CN116298813A - PCB board scanning testing arrangement - Google Patents
PCB board scanning testing arrangement Download PDFInfo
- Publication number
- CN116298813A CN116298813A CN202310352473.7A CN202310352473A CN116298813A CN 116298813 A CN116298813 A CN 116298813A CN 202310352473 A CN202310352473 A CN 202310352473A CN 116298813 A CN116298813 A CN 116298813A
- Authority
- CN
- China
- Prior art keywords
- fixedly connected
- test
- sliding
- pcb
- connecting plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 136
- 239000000523 sample Substances 0.000 claims abstract description 40
- 238000003466 welding Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 2
- 150000003071 polychlorinated biphenyls Chemical class 0.000 description 2
- 230000006978 adaptation Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000002035 prolonged effect Effects 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
- G01R31/2815—Functional tests, e.g. boundary scans, using the normal I/O contacts
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention relates to the technical field of PCB board testing, in particular to a PCB board scanning testing device, which comprises a testing seat and a scanning testing assembly, wherein the scanning testing assembly comprises a bracket, two lifting units, a connecting plate, a sliding unit, a testing board and a plurality of probes, the bracket is fixedly connected with the testing seat and is positioned above the testing seat, the two lifting units are sequentially arranged on the bracket, the connecting plate is arranged between the two lifting units, the sliding unit is arranged on the connecting plate, the testing board is arranged on the sliding unit, the plurality of probes are fixedly connected with the testing board and are sequentially distributed below the testing board, the PCB board is placed on the testing seat, the lifting unit drives the connecting plate and the testing board to move downwards, the probes are contacted with the PCB board for scanning testing, and meanwhile, the sliding unit drives the testing board and the probes to move along the connecting plate to transversely scan and test the PCB board, so that the PCB boards with different sizes can be adapted, and the testing cost is reduced.
Description
Technical Field
The invention relates to the technical field of PCB testing, in particular to a PCB scanning and testing device.
Background
In the production process of the PCB, welding points of the PCB are required to be detected, the delivery quality of products is ensured to be qualified, but the efficiency is low through manual visual inspection at present, and mistakes are easy to occur in the detection process.
In the prior art, a PCB to be tested is placed in a jig, then a cylinder or a push rod is used for driving a test board matched with the PCB to move downwards, and after the test board reaches the upper part of the PCB, a plurality of probes on the test board are used for scanning test, so that manual naked eye observation is not needed.
However, in the prior art, the probe is fixed in position and cannot be transversely used, so that different test boards and probes are required to be replaced for testing the PCB with different types, and the test cost is increased.
Disclosure of Invention
The invention aims to provide a PCB scanning and testing device, which solves the problems that the position of a probe is fixed and cannot be transversely changed in the prior art, different testing boards and probes are required to be replaced for testing different types of PCBs, and the testing cost is increased.
In order to achieve the above purpose, the invention provides a PCB scanning test device, which comprises a test seat and a scanning test assembly;
the scanning test assembly comprises a support, two lifting units, a connecting plate, sliding units, a test plate and a plurality of probes, wherein the support is fixedly connected with the test seat and is located above the test seat, the two lifting units are sequentially arranged on the support, the connecting plate is arranged between the two lifting units, the sliding units are arranged on the connecting plate, the test plate is arranged on the sliding units, and the probes are fixedly connected with the test plate and are sequentially distributed below the test plate.
The scanning test assembly further comprises a control panel, wherein the control panel is fixedly connected with the test seat and is positioned on one side of the test seat.
The lifting unit comprises a cylinder and a first sliding block, the support is provided with a first sliding groove, the first sliding block is in sliding connection with the first sliding groove, the cylinder is fixedly connected with the support and is located on the inner side wall of the first sliding groove, the output end of the cylinder is fixedly connected with the first sliding block, two ends of the connecting plate are respectively fixedly connected with the corresponding first sliding blocks, and the connecting plate is distributed between the two first sliding blocks.
