CN212932705U

CN212932705U - Integrated circuit testing device

Info

Publication number: CN212932705U
Application number: CN202021780280.XU
Authority: CN
Inventors: 杨光
Original assignee: Shenzhen Bosheng Yingke Supply Chain Co ltd
Current assignee: Shenzhen Bosheng Yingke Supply Chain Co ltd
Priority date: 2020-08-24
Filing date: 2020-08-24
Publication date: 2021-04-09
Anticipated expiration: 2030-08-24

Abstract

The utility model discloses an integrated circuit testing arrangement, the on-line screen storage device comprises a base, the top fixed mounting of base has fixing base and riser, and the top fixed mounting of riser has the diaphragm, and the top fixed mounting of diaphragm has first electric putter and electric instrument, and first electric putter's output fixed mounting has first telescopic link, and the round hole has been seted up at the top of diaphragm, and round hole and fixed mounting have been run through to the bottom of first telescopic link. The utility model relates to a rationally, the practicality is good, be convenient for stabilize the centre gripping to not unidimensional integrated circuit, avoid causing integrated circuit to take place the skew and lead to the test result inaccurate in the integrated circuit test procedure to be convenient for adjust the high position and the horizontal position of test probe, do not need artifical manual regulation, bring the convenience for the detection achievement, can realize carrying out continuity test work to a plurality of integrated circuits moreover, the rational utilization operating time, great improvement work efficiency.

Description

Integrated circuit testing device

Technical Field

The utility model relates to an integrated circuit tests technical field, specifically is an integrated circuit testing arrangement.

Background

An integrated circuit is a miniature electronic device or component, and the elements such as transistor, resistor, capacitor and inductor, etc. required in a circuit and wiring are interconnected together by adopting a certain process, and are made on a small or several small semiconductor wafers or medium substrates, and then are packaged in a tube shell to form a miniature structure with the required circuit function, wherein all the elements are structurally integrated into a whole, so that the electronic elements are greatly advanced towards the aspects of microminiaturization, low power consumption, intellectualization and high reliability.

Through retrieval, the No. CN207965052U discloses an integrated circuit testing device, which comprises a base, a circuit testing seat, three testing probes, a probe connecting plate, a rotary rod head, a connecting rod, a lock catch, a supporting rod, a handle, a front top plate and an electric instrument, wherein the three testing probes are connected with the probe connecting plate through screws and are horizontally arranged, the rotary rod head is vertically arranged at the upper end of the probe connecting plate and is connected with the connecting rod, the two lock catches are arranged, the lower ends of the two lock catches penetrate through the top of the connecting rod through screws, and the upper ends of the lock catches are connected with the supporting rod through screws, the integrated circuit testing device is structurally provided with the testing probes, tests a circuit through a testing couple in the device, then the expansion space strengthens the hardness degree of the inner side of the device, and reduces the hardness through a machine body, thereby reducing the damage, therefore, the practicability of the device is enhanced, however, in the prior art, when the integrated circuit testing equipment is used, the integrated circuits with different sizes are not convenient to fix on a circuit testing seat stably, the integrated circuits are easy to deviate in the integrated circuit testing process, so that the testing result is not accurate, the height position and the horizontal position of a testing probe need to be adjusted manually, inconvenience is brought to testing work, continuity testing work on a plurality of integrated circuits cannot be achieved, working time cannot be reasonably utilized, time is more wasted, and the working efficiency is low.

SUMMERY OF THE UTILITY MODEL

Technical problem to be solved

The utility model provides a not enough to prior art, the utility model provides an integrated circuit testing arrangement, it is not convenient for stabilize to not unidimensional integrated circuit and fixes on the circuit test seat to have solved current integrated circuit test equipment, cause integrated circuit to take place the skew easily and lead to the test result inaccurate in to the integrated circuit test procedure, and the high position and the horizontal position that need manual regulation test probe, it is inconvenient to bring for test work, and can not realize carrying out continuity test work to a plurality of integrated circuit, operating time can not rational utilization, the time waste is more, lead to the problem that work efficiency is low.

