CN216385479U - Semiconductor measuring equipment - Google Patents
Semiconductor measuring equipment Download PDFInfo
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- CN216385479U CN216385479U CN202122319963.6U CN202122319963U CN216385479U CN 216385479 U CN216385479 U CN 216385479U CN 202122319963 U CN202122319963 U CN 202122319963U CN 216385479 U CN216385479 U CN 216385479U
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Abstract
The utility model discloses semiconductor measuring equipment, which relates to the technical field of semiconductors and comprises a measuring table and a supporting column, wherein the supporting column is fixed in the middle of the left end of the measuring table, and a vertical plate is vertically and upwards fixed at the top of the supporting column; the upper surface of the measuring table is provided with two rotary grooves which are distributed diagonally, threaded rods are rotatably connected in the rotary grooves, threaded sleeves in threaded connection with the threaded rods are sleeved outside the threaded rods, right-angle clamping plates are welded at the tops of the threaded sleeves, and soft pads are attached to the inner walls of the right-angle clamping plates; a side opening is formed in one side, close to the inside, of the vertical plate, an electric push rod is installed at the bottom of the inside of the side opening, a movable rod extending towards the right side is movably embedded into the side opening, and rolling grooves are formed in the front side and the rear side of the outer wall of the movable rod; the utility model has the beneficial effects that: the semiconductor measuring device is convenient to adjust and fix according to semiconductors of different sizes, improves the fixation of the semiconductors during measurement, avoids loosening, and effectively improves the accuracy of measuring results.
Description
Technical Field
The utility model relates to the technical field of semiconductors, in particular to a semiconductor measuring device.
Background
The semiconductor refers to a material with electric conductivity between a conductor and an insulator at normal temperature, and has application in the fields of integrated circuits, consumer electronics, communication systems, photovoltaic power generation, illumination, high-power conversion and the like, for example, a diode is a device made of the semiconductor, and when the conventional semiconductor measuring equipment measures semiconductors with different sizes, the equipment is difficult to make corresponding fixed tightness according to different sizes, so that the measurement accuracy of the semiconductors with smaller sizes is influenced due to poor fixity.
SUMMERY OF THE UTILITY MODEL
The utility model provides a semiconductor measuring device to solve the problem that the measuring device proposed by the background technology is difficult to fix according to semiconductors with different sizes, so that the detection result is easy to deviate.
In order to achieve the purpose, the utility model adopts the following technical scheme:
the semiconductor measuring equipment comprises a measuring table and a supporting column, wherein the supporting column is fixed in the middle of the left end of the measuring table, and a vertical plate is vertically and upwards fixed at the top of the supporting column;
the upper surface of the measuring table is provided with two rotary grooves which are distributed diagonally, threaded rods are rotatably connected in the rotary grooves, threaded sleeves which are in threaded connection with the threaded rods are sleeved outside the threaded rods, right-angle clamping plates are welded at the tops of the threaded sleeves, and soft pads are attached to the inner walls of the right-angle clamping plates;
a side opening is formed in one side, close to the inside, of the vertical plate, an electric push rod is mounted at the bottom of the inside of the side opening, a movable rod extending towards the right side is movably embedded in the side opening, rolling grooves are formed in the front side and the rear side of the outer wall of the movable rod, and a plurality of balls are connected in the rolling grooves in a rolling mode;
the movable rod is movably sleeved with a movable block outside, a through hole is formed in the middle of the side face of the movable block, a threaded shaft penetrates through the top of the movable block in a threaded mode, the tail end of the threaded shaft penetrates through the upper portion inside the through hole, and an arc-shaped clamping piece is fixed at the tail end of the threaded shaft.
Preferably, supporting plates are fixed to the left rear angle of the outer wall of the measuring table and the right front angle of the outer wall of the measuring table, and motors are mounted above the supporting plates.
Preferably, the tail end of the threaded rod penetrates through the outer wall of the measuring table, and the tail end of the threaded rod is fixedly connected with the adjacent output end of the motor.