The sliding unit comprises a supporting block, a motor, a driving shaft and a roller, wherein the supporting block is sleeved outside the connecting plate, the motor is fixedly connected with the supporting block and is positioned at one end of the supporting block, one end of the driving shaft is fixedly connected with the output end of the motor, the other end of the driving shaft penetrates through the supporting block and is fixedly connected with the roller, the connecting plate is provided with a groove, and the roller is mutually matched with the groove.
The sliding unit further comprises a second sliding block, the connecting plate is further provided with a second sliding groove, the second sliding block is in sliding connection with the second sliding groove, and the second sliding block is fixedly connected with the supporting block and is located on the inner side wall of the supporting block.
The PCB scanning test device further comprises a clamping assembly, and the clamping assembly is arranged on the test seat.
The clamping assembly comprises a driving unit, two clamping plates and two thread blocks, wherein the driving unit is arranged below the test seat, the test seat is provided with a groove, the two thread blocks are sequentially arranged on the driving unit, the two thread blocks are mutually matched with the groove, and the two clamping plates are respectively fixedly connected with the corresponding thread blocks and are positioned above the corresponding thread blocks.
The driving unit comprises two supporting plates, a motor, a first threaded rod, a second threaded rod and a connecting shaft, wherein the two supporting plates are fixedly connected with the test seat and are sequentially distributed below the test seat, the motor is fixedly connected with the corresponding supporting plate and is located at one side of the corresponding supporting plate, one ends of the first threaded rod and the second threaded rod are fixedly connected with the connecting shaft and symmetrically distributed at two ends of the connecting shaft, the other end of the first threaded rod penetrates through the supporting plate close to the motor and is fixedly connected with the output end of the motor, the other end of the second threaded rod is rotatably connected with the supporting plate far away from the motor, and the first threaded rod and the second threaded rod are respectively mutually matched with the corresponding threaded blocks.
According to the PCB scanning test device, the test board supports the probes, the probes can scan and detect welding spots of the PCB, the PCB is placed on the test seat, the lifting unit drives the connecting plate and the test board to move downwards, the probes move downwards to be in contact with the PCB for scanning test, meanwhile, the sliding unit drives the test board and the probes to move along the connecting plate for scanning test on the PCB transversely, and through the arrangement of the structure, the probes can be adjusted movably, so that the PCB with different sizes is adapted, and the test cost is reduced.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below.
Fig. 1 is a schematic overall structure of a first embodiment of the present invention.
Fig. 2 is an overall cross-sectional view of a first embodiment of the present invention.
Fig. 3 is a cross-sectional view taken along line A-A of fig. 2 in accordance with the present invention.
Fig. 4 is an enlarged view of the partial structure at B of fig. 2 according to the present invention.
Fig. 5 is a schematic overall structure of a second embodiment of the present invention.
Fig. 6 is an overall cross-sectional view of a second embodiment of the present invention.
Fig. 7 is a cross-sectional view taken along line C-C of fig. 6 in accordance with the present invention.
Fig. 8 is a schematic overall structure of a third embodiment of the present invention.
Fig. 9 is an overall cross-sectional view of a third embodiment of the present invention.
Fig. 10 is a sectional view taken along line D-D of fig. 9 in accordance with the present invention.
Fig. 11 is an enlarged view of a partial structure at E of fig. 9 according to the present invention.
101-test seat, 102-bracket, 103-connecting plate, 104-test plate, 105-probe, 106-control panel, 107-cylinder, 108-first slide, 109-first slide slot, 110-support block, 111-motor, 112-drive shaft, 113-roller, 114-slot, 115-second slide slot, 116-second slide slot, 201-clamping plate, 202-screw block, 203-groove, 204-support plate, 205-motor, 206-first threaded rod, 207-second threaded rod, 208-connecting shaft, 301-protective cover plate, 302-hinge, 303-first magnet, 304-second magnet, 305-third magnet, 306-fourth magnet.
Detailed Description
The following detailed description of embodiments of the invention, examples of which are illustrated in the accompanying drawings and, by way of example, are intended to be illustrative, and not to be construed as limiting, of the invention.