(II) technical scheme

In order to achieve the above object, the utility model provides a following technical scheme: an integrated circuit testing device comprises a base, wherein a fixed seat and a vertical plate are fixedly installed at the top of the base, a transverse plate is fixedly installed at the top of the vertical plate, a first electric push rod and an electric instrument are fixedly installed at the top of the transverse plate, a first telescopic rod is fixedly installed at the output end of the first electric push rod, a round hole is formed in the top of the transverse plate, the bottom end of the first telescopic rod penetrates through the round hole and is fixedly installed with a mounting plate, a motor is arranged at the bottom of the mounting plate, a probe connecting plate is fixedly installed at the output end of the motor, three testing probes are fixedly installed at the bottom of the probe connecting plate, a sliding groove is formed in the top of the fixed seat, a second electric push rod is fixedly installed on the inner wall of one side of the sliding groove, a second telescopic rod is fixedly installed at, the top of slide extends to outside the spout and fixed mounting has the circuit test seat, the circuit test seat is located test probe under, two standing grooves have been seted up at the top of circuit test seat, all set up threaded hole on the one side inner wall that two standing grooves kept away from each other, the lead screw is installed to the equal screw thread in two threaded hole, the both ends of lead screw all extend to outside the threaded hole, all be equipped with the rubber slab in two standing grooves, the equal fixed mounting in one side that two rubber slabs kept away from each other has the bearing frame, the one end that two lead screws are close to each other rotates respectively and installs on corresponding bearing frame.

Preferably, a guide rod positioned above the second electric push rod is fixedly installed in the sliding groove, and the sliding seat is sleeved on the guide rod in a sliding manner.

Preferably, the bottom of the mounting plate is fixedly provided with a rack, and the motor is fixedly arranged on the rack.

Preferably, the bottom of the sliding seat is nested with a ball, and the ball is in rolling contact with the inner wall of the bottom of the sliding groove.

Preferably, the limiting grooves are formed in the inner walls of the bottoms of the two placing grooves, the limiting rods are fixedly mounted at the bottoms of the two rubber plates, and the two limiting rods are slidably mounted in the corresponding limiting grooves respectively.

Preferably, the handles are fixedly mounted at the ends, far away from each other, of the two screw rods.

(III) advantageous effects

The utility model provides an integrated circuit testing arrangement. The method has the following beneficial effects:

(1) this kind of integrated circuit testing arrangement, put into left standing groove through an integrated circuit of taking, clockwise rotate left handle, the handle promotes left rubber slab level when driving left lead screw pivoted and moves right, through the position of adjusting left rubber slab, can fix the firm centre gripping of integrated circuit in left standing groove, and the position through adjusting the rubber slab can be fixed the centre gripping of stabilizing to the integrated circuit of unidimensional not, avoid causing the integrated circuit to take place the skew and lead to the test result inaccurate in the integrated circuit test procedure.

(2) The integrated circuit testing device comprises a sliding seat, a circuit testing seat, an integrated circuit, a motor, a probe connecting plate, a first electric push rod, a second electric push rod, a motor, a first telescopic rod, a second telescopic rod, a motor, a first electric push rod, a second telescopic rod, a first testing probe, a second electric push rod, a third electric push rod, a fourth, can carry out test work to left integrated circuit, thereby need not the manual position of pushing down the regulation three test probe of staff, time saving and labor saving, high durability and convenient operation, in the integrated circuit test process to the left side standing groove, the staff can take in another integrated circuit puts into the standing groove on right side, clockwise rotation right side handle, make the rubber slab level in the standing groove on right side slide left, utilize the rubber slab on right side can be to the firm centre gripping of integrated circuit in the standing groove on right side, make the preparation work before the detection.

(3) The integrated circuit testing device starts the first electric push rod to reset after the integrated circuit in the left placing groove is tested, the first telescopic rod pushes the mounting plate, the motor, the probe connecting plate and the three testing probes to move upwards and return to the original position, the second electric push rod is started to reset, the second telescopic rod drives the sliding seat, the circuit testing seat and the integrated circuit to move horizontally leftwards, the integrated circuit in the right placing groove can be moved to a proper position below the three testing probes, the first electric push rod is started to work, the first telescopic rod pushes the mounting plate, the motor, the probe connecting plate and the three testing probes to move downwards, so that the bottom ends of the three testing probes are contacted with the integrated circuit on the right side, the testing work can be carried out on the integrated circuit on the right side, in the testing process of the integrated circuit on the right side, by rotating the handle on the left side, make the rubber slab level in the left side standing groove remove left, can take off the integrated circuit that the test was accomplished in the left side standing groove, take another integrated circuit that awaits measuring again and put into left standing groove to it is fixed to stabilize the centre gripping, can make the preparation before the detection work, thereby according to above-mentioned operating procedure, can realize carrying out continuity test work to a plurality of integrated circuits, the rational utilization time, the waste of reduction time, great improvement work efficiency.

Drawings

FIG. 1 is a schematic sectional view of the main view of the present invention;

FIG. 2 is an enlarged view of portion A of FIG. 1;

fig. 3 is an enlarged schematic view of a portion B in fig. 1.

In the figure: 1. a base; 2. a fixed seat; 3. a vertical plate; 4. a transverse plate; 5. a first electric push rod; 6. an electrical meter; 7. a first telescopic rod; 8. mounting a plate; 9. a motor; 10. a probe connecting plate; 11. testing the probe; 12. a chute; 13. a second electric push rod; 14. a second telescopic rod; 15. a slide base; 16. a circuit test socket; 17. a placement groove; 18. a threaded hole; 19. a screw rod; 20. a rubber plate; 21. a bearing seat; 22. a guide rod.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

As shown in fig. 1-3, the utility model provides a technical solution: an integrated circuit testing device comprises a base 1, a fixed seat 2 and a vertical plate 3 are fixedly installed at the top of the base 1, a transverse plate 4 is fixedly installed at the top of the vertical plate 3, a first electric push rod 5 and an electric instrument 6 are fixedly installed at the top of the transverse plate 4, a first telescopic rod 7 is fixedly installed at the output end of the first electric push rod 5, a round hole is formed in the top of the transverse plate 4, the bottom end of the first telescopic rod 7 penetrates through the round hole and is fixedly installed with an installation plate 8, a motor 9 is arranged at the bottom of the installation plate 8, a probe connection plate 10 is fixedly installed at the output end of the motor 9, three testing probes 11 are fixedly installed at the bottom of the probe connection plate 10, a sliding groove 12 is formed in the top of the fixed seat 2, a second electric push rod 13 is fixedly installed on the inner wall of one side of the, one end that second electric putter 13 was kept away from to second telescopic link 14 and one side fixed connection of slide 15, slide 15's top extends to outside spout 12 and fixed mounting has circuit test seat 16, circuit test seat 16 is located test probe 11 under, two standing grooves 17 have been seted up at circuit test seat 16's top, threaded hole 18 has all been seted up on the one side inner wall that two standing grooves 17 kept away from each other, equal threaded mounting has lead screw 19 in two threaded hole 18, the both ends of lead screw 19 all extend outside threaded hole 18, all be equipped with rubber slab 20 in two standing grooves 17, the equal fixed mounting in one side that two rubber slabs 20 kept away from each other has bearing frame 21, the one end that two lead screws 19 are close to each other rotates respectively and installs on corresponding bearing frame 21.

Fixed mounting has the guide bar 22 that is located second electric putter 13 top in spout 12, slide 15 slip cap is established on guide bar 22, the bottom fixed mounting of mounting panel 8 has the frame, motor 9 fixed mounting is in the frame, slide 15's bottom nestification has the ball, ball and spout 12's bottom inner wall rolling contact, the spacing groove has all been seted up on the bottom inner wall of two standing grooves 17, the equal fixed mounting in bottom of two rubber slabs 20 has the gag lever post, two gag lever posts are sliding mounting respectively at corresponding spacing inslot, the equal fixed mounting in one end that two lead screws 19 kept away from each other has the handle.

When the testing device is used, a control switch and an external power line are installed on a base 1, a motor 9 is a motor capable of rotating forwards and backwards, a first electric push rod 5, the motor 9, a second electric push rod 13, the control switch and the external power line are sequentially and electrically connected to form a loop, the control switch can respectively control the starting, stopping and resetting of the first electric push rod 5 and the second electric push rod 13 and can also control the starting, stopping and the forward and reverse rotation of the motor 9, according to an integrated circuit testing device disclosed by the authorization bulletin number CN207965052U, a testing probe 11 is formed by combining a shaft handle, an exchange pipe, a barrier pipe, a finned pipe, a testing nozzle, an expansion space, a testing couple and a machine body, the three testing probes 11 are electrically connected with an electric instrument 6, when the integrated circuit is tested, firstly, the integrated circuit is taken and placed in a left placing groove 17, a left handle is rotated clockwise, the left screw rod 19 is driven by the handle to rotate, and meanwhile, a left rubber, the left rubber plate 20 drives the left limiting rod to slide in the left limiting groove, so that the integrated circuit can be stably clamped and fixed in the left placing groove 17 by adjusting the position of the left rubber plate 20, integrated circuits of different sizes can be stably clamped and fixed by adjusting the position of the rubber plate 20, the situation that the integrated circuit deviates in the testing process to cause inaccurate testing results is avoided, when the integrated circuit is stably clamped in the left placing groove 17, the second electric push rod 13 is started to work, the second telescopic rod 14 pushes the sliding seat 15, the circuit testing seat 16 and the integrated circuit to horizontally move rightwards, the integrated circuit is moved to a proper position below the three testing probes 11, the second electric push rod 13 is stopped to work, the motor 9 drives the probe connecting plate 10 and the three testing probes 11 to rotate clockwise (viewed from an overlooking angle) by starting the motor 9 to rotate forwards, the motor 9 is started to rotate reversely, the motor 9 drives the probe connecting plate 10 and the three test probes 11 to rotate anticlockwise (viewed from an overlooking angle), so that the horizontal positions of the three test probes 11 can be conveniently adjusted in a rotating manner, the test work of different positions of the integrated circuit can be conveniently carried out, after the positions of the three test probes 11 are properly adjusted, the first electric push rod 5 is started to work, the first telescopic rod 7 pushes the mounting plate 8, the motor 9, the probe connecting plate 10 and the three test probes 11 to move downwards, when the bottom ends of the three test probes 11 are contacted with the left integrated circuit, the first electric push rod 5 is stopped to work, the test work of the left integrated circuit can be carried out, the workers are not required to manually press and adjust the positions of the three test probes 11, the time and labor are saved, the operation is convenient, and in the test process of the integrated circuit, at this time, the worker can take another integrated circuit and place the integrated circuit into the right-side placing groove 17, rotate the right-side handle clockwise to slide the rubber plate 20 in the right-side placing groove 17 horizontally leftward, so that the integrated circuit can be stably clamped in the right-side placing groove 17 by using the right-side rubber plate 20, prepare the integrated circuit before detection, after the integrated circuit in the left-side placing groove 17 is tested, start the first electric push rod 5 to reset, the first telescopic rod 7 pushes the mounting plate 8, the motor 9, the probe connecting plate 10 and the three test probes 11 to move upward and return to the original position, start the second electric push rod 13 to reset, the second telescopic rod 14 drives the slide seat 15, the circuit test seat 16 and the integrated circuit to move horizontally leftward, and after the integrated circuit in the right-side placing groove 17 is moved to a proper position below the three test probes 11, stop the second electric push rod 13 to work, the first electric push rod 5 is started to work, the first telescopic rod 7 pushes the mounting plate 8, the motor 9, the probe connecting plate 10 and the three test probes 11 to move downwards, when the bottom ends of the three test probes 11 are contacted with the integrated circuit on the right side, the second electric push rod 13 is stopped to work, the integrated circuit on the right side can be tested, in the process of testing the integrated circuit on the right side, the handle on the left side is rotated anticlockwise, the rubber plate 20 in the placing groove 17 on the left side is horizontally moved leftwards, the integrated circuit which is tested in the placing groove 17 on the left side can be taken down, another integrated circuit to be tested is taken into the placing groove 17 on the left side and is stably clamped and fixed, and the preparation work before the detection can be well carried out, so that the continuity test work of a plurality of integrated circuits can be realized according to the operation steps, the time is reasonably utilized, and the, the working efficiency is greatly improved, and the content which is not described in detail in the specification belongs to the prior art which is known by the professional in the field.