Preferably, the upper surface of the threaded sleeve protrudes out of the surface of the rotary groove, the right-angle clamping plates are positioned on the upper surface of the measuring table, and the two right-angle clamping plates are symmetrically distributed in a diagonal manner.
Preferably, the output end of the electric push rod is connected with a connecting rod, the top of the connecting rod is fixedly connected with the left side of the lower surface of the movable rod, and a sliding block is fixed at the left end of the movable rod.
Preferably, a sliding groove is formed in the left side of the inner wall of the side opening, and the sliding block slides into the sliding groove and is in sliding connection with the sliding groove.
Preferably, the through hole passes the movable rod, just ball outer wall and through hole inner wall roll connection, the arc card is located the movable rod upper surface.
Preferably, the bottom of the movable block is provided with a laser measuring head, and the laser measuring head is parallel to two parts above the right-angle clamping plate.
The utility model has the following beneficial effects:
the two motors are started and the corresponding threaded rods are driven to rotate, the thread sleeves at the moment can move along the threads of the threaded rods, the distance between the two right-angle clamping plates changes, a user only needs to adjust the two right-angle clamping plates to be gradually close to the left rear angle and the right front angle of a measured semiconductor, so that the semiconductor with different sizes can be fixed, the phenomenon that the semiconductor is loosened due to insufficient firmness in fixation is effectively avoided, meanwhile, the measurement accuracy of measuring equipment is improved, the soft cushion on the inner wall of the right-angle clamping plate can be used for reducing friction between the right-angle clamping plates and the semiconductor, and the protection effect is achieved;
when reciprocating the movable rod, can adjust the position of laser measuring head and semiconductor simultaneously, pass through the cooperation of through-hole and ball with the movable block and adjust along the movable rod horizontal slip for the one end that the laser measuring head removed to the semiconductor conveniently measures the work, through about and adjust the movable head can improve the measuring equipment flexibility when measuring.
Drawings
FIG. 1 is a schematic view of the overall front plan structure of the present invention;
FIG. 2 is a schematic top plan view of the measuring table of the present invention;
FIG. 3 is a schematic side sectional view of the movable block of the present invention.
In FIGS. 1-3: the measuring table comprises a measuring table 1, a rotary groove 101, a threaded rod 102, a threaded sleeve 103, a right-angle clamping plate 104, a soft cushion 105, a support plate 106, a motor 107, a support column 2, a vertical plate 201, a side opening 202, an electric push rod 203, a movable rod 204, a sliding block 205, a rolling groove 206, a ball 207, a movable block 3, a laser measuring head 301, a through hole 302, a threaded shaft 303 and an arc-shaped clamping plate 304.
Detailed Description
Referring to fig. 1-3, the utility model provides a semiconductor measuring device, which comprises a measuring table 1 and a supporting column 2, wherein the supporting column 2 is fixed in the middle of the left end of the measuring table 1, and a vertical plate 201 is vertically and upwardly fixed on the top of the supporting column 2;
the upper surface of the measuring table 1 is provided with two rotary grooves 101 which are distributed diagonally, the rotary grooves 101 are connected with threaded rods 102 in a rotating mode, threaded sleeves 103 which are in threaded connection with the threaded rods 102 are sleeved outside the threaded rods 102, right-angle clamping plates 104 are welded at the tops of the threaded sleeves 103, soft pads 105 are attached to the inner walls of the right-angle clamping plates 104, supporting plates 106 are fixed to the left rear angles and the right front angles of the outer walls of the measuring table 1, motors 107 are mounted above the supporting plates 106, the tail ends of the threaded rods 102 penetrate through the outer wall of the measuring table 1, the tail ends of the threaded rods 102 are fixedly connected with the output ends of the adjacent motors 107, the upper surface of the threaded sleeves 103 protrudes out of the surface of the rotary grooves 101, the right-angle clamping plates 104 are located on the upper surface of the measuring table 1, and the two right-angle clamping plates 104 are symmetrically distributed in a diagonal mode;
