CN217112419U

CN217112419U - Double-clamping-hand test fixture

Info

Publication number: CN217112419U
Application number: CN202122828220.1U
Authority: CN
Inventors: 张又平
Original assignee: Ningbo Zhenhai Pingyun Precision Machinery Co ltd
Current assignee: Ningbo Zhenhai Pingyun Precision Machinery Co ltd
Priority date: 2021-11-18
Filing date: 2021-11-18
Publication date: 2022-08-02
Anticipated expiration: 2031-11-18

Abstract

The application provides a double-clamping-hand test fixture, which comprises a base, a first positioning plate, a second positioning plate, a first standard plate and a second standard plate, wherein the lower surface of the first standard plate is connected with a first probe, the lower surface of the second standard plate is connected with a second probe, the base, the first positioning plate, the second positioning plate, the first standard plate and the second standard plate are horizontally arranged, the first positioning plate is fixedly connected with the upper surface of the base, the second positioning plate is fixedly connected with the upper surface of the base, the first positioning plate and the second positioning plate are arranged side by side, the first standard plate is positioned right above the first positioning plate, the second standard plate is positioned right above the second positioning plate, the first probe and the second probe are vertically arranged, the upper surface of the first standard plate is fixedly connected with a first guide rod, the first guide rod is vertically arranged, the first guide rod is connected with the base in a sliding manner along the vertical direction, the upper surface of second standard board fixedly connected with second guide bar, the vertical setting of second guide bar.

Description

Double-clamping-hand test fixture

Technical Field

The application relates to the technical field of PCB (printed circuit board) test fixtures, in particular to a double-clamping-hand test fixture.

Background

The PCB board test fixture is a device for carrying out power-on test on a PCB board, and generally comprises a standard board (standard PCB board), wherein a probe is connected on a contact on the standard board, the board to be tested (the PCB board to be tested) is kept parallel to the standard board, one surface of the board to be tested, which is provided with the contact, is provided with the probe aiming at the standard board, the standard board and the board to be tested are mutually close until the probe is in compression fit with the board to be tested, the standard board is connected with a tester through a flat cable, and the tester is correspondingly compared with the power-on states of the probes through a preset judgment rule, so that whether the contact or the circuit of the board to be tested has the conditions of short circuit, open circuit, electric leakage and the like is judged.

However, the PCB testing jig in the prior art generally has only one station, and can only test one board to be tested at a time, which results in low working efficiency.

Disclosure of Invention

The application provides a double-clamping-hand test fixture for solve the problem that test fixture work efficiency is low among the prior art.

In order to achieve the above purpose, the embodiments of the present application propose the following technical solutions:

a double-clamping-hand test fixture comprises a base, a first positioning plate, a second positioning plate, a first standard plate and a second standard plate, wherein a first probe is connected to the lower surface of the first standard plate, a second probe is connected to the lower surface of the second standard plate, the base, the first positioning plate, the second positioning plate, the first standard plate and the second standard plate are horizontally arranged, the first positioning plate is fixedly connected with the upper surface of the base, the second positioning plate is fixedly connected with the upper surface of the base, the first positioning plate and the second positioning plate are arranged side by side, the first standard plate is positioned right above the first positioning plate, the second standard plate is positioned right above the second positioning plate, the first probe and the second probe are vertically arranged, a first guide rod is fixedly connected to the upper surface of the first standard plate, the first guide rod is vertically arranged, the first guide rod is connected with the base in a sliding mode in the vertical direction, the second guide rod is fixedly connected to the upper surface of the second standard plate, the second guide rod is vertically arranged, and the second guide rod is connected with the base in a sliding mode in the vertical direction.

In some embodiments, the upper surface of the first positioning plate is provided with a first positioning groove for loading a plate to be tested, and the first positioning groove is located right below the first standard plate.

In some embodiments, the second positioning plate has a second positioning groove formed on an upper surface thereof for loading a plate to be tested, and the second positioning groove is located directly below the first standard plate.

In some embodiments, a support is fixedly connected to the upper surface of the base, a first guide sleeve is fixedly connected to the support, the first guide rod is slidably connected to the first guide sleeve in the vertical direction, and the first guide rod is slidably connected to the base in the vertical direction through the first guide sleeve and the support.

In some embodiments, a second guide sleeve is fixedly connected to the bracket, the second guide rod is connected to the second guide sleeve in a sliding manner in the vertical direction, and the second guide rod is connected to the base in a sliding manner in the vertical direction through the second guide sleeve and the bracket.

