thermoplastic plastics.

Preferably, the connecting block, the connecting shaft and the test probe are made of the same material.

Compared with the prior art, the utility model, its beneficial effect does:

1. the connecting wire and the test probe are movably connected by arranging the rotating shaft mechanism.

2. The distance between the test probes is kept fixed and adjustable by arranging the connecting rod mechanism, a plurality of distance circuits are reduced in the detection process, and the workload of distance adjustment of the test probes during manual test is reduced.

3 realize the quick locking between the fixed block fixedly, convenient user's operation through setting up coupling mechanism.

Drawings

Fig. 1 is a schematic view of a front view cross-sectional structure of an integrated circuit test probe card and a test system protection structure according to the present invention;

fig. 2 is a schematic diagram of a connection structure of an integrated circuit test probe card and a test system protection structure according to the present invention;

fig. 3 is an enlarged schematic view of a structure at a position a of the protection structure of the integrated circuit test probe card and the test system according to the present invention.

In the figure: the test device comprises a fixing block 1, a through groove 2 for installation, a push sleeve 3, a rotary adsorption block 4, a test probe 5, a second connecting rod 6, a first connecting rod 7, a sleeve 8, a sliding groove 9, a sliding block 10, a rotary groove 11, a connecting block 12, a connecting shaft 13, a connecting groove 14, a butt joint plate 15, a butt joint block 16, a clamping block 17, a clamping groove 18, a clamping block 19, a matching groove 20 and a spring rod 21.

Detailed Description

In order to make the above objects, features and advantages of the present invention more comprehensible, embodiments of the present invention are described in detail below with reference to the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. The present invention can be embodied in many different forms other than those specifically described herein, and it will be apparent to those skilled in the art that similar modifications can be made without departing from the spirit and scope of the invention, and it is therefore not to be limited to the specific embodiments disclosed below.

It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical," "horizontal," "left," "right," and the like as used herein are for illustrative purposes only and do not represent the only embodiments.

Referring to fig. 1-3, an integrated circuit test probe card and test system protection structure comprises a fixed block 1, a sliding groove 9 is arranged on the fixed block 1, an installation through groove 2 is arranged in the fixed block 1, a rotation adsorption block 4 is arranged in the installation through groove 2, a test probe 5 is slidably connected in the installation through groove 2, a rotating shaft mechanism used for realizing connection of a connecting wire and the test probe is arranged on the fixed block 1, a connecting mechanism used for realizing connection of the two test probes is arranged on the fixed block 1, an installation block is fixedly connected on the fixed block 1, and a connecting rod mechanism used for realizing rotation of the test probe is arranged on.

The utility model discloses in, pivot mechanism is including setting up rotation groove 11 on

fixed block

1, and 11 internal rotations in rotation groove are connected with connecting axle 13, and fixedly connected with connecting block 12 on the connecting axle 13, sliding connection have the joint pole on the connecting axle 13, and joint pole end-to-end connection has the installation to lead to groove 2, through the swing joint that sets up pivot mechanism realization connecting wire and test probe.

Coupling mechanism is including setting up spread groove 14 on fixed block 1 and the butt joint piece 16 that corresponds spread groove 14, be equipped with joint groove 18 in the spread groove 14, sliding connection has butt joint plate 15 in the spread groove 14, butt joint plate 15's end is equipped with cooperation groove 20, butt joint plate 15's terminal fixedly connected with joint piece 19, fixedly connected with spring rod 21 on the joint piece 19, spring rod 21 sliding connection is in

butt joint plate

15, 19 sliding connection of joint piece are in joint groove 18, fixedly connected with fixture block 17 on the butt joint piece 16, it is fixed to realize the quick locking between the fixed block through setting up coupling mechanism, convenient user's operation.