specifically, a user places a semiconductor to be measured on the measuring table 1 and is located between two right-angle clamping plates 104, then adjusts the distance between the two right-angle clamping plates 104 according to the size of the semiconductor, only two motors 107 need to be started and corresponding threaded rods 102 are driven to rotate, the threaded sleeves 103 move along the threads of the threaded rods 102 at the moment, so that the distance between the two right-angle clamping plates 104 changes, the user only needs to adjust the two right-angle clamping plates 104 to be gradually close to the left rear corner and the right front corner of the semiconductor to be measured, thus the semiconductor with different sizes can be fixed, the phenomenon that the semiconductor is loosened due to insufficient fixation is effectively avoided, meanwhile, the measurement accuracy of the measuring equipment is improved, and the soft pads 105 on the inner walls of the right-angle clamping plates 104 can reduce the friction between the right-angle clamping plates 104 and the semiconductor, the protective effect is achieved;
a side opening 202 is formed in one side, close to the inside, of the vertical plate 201, an electric push rod 203 is installed at the bottom of the inside of the side opening 202, a movable rod 204 extending towards the right side is movably embedded in the side opening 202, rolling grooves 206 are formed in the front side and the rear side of the outer wall of the movable rod 204, a plurality of balls 207 are connected in the rolling grooves 206 in a rolling mode, the output end of the electric push rod 203 is connected with a connecting rod, the top of the connecting rod is fixedly connected with the left side of the lower surface of the movable rod 204, a sliding block 205 is fixed at the left end of the movable rod 204, a sliding groove is formed in the left side of the inner wall of the side opening 202, and the sliding block 205 slides into the sliding groove and is connected with the sliding groove in a sliding mode;
furthermore, after the semiconductor is fixed, the electric push rod 203 can be started, the connecting rod can be driven by the electric push rod 203 to move up and down, the movable rod 204 can be driven by the connecting rod to move up and down along the side opening 202, the sliding block 205 can move along the sliding groove, a guiding effect can be achieved, the movable rod 204 can move up and down more smoothly, the distance between the movable rod 204 and the semiconductor can be adjusted by moving the movable rod 204 up and down, and therefore the semiconductor can be measured more conveniently;
the movable block 3 is movably sleeved outside the movable rod 204, a through hole 302 is formed in the middle of the side face of the movable block 3, a threaded shaft 303 penetrates through the top of the movable block 3 in a threaded manner, the tail end of the threaded shaft 303 penetrates above the inside of the through hole 302, an arc-shaped clamping piece 304 is fixed at the tail end of the threaded shaft 303, the through hole 302 penetrates through the movable rod 204, the outer wall of a ball 207 is in rolling connection with the inner wall of the through hole 302, the arc-shaped clamping piece 304 is located on the upper surface of the movable rod 204, a laser measuring head 301 is installed at the bottom of the movable block 3, and the laser measuring head 301 is parallel to the space between the two right-angle clamping plates 104;
further, when reciprocating the movable rod 204, can adjust the position of laser measuring head 301 and semiconductor simultaneously, adjust the bottom of laser measuring head 301 to the laminating in the semiconductor top can, then, the user passes through the cooperation of through-hole 302 and ball 207 with the movable block 3 again and slides the adjustment along movable rod 204 about, make laser measuring head 301 remove the one end of semiconductor conveniently to carry out measurement work, when the user needs to fix the position after the movable block 3 removes, only need screw spindle 303 screw up downwards can, make arc card 304 firmly block in the surface of movable rod 204 can, like this alright with temporarily fixing movable block 3, if need remove the movable head again, it can to unscrew screw spindle 303 again, and convenient and simple, and can improve the flexibility when measuring equipment measures through adjusting the movable head about and from top to bottom.
