CN218470823U

CN218470823U - Chip performance detection probe platform

Info

Publication number: CN218470823U
Application number: CN202221943226.1U
Authority: CN
Inventors: 刘卫滨
Original assignee: Dongfang Chenjing Nanjing Technology Co ltd
Current assignee: Dongfang Chenjing Nanjing Technology Co ltd
Priority date: 2022-07-26
Filing date: 2022-07-26
Publication date: 2023-02-10
Anticipated expiration: 2032-07-26

Abstract

The utility model relates to a chip detects technical field, especially relates to a chip performance detection probe platform, including detecting the platform, the upper end fixed mounting who detects the platform has motor one, the output shaft fixed mounting of motor one has the plectane, the upper end fixed mounting of plectane has places the board, the upper end fixed mounting who detects the platform has the support frame, and removal through the connecting seat can drive mounting, anchor clamps and probe pin and carry out the ascending removal of vertical side, and this probe platform is convenient for carry out vertical direction and horizontal direction's regulation to the probe pin, conveniently carries out performance detection to the chip of placing in the board, uses more in a flexible way, through starter motor one, makes the plectane rotate, and rotation through the plectane can drive and place the board and place the chip in the board and rotate, and the use of adjusting structure and pushing structure on the deuterogamy for it is more comprehensive to detect the chip, and it is more convenient to use, has improved the practicality of chip performance detection probe platform.

Description

Chip performance detection probe platform

Technical Field

The utility model relates to a chip detects technical field, especially relates to a chip performance test probe platform.

Background

The probe station is mainly applied to the testing of semiconductor industry, photoelectric industry, integrated circuits and packaging. The method is widely applied to the research and development of precise electrical measurement of complex and high-speed devices, and aims to ensure quality and reliability and reduce research and development time and cost of device manufacturing processes.

However, in the actual use process, the position of the probe needle is not convenient to adjust, so that the detection of the chip is not comprehensive, and the use is inconvenient, so that the probe station for detecting the chip performance is urgently needed.

SUMMERY OF THE UTILITY MODEL

In order to overcome the defects of the prior art, the utility model provides a chip performance detection probe platform.

In order to solve the technical problem, the utility model provides a following technical scheme: the utility model provides a chip performance detection probe platform, is including examining test table, the upper end fixed mounting who examines test table has motor I, the output shaft fixed mounting of motor I has the plectane, the upper end fixed mounting of plectane has places the board, the upper end fixed mounting who examines test table has the support frame, the spout has been seted up on the surface of support frame, the activity is pegged graft in the spout has the connecting seat, the rectangular channel has been seted up to the upper surface of connecting seat, movable mounting has the mounting on the connecting seat, the tip fixed mounting of mounting has anchor clamps, fixed mounting has the probe on the anchor clamps, be provided with push structure on the connecting seat, push structure includes slide bar, motor two and rack, the slide bar activity runs through the rectangular channel, rack fixed mounting is in the bottom of slide bar, the output shaft fixed mounting of motor two has the gear, gear and rack toothing, be provided with the regulation structure on the support frame, the regulation structure includes motor three and threaded rod, fixed mounting has the gag lever in the rectangular channel, the gag lever activity runs through the slide bar, the both sides tip fixed mounting of connecting seat has the connecting block.

As a preferred technical scheme of the utility model, two the arc wall has all been seted up on the relative two sides of connecting block, the equal fixed mounting in both ends of support frame has the arc pole, two the arc pole activity respectively runs through the spout.

As a preferred technical scheme of the utility model, fixed mounting has the supporting shoe on the connecting block, two fixed mounting of motor are on the supporting shoe, three fixed mounting of motor are in the upper end of support frame.

As a preferred technical scheme of the utility model, the threaded rod rotates and installs in the spout, output shaft two and the threaded rod fixed connection of motor three.

As a preferred technical scheme of the utility model, the threaded rod runs through the connecting seat to with connecting seat threaded connection.

Compared with the prior art, the utility model discloses the beneficial effect that can reach is:

one of them, can drive the connecting seat through the rotation of threaded rod and carry out the ascending removal of vertical side, the removal through the connecting seat can drive the mounting, anchor clamps and probe needle carry out the ascending removal of vertical side, this probe platform is convenient for carry out the regulation of vertical direction and horizontal direction to the probe needle, the convenience is to placing the chip in the board and carrying out the performance detection, it is more nimble to use, through starter motor one, make the plectane rotate, the rotation through the plectane can drive and place the board and place the chip in the board and rotate, the use of adjusting structure and pushing structure on deuterogamying, make the detection to the chip detect more comprehensively, it is more convenient to use, the practicality of chip performance detection probe platform has been improved.

