CN213750024U - Radio frequency probe testing device - Google Patents
Radio frequency probe testing device Download PDFInfo
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- CN213750024U CN213750024U CN202022890896.9U CN202022890896U CN213750024U CN 213750024 U CN213750024 U CN 213750024U CN 202022890896 U CN202022890896 U CN 202022890896U CN 213750024 U CN213750024 U CN 213750024U
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- probe
- radio frequency
- fixedly connected
- frequency probe
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Abstract
The utility model discloses a radio frequency probe testing arrangement, the regulating part is located the top of base, the test component is located the top of base, it is located to push down the subassembly the top of test component, the riser with base fixed connection, and be located the top of base, be equipped with two vertical spouts on the riser, the diaphragm is located the upside of riser, probe card and two vertical spout cooperatees, the radio frequency probe is located the below of probe card, the probe head is located the below of radio frequency probe, the spring set up in inside the radio frequency probe, just the both ends of spring respectively with the radio frequency probe with the probe head contacts, through above-mentioned structural design, can make when protecting the PCBA board, also be convenient for adjust the test to the different models of PCBA board.
Description
Technical Field
The utility model relates to a test equipment technical field especially relates to radio frequency probe testing arrangement.
Background
Currently, a testing device is a tool for testing mechanical, electrical and other handicrafts, and is mainly used as a tool for assisting in controlling positions or actions. The jig can be divided into a process assembly type jig, a project test type jig and a circuit board test type jig, when the PCBA is produced, a radio frequency test is required, and at the moment, the test jig is required.
The radio frequency test fixture of current collection PCBA board adopts the mode of directly pressing to descend the probe card more, with the probe of probe card and the test point contact of the PCBA board that needs the test, causes probe and PCBA board striking very easily at the in-process that pushes down to make probe or PCBA board damage, there is certain not enough, and the PCBA board of the fixed model of radio frequency test fixture more that has now, and it is comparatively inconvenient to use.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide a radio frequency probe testing arrangement, the test point contact of the PCBA board of the test that aims at solving among the prior art makes the probe cause the damage with the striking of PCBA board pushing down in-process, and can only the PCBA board of fixed test model, uses comparatively inconvenient technical problem.
In order to achieve the above object, the radio frequency probe testing device adopted by the present invention comprises a base, an adjusting component, a testing component and a pressing component, wherein the adjusting component is fixedly connected with the base and is located above the base, the testing component is arranged above the base, the pressing component is fixedly connected with the testing component and is located above the testing component, the testing component comprises a vertical plate, a transverse plate, a probe plate, a spring, a radio frequency probe and a probe head, the vertical plate is fixedly connected with the base and is located above the base, the vertical plate is provided with two vertical chutes, the transverse plate is fixedly connected with the vertical plate and is located on the upper side of the vertical plate, the probe plate is matched with the two vertical chutes, the radio frequency probe is fixedly connected with the probe plate and is located below the probe plate, the probe head is fixedly connected with the radio frequency probe and is positioned below the radio frequency probe, the spring is arranged in the radio frequency probe, and two ends of the spring are respectively fixed with the radio frequency probe and the probe head.
The pressing assembly comprises a telescopic rod and an air cylinder, the air cylinder is fixedly connected with the transverse plate and located above the transverse plate, one end of the telescopic rod is fixedly connected with the output end of the air cylinder, and the other end of the telescopic rod penetrates through the transverse plate and is fixedly connected with the probe card.
The radio frequency probe testing device further comprises an installation block, wherein the installation block is fixedly connected with the telescopic rod and is positioned above the probe board
The adjusting assembly comprises a placing plate and two sliding blocks, two transverse sliding grooves are formed in the base, the placing plate is fixedly connected with the base and located above the base, and the two sliding blocks are movably connected with the two transverse sliding grooves and located on the side edges of the sliding blocks.
The radio frequency probe testing device further comprises two abutting blocks, and the side wall of each sliding block is provided with the abutting block.
The radio frequency probe testing device further comprises damping rubber, wherein the damping rubber is fixedly connected with the air cylinder and is positioned on two sides of the air cylinder.
