CN218359388U

CN218359388U - Z-axis lifting table for quartz wafer test bench

Info

Publication number: CN218359388U
Application number: CN202222747503.8U
Authority: CN
Inventors: 曹鹏
Original assignee: Nanjing Luxian Automation Technology Co ltd
Current assignee: Nanjing Luxian Automation Technology Co ltd
Priority date: 2022-10-19
Filing date: 2022-10-19
Publication date: 2023-01-24
Anticipated expiration: 2032-10-19

Abstract

The utility model discloses a Z axle elevating platform for quartz wafer testboard, concretely relates to quartz wafer testboard technical field, including the testboard, testboard top fixed mounting has the platen, and platen top fixed mounting has tray down, and the tray top is provided with Z axle elevating platform down, and Z axle elevating platform top is provided with the tray. The utility model discloses a set up the lower tray, Z axle elevating platform and last tray, rotate the hand wheel in operation process, realize the rotation of dwang, thereby realize backing plate one, the removal of backing plate two and second slide rail, the second slide moves along the second slide rail, the Z that realizes the upper tray under guide post and guide sleeve's effect is to the adjustment of height, structural design is reasonable, and is easy to operate, through setting up scale and pointer, can confirm suitable adjustment height according to the direction of pointer, thereby guarantee the accurate nature of data in the test procedure.

Description

Z-axis lifting table for quartz wafer test bench

Technical Field

The utility model relates to a quartz wafer testboard technical field, more specifically says, the utility model relates to a Z axle elevating platform for quartz wafer testboard.

Background

The quartz crystal wafer is mainly used in various electronic components, is a very excellent basic material, and has a series of excellent physical and chemical functions, such as good light transmission function, good thermal stability, corrosion resistance, high temperature resistance and the like. The quartz wafer needs to be tested before use, and can be used after the test is qualified. During testing, the quartz wafer is placed on a test bench for testing.

The existing test bench is only a fixed plane, lacks a matched Z-axis adjusting mechanism, and cannot quickly enable the quartz wafer to be quickly butted with a testing mechanism in the using process, so that a user cannot quickly test the quartz wafer at the most proper height, and the working efficiency is reduced. The present invention was made in view of the above problems.

SUMMERY OF THE UTILITY MODEL

In order to overcome the above-mentioned defects of the prior art, the utility model provides a Z axle elevating platform for quartz wafer testboard solves the problem that proposes among the above-mentioned background art.

In order to achieve the above object, the present invention provides the following technical solutions: a Z-axis lifting table for a quartz wafer test table comprises a test table, wherein a table plate is fixedly arranged at the top of the test table, a lower tray is fixedly arranged at the top of the table plate, a Z-axis lifting table is arranged above the lower tray, and an upper tray is arranged at the top of the Z-axis lifting table;

z axle elevating platform includes four guide posts, the equal fixed mounting in upper tray four corners department has guide sleeve, fixed surface installs first slide rail on the lower tray, sliding connection has two first slides on the first slide rail, two first slide top fixed mounting have backing plate one, backing plate right side fixed mounting has backing plate two, backing plate two right side fixed mounting has the second slide rail, and the second slide rail is the slant setting, sliding connection has the second slide on the second slide rail, second slide right side fixed mounting has backing plate three, backing plate three top and upper tray lower fixed surface are connected.

In a preferred embodiment, the four corners of the lower surface of the test bench are fixedly provided with moving wheels.

In a preferred embodiment, the upper surface of the lower tray is detachably provided with a first connecting plate through bolts, and a graduated scale is fixedly arranged on the first connecting plate.

In a preferred embodiment, the scale is vertically disposed.

In a preferred embodiment, a second connecting plate is detachably mounted on the upper tray through bolts, and a pointer is fixedly mounted on the second connecting plate.

In a preferred embodiment, the pointer is arranged horizontally.

In a preferred embodiment, four guide posts are respectively and fixedly installed at four corners of the lower tray, and the positions of the four guide posts correspond to the positions of the four guide sleeves up and down.

In a preferred embodiment, a connecting seat is fixedly arranged on the upper surface of the lower tray, a rotating rod is rotatably arranged in the connecting seat, and an external thread is processed on the rotating rod.

In a preferred embodiment, the first backing plate is provided with a threaded hole, and the rotating rod is in threaded connection with the first backing plate.

In a preferred embodiment, a hand wheel is fixedly mounted at the outer end of the rotating rod.

Compared with the prior art, the beneficial effects of the utility model are that:

1. the utility model realizes the rotation of the rotating rod by arranging the lower tray, the Z-axis lifting table and the upper tray and rotating the hand wheel in the operation process, thereby realizing the movement of the first backing plate, the second backing plate and the second slide rail, and the second slide carriage moves along the second slide rail, realizing the adjustment of the Z-direction height of the upper tray, and having reasonable structural design and simple operation;

2. the utility model discloses a set up scale and pointer, operating personnel can confirm suitable adjustment height according to the direction of pointer when highly adjusting to the Z of last tray to guarantee the accurate nature of data in the test procedure.

Drawings

For a clearer explanation of the embodiments of the present application or technical solutions in the prior art, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments described in the present application, and it is obvious for those skilled in the art to obtain other drawings according to these drawings.

Fig. 1 is a partial structural schematic view of embodiment 1 of the present invention;

fig. 2 is a side view of a Z-axis elevating table according to embodiment 1 of the present invention;

fig. 3 is a rear view of a Z-axis elevating table according to embodiment 1 of the present invention;

fig. 4 is a front view of a Z-axis elevating table according to embodiment 2 of the present invention;

fig. 5 is an enlarged schematic view of the area a in fig. 4 according to the present invention;

fig. 6 is a schematic view of the overall structure of the present invention.

Description of reference numerals:

1. a test bench; 2. a moving wheel; 3. a platen; 4. a lower tray; 5. a Z-axis lifting table; 501. a guide post; 502. a guide sleeve; 503. a first slide rail; 504. a first slider; 505. a first base plate; 506. a second backing plate; 507. a second slide rail; 508. a second slide carriage; 509. a base plate III; 510. a connecting seat; 511. rotating the rod; 512. a hand wheel; 6. an upper tray; 7. a first connecting plate; 8. a graduated scale; 9. a second connecting plate; 10. a pointer.

Detailed Description

The present invention is described in terms of specific embodiments, and other advantages and benefits of the present invention will become apparent to those skilled in the art from the following disclosure. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Example 1

Referring to fig. 6, the Z-axis lifting table for the quartz wafer test table of the embodiment includes a test table 1, wherein moving wheels 2 are fixedly mounted at four corners of the lower surface of the test table 1, so that the quartz wafer test table can be moved and transported conveniently, and the flexibility of the device is improved.

Referring to the attached drawing 1, a platen 3 is fixedly mounted at the top of the test bench 1, a lower tray 4 is fixedly mounted at the top of the platen 3, a Z-axis lifting table 5 is arranged above the lower tray 4, and an upper tray 6,Z is arranged at the top of the Z-axis lifting table 5 and used for lifting an upper tray 6.

Referring to fig. 1, fig. 2 and fig. 3, the Z-axis lifting table 5 includes four guide posts 501, four guide posts 501 are respectively and fixedly mounted at four corners of the lower tray 4, four corners of the upper tray 6 are respectively and fixedly mounted with guide sleeves 502, four positions of the guide posts 501 correspond to positions of the four guide sleeves 502 up and down, the four guide posts 501 respectively penetrate through the four guide sleeves 502, and by arranging the guide posts 501 and the guide sleeves 502, the guiding and limiting effects are realized, and the upper tray 6 is guaranteed to move in the Z direction.

Referring to fig. 2 and 3, fixed surface installs first slide rail 503 on tray 4 down, sliding connection has two first slides 504, two on first slide rail 503 slide rail 504 top fixed mounting has backing plate 505, fixed surface installs connecting seat 510 on tray 4 down, and connecting seat 510 sets up the place ahead at first slide rail 503, dwang 511 is installed to connecting seat 510 internal rotation, it has the external screw thread to process on the dwang 511, set up threaded hole on backing plate 505, dwang 511 and backing plate 505 threaded connection, dwang 511 outer end fixed mounting has hand wheel 512, and operating personnel rotates hand wheel 512 in the use, and hand wheel 512 drives dwang 511 to rotate, because backing plate 505 and dwang 511 threaded connection to backing plate 505 fixed mounting is in the top of two first slides 504, and first slide 504 sliding connection is on first slide rail 503, consequently at dwang 511 pivoted in-process, first slide rail 503 will move along first slide rail 503.

Referring to fig. 2 and 3, the right side of the first backing plate 505 is fixedly provided with a second backing plate 506, the second backing plate 506 moves along with the first backing plate 505, the right side of the second backing plate 506 is fixedly provided with a second slide rail 507, the second slide rail 507 is obliquely arranged, specifically, the second slide rail is arranged at the rear lower part, the second slide rail 507 is slidably connected with a second slide carriage 508, the right side of the second slide carriage 508 is fixedly provided with a third backing plate 509, and the top end of the third backing plate 509 is fixedly connected with the lower surface of the upper tray 6.

