CN210089656U

CN210089656U - Probe assembly and PCB detection device with same

Info

Publication number: CN210089656U
Application number: CN201920960037.7U
Authority: CN
Inventors: 易真江; 罗告京; 张念华
Original assignee: Guangdong Chinese Testing Robot Ltd By Share Ltd
Current assignee: Guangdong Chinese Testing Robot Ltd By Share Ltd
Priority date: 2019-06-24
Filing date: 2019-06-24
Publication date: 2020-02-18
Anticipated expiration: 2029-06-24

Abstract

The utility model relates to a circuit board detects technical field, and more specifically says, it relates to a probe subassembly and has this probe subassembly's PCB detection device, and both technical scheme's common main points are: comprises an elastic telescopic component used for abutting against a plate to be detected and a probe connected with the elastic telescopic component; when the elastic telescopic part is in a natural state, the end part of the probe is positioned in the elastic telescopic part; when the elastic telescopic component is in a compressed state, the end part of the probe protrudes out of the elastic telescopic component. The elastic telescopic part comprises a fixed end, a sliding end and a first elastic piece, the sliding end is connected to the fixed end and the sliding end, the sliding end is used for abutting against a plate to be tested, and the probe is connected to the fixed end. The utility model provides high detection efficiency.

Description

Probe assembly and PCB detection device with same

Technical Field

The utility model relates to a circuit board detects technical field, especially relates to a probe subassembly and has this probe subassembly's PCB detection device.

Background

The circuit board is the most demanding plate for electronic manufacturing industry. The board needs to carry out copper facing when the circuit board is made, and the thickness of copper coating can influence the result of use of circuit board in the later stage, so need carry out copper coating thickness detection after the circuit board production is accomplished.

The equipment that is used for detecting circuit board copper coating thickness in the mill is thick tester of copper, and general thick tester of copper divides into two steps before the copper coating thickness of detection circuit board, first step: the external driving device enables the pressing plate to abut against the edge of the circuit board, so that the stability of the circuit board is guaranteed; the second step is that: the external driving device pushes the probe against the circuit board for detection.

Although the detection mode can detect whether the copper plating layer of the circuit board reaches the standard, each circuit board needs to be controlled to press down the circuit board by the pressing plate firstly and then the probe is controlled to abut against the circuit board, so that the steps are complicated, and the detection efficiency is greatly influenced.

Disclosure of Invention

To the not enough of above-mentioned prior art, the utility model discloses a first purpose provides a probe subassembly to improve detection efficiency.

The first purpose of the utility model is realized through the following technical scheme: a probe assembly comprises an elastic telescopic component and a probe, wherein the elastic telescopic component is used for abutting against a plate to be detected;

when the elastic telescopic part is in a natural state, the end part of the probe is positioned in the elastic telescopic part;

when the elastic telescopic component is in a compressed state, the end part of the probe protrudes out of the elastic telescopic component.

Further, the elastic telescopic part comprises a fixed end and is used for contacting and extruding the sliding end of the plate to be tested and connecting the first elastic part between the fixed end and the sliding end, the sliding end is connected to the fixed end in a sliding mode, and the probe is connected to the fixed end.

Further, the first elastic member is a spring.

Furthermore, one of the fixed end and the sliding end is provided with a guide rod, the other one of the fixed end and the sliding end is provided with a guide groove, the guide rod is connected in the guide groove in a sliding manner, and the spring is connected between the bottom of the guide groove and the guide rod.

Further, the sliding end is provided with a buffer piece used for abutting against the plate to be tested.

Further, the sliding end is provided with an opening for the probe to pass through.

Furthermore, a second elastic piece is connected between the probe and the elastic telescopic part.

Further, the second elastic member is connected to the fixed end.

Further, the second elastic piece is a spring thimble.

To the not enough of above-mentioned prior art, the utility model discloses a second purpose provides a PCB detection device to improve detection efficiency.

The second purpose of the utility model is realized through the following technical scheme: the utility model provides a PCB detection device, includes a plurality of foretell probe subassembly, still includes the workstation, the workstation is equipped with the frame, the frame is equipped with the transport mechanism who is used for carrying the plate that awaits measuring and is used for driving the drive mechanism that the probe subassembly supported and presses the plate that awaits measuring.

The utility model has the advantages that: when an external driving device drives a probe to detect the thickness of a copper coating of a plate to be detected, the probe moves along with an elastic telescopic part at the same time, firstly, the elastic telescopic part is contacted with the plate to be detected and is abutted against the plate to be detected, the plate to be detected is kept stable, then, the pressure is continuously applied along with the external driving device, a sliding end compresses a first elastic part to slide and contract along the direction close to a fixed end, so that the end part of the probe protrudes out of the elastic telescopic part and is abutted against the plate to be detected, the thickness detection of the copper coating is carried out, the step that the external driving device drives the pressure plate to press the plate to be detected is omitted, and the detection efficiency is; after the detection is finished, the external driving device drives the elastic telescopic part to be far away from the plate to be detected, and the subsequent plate to be detected repeats the detection step.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the embodiments or the prior art descriptions will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without inventive labor.

Fig. 1 is a schematic structural diagram of a first embodiment of the present invention;

fig. 2 is another view of the first embodiment of the present invention;

fig. 3 is a schematic structural diagram of a second embodiment of the present invention.

Reference numerals: 1. an elastic expansion member; 11. a fixed end; 12. a guide bar; 13. a sliding end; 14. a buffer member; 15. an opening; 2. a probe; 21. a second elastic member; 3. a frame; 4. a transport mechanism; 41. a thumb cylinder; 42. and a powerless transmission wheel.

Detailed Description

In order to make the technical problem, technical solution and advantageous effects to be solved by the present invention more clearly understood, the following description is given in conjunction with the accompanying drawings and embodiments to illustrate the present invention in further detail. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.

It will be understood that when an element is referred to as being "secured to" or "disposed on" another element, it can be directly on the other element or be indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly or indirectly connected to the other element.

It will be understood that the terms "length," "width," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like are used in an orientation or positional relationship indicated in the drawings for convenience in describing the invention and to simplify the description, and are not intended to indicate or imply that the device or element so referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be construed as limiting the invention.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless specifically limited otherwise.

A probe assembly, see figures 1 and 2, comprises an elastic telescopic component 1 for abutting against a plate to be tested and a probe 2 connected with the elastic telescopic component 1; when the elastic telescopic part 1 is in a natural state, the end part of the probe 2 is positioned in the elastic telescopic part 1; when the elastic telescopic part 1 is in a compressed state, the end part of the probe 2 protrudes out of the elastic telescopic part 1.

When an external driving device (not shown in the figure) drives a probe to detect the thickness of a copper coating of a plate to be detected, the probe 2 moves along with the elastic telescopic part 1 at the same time, firstly, the elastic telescopic part 1 is contacted with the plate to be detected and is abutted against the plate to be detected, the plate to be detected is kept stable, then, the pressure is continuously applied along with the external driving device, the elastic telescopic part 1 contracts, so that the end part of the probe 2 protrudes out of the elastic telescopic part 1 and is abutted against the plate to be detected, the thickness detection of the copper coating is carried out, the step that the external driving device drives the pressure plate to press the plate to be detected is omitted, and the detection efficiency is improved; after the detection is finished, the external driving device drives the elastic telescopic part 1 to be far away from the plate to be detected, and the detection step is repeated on the subsequent plate to be detected.

Specifically, elastic telescopic part 1 includes stiff end 11 for the contact with the extrusion plate to be measured slide end 13 to and connect the first elastic component (not shown in the figure) between stiff end 11 and slide end 13, slide end 13 sliding connection is in stiff end 11, probe 2 is connected in stiff end 11. In this embodiment, the first elastic member is a spring.

When an external driving device drives a probe to detect the thickness of a copper coating of a plate to be detected, the probe 2 moves along with the elastic telescopic part 1 at the same time, firstly, the sliding end 13 is in contact with the plate to be detected and abuts against the plate to be detected, the plate to be detected is kept stable, then, the pressure is continuously applied along with the external driving device, the sliding end 13 compresses the first elastic part to slide and contract along the direction close to the fixed end 11, so that the end part of the probe 2 protrudes out of the elastic telescopic part 1 and abuts against the plate to be detected, and the thickness detection of the copper coating is carried out; under the natural state of the spring, the end part of the probe 2 is positioned in the elastic telescopic part 1, and under the compressed state of the spring, the end part of the probe 2 protrudes out of the elastic telescopic part 1. Of course, the first elastic member may be a spring sleeved on the probe 2, an ejector spring connected to one side of the probe 2, or a rubber pad, instead of being connected between the fixed end 11 and the sliding end 13.

Specifically, one of the fixed end 11 and the sliding end 13 is provided with a guide rod 12, the other one is provided with a guide groove, the guide rod 12 is slidably connected in the guide groove, and the spring is connected between the bottom of the guide groove and the guide rod 12. The arrangement of the guide rod 12 and the guide groove improves the linearity and stability of the sliding fit between the sliding end 13 and the fixed end 11. In this embodiment, the fixed end 11 is provided with a guide rod 12, and the sliding end 13 is provided with a guide groove.

Preferably, the spring is sleeved on the guide rod 12, so that the situation that when one end of the spring is directly connected with one end of the guide rod 12, the guide rod 12 slides to press the spring to cause bending of the spring can be avoided.

Specifically, the sliding end 13 is provided with a buffer 14 for abutting against the plate to be tested. The buffer 14 is arranged to buffer the impact force generated when the external driving device drives the probe assembly to abut against the plate to be tested, so as to protect the probe assembly from being damaged easily.

In the present embodiment, the buffer 14 is a silicone ring. The fixed end 11 and the sliding end 13 are both arranged in an L shape, specifically, the fixed end 11 comprises a first vertical section and a first horizontal section extending along one end of the first vertical section in a bending manner, the sliding end 13 comprises a second vertical section and a second horizontal section extending along one end of the second vertical section in a bending manner, and the probe 2 is connected between the outer side of the first horizontal section and the second horizontal section; in addition, the second horizontal section of the sliding end 13 is provided with an opening 15 for the probe 2 to pass through, in this embodiment, the opening 15 is a through hole, of course, according to actual conditions, the opening 15 may also be provided as a groove with a notch, etc., the silicone ring is provided on the lower surface of the sliding end 13, and the silicone ring surrounds the opening 15.

Specifically, a second elastic element 21 is further connected between the probe 2 and the elastic telescopic component 1. The second elastic element 21 is connected to the fixed end 11, and in this embodiment, the second elastic element 21 is a pogo pin. The second elastic member 21 is used for protecting the probe 2, and the problem that the probe 2 and the plate to be measured are rigidly extruded and damaged due to the pressing of an external driving device of the probe 2 is avoided. Of course, the second elastic member 21 may be provided as an extension spring, an air compression spring using compressibility of air in the hermetic container, or a magnetic spring using magnetic force between magnets, depending on the actual situation. In addition, the second elastic member 21 may be connected to the sliding end 13.

Example two: the PCB detection device comprises a plurality of probe assemblies according to the first embodiment and a workbench (not shown in the figure), wherein the probe assemblies are divided into an upper group and a lower group, the upper group and the lower group of the probe assemblies correspond to each other one by one, the PCB detection device also comprises a rack 3, the rack 3 is provided with a transmission mechanism 4 for conveying a plate to be detected and a driving mechanism (not shown in the figure) for driving the probe assemblies to abut against the plate to be detected.

When the plate that awaits measuring removes under a plurality of probe subassemblies, two sets of probe subassemblies are close to each other and support and press in the plate that awaits measuring about actuating mechanism drive, later carry out the copper coating thickness detection of the plate that awaits measuring, after having detected, two sets of probe subassemblies of actuating mechanism drive are kept away from each other, and later transmission device 4 carries away the plate that awaits measuring. In this embodiment, the transmission mechanism 4 is a plurality of thumb cylinders 41 slidably connected to two sides of the frame 3 and a plurality of unpowered transmission wheels 42 rotatably connected to the frame 3, the sliding direction of the thumb cylinders 41 is set along the rotating direction of the unpowered transmission wheels 42, and according to practical situations, a conveyor belt mechanism may also be adopted, and the driving mechanism is a cylinder and a bracket slidably connected to the frame 3, and the bracket slides in the direction perpendicular to the plate to be tested.

The above embodiments are merely illustrative of the present invention, and are not intended to limit the present invention, and those skilled in the art can make modifications of the present embodiments without inventive contribution as required after reading the present specification, but all the embodiments are protected by patent law within the scope of the present invention.

Claims

1. A probe assembly, characterized by: comprises an elastic telescopic component (1) used for abutting against a plate to be tested and a probe (2) connected with the elastic telescopic component (1);

when the elastic telescopic part (1) is in a natural state, the end part of the probe (2) is positioned in the elastic telescopic part (1);

when the elastic telescopic part (1) is in a compressed state, the end part of the probe (2) protrudes out of the elastic telescopic part (1).

2. The probe assembly of claim 1, wherein: elastic stretching part (1) includes stiff end (11) for contact and extrusion plate's slip end (13) to and connect the first elastic component between stiff end (11) and slip end (13), slip end (13) sliding connection is in stiff end (11), probe (2) are connected in stiff end (11).

3. A probe assembly as claimed in claim 2, wherein: the first elastic piece is a spring.

4. A probe assembly as claimed in claim 3, wherein: the fixed end (11) and the sliding end (13) are provided with a guide rod (12), the other is provided with a guide groove, the guide rod (12) is connected in the guide groove in a sliding manner, and the spring is connected between the bottom of the guide groove and the guide rod (12).

5. A probe assembly as claimed in claim 2, wherein: the sliding end (13) is provided with a buffer piece (14) used for abutting against a plate to be tested.

6. A probe assembly as claimed in claim 2, wherein: the sliding end (13) is provided with an opening (15) for the probe (2) to pass through.

7. A probe assembly as claimed in claim 2, wherein: and a second elastic piece (21) is connected between the probe (2) and the elastic telescopic part (1).

8. The probe assembly of claim 7, wherein: the second elastic piece (21) is connected to the fixed end (11).

9. The probe assembly of claim 7, wherein: the second elastic piece (21) is a spring thimble.

10. The PCB detection device is characterized in that: comprising a plurality of probe assemblies according to any of claims 1-9, and further comprising a work table provided with a frame (3), said frame (3) being provided with a transport mechanism (4) for transporting a plate to be tested and a drive mechanism for driving the probe assemblies against the plate to be tested.