First embodiment:
referring to fig. 1 to 4, fig. 1 is a schematic overall structure of a first embodiment of the present invention, fig. 2 is a sectional overall view of the first embodiment of the present invention, fig. 3 is a sectional view of fig. 2 A-A of the present invention, and fig. 4 is an enlarged view of a partial structure of fig. 2B of the present invention. The invention provides a PCB board scanning test device, which comprises a test seat 101 and a scanning test assembly, wherein the scanning test assembly comprises a bracket 102, two lifting units, a connecting plate 103, a sliding unit, a test board 104, a plurality of probes 105 and a control panel 106, the lifting units comprise an air cylinder 107 and a first sliding block 108, the bracket 102 is provided with a first sliding groove 109, the sliding unit comprises a supporting block 110, a motor 111, a driving shaft 112, a roller 113 and a second sliding block 115, and the connecting plate 103 is also provided with a second sliding groove 116.
For the specific embodiment, the cylinder 107 drives the first slider 108 to slide in the first chute 109, the probe 105 moves down to contact with the PCB board for scanning test, the motor 111 drives the driving shaft 112 to rotate, the driving shaft 112 drives the roller 113 to rotate in the slot 114, and drives the supporting block 110 and the plurality of probes 105 to move along the connecting board 103, so as to transversely scan test the PCB board.
The support 102 is fixedly connected with the test seat 101, and is located above the test seat 101, two lifting units are sequentially arranged on the support 102, a connecting plate 103 is arranged between the two lifting units, a sliding unit is arranged on the connecting plate 103, a test plate 104 is arranged on the sliding unit, and a plurality of probes 105 are fixedly connected with the test plate 104 and are sequentially distributed below the test plate 104. The test seat 101 supports the scanning test assembly, the test board 104 supports a plurality of probes 105, the probes 105 can scan and detect welding spots of the PCB, the PCB is placed on the test seat 101, the lifting unit drives the connecting plate 103 and the test board 104 to move downwards, the probes 105 move downwards to be in contact with the PCB for scanning test, and meanwhile the sliding unit drives the test board 104 and the probes 105 to move along the connecting plate 103 for scanning test of the PCB transversely.
Next, the control panel 106 is fixedly connected to the test socket 101 and located at one side of the test socket 101. The control panel 106 facilitates control of the start and stop of the equipment of the PCB scan test device.
Meanwhile, the support 102 is provided with a first sliding groove 109, the first sliding block 108 is slidably connected with the first sliding groove 109, the air cylinder 107 is fixedly connected with the support 102 and is located on the inner side wall of the first sliding groove 109, the output end of the air cylinder 107 is fixedly connected with the first sliding block 108, two ends of the connecting plate 103 are respectively fixedly connected with the corresponding first sliding blocks 108, and the connecting plate 103 is distributed between the two first sliding blocks 108. The cylinder 107 extends to drive the first slider 108 to slide in the first chute 109, and drive the connecting plate 103 and the probe 105 to move downward.
In addition, the supporting block 110 is sleeved outside the connecting plate 103, the motor 111 is fixedly connected with the supporting block 110 and is located at one end of the supporting block 110, one end of the driving shaft 112 is fixedly connected with the output end of the motor 111, the other end of the driving shaft 112 penetrates through the supporting block 110 and is fixedly connected with the roller 113, the connecting plate 103 is provided with a slot 114, and the roller 113 is mutually matched with the slot 114. The supporting block 110 supports the whole sliding unit, the motor 111 drives the driving shaft 112 to rotate, and the driving shaft 112 drives the roller 113 to rotate in the slot 114, so as to drive the supporting block 110 to move along the connecting plate 103.
Finally, the connecting plate 103 further has a second sliding groove 116, and the second sliding block 115 is slidably connected with the second sliding groove 116, and the second sliding block 115 is fixedly connected with the supporting block 110 and is located on an inner side wall of the supporting block 110. When the supporting block 110 moves, the second slider 115 is driven to slide in the second sliding groove 116, so as to improve the movement stability.