The beneficial effects of the utility model are embodied in: the probe card is arranged above the base through the adjusting component, the testing component is arranged above the adjusting component, the pressing component is arranged above the testing component, the vertical plate is arranged above the base, the transverse plate is arranged above the vertical plate, two vertical sliding grooves are formed in the vertical plate, the probe card is matched with the two vertical sliding grooves in the vertical plate, the probe card can slide down gradually, the radio frequency probe is arranged below the probe card, the spring is arranged in the radio frequency probe, two ends of the spring are respectively contacted with the radio frequency probe and the probe head, the spring is arranged in the radio frequency probe and is connected with the probe head, and when the probe card slides down gradually along the two sliding grooves, the probe head is contacted with a circuit board contact, under the effect of spring, can the protection circuit board, not receive the impact of external force, cause unnecessary damage, the probe head adopts a plurality of sharp-pointed interfaces and circuit board contact, makes during the radio frequency probe can pierce the contact of taking the tin, guarantees the radio frequency probe can reliably be connected with the circuit board, the radio frequency probe of shapes such as point needle, button head needle, concave surface needle, multiple spot point needle can be selected according to the characteristic of circuit board to the radio frequency probe, according to cladding material thickness etc. of circuit board, selects pressure such as 2N, 2.8N the radio frequency probe cooperates the use, when can protecting the PCBA board, also is convenient for adjust the test to the different models of PCBA board.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a schematic structural diagram of the rf probe testing apparatus of the present invention.
Fig. 2 is a front view of the rf probe testing device of the present invention.
Fig. 3 is a side view of the rf probe testing apparatus of the present invention.
Fig. 4 is an enlarged view of a portion of a structure in fig. 2 according to the present invention.
The device comprises a base, a 2-adjusting component, a 21-placing plate, a 22-sliding block, a 23-transverse sliding groove, a 3-testing component, a 31-vertical plate, a 32-transverse plate, a 33-probe plate, a 34-spring, a 35-radio frequency probe, a 36-probe head, a 37-vertical sliding groove, a 4-pressing component, a 41-telescopic rod, a 42-air cylinder, a 5-mounting block, a 6-abutting block and 7-damping rubber.
Detailed Description
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are exemplary and intended to be used for explaining the present invention, and should not be construed as limiting the present invention.
In the description of the present invention, it is to be understood that the terms "length", "width", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on those shown in the drawings, and are merely for convenience of description and simplicity of description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be construed as limiting the present invention. In addition, in the description of the present invention, "a plurality" means two or more unless specifically limited otherwise.
Referring to fig. 1 to 4, the present invention provides a radio frequency probe testing apparatus, including a base 1, an adjusting component 2, a testing component 3 and a pressing component 4, wherein the adjusting component 2 is fixedly connected to the base 1 and located above the base 1, the testing component 3 is disposed above the base 1, the pressing component 4 is fixedly connected to the testing component 3 and located above the testing component 3, the testing component 3 includes a vertical plate 31, a horizontal plate 32, a probe plate 33, a spring 34, a radio frequency probe 35 and a probe head 36, the vertical plate 31 is fixedly connected to the base 1 and located above the base 1, the vertical plate 31 is provided with two vertical sliding grooves 37, the horizontal plate 32 is fixedly connected to the vertical plate 31 and located above the vertical plate 31, the probe plate 33 is matched with the two vertical sliding grooves 37, the radio frequency probe 35 is fixedly connected with the probe board 33 and located below the probe board 33, the probe head 36 is fixedly connected with the radio frequency probe 35 and located below the radio frequency probe 35, the spring 34 is disposed inside the radio frequency probe 35, and two ends of the spring 34 are respectively fixed with the radio frequency probe 35 and the probe head 36.
