CN205643624U - A test fixture for integrated circuit tests sorter with locate function - Google Patents
A test fixture for integrated circuit tests sorter with locate function Download PDFInfo
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- CN205643624U CN205643624U CN201620261370.5U CN201620261370U CN205643624U CN 205643624 U CN205643624 U CN 205643624U CN 201620261370 U CN201620261370 U CN 201620261370U CN 205643624 U CN205643624 U CN 205643624U
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Abstract
The utility model relates to a test fixture for integrated circuit tests sorter with locate function. The test support is connected on testing base through three -dimensional guiding mechanism, and the briquetting stopper is installed at the top of test support, and it has the notch to open in the middle of the briquetting stopper, and the test briquetting is placed in the notch of briquetting stopper and can be reciprocated, installing two vertical guiding axles between test support and briquetting stopper, being equipped with two guide holes on the test briquetting, the test briquetting constitutes the slide steering cooperation through guide hole on it and guiding axle, compression spring sets up between test support and test briquetting, and the test support is connected to the compression spring lower extreme, and compression spring connects the upper end test briquetting, test briquetting top installation testing collets, both sides press from both sides respectively around the test support tightly has a test spring, symmetry around two test springs. The utility model discloses can carry out position correction to integrated circuit automatically, guarantee that the integrated circuit pin is good with the test spring contact, improvement test quality.
Description
Technical field
The present invention relates to a kind of test fixture, a kind of test fixture for integrated circuit test sorting machine with positioning function, belong to integrated circuit testing and sorting equipment technical field.
Background technology
Integrated circuit test sorting machine for carrying out electric performance test and classifying integrated circuit according to test result to integrated circuit.Test fixture is very important parts of testing, sorting machine.In the work process of testing, sorting machine, vacuum WAND is drawn integrated circuit and is moved to above the test fixture of testing, sorting machine, by pressing under mechanism controls vacuum WAND, absorption is pressed on the test spring of test fixture at the sea-gull type pin of the integrated circuit of vacuum WAND end, and one_to_one corresponding, carry out electric performance test.Require pin and the test spring aligned in position of integrated circuit during test, thus integrated circuit pin directly affects the test result of integrated circuit with the situation that contacts of test spring.
In the past, owing to integrated circuit volume is relatively big, its pin-pitch was the biggest, and the position accuracy demand contacted circuit pin with test spring during test is the highest, and generally the test fixture without positioning function just can meet test request.Along with the portability of terminal consumption electronics and save the requirement of electric power etc., the integrated circuit quantity of ultra-miniature package form rapidly increases, account for more than the 70% of IC market total amount at present, its principal character show as that chip volume is little, pin is many and intensive, integrated functionality is powerful, therefore the requirement to test fixture is higher.If the location between integrated circuit pin and test spring is accurate not, it is likely to result in integrated circuit pin and does not reaches position with test spring, cause testing yield low, even cause short circuit between integrated circuit pin, burn integrated circuit.
Summary of the invention
It is an object of the invention to overcome the deficiencies in the prior art, a kind of test fixture for integrated circuit test sorting machine is provided, there is integrated circuit automatic positioning function, can be under vacuum WAND absorption integrated circuit during pressure, automatically integrated circuit is carried out position correction, ensure that integrated circuit pin contacts well with test spring, thus improve test quality.
The technical scheme provided according to the present invention: a kind of test fixture for integrated circuit test sorting machine with positioning function, including testing base, support for testing, briquetting limited block, test briquetting, test collets, compression spring, the axis of guide and test spring；Described support for testing is connected in testing base by three-dimension adjusting mechanism, and briquetting limited block is arranged on the top of support for testing, has notch in the middle of briquetting limited block；In described test briquetting is placed in the notch of briquetting limited block and can move up and down, briquetting limited block limits the stroke that test briquetting moves up；Being provided with two vertical axis of guides between support for testing and briquetting limited block, described test briquetting is provided with two guide holes, and test briquetting constitutes slide-and-guide by guide hole thereon with the described axis of guide and coordinates；Compression spring is arranged between support for testing and test briquetting, compression spring lower end connecting test bearing, compression spring upper end connecting test briquetting, and test briquetting can move back and forth up and down under compression spring effect along the axis of guide；Described test briquetting top is installed with the test collets for support integrated circuit, and before and after described support for testing, there is a symmetry before and after the test spring contacted with integrated circuit pin, two test springs both sides with the clamping of reed fixation kit respectively.