When the PCB scanning test device is used, a PCB is firstly placed on the test seat 101, the first sliding block 108 is driven to slide in the first sliding groove 109 through the extension of the air cylinder 107, the connecting plate 103 and the probe 105 are driven to move downwards, the probe 105 is driven to move downwards to contact the PCB for scanning test, meanwhile, the motor 111 drives the driving shaft 112 to rotate, the driving shaft 112 drives the roller 113 to rotate in the groove 114, so that the supporting block 110 and the probes 105 are driven to move along the connecting plate 103, the PCB is transversely scanned and tested, and the probes 105 are movably adjusted to adapt to the PCBs with different sizes through the arrangement of the structure.
Second embodiment:
on the basis of the first embodiment, please refer to fig. 5 to 7, wherein fig. 5 is a schematic overall structure of the second embodiment of the present invention, fig. 6 is an overall cross-sectional view of the second embodiment of the present invention, and fig. 7 is a cross-sectional view of fig. 6 along line C-C of the present invention. The invention provides a PCB scanning testing device, which also comprises a clamping assembly, wherein the clamping assembly comprises a driving unit, two clamping plates 201 and two threaded blocks 202, the testing seat 101 is provided with a groove 203, and the driving unit comprises two supporting plates 204, a motor 205, a first threaded rod 206, a second threaded rod 207 and a connecting shaft 208.
For this embodiment, the motor 205 drives the first threaded rod 206 to rotate, and drives the second threaded rod 207 to rotate through the connection of the connecting shaft 208, so as to drive the threaded block 202 to move in the groove 203, and drive the two clamping plates 201 to move relatively, so as to clamp and fix the PCB.
Wherein, the clamping assembly is disposed on the test seat 101. The clamping assembly clamps and fixes the PCB, so that the stability of scanning test is improved.
Secondly, the driving unit is disposed below the test seat 101, the test seat 101 has a groove 203, two screw blocks 202 are sequentially disposed on the driving unit, the two screw blocks 202 are mutually adapted to the groove 203, and the two clamping plates 201 are respectively fixedly connected with the corresponding screw blocks 202 and are located above the corresponding screw blocks 202. The driving unit is matched with the two threaded blocks 202, so that the two clamping plates 201 are driven to move relatively to clamp the PCB.
Simultaneously, two backup pad 204 all with test seat 101 fixed connection, and distribute in proper order test seat 101's below, motor 205 with corresponding backup pad 204 fixed connection, and be located corresponding one side of backup pad 204, first threaded rod 206 with one end of second threaded rod 207 all with connecting axle 208 fixed connection, and the symmetric distribution is in connecting axle 208's both ends, the other end of first threaded rod 206 runs through be close to motor 205 backup pad 204, and with motor 205's output fixed connection, the other end of second threaded rod 207 with keep away from motor 205 backup pad 204 rotates to be connected, first threaded rod 206 and second threaded rod 207 respectively with corresponding screw thread piece 202 looks adaptation each other. The two support plates 204 support the first threaded rod 206, the second threaded rod 207 and the motor 205, the connecting shaft 208 connects the first threaded rod 206 with the second threaded rod 207, the motor 205 is started to drive the first threaded rod 206 to rotate, the second threaded rod 207 is driven to rotate through the connection of the connecting shaft 208, and after being matched with the corresponding threaded block 202, the threaded block 202 is driven to move in the groove 203 to drive the two clamping plates 201 to move relatively, so that the PCB is clamped and fixed.
When the PCB scanning testing device of the embodiment is used, after a PCB is placed on the testing seat 101, the first threaded rod 206 and the second threaded rod 207 are connected through the connecting shaft 208, then the motor 205 is started to drive the first threaded rod 206 to rotate, the second threaded rod 207 is driven to rotate through the connection of the connecting shaft 208, the threaded block 202 is driven to move in the groove 203 after being matched with the corresponding threaded block 202, the two clamping plates 201 are driven to move relatively, the PCB is clamped and fixed, and the PCB can be clamped and fixed through the arrangement of the structure, so that the testing stability is improved.