In the present embodiment, the adjusting component 2 is disposed above the base 1, the testing component 3 is disposed above the adjusting component 2, the pressing component 4 is disposed above the testing component 3, the vertical plate 31 is disposed above the base 1, the horizontal plate 32 is disposed above the vertical plate 31, two vertical sliding grooves 37 are disposed on the vertical plate 31, the probe plate 33 is matched with the two vertical sliding grooves 37 on the vertical plate 31, the probe plate 33 can slide down gradually, the rf probe 35 is disposed below the probe plate 33, the spring 34 is disposed inside the rf probe 35, and two ends of the spring 34 are respectively in contact with the rf probe 35 and the probe head 36, the spring 34 is disposed inside the rf probe 35 and connected with the probe head 36, probe card 33 is along two when the spout progressively descends, probe head 36 just contacts with the circuit board contact, under the effect of spring 34, can protect the circuit board, do not receive the impact of external force, cause unnecessary damage, probe head 36 adopts a plurality of sharp-pointed interfaces and circuit board contact, makes during radio frequency probe 35 can pierce the contact of taking the tin, guarantee radio frequency probe 35 can reliably be connected with the circuit board, radio frequency probe 35 can select the radio frequency probe of shapes such as point needle, bull-nose needle, multiple spot sharp needle according to the characteristic of circuit board, according to the cladding material thickness of circuit board etc. selects 2N, 2.8N wait pressure radio frequency probe 35 cooperatees and uses, when can protecting the PCBA board, also can adjust the test to the different models of PCBA board.
Further, the pressing assembly 4 includes an expansion link 41 and an air cylinder 42, the air cylinder 42 is fixedly connected to the transverse plate 32 and located above the transverse plate 32, one end of the expansion link 41 is fixedly connected to an output end of the air cylinder 42, and the other end of the expansion link 41 penetrates through the transverse plate 32 and is fixedly connected to the probe card 33.
In this embodiment, the air cylinder 42 is disposed above the transverse plate 32, one end of the telescopic rod 41 is fixedly connected to an output end of the telescopic rod 41 of the air cylinder 42, the other end of the telescopic rod 41 penetrates through the transverse plate 32 and is fixedly connected to the probe board 33, the air cylinder 42 is started, the output end of the air cylinder 42 pushes the telescopic rod 41 downwards step by step, the telescopic rod 41 extends, the probe board 33 is slowly pressed down along the two vertical sliding grooves 37, and the radio frequency probe 35 fixedly connected to the probe board 33 is contacted with a circuit board for testing.
Further, the radio frequency probe testing device further comprises an installation block 5, and the installation block 5 is fixedly connected with the telescopic rod 41 and is located above the probe board 33.
In this embodiment, the mounting block 5 is disposed above the probe board 33, and the telescopic rod 41 is fixedly connected to the mounting block 5, so that the connection between the telescopic rod 41 and the probe board 33 can be more fixed, the service lives of the telescopic rod 41 and the probe board 33 can be prolonged, and the probe board 33 can be more stable during testing.
Further, the adjusting assembly 2 includes a placing plate 21 and two sliding blocks 22, two transverse sliding grooves 23 are provided on the base 1, the placing plate 21 is fixedly connected with the base 1 and is located above the base 1, and the two sliding blocks 22 are respectively movably connected with the two transverse sliding grooves 23 and are located above the base 1.
In this embodiment, because the base 1 is provided with two horizontal sliding grooves 23, two sliders 22 and two sliding grooves cooperate, the placing plate 21 is disposed above the base 1, and the PCBA board can be placed, two sliders 22 will be abutted and fixed to the PCBA board along the horizontal sliding grooves 23, and the probe plate 33 slides down to drive the radio frequency probe 35, so that the PCBA board can be tested.
Further, the radio frequency probe testing device further comprises two abutting blocks 6, and the abutting block 6 is arranged on the side wall of each sliding block 22.
In this embodiment, the two abutting blocks 6 are respectively disposed on the side edges of the two sliding blocks 22, and when the two sliding blocks 22 fix the PCBA board on the placing plate 21, the two abutting blocks 6 can fix the PCBA board, thereby reinforcing the abutting effect of the PCBA board.
Further, the radio frequency probe testing device further comprises a damping rubber 7, wherein the damping rubber 7 is fixedly connected with the air cylinder 42 and is positioned on two sides of the air cylinder 42.
In this embodiment, the damping rubber 7 is disposed on two sides of the cylinder 42, the damping rubber 7 has a damping effect, and can stabilize the cylinder 42, and when the cylinder 42 operates, the cylinder 42 can be stabilized, so that the test effect is not affected by the vibration of the cylinder 42.
While the invention has been described with reference to a preferred embodiment, it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention.
Claims (6)
1. The radio frequency probe testing device is characterized by comprising a base, an adjusting component, a testing component and a pressing component, wherein the adjusting component is fixedly connected with the base and positioned above the base, the testing component is arranged above the base, the pressing component is fixedly connected with the testing component and positioned above the testing component, the testing component comprises a vertical plate, a transverse plate, a probe plate, a spring, a radio frequency probe and a probe head, the vertical plate is fixedly connected with the base and positioned above the base, two vertical sliding grooves are arranged on the vertical plate, the transverse plate is fixedly connected with the vertical plate and positioned on the upper side of the vertical plate, the probe plate is matched with the two vertical sliding grooves, the radio frequency probe is fixedly connected with the probe plate and positioned below the probe plate, and the probe head is fixedly connected with the radio frequency probe, and the spring is arranged in the radio frequency probe, and two ends of the spring are respectively fixed with the radio frequency probe and the probe head.
2. The radio frequency probe test apparatus of claim 1,
the pressing assembly comprises a telescopic rod and an air cylinder, the air cylinder is fixedly connected with the transverse plate and is positioned above the transverse plate, one end of the telescopic rod is fixedly connected with the output end of the air cylinder, and the other end of the telescopic rod penetrates through the transverse plate and is fixedly connected with the probe card.
3. The radio frequency probe test apparatus of claim 2,
the radio frequency probe testing device further comprises an installation block, wherein the installation block is fixedly connected with the telescopic rod and is positioned above the probe board.
4. The radio frequency probe test apparatus of claim 1,
the adjusting component comprises a placing plate and two sliding blocks, wherein the base is provided with two transverse sliding grooves, the placing plate is fixedly connected with the base and is positioned above the base, and the two sliding blocks are respectively movably connected with the two transverse sliding grooves and are positioned on the side edges of the sliding blocks.
5. The radio frequency probe test apparatus of claim 4,
the radio frequency probe testing device further comprises two abutting blocks, and the abutting blocks are arranged on the side wall of each sliding block.
6. The radio frequency probe test apparatus of claim 2,
the radio frequency probe testing device further comprises damping rubber, wherein the damping rubber is fixedly connected with the air cylinder and is positioned on two sides of the air cylinder.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202022890896.9U CN213750024U (en) | 2020-12-02 | 2020-12-02 | Radio frequency probe testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202022890896.9U CN213750024U (en) | 2020-12-02 | 2020-12-02 | Radio frequency probe testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN213750024U true CN213750024U (en) | 2021-07-20 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202022890896.9U Active CN213750024U (en) | 2020-12-02 | 2020-12-02 | Radio frequency probe testing device |
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| Country | Link |
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| CN (1) | CN213750024U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113640645A (en) * | 2021-07-28 | 2021-11-12 | 孙瑞 | Integrated circuit IC testing device |
| CN116318446A (en) * | 2023-04-18 | 2023-06-23 | 成都美数科技有限公司 | Radio frequency transceiver module testing arrangement |
| CN117310231A (en) * | 2023-11-29 | 2023-12-29 | 江苏惠达电子科技有限责任公司 | Frequency measuring device for multi-size element single body |
-
2020
- 2020-12-02 CN CN202022890896.9U patent/CN213750024U/en active Active
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113640645A (en) * | 2021-07-28 | 2021-11-12 | 孙瑞 | Integrated circuit IC testing device |
| CN113640645B (en) * | 2021-07-28 | 2024-04-30 | 江西芯诚微电子有限公司 | IC testing device for integrated circuit |
| CN116318446A (en) * | 2023-04-18 | 2023-06-23 | 成都美数科技有限公司 | Radio frequency transceiver module testing arrangement |
| CN116318446B (en) * | 2023-04-18 | 2024-01-23 | 成都美数科技有限公司 | Radio frequency transceiver module testing arrangement |
| CN117310231A (en) * | 2023-11-29 | 2023-12-29 | 江苏惠达电子科技有限责任公司 | Frequency measuring device for multi-size element single body |
| CN117310231B (en) * | 2023-11-29 | 2024-02-09 | 江苏惠达电子科技有限责任公司 | Frequency measuring device for multi-size element single body |
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