As a further improvement on the present invention, described three-dimension adjusting mechanism includes horizontal adjustment block, lower vertical regulating block and upper vertical regulating block；Described horizontal adjustment block is placed in testing base and is attached thereto by laterally adjusting assembly and longitudinally adjusted assembly；The described assembly that laterally adjusts is arranged on testing base right-hand member, laterally adjust assembly and include lateral adjustments bolt, lateral adjustments pad, lateral adjustments slide block and located lateral pin, it is provided with horizontal concrete chute in the middle part of described testing base right-hand member, described lateral adjustments slide block is placed in horizontal concrete chute, described lateral adjustments pad is fixed on testing base right side, described lateral adjustments bolt thread is connected on lateral adjustments pad, threadeding with lateral adjustments slide block in lateral adjustments bolt the inner, drives lateral adjustments slide block to horizontally slip in horizontal concrete chute when lateral adjustments bolt rotates；Described located lateral pin lower end is fixed on lateral adjustments slide block, and the upper end activity of located lateral pin is plugged in the pin-and-hole on horizontal adjustment block；Described lateral adjustments slide block is connected with horizontal adjustment block by located lateral pin；Described longitudinally adjusted assembly is arranged on testing base side, longitudinally adjusted assembly includes longitudinally regulating bolt, longitudinally regulation pad, longitudinal adjusting slider and longitudinal register pin, longitudinal chute it is provided with in described testing base, described longitudinal adjusting slider is placed in longitudinal chute, described longitudinally regulation pad is fixed on testing base side, described longitudinally regulation bolt thread is connected to longitudinally regulate on pad, longitudinally the inner and longitudinal adjusting slider of regulation bolt is threadeded, and longitudinal regulation bolt drives longitudinal adjusting slider slide anteroposterior in longitudinal direction chute when rotating；Described longitudinal register pin lower end is fixed on longitudinal adjusting slider, and the upper end activity of longitudinal register pin is plugged in the horizontal mounting hole on horizontal adjustment block；Described lower vertical regulating block is bolted on horizontal adjustment block by first, and described vertical regulating block is bolted on lower vertical regulating block by second, and on described lower vertical regulating block, the hole for installation the second bolt is vertical mounting hole；Described support for testing is connected on vertical regulating block.
As a further improvement on the present invention, described reed fixation kit includes that reed fixes horizontal block and reed c-type fixed block, horizontal block fixed by described reed and reed c-type fixed block is respectively fixedly connected with in support for testing side, and described test spring is clamped in reed and fixes horizontal block, between reed c-type fixed block and support for testing.
As a further improvement on the present invention, described reed is fixed and is machined with elongated slot on horizontal block, on the horizontal frame of described reed c-type fixed block, two pieces is installed and can move left and right the reed fixture block of adjustment, two pieces reed fixture block is stuck in test spring both sides, adjusts reed fixture block by transverse moving left and right and just can finely tune the position of test spring.
As a further improvement on the present invention, the notch of described briquetting limited block is arranged over slope and symmetrical.
As a further improvement on the present invention, the upper surface of described test collets is provided with groove, and before and after described groove, limit internal face is slope and symmetrically.
As a further improvement on the present invention, before and after described groove, limit internal face is arc slope.
As a further improvement on the present invention, fastened by outline card between described test briquetting and test collets.
As a further improvement on the present invention, described test briquetting is nonconductive metal material, and described test collets are rigid plastics class nonmetallic materials.
Compared with the prior art the present invention, has the advantage thatPresent configuration is simple, compact, reasonable, there is integrated circuit positioning function, it is possible under vacuum WAND end-attachment integrated circuit during pressure, integrated circuit is carried out position adjustment and location, improve the pin of integrated circuit and the contact precision of test spring, and then improve the quality of test.
Accompanying drawing explanation
Fig. 1 is the perspective view of the embodiment of the present invention.
Fig. 2 is A portion enlarged drawing in Fig. 1.
Fig. 3 is the structure sectional view of the embodiment of the present invention.
Fig. 4 is the partial enlarged drawing in Fig. 3.
Description of reference numerals: 1-testing base, 2-horizontal adjustment block, vertical regulating block under 3-, the upper vertical regulating block of 4-, 5-support for testing, 6-briquetting limited block, 7-tests briquetting, 8-tests collets, 9-compression spring, the 10-axis of guide, horizontal block fixed by 11-reed, 12-reed c-type fixed block, 13-reed fixture block, 14-test spring, 15-vacuum WAND, 16-integrated circuit, 17.1-lateral adjustments bolt, 18.1-lateral adjustments pad, 19.1-lateral adjustments slide block, 20.1-located lateral pin, 17.2-longitudinally regulation bolt, 18.2-longitudinally regulation pad, 19.2-longitudinal adjusting slider, 20.2-longitudinal register pin, 21-the first bolt, 22-the second bolt.
Detailed description of the invention
Below in conjunction with concrete drawings and Examples, the invention will be further described.
As shown in the figure: embodiment is a kind of test fixture for integrated circuit 16 testing, sorting machine with positioning function, it is mainly by testing base 1, horizontal adjustment block 2, the most vertical regulating block 3, upper vertical regulating block 4, support for testing 5, briquetting limited block 6, test briquetting 7, test collets 8, compression spring 9, the axis of guide 10, horizontal block 11 fixed by reed, reed c-type fixed block 12, reed fixture block 13, test spring 14, lateral adjustments bolt 17.1, lateral adjustments pad 18.1, lateral adjustments slide block 19.1, located lateral pin 20.1, longitudinally regulation bolt 17.2, longitudinally regulation pad 18.2, longitudinal adjusting slider 19.2, longitudinal register pin 20.2, first bolt 21 and the second bolt 22 etc. form.
As shown in Fig. 1 ~ Fig. 4, described support for testing 5 is connected in testing base 1 by three-dimension adjusting mechanism, briquetting limited block 6 is arranged on the top of support for testing 5, notch is had in the middle of briquetting limited block 6, described test briquetting is put 7 and and can be moved up and down in the notch of briquetting limited block 6, and briquetting limited block 6 limits the stroke that test briquetting 7 moves up；Being provided with two vertical axis of guides 10 between support for testing 5 and briquetting limited block 6, described test briquetting 7 is provided with two guide holes, and test briquetting 7 constitutes slide-and-guide by guide hole thereon with the described axis of guide 10 and coordinates；Compression spring 9 is arranged between support for testing 5 and test briquetting 7, compression spring 9 lower end connecting test bearing 5, compression spring 9 upper end connecting test briquetting 7, and test briquetting 7 can move back and forth up and down under compression spring 9 acts on along the axis of guide 10；Described test briquetting 7 top is installed with the test collets 8 for support integrated circuit 16, before and after described support for testing 5, there is a symmetry before and after the test spring 14 contacted with integrated circuit 16 pin, two test springs 14 both sides with the clamping of reed fixation kit respectively.
As shown in Fig. 1 ~ Fig. 4, in the present embodiment, described three-dimension adjusting mechanism mainly includes horizontal adjustment block 2, lower vertical regulating block 3 and upper vertical regulating block 4；Described horizontal adjustment block 2 is placed in testing base 1 and is attached thereto by laterally adjusting assembly and longitudinally adjusted assembly；The described assembly that laterally adjusts is arranged on testing base 1 right-hand member, laterally adjust assembly and include lateral adjustments bolt 17.1, lateral adjustments pad 18.1, lateral adjustments slide block 19.1 and located lateral pin 20.1, it is provided with horizontal concrete chute in the middle part of described testing base 1 right-hand member, described lateral adjustments slide block 19.1 is placed in horizontal concrete chute, described lateral adjustments pad 18.1 is fixed on testing base 1 right side, described lateral adjustments bolt 17.1 is threaded on lateral adjustments pad 18.1, threaded with lateral adjustments slide block 19.1 in lateral adjustments bolt 17.1 the inner, lateral adjustments slide block 19.1 is driven to horizontally slip in horizontal concrete chute when lateral adjustments bolt 17.1 rotates；Described located lateral pin 20.1 lower end is fixed on lateral adjustments slide block 19.1, and located lateral pin 20.1 upper end activity is plugged in the pin-and-hole on horizontal adjustment block 2；Described lateral adjustments slide block 19.1 is connected with horizontal adjustment block 2 by located lateral pin 20.1；Described longitudinally adjusted assembly is arranged on testing base 1 side, longitudinally adjusted assembly includes longitudinally regulating bolt 17.2, longitudinally regulation pad 18.2, longitudinal adjusting slider 19.2 and longitudinal register pin 20.2, it is provided with longitudinal chute in described testing base 1, described longitudinal adjusting slider 19.2 is placed in longitudinal chute, described longitudinally regulation pad 18.2 is fixed on testing base 1 side, described longitudinally regulation bolt 17.2 is threaded in and longitudinally regulates on pad 18.2, longitudinally regulation bolt 17.2 is inner and longitudinal direction adjusting slider 19.2 is threadeded, longitudinally regulation bolt 17.2 drives longitudinal adjusting slider 19.2 slide anteroposterior in longitudinal chute when rotating；Described longitudinal register pin 20.2 lower end is fixed on longitudinal adjusting slider 19.2, and longitudinal register pin 20.2 upper end activity is plugged in the horizontal mounting hole on horizontal adjustment block 2；Described lower vertical regulating block 3 is connected on horizontal adjustment block 2 by the first bolt 21, and described vertical regulating block 4 is connected on lower vertical regulating block 3 by the second bolt 22, and on described lower vertical regulating block 3, the hole for installation the second bolt 22 is vertical mounting hole；Described support for testing 5 is bolted on upper vertical regulating block 4.
The operation principle of three-dimension adjusting mechanism is as follows:
Laterally, longitudinally regulation: drive lateral adjustments slide block about 19.1 transverse shifting by rotating lateral adjustments bolt 17.1, owing to lateral adjustments slide block 19.1 is connected with horizontal adjustment block 2 by located lateral pin 20.1, during lateral adjustments slide block about 19.1 transverse shifting, just drive horizontal adjustment block 2 at the transverse shifting of testing base 1；Vertically move by rotating before and after longitudinally regulation bolt 17.2 drives longitudinal adjusting slider 19.2, owing to longitudinal adjusting slider 19.2 is connected with horizontal adjustment block 2 by longitudinal register pin 20.2, when vertically moving before and after longitudinal adjusting slider 19.2, just drive horizontal adjustment block 2 vertically moving in testing base 1；Thus achieve horizontal adjustment block 2 and parts [including lower vertical regulating block 3, lower vertical regulating block 3 and support for testing 5 etc.] the mounted thereto position adjustments in direction in length and breadth.
Vertical adjustment: first rotate the first bolt 21 unclamped on lower vertical regulating block 3 in mounting hole, in regulation, vertical regulating block 4 is relative to the vertical position of lower vertical regulating block 3, the most again tighten the first bolt 21, be achieved that the support for testing 5 position adjustments at vertical direction.
As shown in Fig. 1 ~ Fig. 4, in the present embodiment, described reed fixation kit is mainly fixed horizontal block 11, reed c-type fixed block 12 and reed fixture block 13 by reed and is formed, horizontal block 11 fixed by described reed and reed c-type fixed block 12 is bolted to connection in support for testing 5 side respectively, and described test spring 14 is clamped in reed and fixes horizontal block 11, between reed c-type fixed block 12 and support for testing 5；Described reed is fixed and is machined with elongated slot on horizontal block 11, on the horizontal frame of described reed c-type fixed block 12, two pieces is installed and can move left and right the reed fixture block 13 of adjustment, two pieces reed fixture block 13 is stuck in test spring 14 both sides, adjusts reed fixture block 13 by transverse moving left and right and just can finely tune the position of test spring 14.
As shown in Figure 1 and Figure 2, in the present embodiment, the upper surface of described test collets 8 is provided with groove, and before and after described groove, limit internal face is slope and symmetrically.Preferably, before and after described groove, limit internal face is arc slope.So during 16 times pressures of integrated circuit, the position of described groove adjustable integrated circuit 16 fore-and-aft direction, integrated circuit 16 is positioned.
As shown in Fig. 1 ~ Fig. 4, in the present embodiment, the notch of described briquetting limited block 6 is arranged over slope and symmetrical.So during 16 times pressures of integrated circuit, the position of slope adjustable integrated circuit 16 left and right directions of briquetting limited block 6, integrated circuit 16 is positioned.
As it is shown on figure 3, in the present embodiment, fastened by outline card between described test briquetting 7 and test collets 8.Described test briquetting 7 preferably employs nonconductive metal material, and described test collets 8 preferably employ rigid plastics class nonmetallic materials.The described axis of guide 10 preferably employs metal material.
Operation principle and the work process of the present invention are as follows:
During work, vacuum WAND 15 end holds integrated circuit and presses for 16 times, until integrated circuit 16 is pressed on test collets 8, then proceedes to down press, and test briquetting 7 overcomes the active force of compression spring 9, moves down along the axis of guide 10.During pressure down, position and right position before and after integrated circuit 16 can be adjusted by the groove of test collets 8 upper surface and the slope of briquetting limited block 6, make integrated circuit 16 be positioned at the center testing collets 8 of test fixture.Reed fixation kit fixes test spring 14 simultaneously, makes test spring 14 be in the centre position of test fixture.After the sea-gull type pin of the lower straightening of integrated circuit 16 continuation to integrated circuit 16 touches test spring 14 one_to_one corresponding contact, vacuum WAND 15 is further continued for down pressing, it is ensured that have good contact stress between integrated circuit 16 pin and test spring 14.Then test spring 14 is applied the signal of telecommunication, integrated circuit 16 is carried out electric performance test.After test terminates, vacuum WAND 15 is lifted, test collets 8 and test briquetting 7 under the active force of compression spring 9 on move, the pin of integrated circuit 16 disengages with test spring 14, i.e. completes the test operation of an integrated circuit 16.In whole test process, integrated circuit 16 decline, test and on move during adsorb the end at vacuum WAND 15 all the time.
Above example only for technology design and the feature of the present invention are described, its object is to allow person skilled in the art will appreciate that present disclosure and to implement accordingly, can not limit the scope of the invention.All impartial changes done according to scope of the invention as claimed and modification, all should belong to the covering scope of the claims in the present invention.
Claims (9)
1. there is the test fixture for integrated circuit test sorting machine of positioning function, including testing base (1), support for testing (5), briquetting limited block (6), test briquetting (7), test collets (8), compression spring (9), the axis of guide (10) and test spring (14)；Described support for testing (5) is connected in testing base (1) by three-dimension adjusting mechanism, briquetting limited block (6) is arranged on the top of support for testing (5), notch is had in the middle of briquetting limited block (6), in described test briquetting (7) is placed in the notch of briquetting limited block (6) and can move up and down, briquetting limited block (6) limits tests the stroke that briquetting (7) moves up；Being provided with two vertical axis of guides (10) between support for testing (5) and briquetting limited block (6), described test briquetting (7) is provided with two guide holes, and test briquetting (7) constitutes slide-and-guide by guide hole thereon with the described axis of guide (10) and coordinates；Compression spring (9) is arranged between support for testing (5) and test briquetting (7), compression spring (9) lower end connecting test bearing (5), compression spring (9) upper end connecting test briquetting (7), test briquetting (7) can move back and forth up and down under compression spring (9) acts on along the axis of guide (10)；Described test briquetting (7) top is installed with the test collets (8) for support integrated circuit (16), before and after described support for testing (5), there is a symmetry before and after the test spring (14) contacted with integrated circuit (16) pin, two test springs (14) both sides with the clamping of reed fixation kit respectively.
There is the test fixture for integrated circuit test sorting machine of positioning function the most as claimed in claim 1, it is characterised in that: described three-dimension adjusting mechanism includes horizontal adjustment block (2), lower vertical regulating block (3) and upper vertical regulating block (4)；Described horizontal adjustment block (2) is placed on testing base (1) and above and is attached thereto by laterally adjusting assembly and longitudinally adjusted assembly；The described assembly that laterally adjusts is arranged on testing base (1) right-hand member, laterally adjust assembly and include lateral adjustments bolt (17.1), lateral adjustments pad (18.1), lateral adjustments slide block (19.1) and located lateral pin (20.1), it is provided with horizontal concrete chute in the middle part of described testing base (1) right-hand member, described lateral adjustments slide block (19.1) is placed in horizontal concrete chute, described lateral adjustments pad (18.1) is fixed on testing base (1) right side, described lateral adjustments bolt (17.1) is threaded on lateral adjustments pad (18.1), threaded with lateral adjustments slide block (19.1) in lateral adjustments bolt (17.1) the inner, lateral adjustments slide block (19.1) is driven to horizontally slip in horizontal concrete chute when lateral adjustments bolt (17.1) rotates；Described located lateral pin (20.1) lower end is fixed on lateral adjustments slide block (19.1), and located lateral pin (20.1) upper end activity is plugged in the pin-and-hole on horizontal adjustment block (2)；Described lateral adjustments slide block (19.1) is connected with horizontal adjustment block (2) by located lateral pin (20.1)；Described longitudinally adjusted assembly is arranged on testing base (1) side, longitudinally adjusted assembly includes longitudinally regulating bolt (17.2), longitudinally regulation pad (18.2), longitudinal adjusting slider (19.2) and longitudinal register pin (20.2), described testing base is provided with longitudinal chute in (1), described longitudinal adjusting slider (19.2) is placed in longitudinal chute, described longitudinally regulation pad (18.2) is fixed on testing base (1) side, described longitudinally regulation bolt (17.2) is threaded in longitudinally regulation pad (18.2), longitudinally regulation bolt (17.2) is inner and longitudinal direction adjusting slider (19.2) is threadeded, longitudinally regulation bolt (17.2) drives longitudinal adjusting slider (19.2) slide anteroposterior in longitudinal chute when rotating；Described longitudinal register pin (20.2) lower end is fixed on longitudinal adjusting slider (19.2), and longitudinal register pin (20.2) upper end activity is plugged in the horizontal mounting hole on horizontal adjustment block (2)；Described lower vertical regulating block (3) is connected on horizontal adjustment block (2) by the first bolt (21), described vertical regulating block (4) is connected on lower vertical regulating block (3) by the second bolt (22), and the upper hole for installing the second bolt (22) of described lower vertical regulating block (3) is vertical mounting hole；Described support for testing (5) is connected on vertical regulating block (4).
There is the test fixture for integrated circuit test sorting machine of positioning function the most as claimed in claim 1, it is characterized in that: described reed fixation kit includes that reed fixes horizontal block (11) and reed c-type fixed block (12), horizontal block (11) fixed by described reed and reed c-type fixed block (12) is respectively fixedly connected with in support for testing (5) side, and described test spring (14) is clamped in reed and fixes between horizontal block (11), reed c-type fixed block (12) and support for testing (5).
There is the test fixture for integrated circuit test sorting machine of positioning function the most as claimed in claim 3, it is characterized in that: described reed is fixed and is machined with elongated slot on horizontal block (11), two pieces is installed on the horizontal frame of described reed c-type fixed block (12) the reed fixture block (13) of adjustment can be moved left and right, two pieces reed fixture block (13) is stuck in test spring (14) both sides, adjusts reed fixture block (13) by transverse moving left and right and just can finely tune the position of test spring (14).
There is the test fixture for integrated circuit test sorting machine of positioning function the most as claimed in claim 1, it is characterised in that: the notch of described briquetting limited block (6) is arranged over slope and symmetrical.
There is the test fixture for integrated circuit test sorting machine of positioning function the most as claimed in claim 1, it is characterised in that: the upper surface of described test collets (8) is provided with groove, and before and after described groove, limit internal face is slope and symmetrically.
There is the test fixture for integrated circuit test sorting machine of positioning function the most as claimed in claim 6, it is characterised in that: before and after described groove, limit internal face is arc slope.
There is the test fixture for integrated circuit (16) testing, sorting machine of positioning function the most as claimed in claim 1, it is characterised in that: fastened by outline card between described test briquetting (7) and test collets (8).
There is the test fixture for integrated circuit (16) testing, sorting machine of positioning function the most as claimed in claim 1, it is characterised in that: described test briquetting (7) is nonconductive metal material, and described test collets (8) are rigid plastics class nonmetallic materials.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620261370.5U CN205643624U (en) | 2016-03-30 | 2016-03-30 | A test fixture for integrated circuit tests sorter with locate function |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620261370.5U CN205643624U (en) | 2016-03-30 | 2016-03-30 | A test fixture for integrated circuit tests sorter with locate function |
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| CN205643624U true CN205643624U (en) | 2016-10-12 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201620261370.5U Active CN205643624U (en) | 2016-03-30 | 2016-03-30 | A test fixture for integrated circuit tests sorter with locate function |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105717441A (en) * | 2016-03-30 | 2016-06-29 | 中科芯集成电路股份有限公司 | Test fixture with positioning function used for integrated circuit testing and sorting machine |
| CN110031748A (en) * | 2019-04-29 | 2019-07-19 | 西安国是电子科技有限公司 | Integrated circuit component test device and test method |
-
2016
- 2016-03-30 CN CN201620261370.5U patent/CN205643624U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105717441A (en) * | 2016-03-30 | 2016-06-29 | 中科芯集成电路股份有限公司 | Test fixture with positioning function used for integrated circuit testing and sorting machine |
| CN110031748A (en) * | 2019-04-29 | 2019-07-19 | 西安国是电子科技有限公司 | Integrated circuit component test device and test method |
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Address after: 2 / F, building 9, block 04-6 (100 didui Road), Liyuan Development Zone, Binhu District, Wuxi City, Jiangsu Province Patentee after: ZHONGKEXIN INTEGRATED CIRCUIT Co.,Ltd. Address before: 214072 Jiangsu city of Wuxi province DiCui Binhu District Liyuan Development Zone, Road No. 100 building 9 layer 2 Patentee before: CHINA KEY SYSTEM & INTEGRATED CIRCUIT Co.,Ltd. |