Third embodiment:
the PCB scanning test device further comprises a protection component, and the protection component is arranged on the test board 104. The protection assembly comprises a protection cover plate 301, two hinges 302, a first magnet 303, a second magnet 304, a third magnet 305 and a fourth magnet 306, wherein the protection cover plate 301 is connected with the test plate 104 through the two hinges 302, the first magnet 303 is fixedly connected with the protection cover plate 301 and is positioned at one end of the protection cover plate 301, the second magnet 304 is fixedly connected with the test plate 104 and is positioned below the test plate 104, the first magnet 303 and the second magnet 304 are attracted mutually, the third magnet 305 is fixedly connected with the protection cover plate 301 and is positioned at one side of the protection cover plate 301, the fourth magnet 306 is fixedly connected with the support block 110 and is positioned at one side of the support block 110, and the third magnet 305 and the fourth magnet 306 are attracted mutually.
On the basis of the second embodiment, please refer to fig. 8 to 11, wherein fig. 8 is a schematic overall structure diagram of the third embodiment of the present invention, fig. 9 is a sectional overall view of the third embodiment of the present invention, fig. 10 is a sectional D-D view of fig. 9 of the present invention, and fig. 11 is a partial enlarged view of the structure of fig. 9 at E of the present invention. The invention provides a PCB scanning testing device, which also comprises a protection component, wherein the protection component comprises a protection cover plate 301, two hinges 302, a first magnet 303, a second magnet 304, a third magnet 305 and a fourth magnet 306.
For the present embodiment, the protection cover 301 is covered on the outer parts of the plurality of probes 105, and is rotatably opened by the hinge 302, and then the protection cover 301 is attracted to one side of the supporting block 110 by the attraction between the third magnet 305 and the fourth magnet 306.
Wherein the protection component is disposed on the test board 104. The protection assembly protects a plurality of probes 105 from being damaged by collision when not in use, and improves service life.
Secondly, the protection cover plate 301 is connected with the test plate 104 through two hinges 302, the first magnet 303 is fixedly connected with the protection cover plate 301 and is located at one end of the protection cover plate 301, the second magnet 304 is fixedly connected with the test plate 104 and is located below the test plate 104, the first magnet 303 and the second magnet 304 attract each other, the third magnet 305 is fixedly connected with the protection cover plate 301 and is located at one side of the protection cover plate 301, the fourth magnet 306 is fixedly connected with the support block 110 and is located at one side of the support block 110, and the third magnet 305 and the fourth magnet 306 attract each other. The protection cover 301 is covered on the outer parts of the plurality of probes 105 by the mutual attraction of the first magnet 303 and the second magnet 304, the protection cover 301 protects the probes 105, the protection cover 301 can be opened by rotating the hinge 302, and then the protection cover 301 is adsorbed on one side of the supporting block 110 by the mutual attraction of the third magnet 305 and the fourth magnet 306.
When the PCB scanning test device of the embodiment is used, the protection cover plate 301 is covered on the outer parts of the probes 105 through the mutual attraction of the first magnet 303 and the second magnet 304, the protection cover plate 301 protects the probes 105, the protection cover plate 301 can be opened in a rotating mode through the hinge 302, and then the protection cover plate 301 is adsorbed on one side of the supporting block 110 through the mutual attraction of the third magnet 305 and the fourth magnet 306, so that the probes 105 are not influenced to move downwards for scanning test, the probes 105 are protected, collision damage is avoided when the device is not used, and the service life is prolonged.
The foregoing disclosure is only illustrative of one or more preferred embodiments of the present application and is not intended to limit the scope of the claims hereof, as it is to be understood by those skilled in the art that all or part of the process of implementing the described embodiment may be practiced otherwise than as specifically described and illustrated by the appended claims.