In some embodiments, the bracket is rotatably connected with a first pressure lever, the first pressure lever is located above the first guide rod, the first pressure lever is hinged to the upper end of the first guide rod, a central axis of the relative rotation of the first pressure lever and the bracket is perpendicular to the first guide rod, and the first pressure lever can drive the first guide rod to move upwards or downwards after rotating relative to the bracket.

In some embodiments, a second pressure lever is rotatably connected to the bracket, the second pressure lever is located above the second guide rod, the second pressure lever is hinged to the upper end of the second guide rod, a central axis of the relative rotation of the second pressure lever and the bracket is perpendicular to the second guide rod, and the second pressure lever can drive the second guide rod to move upwards or downwards after rotating relative to the bracket.

In some embodiments, the central axis of rotation of the first strut relative to the bracket is collinear with the central axis of rotation of the second strut relative to the bracket.

In some embodiments, the double-grip test fixture further includes a linkage rod, the first pressure rod is parallel to the linkage rod relative to the central axis of the support, one end of the linkage rod is plugged with the first pressure rod, the other end of the linkage rod is plugged with the second pressure rod, the first pressure rod is rotatably connected with the linkage rod, and the second pressure rod is rotatably connected with the linkage rod.

Has the advantages that:

in the working process, a linkage rod is held by a hand and lifted upwards, the linkage rod drives a first pressure rod and a second pressure rod to rotate upwards respectively so as to drive a first standard plate and a second standard plate to move upwards, a first plate to be tested is horizontally placed in a first positioning groove, a second plate to be tested is horizontally placed in a second positioning groove, then the linkage rod is pushed downwards, the linkage rod drives the first pressure rod and the second pressure rod to rotate downwards respectively so as to drive the first standard plate and the second standard plate to move downwards until a first probe is in tight fit with the first plate to be tested and a second probe is in tight fit with the second plate to be tested, after the detection is finished, the linkage rod is lifted upwards, the first probe is separated from the first plate to be tested, the second probe is separated from the second plate to be tested, the first plate to be tested is taken out of the first positioning groove, and the second plate to be tested is taken out of the second positioning groove, and testing the next group of boards to be tested. Compared with the prior art, the double-clamping-hand test fixture in the embodiment can finish the detection of two boards to be tested at one time, and has higher working efficiency. After the linkage rod is pulled down from the first pressure rod and the second pressure rod, the first standard plate and the second standard plate can respectively and independently complete detection on the plate to be detected, and quick switching between two modes of single plate detection and double plate detection can be realized.

Drawings

In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative efforts.

Fig. 1 is a schematic structural diagram of a dual-grip testing fixture in an embodiment of the present application.

Reference numerals:

101. a base; 102. a first positioning plate; 103. a second positioning plate; 104. a first standard plate; 105. a second standard board; 106. a first probe; 107. a first guide bar; 108. a second guide bar; 109. a first positioning groove; 110. a second positioning groove; 111. a first guide sleeve; 112. a second guide sleeve; 113. a first pressure lever; 114. a second compression bar; 115. a linkage rod; 116. a second probe; 117. and (4) a bracket.

Detailed Description

Embodiments of the present application will be described in further detail with reference to the drawings and examples. The following examples are intended to illustrate the present application but are not intended to limit the scope of the present application.

In the description of the embodiments of the present application, it should be noted that the terms "center", "longitudinal", "lateral", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of describing the embodiments of the present application and simplifying the description, but do not indicate or imply that the referred devices or elements must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the embodiments of the present application. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.

In the description of the embodiments of the present application, it should be noted that the terms "connected" and "connected" are to be interpreted broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected, unless explicitly stated or limited otherwise; can be mechanically or electrically connected; may be directly connected or indirectly connected through an intermediate. Specific meanings of the above terms in the embodiments of the present application can be understood in specific cases by those of ordinary skill in the art.

In the embodiments of the present application, unless otherwise explicitly specified or limited, the first feature "on" or "under" the second feature may be directly contacted with the second feature or indirectly contacted with the second feature through an intermediate. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature "under," "beneath," and "under" a second feature may be directly under or obliquely under the second feature, or may simply mean that the first feature is at a lesser elevation than the second feature.

In the description herein, references to the description of the terms "a particular example," "one embodiment," "an example," "some embodiments," "some examples," "some embodiments," or "possible embodiments," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of an embodiment of the application. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples and features of different embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.