Claims (8)
1. The utility model provides a semiconductor measuring equipment, includes measuring stage (1) and support column (2), support column (2) are fixed in measuring stage (1) left end middle part, just support column (2) top is fixed with riser (201), its characterized in that perpendicularly upwards:
the upper surface of the measuring table (1) is provided with two rotary grooves (101) which are distributed diagonally, threaded rods (102) are rotatably connected in the rotary grooves (101), threaded sleeves (103) which are in threaded connection with the threaded rods (102) are sleeved outside the threaded rods (102), the tops of the threaded sleeves (103) are welded with right-angle clamping plates (104), and the inner walls of the right-angle clamping plates (104) are attached with soft pads (105);
a side opening (202) is formed in one side, close to the inside, of the vertical plate (201), an electric push rod (203) is installed at the bottom of the inside of the side opening (202), a movable rod (204) extending towards the right side is movably embedded into the side opening (202), rolling grooves (206) are formed in the front side and the rear side of the outer wall of the movable rod (204), and a plurality of rolling balls (207) are connected in the rolling grooves (206) in a rolling mode;
the movable rod (204) is movably sleeved with a movable block (3) outside, a through hole (302) is formed in the middle of the side face of the movable block (3), a threaded shaft (303) penetrates through the top of the movable block (3), the tail end of the threaded shaft (303) penetrates through the upper portion of the inside of the through hole (302), and an arc-shaped clamping piece (304) is fixed at the tail end of the threaded shaft (303).
2. A semiconductor measuring device according to claim 1, characterized in that: a support plate (106) is fixed on both the left rear angle of the outer wall and the right front angle of the outer wall of the measuring table (1), and a motor (107) is mounted above the support plate (106).
3. A semiconductor measuring device according to claim 2, characterized in that: the tail end of the threaded rod (102) penetrates through the outer wall of the measuring table (1), and the tail end of the threaded rod (102) is fixedly connected with the output end of the adjacent motor (107).
4. A semiconductor measuring device according to claim 1, characterized in that: the upper surface of the threaded sleeve (103) protrudes out of the surface of the rotary groove (101), the right-angle clamping plates (104) are located on the upper surface of the measuring table (1), and the two right-angle clamping plates (104) are symmetrically distributed in a diagonal mode.
5. A semiconductor measuring device according to claim 1, characterized in that: the output end of the electric push rod (203) is connected with a connecting rod, the top of the connecting rod is fixedly connected with the left side of the lower surface of the movable rod (204), and a sliding block (205) is fixed at the left end of the movable rod (204).
6. A semiconductor measurement device according to claim 5, characterized in that: a sliding groove is formed in the left side of the inner wall of the side opening (202), and the sliding block (205) slides into the sliding groove and is in sliding connection with the sliding groove.
7. A semiconductor measuring device according to claim 1, characterized in that: the through hole (302) penetrates through the movable rod (204), the outer wall of the ball (207) is in rolling connection with the inner wall of the through hole (302), and the arc-shaped clamping piece (304) is located on the upper surface of the movable rod (204).
8. A semiconductor measuring device according to claim 1, characterized in that: laser measuring head (301) is installed to movable block (3) bottom, just laser measuring head (301) are on a parallel with two top between right angle splint (104).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122319963.6U CN216385479U (en) | 2021-09-24 | 2021-09-24 | Semiconductor measuring equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122319963.6U CN216385479U (en) | 2021-09-24 | 2021-09-24 | Semiconductor measuring equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN216385479U true CN216385479U (en) | 2022-04-26 |
Family
ID=81241629
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202122319963.6U Active CN216385479U (en) | 2021-09-24 | 2021-09-24 | Semiconductor measuring equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN216385479U (en) |
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2021
- 2021-09-24 CN CN202122319963.6U patent/CN216385479U/en active Active
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| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20220706 Address after: 528000 one of the fourth floor, block 2, no.7-2, Fu'an Industrial Zone, Leliu street, Shunde District, Foshan City, Guangdong Province Patentee after: Foshan Shunde Zhengqi Electronic Technology Co.,Ltd. Address before: 422407 No. 8, group 6, Guizhu village, houshutang Town, Wugang City, Shaoyang City, Hunan Province Patentee before: Zhu Yueke |
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| TR01 | Transfer of patent right |