Claims (8)
1. A PCB scanning test device comprises a test seat, and is characterized in that,
the device also comprises a scanning test assembly;
the scanning test assembly comprises a support, two lifting units, a connecting plate, sliding units, a test plate and a plurality of probes, wherein the support is fixedly connected with the test seat and is located above the test seat, the two lifting units are sequentially arranged on the support, the connecting plate is arranged between the two lifting units, the sliding units are arranged on the connecting plate, the test plate is arranged on the sliding units, and the probes are fixedly connected with the test plate and are sequentially distributed below the test plate.
2. The PCB scan test device of claim 1, wherein,
the scanning test assembly further comprises a control panel which is fixedly connected with the test seat and is positioned on one side of the test seat.
3. The PCB scan test device of claim 2, wherein,
the lifting unit comprises a cylinder and a first sliding block, the support is provided with a first sliding groove, the first sliding block is in sliding connection with the first sliding groove, the cylinder is fixedly connected with the support and is located on the inner side wall of the first sliding groove, the output end of the cylinder is fixedly connected with the first sliding block, two ends of the connecting plate are respectively fixedly connected with the corresponding first sliding blocks, and the connecting plate is distributed between the two first sliding blocks.
4. The PCB scan test device of claim 3, wherein,
the sliding unit comprises a supporting block, a motor, a driving shaft and a roller, wherein the supporting block is sleeved outside the connecting plate, the motor is fixedly connected with the supporting block and is positioned at one end of the supporting block, one end of the driving shaft is fixedly connected with the output end of the motor, the other end of the driving shaft penetrates through the supporting block and is fixedly connected with the roller, the connecting plate is provided with a groove, and the roller is mutually matched with the groove.
5. The PCB scan test device of claim 4, wherein,
the sliding unit further comprises a second sliding block, the connecting plate is further provided with a second sliding groove, the second sliding block is in sliding connection with the second sliding groove, and the second sliding block is fixedly connected with the supporting block and is located on the inner side wall of the supporting block.
6. The PCB scan test device of claim 5, wherein,
the PCB scanning test device further comprises a clamping assembly, and the clamping assembly is arranged on the test seat.
7. The PCB scan test device of claim 6, wherein,
the clamping assembly comprises a driving unit, two clamping plates and two thread blocks, wherein the driving unit is arranged below the test seat, the test seat is provided with a groove, the two thread blocks are sequentially arranged on the driving unit, the two thread blocks are mutually matched with the groove, and the two clamping plates are respectively fixedly connected with the corresponding thread blocks and are positioned above the corresponding thread blocks.
8. The PCB scan test device of claim 7, wherein,