Link mechanism establishes the sleeve pipe 8 at the connecting wire including the cover, it is connected with head rod 7 to rotate on the sleeve pipe 8, it is connected with second connecting rod 6 to rotate on the head rod 7, the terminal fixedly connected with of second connecting rod 6 promotes sleeve pipe 3, the lower terminal surface fixedly connected with sliding block 10 of second connecting rod 6, sliding block 10 sliding connection is in sliding tray 9, fixed block 1 is the thermoplastic material, connecting block 12, connecting

axle

13 and 5 material looks of test probe, realize keeping fixed adjustable to the distance between the test probe through setting up link mechanism, reduce a plurality of distance circuits in the testing process, to the work load of the distance regulation of test probe when reducing artifical test.

The utility model discloses during the use, as shown in fig. 3, at first through realizing connecting wire and test probe 5's being connected connecting wire and connecting block 12 joint, the multi-angle that realizes the connecting wire is connected in the rotation of rotating groove 11 through connecting axle 13 rotates, fixed agreeing with of realizing the fixed block through the joint piece 19 on butt joint piece 15 and the joint of fixture block 17 through butt joint piece 16 and spread groove 14 realizes the distance between two test probe 5, first connecting rod 7 through rotating the connection on the sleeve pipe 8 drives second connecting rod 6 and second connecting rod 6 on sliding tray 9 remove the realization through the angle that push sleeve 3 drove test probe 5 and deflect.

The above, only be the concrete implementation of the preferred embodiment of the present invention, but the protection scope of the present invention is not limited thereto, and any person skilled in the art is in the technical scope of the present invention, according to the technical solution of the present invention and the utility model, the concept of which is equivalent to replace or change, should be covered within the protection scope of the present invention.

Claims

1. The utility model provides an integrated circuit test probe card and test system protection architecture, includes fixed block (1), its characterized in that, be equipped with sliding tray (9) on fixed block (1), be equipped with the logical groove of installation (2) in fixed block (1), the installation is equipped with in leading to groove (2) and rotates adsorption block (4), the installation leads to groove (2) sliding connection has test probe (5), be equipped with the pivot mechanism that is used for realizing connecting wire intercommunication test probe on fixed block (1), be equipped with the coupling mechanism who is used for realizing two test probe connections on fixed block (1), fixedly connected with installation piece on fixed block (1), be equipped with on the installation piece and be used for realizing test probe pivoted link mechanism.

2. The integrated circuit test probe card and test system protection structure of claim 1, wherein the rotation shaft mechanism comprises a rotation groove (11) disposed on the fixed block (1), a connection shaft (13) is rotatably connected in the rotation groove (11), a connection block (12) is fixedly connected to the connection shaft (13), a clamping rod is slidably connected to the connection shaft (13), and the clamping rod is connected to an end of the installation through groove (2).

3. The integrated circuit test probe card and test system protection structure of claim 1, wherein the connection mechanism comprises a connection slot (14) disposed on the fixed block (1) and a docking block (16) corresponding to the connection slot (14), a clamping slot (18) is disposed in the connection slot (14), a docking plate (15) is slidably connected in the connection slot (14), a mating slot (20) is disposed at a terminal of the docking plate (15), a clamping block (19) is fixedly connected at a terminal of the docking plate (15), a spring rod (21) is fixedly connected on the clamping block (19), the spring rod (21) is slidably connected in the docking plate (15), the clamping block (19) is slidably connected in the clamping slot (18), and a clamping block (17) is fixedly connected on the docking block (16).

4. The integrated circuit test probe card and test system protection structure of claim 1, wherein the link mechanism comprises a sleeve (8) sleeved on the connection line, a first connection rod (7) is rotatably connected to the sleeve (8), a second connection rod (6) is rotatably connected to the first connection rod (7), a push sleeve (3) is fixedly connected to the end of the second connection rod (6), a sliding block (10) is fixedly connected to the lower end surface of the second connection rod (6), and the sliding block (10) is slidably connected in the sliding groove (9).

5. The integrated circuit test probe card and test system protection structure of claim 1, wherein said fixing block (1) is made of thermoplastic plastic.

6. The integrated circuit test probe card and test system protection structure of claim 2, wherein the connection block (12), the connection shaft (13) and the test probe (5) are made of the same material.