As shown in fig. 1, in an embodiment of the present application, a dual-grip test fixture is provided, which includes a base 101, a first positioning plate 102, a second positioning plate 103, a first standard plate 104 and a second standard plate 105, wherein a lower surface of the first standard plate 104 is connected to a first probe 106, a lower surface of the second standard plate 105 is connected to a second probe 116, the base 101, the first positioning plate 102, the second positioning plate 103, the first standard plate 104 and the second standard plate 105 are horizontally disposed, the first positioning plate 102 is fixedly connected to an upper surface of the base 101, the second positioning plate 103 is fixedly connected to an upper surface of the base 101, the first positioning plate 102 and the second positioning plate 103 are arranged side by side, the first standard plate 104 is located directly above the first positioning plate 102, the second standard plate 105 is located directly above the second positioning plate 103, the first probe 106 and the second probe 116 are vertically disposed, an upper surface of the first standard plate 104 is fixedly connected to a first guide rod 107, the first guide rod 107 is vertically arranged, the first guide rod 107 is connected with the base 101 in a sliding mode in the vertical direction, the second guide rod 108 is fixedly connected to the upper surface of the second standard plate 105, the second guide rod 108 is vertically arranged, and the second guide rod 108 is connected with the base 101 in a sliding mode in the vertical direction.

In some embodiments, the upper surface of the first positioning plate 102 is provided with a first positioning groove 109 for loading the plate to be tested, and the first positioning groove 109 is located right below the first standard plate 104.

In some embodiments, the second positioning plate 103 has a second positioning groove 110 formed on an upper surface thereof for loading a board to be tested, and the second positioning groove 110 is located directly below the first standard plate 104.

In some embodiments, a bracket 117 is fixedly connected to the upper surface of the base 101, a first guide sleeve 111 is fixedly connected to the bracket 117, the first guide rod 107 is slidably connected to the first guide sleeve 111 in the vertical direction, and the first guide rod 107 is slidably connected to the base 101 through the first guide sleeve 111 and the bracket 117 in the vertical direction.

In some embodiments, the second guide sleeve 112 is fixedly connected to the bracket 117, the second guide rod 108 is slidably connected to the second guide sleeve 112 in the vertical direction, and the second guide rod 108 is slidably connected to the base 101 through the second guide sleeve 112 and the bracket 117 in the vertical direction.

In some embodiments, the bracket 117 is rotatably connected with a first pressing rod 113, the first pressing rod 113 is located above the first guide rod 107, the first pressing rod 113 is hinged to the upper end of the first guide rod 107, a central axis of the relative rotation between the first pressing rod 113 and the bracket 117 is perpendicular to the first guide rod 107, and the first pressing rod 113 can drive the first guide rod 107 to move upwards or downwards after rotating relative to the bracket 117.

In some embodiments, the bracket 117 is rotatably connected with a second pressing rod 114, the second pressing rod 114 is located above the second guide rod 108, the second pressing rod 114 is hinged to the upper end of the second guide rod 108, a central axis of the relative rotation between the second pressing rod 114 and the bracket 117 is perpendicular to the second guide rod 108, and the second pressing rod 114 can drive the second guide rod 108 to move up or down after rotating relative to the bracket 117.

In some embodiments, the central axis of rotation of the first plunger 113 relative to the bracket 117 is collinear with the central axis of rotation of the second plunger 114 relative to the bracket 117.

In some embodiments, the double-grip testing jig further includes a linkage rod 115, the first pressure rod 113 is parallel to the linkage rod 115 relative to the central axis of the bracket 117, one end of the linkage rod 115 is plugged with the first pressure rod 113, the other end of the linkage rod 115 is plugged with the second pressure rod 114, the first pressure rod 113 is rotatably connected with the linkage rod 115, and the second pressure rod 114 is rotatably connected with the linkage rod 115.