To sum up, the integrated circuit testing device can be obtained by taking an integrated circuit, putting the integrated circuit into the left placing groove 17, rotating the left handle clockwise, driving the left screw rod 19 to rotate by the handle and simultaneously pushing the left rubber plate 20 to move horizontally to the right, by adjusting the position of the left rubber plate 20, the integrated circuit can be stably clamped and fixed in the left placing groove 17, and by adjusting the position of the rubber plate 20, the integrated circuits with different sizes can be stably clamped and fixed, so that the integrated circuit testing device can avoid the integrated circuit from deviating in the integrated circuit testing process to cause inaccurate testing result, by starting the second electric push rod 13 to work, the second telescopic rod 14 pushes the sliding seat 15, the circuit testing seat 16 and the integrated circuit to move horizontally to the right, the integrated circuit can be moved to a proper position below the three testing probes 11, and by starting the motor 9 to rotate forwards, the motor 9 drives the probe connecting plate 10 and the three test probes 11 to rotate clockwise (viewed from an overlooking angle), the motor 9 is started to rotate reversely, the motor 9 drives the probe connecting plate 10 and the three test probes 11 to rotate anticlockwise (viewed from an overlooking angle), the horizontal positions of the three test probes 11 are convenient to rotate and adjust, the test work of different positions of the integrated circuit is convenient to carry out, by starting the first electric push rod 5 to work, the first telescopic rod 7 pushes the mounting plate 8, the motor 9, the probe connecting plate 10 and the three test probes 11 to move downwards, when the bottom ends of the three test probes 11 are contacted with the left integrated circuit, the test work of the left integrated circuit can be carried out, so that the position of the three test probes 11 does not need to be manually pressed and adjusted by a worker, time and labor are saved, the operation is convenient, in the test process of the, the worker can take another integrated circuit and place the integrated circuit into the right-side placing groove 17, clockwise rotate the right-side handle to enable the rubber plate 20 in the right-side placing groove 17 to horizontally slide leftwards, utilize the right-side rubber plate 20 to firmly clamp the integrated circuit in the right-side placing groove 17, prepare the work before detection, after the integrated circuit in the left-side placing groove 17 is tested, start the first electric push rod 5 to reset, the first telescopic rod 7 pushes the mounting plate 8, the motor 9, the probe connecting plate 10 and the three test probes 11 to move upwards and return to the original position, start the second electric push rod 13 to reset, the second telescopic rod 14 drives the sliding seat 15, the circuit test seat 16 and the integrated circuit to horizontally move leftwards, the integrated circuit in the right-side placing groove 17 can be moved to a proper position below the three test probes 11, and start the first electric push rod 5 to work, the first telescopic rod 7 pushes the mounting plate 8, the motor 9, the probe connecting plate 10 and the three test probes 11 to move downwards, so that the bottom ends of the three test probes 11 contact with the integrated circuit on the right side, the integrated circuit on the right side can be tested, in the process of testing the integrated circuit on the right side, the rubber plate 20 in the placing groove 17 on the left side is horizontally moved leftwards by rotating the handle on the left side anticlockwise, the tested integrated circuit in the placing groove 17 on the left side can be taken down, another integrated circuit to be tested is taken into the placing groove 17 on the left side, and the stable clamping and fixing are carried out, so that the preparation work before the detection can be well carried out, the continuity testing work of a plurality of integrated circuits can be realized according to the operation steps, the time is reasonably utilized, the waste of the time is reduced, the working efficiency is greatly improved, and the utility model has, the practicality is good, be convenient for stabilize the centre gripping to not unidimensional integrated circuit, avoid causing integrated circuit to take place the skew and lead to the test result inaccurate in the integrated circuit test process to be convenient for adjust test probe 11's high position and horizontal position, do not need artifical manual regulation, bring the convenience for the detection achievement, can realize carrying out continuity test work to a plurality of integrated circuits moreover, the rational utilization operating time, great improvement work efficiency.

Claims

1. An integrated circuit testing device, comprising a base (1), characterized in that: the testing device is characterized in that a fixing seat (2) and a vertical plate (3) are fixedly mounted at the top of a base (1), a transverse plate (4) is fixedly mounted at the top of the vertical plate (3), a first electric push rod (5) and an electric meter (6) are fixedly mounted at the top of the transverse plate (4), a first telescopic rod (7) is fixedly mounted at the output end of the first electric push rod (5), a round hole is formed in the top of the transverse plate (4), a mounting plate (8) is fixedly mounted at the bottom end of the first telescopic rod (7) in a penetrating mode through the round hole, a motor (9) is arranged at the bottom of the mounting plate (8), a probe connecting plate (10) is fixedly mounted at the output shaft end of the motor (9), three testing probes (11) are fixedly mounted at the bottom of the probe connecting plate (10), a sliding groove (12) is formed, a second telescopic rod (14) is fixedly installed at the output end of the second electric push rod (13), a sliding seat (15) is installed in the sliding groove (12) in a sliding mode, one end, far away from the second electric push rod (13), of the second telescopic rod (14) is fixedly connected with one side of the sliding seat (15), the top of the sliding seat (15) extends out of the sliding groove (12) and is fixedly provided with a circuit testing seat (16), the circuit testing seat (16) is located under a testing probe (11), two placing grooves (17) are formed in the top of the circuit testing seat (16), threaded holes (18) are formed in the inner wall of one side, far away from each other, of the two placing grooves (17), screw rods (19) are installed in the two threaded holes (18) in a threaded mode, two ends of each screw rod (19) extend out of each threaded hole (18), rubber plates (20) are arranged in the two placing grooves (17), a bearing seat (21) is fixedly installed on, one ends of the two screw rods (19) close to each other are respectively and rotatably arranged on the corresponding bearing seats (21).

2. An integrated circuit testing device according to claim 1, wherein: a guide rod (22) positioned above the second electric push rod (13) is fixedly arranged in the sliding groove (12), and the sliding seat (15) is sleeved on the guide rod (22) in a sliding manner.

3. An integrated circuit testing device according to claim 1, wherein: the bottom fixed mounting of mounting panel (8) has the frame, and motor (9) fixed mounting is in the frame.

4. An integrated circuit testing device according to claim 1, wherein: the bottom of the sliding seat (15) is nested with a ball, and the ball is in rolling contact with the inner wall of the bottom of the sliding groove (12).

5. An integrated circuit testing device according to claim 1, wherein: the limiting grooves are formed in the inner walls of the bottoms of the two placing grooves (17), limiting rods are fixedly mounted at the bottoms of the two rubber plates (20), and the two limiting rods are slidably mounted in the corresponding limiting grooves respectively.

6. An integrated circuit testing device according to claim 1, wherein: the handles are fixedly arranged at the ends, far away from each other, of the two screw rods (19).