Secondly, there is the gag lever post through fixed mounting in the rectangular channel, the gag lever post activity runs through the slide bar, spacing and supporting role have been played to the slide bar, make rack and probe removal more stable, wheel and rack meshing has been guaranteed, thereby this pushing structure's steady operation has been guaranteed, the equal fixed mounting of both sides tip through the support frame has the arc pole, two arc poles activity respectively runs through the arc wall, limiting role has been played to the connecting seat, make the vertical direction of connecting seat remove more stably, thereby make to adjust more stably to the vertical direction of probe, the steady operation of chip performance testing probe platform has been guaranteed.

Drawings

Fig. 1 is a schematic structural diagram of a chip performance testing probe station of the present invention;

FIG. 2 is an enlarged schematic view of the structure of FIG. 1;

FIG. 3 is a schematic structural view of the support frame of the present invention;

fig. 4 is a schematic structural view of the connecting seat of the present invention.

Wherein: 1. a detection table; 11. a first motor; 12. a circular plate; 13. placing the plate; 14. a support frame; 15. a chute; 16. an arcuate bar; 2. a connecting seat; 21. a rectangular groove; 22. a limiting rod; 24. connecting blocks; 25. an arc-shaped slot; 26. a supporting block; 3. a fixing member; 31. a clamp; 32. a probe pin; 4. a slide bar; 5. a second motor; 51. a gear; 6. a rack; 7. a third motor; 8. a threaded rod.

Detailed Description

In order to make the technical means, the creation features, the achievement purposes and the functions of the invention easy to understand, the invention is further explained below with reference to the specific embodiments, but the following embodiments are only the preferred embodiments of the invention, not all. Based on the embodiments in the implementation, other embodiments obtained by those skilled in the art without any creative work belong to the protection scope of the present invention. The experimental procedures in the following examples were carried out in a conventional manner unless otherwise specified, and materials, reagents and the like used in the following examples were commercially available unless otherwise specified.

As shown in fig. 1, 2, 3 and 4, a chip performance detection probe station comprises a detection station 1, a first motor 11 is fixedly mounted at the upper end of the detection station 1, a circular plate 12 is fixedly mounted at an output shaft of the first motor 11, a placing plate 13 is fixedly mounted at the upper end of the circular plate 12, a support frame 14 is fixedly mounted at the upper end of the detection station 1, a sliding groove 15 is formed in the surface of the support frame 14, a connecting seat 2 is movably inserted in the sliding groove 15, a rectangular groove 21 is formed in the upper surface of the connecting seat 2, a fixing part 3 is movably mounted on the connecting seat 2, a clamp 31 is fixedly mounted at the end part of the fixing part 3, a detection needle 32 is fixedly mounted on the clamp 31, a pushing structure is arranged on the connecting seat 2 and comprises a sliding rod 4, a second motor 5 and a rack 6, the sliding rod 4 movably penetrates through the rectangular groove 21, the rack 6 is fixedly installed at the bottom end of the sliding rod 4, the gear 51 is fixedly installed on the first output shaft of the motor II 5, the gear 51 is meshed with the rack 6, the adjusting structure is arranged on the supporting frame 14 and comprises a motor III 7 and a threaded rod 8, the limiting rod 22 is fixedly installed in the rectangular groove 21, the limiting rod 22 movably penetrates through the sliding rod 4, the connecting blocks 24 are fixedly installed at the end portions of the two sides of the connecting seat 2, the chip is placed in the placing plate 13, then the motor II 5 is started, the gear 51 rotates, the rack 6 is driven to move in the horizontal direction through the rotation of the gear 51, the sliding rod 4 is driven to move through the movement of the rack 6, the fixing piece 3, the clamp 31 and the detecting needle 32 are driven to move through the movement of the sliding rod 4, the threaded rod 8 is driven to rotate through the starting of the motor III 7, the probe station can drive the connecting seat 2 to move in the vertical direction through the rotation of the threaded rod 8, the fixing part 3, the clamp 31 and the probe needle 32 can be driven to move in the vertical direction through the movement of the connecting seat 2, the probe station can conveniently adjust the probe needle 32 in the vertical direction and the horizontal direction, the performance detection of a chip in the placing plate 13 can be conveniently carried out, the probe station is more flexible to use, the circular plate 12 can be rotated through the starting motor I11, the placing plate 13 and the chip in the placing plate 13 can be driven to rotate through the rotation of the circular plate 12, the use of the adjusting structure and the pushing structure is matched, the probe needle 32 can more comprehensively detect the chip and is more convenient to use, the practicability of the chip performance detection probe station is improved, the limiting rod 22 is fixedly installed in the rectangular groove 21, the limiting rod 22 movably penetrates through the sliding rod 4, the sliding rod 4 plays a limiting and supporting roles, the rack 6 and the probe needle 32 can move more stably, the gear 51 is meshed with the rack 6, so that the stable operation of the pushing structure is ensured, the stable operation of the supporting rod 14 is ensured, the supporting block 14 is fixedly installed on the supporting seat 14, the two supporting rods 16 are respectively, the two supporting blocks 16 are installed on the fixing grooves 24, the fixing motor 24 and the supporting block 14 respectively, the two supporting blocks 14 are installed on the fixing and the fixing groove 14, and the output shaft II of the motor III 7 is fixedly connected with the threaded rod 8, and the threaded rod 8 penetrates through the connecting seat 2 and is in threaded connection with the connecting seat 2.

When the probe station is used, chips are placed in the placing plate 13, then the second motor 5 is started, the gear 51 is enabled to rotate, the rack 6 is driven to move in the horizontal direction through the rotation of the gear 51, the slide rod 4 is driven to move through the movement of the rack 6, the fixing piece 3, the clamp 31 and the probe needle 32 are driven to move through the movement of the slide rod 4, the threaded rod 8 is enabled to rotate through the third motor 7, the connecting seat 2 is driven to move in the vertical direction through the rotation of the threaded rod 8, the fixing piece 3, the clamp 31 and the probe needle 32 are driven to move in the vertical direction through the movement of the connecting seat 2, the probe station is convenient to adjust the probe needle 32 in the vertical direction and the horizontal direction, the performance detection of the chips in the placing plate 13 is facilitated, the use is more flexible, and the circular plate 12 is enabled to rotate through the first motor 11, the placing plate 13 and the chip in the placing plate 13 are driven to rotate by the rotation of the circular plate 12, and then the use of an adjusting structure and a pushing structure is matched, so that the detection probe 32 can detect the chip more comprehensively and more conveniently, the practicability of a chip performance detection probe platform is improved, a limiting rod 22 is fixedly arranged in a rectangular groove 21, the limiting rod 22 movably penetrates through a sliding rod 4, the limiting and supporting effects on the sliding rod 4 are achieved, the rack 6 and the detection probe 32 can move more stably, the gear 51 is ensured to be meshed with the rack 6, the stable operation of the pushing structure is ensured, arc rods 16 are fixedly arranged at the end parts of two sides of a supporting frame 14, the two arc rods 16 respectively movably penetrate through arc grooves 25, the limiting effect on the connecting seat 2 is achieved, the vertical direction movement of the connecting seat 2 is enabled to be more stable, and the vertical direction adjustment on the detection probe 32 is enabled to be more stable, the stable operation of the chip performance detection probe station is ensured.

The embodiments of the present invention have been described in detail with reference to the drawings, but the present invention is not limited thereto, and various changes can be made without departing from the gist of the present invention within the knowledge of those skilled in the art.

Claims

1. The chip performance detection probe station comprises a detection station (1) and is characterized in that a first motor (11) is fixedly mounted at the upper end of the detection station (1), a circular plate (12) is fixedly mounted at an output shaft of the first motor (11), a placing plate (13) is fixedly mounted at the upper end of the circular plate (12), a support frame (14) is fixedly mounted at the upper end of the detection station (1), a sliding groove (15) is formed in the surface of the support frame (14), a connecting seat (2) is movably inserted in the sliding groove (15), a rectangular groove (21) is formed in the upper surface of the connecting seat (2), a fixing part (3) is movably mounted on the connecting seat (2), a clamp (31) is fixedly mounted at the end part of the fixing part (3), a detection needle (32) is fixedly mounted on the clamp (31), a pushing structure is arranged on the connecting seat (2), the pushing structure comprises a sliding rod (4), a second motor (5) and a rack (6), the sliding rod (4) movably penetrates through the rectangular groove (21), the rack (6) is fixedly mounted at the bottom end of the sliding rod (4), a gear (51) is meshed with the support frame (14), the adjusting structure comprises a motor III (7) and a threaded rod (8).

2. The chip performance testing probe station according to claim 1, wherein a limiting rod (22) is fixedly installed in the rectangular groove (21), the limiting rod (22) movably penetrates through the sliding rod (4), and connecting blocks (24) are fixedly installed at both side ends of the connecting seat (2).

3. The probe station for detecting the chip performance according to claim 2, wherein two opposite surfaces of the two connecting blocks (24) are respectively provided with an arc-shaped groove (25), two ends of the supporting frame (14) are respectively and fixedly provided with an arc-shaped rod (16), and the two arc-shaped rods (16) respectively and movably penetrate through the sliding grooves (15).

4. The chip performance test probe station according to claim 3, wherein a supporting block (26) is fixedly installed on the connecting block (24), the second motor (5) is fixedly installed on the supporting block (26), and the third motor (7) is fixedly installed at the upper end of the supporting frame (14).

5. The chip performance testing probe station according to claim 4, characterized in that the threaded rod (8) is rotatably installed in the sliding groove (15), and an output shaft II of the motor III (7) is fixedly connected with the threaded rod (8).

6. The probing station for testing chip performance as claimed in claim 5, wherein the threaded rod (8) penetrates through the connecting base (2) and is threadedly connected to the connecting base (2).