In the working process of the double-clamping-hand test fixture provided by this embodiment, the linkage rod 115 is held by a hand and lifted upwards, the linkage rod 115 drives the first pressure rod 113 and the second pressure rod 114 to rotate upwards respectively, so as to drive the first standard board 104 and the second standard board 105 to move upwards, the first board to be tested is horizontally placed in the first positioning groove 109, the second board to be tested is horizontally placed in the second positioning groove 110, then the linkage rod 115 is pushed downwards, the linkage rod 115 drives the first pressure rod 113 and the second pressure rod 114 to rotate downwards respectively, so as to drive the first standard board 104 and the second standard board 105 to move downwards until the first probe 106 is in tight press fit with the first board to be tested, the second probe 116 is in tight press fit with the second board to be tested, after the test is completed, the linkage rod 115 is lifted upwards, the first probe 106 is separated from the first board to be tested, the second probe 116 is separated from the second board to be tested, the first board to be tested is taken out from the first positioning groove 109, the second board to be tested is taken out from the second positioning groove 110, and the next group of boards to be tested is tested. Compared with the prior art, the double-clamping-hand test fixture in the embodiment can finish the detection of two boards to be tested at one time, and has higher working efficiency. After the linkage rod 115 is pulled down from the first pressure rod 113 and the second pressure rod 114, the first standard plate 104 and the second standard plate 105 can respectively and independently complete the detection of the plate to be detected, and the quick switching between the two modes of single plate detection and double plate detection can be realized.

The above examples are only for explaining the present application and are not intended to limit the present application, and those skilled in the art can make modifications to the embodiments of the present application without inventive contribution as needed after reading the present specification, but are protected by patent laws within the scope of the claims of the present application.

Claims

1. A double-clamping-hand test fixture is characterized by comprising a base, a first positioning plate, a second positioning plate, a first standard plate and a second standard plate, wherein the lower surface of the first standard plate is connected with a first probe, the lower surface of the second standard plate is connected with a second probe, the base, the first positioning plate, the second positioning plate, the first standard plate and the second standard plate are horizontally arranged, the first positioning plate is fixedly connected with the upper surface of the base, the second positioning plate is fixedly connected with the upper surface of the base, the first positioning plate and the second positioning plate are arranged side by side, the first standard plate is positioned right above the first positioning plate, the second standard plate is positioned right above the second positioning plate, the first probe and the second probe are vertically arranged, the upper surface of the first standard plate is fixedly connected with a first guide rod, the first guide rod is vertically arranged, the first guide rod is connected with the base in a sliding mode in the vertical direction, the second guide rod is fixedly connected to the upper surface of the second standard plate, the second guide rod is vertically arranged, and the second guide rod is connected with the base in a sliding mode in the vertical direction.

2. The dual-grip testing jig according to claim 1, wherein a first positioning groove for loading a board to be tested is formed on an upper surface of the first positioning plate, and the first positioning groove is located right below the first standard plate.

3. The dual-grip testing jig of claim 2, wherein the second positioning plate has a second positioning groove on an upper surface thereof for loading a board to be tested, the second positioning groove being located directly below the first standard board.

4. The double-gripper testing jig of claim 3, wherein a support is fixedly connected to the upper surface of the base, a first guide sleeve is fixedly connected to the support, the first guide rod is connected with the first guide sleeve in a sliding manner in the vertical direction, and the first guide rod is connected with the base in a sliding manner in the vertical direction through the first guide sleeve and the support.

5. The double-gripper testing jig of claim 4, wherein a second guide sleeve is fixedly connected to the bracket, the second guide rod is connected with the second guide sleeve in a sliding manner in the vertical direction, and the second guide rod is connected with the base in a sliding manner in the vertical direction through the second guide sleeve and the bracket.

6. The double-gripper testing jig of claim 5, wherein the bracket is rotatably connected with a first pressure lever, the first pressure lever is located above the first guide rod, the first pressure lever is hinged to the upper end of the first guide rod, a central axis of the relative rotation of the first pressure lever and the bracket is perpendicular to the first guide rod, and the first pressure lever can drive the first guide rod to move up or down after rotating relative to the bracket.

7. The double-gripper testing jig of claim 6, wherein the bracket is rotatably connected with a second pressing rod, the second pressing rod is located above the second guide rod, the second pressing rod is hinged to the upper end of the second guide rod, a central axis of the relative rotation of the second pressing rod and the bracket is perpendicular to the second guide rod, and the second pressing rod can drive the second guide rod to move upwards or downwards after rotating relative to the bracket.

8. The dual-grip testing jig of claim 7, wherein the central axis of rotation of the first pressing rod relative to the bracket and the central axis of rotation of the second pressing rod relative to the bracket are located on the same straight line.

9. The double-clamping-hand test fixture according to claim 8, further comprising a linkage rod, wherein the first pressure rod is parallel to the linkage rod relative to a central axis of the support, one end of the linkage rod is connected with the first pressure rod in an inserting manner, the other end of the linkage rod is connected with the second pressure rod in an inserting manner, the first pressure rod is rotatably connected with the linkage rod, and the second pressure rod is rotatably connected with the linkage rod.