In the process that the first cushion plate 505 drives the second cushion plate 506 to move, because the second slide rail 507 is fixedly mounted on the second cushion plate 506, the second slide seat 508 is in sliding connection with the second slide rail 507, the third cushion plate 509 is fixedly connected with the second slide seat 508, and the third cushion plate 509 is in a limiting state under the action of the guide column 501 and the guide sleeve 502, when the first cushion plate 505 drives the second cushion plate 506 to move, the second slide rail 507 moves synchronously, at the moment, the second slide seat 508 moves along the second slide rail 507, so that the third cushion plate 509 moves in the vertical direction, and the adjustment of the height of the upper tray 6 in the Z direction is realized. This device structural design is reasonable, and easy operation can realize tray 6's Z to the adjustment of height, and the operating personnel of being convenient for uses.

Example 2

Referring to fig. 4 and 5, a Z-axis lifting table for a quartz wafer test bench according to this embodiment has a structure substantially the same as that of embodiment 1, except that in this embodiment, a first connecting plate 7 is detachably mounted on an upper surface of a lower tray 4 through a bolt, a scale 8 is fixedly mounted on the first connecting plate 7, the scale 8 is vertically arranged, a second connecting plate 9 is detachably mounted on an upper tray 6 through a bolt, a pointer 10 is fixedly mounted on the second connecting plate 9, the pointer 10 is horizontally arranged, the pointer 10 points to the scale 8, and when an operator operates the Z-axis lifting table 5 to adjust the Z-direction height of the upper tray 6, the operator can determine an appropriate adjustment height according to the pointing direction of the pointer 10, thereby ensuring accuracy of data during a test process.

And finally: the above description is only for the preferred embodiment of the present invention and should not be taken as limiting the invention, and any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. The utility model provides a Z axle elevating platform for quartz wafer testboard, includes testboard (1), its characterized in that: a bedplate (3) is fixedly installed at the top of the test bench (1), a lower tray (4) is fixedly installed at the top of the bedplate (3), a Z-axis lifting table (5) is arranged above the lower tray (4), and an upper tray (6) is arranged at the top of the Z-axis lifting table (5);

z axle elevating platform (5) includes four guide posts (501), go up tray (6) four corners department equal fixed mounting have guide sleeve (502), tray (4) upper surface fixed mounting has first slide rail (503) down, sliding connection has two first slides (504) on first slide rail (503), two first slide (504) top fixed mounting has backing plate (505), backing plate (505) right side fixed mounting has backing plate two (506), backing plate two (506) right side fixed mounting has second slide rail (507) to second slide rail (507) is the slant setting, sliding connection has second slide (508) on second slide rail (507), second slide (508) right side fixed mounting has backing plate three (509), backing plate three (509) top and last tray (6) lower fixed connection.

2. The Z-axis lift table for a quartz wafer test stand of claim 1, wherein: the four corners of the lower surface of the test board (1) are fixedly provided with moving wheels (2).

3. The Z-axis lift table for a quartz wafer test stand of claim 1, wherein: lower tray (4) upper surface has first connecting plate (7) through bolt demountable installation, fixed mounting has scale (8) on first connecting plate (7).

4. The Z-axis lift table for a quartz wafer test stand of claim 3, wherein: the graduated scale (8) is vertically arranged.

5. The Z-axis lift table for a quartz wafer test stand of claim 1, wherein: go up tray (6) and go up through bolt demountable installation have second connecting plate (9), fixed mounting has pointer (10) on second connecting plate (9).

6. The Z-axis lift table for a quartz wafer test stand of claim 5, wherein: the pointer (10) is arranged horizontally.

7. The Z-axis lift table for a quartz wafer test stand of claim 1, wherein: the four guide posts (501) are respectively and fixedly installed at four corners of the lower tray (4), and the positions of the four guide posts (501) correspond to the positions of the four guide sleeves (502) up and down.

8. The Z-axis lift table for a quartz wafer test stand of claim 1, wherein: fixed surface installs connecting seat (510) on lower tray (4), dwang (511) are installed to connecting seat (510) internal rotation, it has the external screw thread to process on dwang (511).

9. The Z-axis lift table for a quartz wafer test stand of claim 8, wherein: a threaded hole is formed in the first backing plate (505), and the rotating rod (511) is in threaded connection with the first backing plate (505).

10. The Z-axis lift table for a quartz wafer test stand of claim 8, wherein: and a hand wheel (512) is fixedly mounted at the outer end of the rotating rod (511).