the drive unit comprises two support plates, a motor, a first threaded rod, a second threaded rod and a connecting shaft, wherein the two support plates are fixedly connected with the test seat and are sequentially distributed below the test seat, the motor is fixedly connected with the corresponding support plate and is located at one side of the corresponding support plate, one ends of the first threaded rod and the second threaded rod are fixedly connected with the connecting shaft and symmetrically distributed at two ends of the connecting shaft, the other end of the first threaded rod penetrates through the support plate close to the motor and is fixedly connected with the output end of the motor, the other end of the second threaded rod is rotatably connected with the support plate far away from the motor, and the first threaded rod and the second threaded rod are respectively matched with the corresponding threaded blocks.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310352473.7A CN116298813A (en) | 2023-04-04 | 2023-04-04 | PCB board scanning testing arrangement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310352473.7A CN116298813A (en) | 2023-04-04 | 2023-04-04 | PCB board scanning testing arrangement |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN116298813A true CN116298813A (en) | 2023-06-23 |
Family
ID=86837844
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202310352473.7A Pending CN116298813A (en) | 2023-04-04 | 2023-04-04 | PCB board scanning testing arrangement |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN116298813A (en) |
Citations (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN205283819U (en) * | 2015-12-09 | 2016-06-01 | 上海斐讯数据通信技术有限公司 | Silicon wafer microphone detection tool at terminal |
| CN106771989A (en) * | 2017-03-30 | 2017-05-31 | 冯晓栋 | A kind of LED circuit board detection means |
| CN208314088U (en) * | 2018-04-19 | 2019-01-01 | 敦吉电子（上海）有限公司 | A kind of electromagnetic compatibility test air-conditioning removable installation device |
| CN109541435A (en) * | 2018-11-14 | 2019-03-29 | 合肥泾渭信息通讯有限公司 | A kind of electronic equipment boundary scan testing device based on backboard |
| CN209821816U (en) * | 2019-05-31 | 2019-12-20 | 武汉华工正源光子技术有限公司 | Probe burning clamp |
| CN209981547U (en) * | 2019-05-30 | 2020-01-21 | 上海航键航空设备有限公司 | Burning tool for PCBA |
| CN210199253U (en) * | 2019-06-26 | 2020-03-27 | 珠海市金涛精密机械有限公司 | PCB testing mechanism with high alignment precision |
| CN210347722U (en) * | 2019-07-22 | 2020-04-17 | 成都汉芯国科集成技术有限公司 | Probe card for testing semiconductor chip |
| CN211043570U (en) * | 2019-07-31 | 2020-07-17 | 东莞联桥电子有限公司 | Testing device for single-sided PCB |
| CN211577337U (en) * | 2019-12-21 | 2020-09-25 | 广州市熠特电子科技有限公司 | Circuit board testing device |
| CN212301629U (en) * | 2020-05-22 | 2021-01-05 | 厦门煜雄智能机器人有限公司 | A structure test machine for mineral casting |
| CN212932705U (en) * | 2020-08-24 | 2021-04-09 | 深圳市博盛盈科供应链有限公司 | Integrated circuit testing device |
| CN213275855U (en) * | 2020-08-20 | 2021-05-25 | 镇江矽佳测试技术有限公司 | Semiconductor wafer probe test equipment |
| CN113655369A (en) * | 2021-08-09 | 2021-11-16 | 南京高喜电子科技有限公司 | PCBA board welding spot test structure and test method thereof |
| CN216350857U (en) * | 2021-09-10 | 2022-04-19 | 长江存储科技有限责任公司 | Probe card protection device |
| CN114624567A (en) * | 2022-02-11 | 2022-06-14 | 深圳市百泰实业股份有限公司 | 5G multithread PCBA test shielded cell |
| CN217360016U (en) * | 2021-12-28 | 2022-09-02 | 苏州速腾电子科技有限公司 | Probe card for testing semiconductor chip |
| CN217689276U (en) * | 2021-12-30 | 2022-10-28 | 珠海市奔强科技有限公司 | Detection device is used in printed circuit board production |
| CN115372788A (en) * | 2022-07-12 | 2022-11-22 | 南京隆远电气技术有限公司 | Circuit artificial intelligence assists maintenance system |
| CN115598509A (en) * | 2022-10-31 | 2023-01-13 | 南京高喜电子科技有限公司（Cn） | PCBA board welding spot test structure and test method thereof |
-
2023
- 2023-04-04 CN CN202310352473.7A patent/CN116298813A/en active Pending
Patent Citations (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN205283819U (en) * | 2015-12-09 | 2016-06-01 | 上海斐讯数据通信技术有限公司 | Silicon wafer microphone detection tool at terminal |
| CN106771989A (en) * | 2017-03-30 | 2017-05-31 | 冯晓栋 | A kind of LED circuit board detection means |
| CN208314088U (en) * | 2018-04-19 | 2019-01-01 | 敦吉电子（上海）有限公司 | A kind of electromagnetic compatibility test air-conditioning removable installation device |
| CN109541435A (en) * | 2018-11-14 | 2019-03-29 | 合肥泾渭信息通讯有限公司 | A kind of electronic equipment boundary scan testing device based on backboard |
| CN209981547U (en) * | 2019-05-30 | 2020-01-21 | 上海航键航空设备有限公司 | Burning tool for PCBA |
| CN209821816U (en) * | 2019-05-31 | 2019-12-20 | 武汉华工正源光子技术有限公司 | Probe burning clamp |
| CN210199253U (en) * | 2019-06-26 | 2020-03-27 | 珠海市金涛精密机械有限公司 | PCB testing mechanism with high alignment precision |
| CN210347722U (en) * | 2019-07-22 | 2020-04-17 | 成都汉芯国科集成技术有限公司 | Probe card for testing semiconductor chip |
| CN211043570U (en) * | 2019-07-31 | 2020-07-17 | 东莞联桥电子有限公司 | Testing device for single-sided PCB |
| CN211577337U (en) * | 2019-12-21 | 2020-09-25 | 广州市熠特电子科技有限公司 | Circuit board testing device |
| CN212301629U (en) * | 2020-05-22 | 2021-01-05 | 厦门煜雄智能机器人有限公司 | A structure test machine for mineral casting |
| CN213275855U (en) * | 2020-08-20 | 2021-05-25 | 镇江矽佳测试技术有限公司 | Semiconductor wafer probe test equipment |
| CN212932705U (en) * | 2020-08-24 | 2021-04-09 | 深圳市博盛盈科供应链有限公司 | Integrated circuit testing device |
| CN113655369A (en) * | 2021-08-09 | 2021-11-16 | 南京高喜电子科技有限公司 | PCBA board welding spot test structure and test method thereof |
| CN216350857U (en) * | 2021-09-10 | 2022-04-19 | 长江存储科技有限责任公司 | Probe card protection device |
| CN217360016U (en) * | 2021-12-28 | 2022-09-02 | 苏州速腾电子科技有限公司 | Probe card for testing semiconductor chip |
| CN217689276U (en) * | 2021-12-30 | 2022-10-28 | 珠海市奔强科技有限公司 | Detection device is used in printed circuit board production |
| CN114624567A (en) * | 2022-02-11 | 2022-06-14 | 深圳市百泰实业股份有限公司 | 5G multithread PCBA test shielded cell |
| CN115372788A (en) * | 2022-07-12 | 2022-11-22 | 南京隆远电气技术有限公司 | Circuit artificial intelligence assists maintenance system |
| CN115598509A (en) * | 2022-10-31 | 2023-01-13 | 南京高喜电子科技有限公司（Cn） | PCBA board welding spot test structure and test method thereof |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN109738783B (en) | PCB testing device and testing method | |
| CN109821755A (en) | A kind of circuit board detects automatically and sorting equipment | |
| CN108333511B (en) | Motor performance test system | |
| CN110926947A (en) | Column type insulator check out test set | |
| CN116298813A (en) | PCB board scanning testing arrangement | |
| CN213689851U (en) | Fault detection device | |
| CN117169034B (en) | Automobile coated glass detection device | |
| CN110153022B (en) | Motor stator's detection device | |
| CN209218463U (en) | Production device for circuit board | |
| CN113804920A (en) | Jig for testing PCB (printed circuit board) | |
| CN206804818U (en) | A kind of PCBA board detection device | |
| KR20020029853A (en) | Pcb inspection system | |
| CN108871752A (en) | The detection device and its detection method of door of railway vehicle rodless cylinder | |
| CN211207005U (en) | Universal lighting fixture | |
| US11385257B2 (en) | Apparatus for testing electronic components | |
| CN108152618A (en) | Electrical safety detection equipment | |
| CN211085683U (en) | Cylindrical bearing detection device | |
| CN210180967U (en) | Portable concrete electric flux detector | |
| CN113484657B (en) | Standardized high-frequency transformer automatic detection equipment | |
| CN219302607U (en) | Circuit board inspection device | |
| CN110243868B (en) | Portable concrete electric flux detector and use method thereof | |
| CN219392515U (en) | Display control panel test fixture | |
| CN206601288U (en) | A kind of testing integrated machine equipment of shared quick changing formula | |
| CN213792930U (en) | Motor counter potential sorting device | |
| KR100562586B1 (en) | Apparatus for testing panel |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |